CN107063312B - Resistive sensor array measuring device and method - Google Patents
Resistive sensor array measuring device and method Download PDFInfo
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- CN107063312B CN107063312B CN201710048637.1A CN201710048637A CN107063312B CN 107063312 B CN107063312 B CN 107063312B CN 201710048637 A CN201710048637 A CN 201710048637A CN 107063312 B CN107063312 B CN 107063312B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/16—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying resistance
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Abstract
The invention discloses a kind of resistive sensor array measuring device, the resistive sensor array is classified as the resistive sensor array of common row line and alignment；The measuring device includes: measuring resistance row comprising a lineNA measuring resistance is added in resistive sensor array, thus obtain new a shared line and alignment (M+1) ×NElectric resistance array；(M+1) a operational amplifier, with electric resistance array (M+1) line corresponds, and the inverting input terminal of each operational amplifier, output end pass through a connecting line respectively and connect with its corresponding line；Controller, have at least (M+ 1) a I/O port and at leastNA ADC sample port, therein (M+ 1) a I/O port with (M+1) non-inverting input terminal of a operational amplifier connects one to one, thereinNA ADC sample port and new electric resistance arrayNAlignment connects one to one.The invention discloses a kind of resistive sensor array measurement methods.The present invention has more high measurement accuracy and bigger measuring range.
Description
Technical field
The present invention relates to a kind of resistive sensor array measuring device and methods, belong to sensor technical field.
Background technique
Array sensing device is exactly the multiple sensing elements that will have same performance, is combined according to the structure of two-dimensional array
Together, it can change or generate corresponding form and feature by detecting the Parameters variation focused on array.This is special
Property is widely used in bio-sensing, temperature tactile and thermal imaging based on infrared sensor etc. etc..
Resistive sensor array is widely used in Simulations of Infrared Image system, power tactilely-perceptible and temperature tactilely-perceptible.
By taking temperature tactile as an example, the transmitting of the heat as involved in temperature sensation sensing device and the perception of temperature, to obtain the heat of object
Attribute, device propose higher requirement to temperature measurement accuracy and resolution ratio, and in order to further obtain object different location
The hot attribute that material is shown then proposes higher spatial resolving power requirement to temperature sensation sensing device.
The quality or resolution ratio of resistive sensor array are to need to increase by the quantity of the sensor in increase array
's.However, the scale when sensor array increases, information collection and signal processing to all components are just become difficult.One
As in the case of, the progress of all sensors of a M N array is accessed one by one, and each sensor tool there are two end
Mouthful, 2 × M × N root connecting line is needed altogether.Not only line is complicated for this connection type, but also can only select single electricity to be measured every time
Resistance measures, and scanning speed is slow, and the period is long, low efficiency.For reduce device interconnection complexity, can introduce shared line with
The two-dimensional array of alignment, by scanning monitor in conjunction with single operational amplification circuit and multiple selector, but it is necessarily increased
The complexity of circuit, therefore scanning times how are reduced, reduce circuit complexity just at the problem for needing to capture together.
Detection about resistance-type sensor array is studied, and R.S.Saxena in 2006 et al. is proposed based on infrared thermal imaging
Array technology, test structure be based on resistance sensing network configure, based on resistance it is linear with it is homogeneity using compensate
Network theorem and stacking network theorem develop the theoretical model of the resistor network.Use 16 × 16 array network bolometer battle arrays
Column verifying, is used only 32 pins, it has already been proven that, which can be effective for the minor change of device failure or device value
It differentiates, it has certain precision, but still remains technological deficiency in detection speed.Y.J.Yang in 2009 et al. is proposed
The temperature and tactile sensing array of one 32 × 32 array, for the artificial skin of mechanical arm, the circuit is in order to guarantee to detect
Precision, the interference of non-testing resistance in mask array all introduce operational amplification circuit in each column of array, and circuit is complicated
Degree greatly increases, and the interference of its internal resistance can not be avoided effectively, detection efficiency, circuit complexity and avoids in electronic device
The interference of portion's equivalent internal resistance becomes maximum technical bottleneck.
There is pertinent literature to propose a kind of to read by establishing sensor array and solving the method for resistor matrix equation
Resistance in array out.The first row of resistive array is set measuring resistance by it, is acquired on corresponding column direction using ADC
Column voltage data are grounded the first row successively to last line, remaining row input high level, logical in the process every time
The voltage for crossing respective column when ADC produces corresponding row ground connection, lists matrix equation, finds out resistance and measuring resistance in each column respectively
Relationship and solution.Although this method is largely avoided crossfire, while reducing circuit complexity, detects speed
Higher, computational complexity is lower, but does not account for the presence of its equivalent internal resistance when exporting low and high level by single-chip microcontroller, simultaneously
Resistance range is confined in a certain section in array, for a wide range of resistance measurement problem again without solution,
So also needing to seek one kind under the premise of not improving computational complexity, voltage output equivalent internal resistance can be effectively avoided
The method of interference, while being also required to further expand in resistance range.
Summary of the invention
Technical problem to be solved by the present invention lies in overcoming the shortage of prior art, propose that a kind of resistive sensor array is surveyed
Device and method is measured, may be implemented to all resistive sensor (objects in the resistive sensor array of the two dimension of shared line and alignment
Reason amount sensitive resistance) quick detection, while output resistance when can effectively eliminate controller I/O port direct driving circuit
The measurement error that connection line resistance generates in influence and array, improves measurement accuracy, while expanding measuring range.
The present invention specifically uses following technical scheme to solve above-mentioned technical problem:
A kind of resistive sensor array measuring device, the resistive sensor array are classified as M × N bis- of common row line and alignment
Tie up resistive sensor array；The measuring device includes:
Measuring resistance row comprising measuring resistance known to row of N resistance value is added as new a line in described
In resistive sensor array, to obtain (M+1) × N electric resistance array of new a shared line and alignment；
(M+1) a operational amplifier, (M+1) item with (M+1) × N electric resistance array of the new shared line and alignment
Line corresponds, and the inverting input terminal of each operational amplifier, output end pass through a connecting line and its corresponding row respectively
Line connection；
Controller has at least (M+1) a I/O port and at least N number of ADC sample port, (M+1) a IO therein
Port and the non-inverting input terminal of (M+1) a operational amplifier connect one to one, N number of ADC sample port therein and institute
N alignment for stating (M+1) × N electric resistance array of new shared line and alignment connects one to one.
A kind of resistive sensor array measurement method, the resistive sensor array are classified as M × N bis- of common row line and alignment
Tie up resistive sensor array；It is measured using above-mentioned apparatus, specifically includes the following steps:
The I/O port output low level that step 1, controller control are connect with measuring resistance row, and remaining M I/O port
Export high level；Controller acquires the voltage of N root alignment by the N number of ADC sample port connecting with N alignment at the same time,
The column voltage of j-th strip alignment is denoted as V at this timesj, j=1,2 ..., N；
Step 2, controller successively control the I/O port being connect with the i-th row of the resistive sensor array of M × N two dimension and export
Low level, and remaining M I/O port exports high level；Controller is sampled by the N number of ADC connecting with N alignment at the same time
The voltage of port processing N root alignment, the column voltage of j-th strip alignment is denoted as V at this timeij, i=1,2 ..., M, j=1,2 ..., N；
Step 3, the resistance value that each resistive sensor in the resistive sensor array of two dimension is calculated using following formula:
In formula, RijIndicate the resistance value for the resistive sensor that the i-th row jth arranges in the resistive sensor array of two dimension, Rsj
Indicate to access the resistance value of the measuring resistance of jth column in the resistive sensor array of two dimension, VccIndicate controller I/O port institute
The high level voltage of output.
Compared with prior art, the invention has the following advantages:
(1) measurement method of the present invention uses (M+1) a operational amplifier, it is possible to prevente effectively from the connection of controller I/O port is negative
The influence of the output resistance as caused by driving current when load.Due to controller (M+1) a I/O port respectively with corresponding row
The non-inverting input terminal of operational amplifier is connected, and driving current is 0 when output level, and then avoids the end controller general digital IO
The influence of the output internal resistance of mouth, improves physical quantity sensitive resistance in resistive sensor array under the premise of low computational complexity
Measurement accuracy.
(2) measurement method of the present invention is that each line of the resistive sensor array of two dimension is provided with two connecting lines, is eliminated
Crosstalk error caused by the contact resistance of test cable connector, long test cable, improves physical quantity sensitive resistance in array
Measurement accuracy, but also long test cable can be applied to resistive sensor array measurement.
(3) measurement method of the present invention passes through N number of ADC sampling channel of controller, realizes that current drive level be low electricity
The disposable voltage sample of flat resistance row.Due to N number of ADC sampling channel N alignment with the resistive sensor array of two dimension respectively
Be connected, to measuring resistance row apply low level, while to the M row of physical quantity sensitive resistance array apply high level after, can acquire
Apply low level to N number of standard voltage value, then to a line any in M × N physical quantity sensitive resistance array, while to measuring resistance
Row applies high level, collects N number of voltage value corresponding to the row, the high level V exported in conjunction with controllerccAnd N number of standard
Voltage value can disposably acquire the resistance value of all physical quantity sensitive resistances in the row, and then select remaining row to be measured one by one, finally
The measurement of all measured physical quantity sensitive resistances in array is completed, and finally improves measuring speed.
(4) additional devices that measurement method of the present invention needs only include (M+1) a operational amplifier and N number of measuring resistance,
Under the premise of ensuring measurement accuracy, reduce the quantity and circuit complexity of line between device.
Detailed description of the invention
Fig. 1 is the resistive sensor array structure schematic diagram of M × N two dimension to share line and alignment；；
Fig. 2 is the resistive sensor array measuring circuit schematic diagram of existing single-wire drive line；
Fig. 3 is the voltage and current relationship curve synoptic diagram of its port when STC single-chip microcontroller I/O port is set height respectively, set low；
Fig. 4 is the circuit diagram of measuring device of the present invention；
The current direction signal that Fig. 5 is the drive level of measuring resistance row when being low level in array on each column column direction
Figure；
Fig. 6 be measuring resistance row drive level be low level when the 1st column resistor current rule rough schematic view；
The electric current that Fig. 7 is the drive level of the 1st row physical quantity sensitive resistance when being low level in array on each column column direction
Flow to schematic diagram；
Fig. 8 is the drive level of the 1st row physical quantity sensitive resistance when being low level, and the simplification of the 1st column resistor current rule is shown
It is intended to；
Fig. 9 be the i-th row physical quantity sensitive resistance drive level be low level when the 1st column resistor current rule simplification show
It is intended to.
Specific embodiment
Technical solution of the present invention is described in detail with reference to the accompanying drawing:
For reduce resistive sensor array device interconnection complexity, there is researcher to propose shared line and alignment
Two-dimensional array structure.Fig. 1 shows the structure of the resistive sensor array of the two dimension of shared line and alignment.As shown in Figure 1, the biography
Sensor array includes two groups of orthogonal lines respectively as shared line and shared alignment and the two-dimensional structure distribution according to M × N
Physical quantity sensitive resistance (i.e. resistive sensor) array, each physical quantity sensitive resistance one end in array connects corresponding row
Line, the other end connect corresponding alignment, and each resistance in array has the combination of unique line and alignment, are in the i-th row
The resistance R of jth columnijIt indicates, wherein M is line number, and N is columns.Two-dimensional structure according to M × N may make using this kind of structure
The array of distribution, it is only necessary to which M+N root line number can guarantee that any one specific resistive element can be by controlling line
It is accessed with the corresponding combination of alignment, therefore required session number is greatly decreased.
Fig. 2 shows that a kind of existing resistive sensor array reading circuit, the reading circuit are the measurement of single-wire drive line
Method.As shown in Fig. 2, in the circuit, being connect before sharing the first row of the resistive sensor array of M × N two dimension of line and alignment
Measuring resistance R known to row of N resistance value is enteredsj, j=1,2 ..., N, measuring resistance row is together with resistive sensor array
Constitute (M+1) × N electric resistance array of new a shared line and alignment.In the reading circuit, every row of electric resistance array
Between line and reading circuit only have a connecting line, controller by I/O port directly with each connecting line pair of electric resistance array
It should be connected, and by the voltage on its ADC sample port acquisition alignment.The circuit is under ideal working condition, controller output electricity
When putting down to each line, output resistance existing for each I/O port is ignored, and in array every a line connecting line lead
The cumulative resistance RL of resistance and connector contacts resistancexIt is ignored, x=s, 1,2 ..., M, thus line xrs、xr1、xr2、…、xrMEnd
Voltage be controller I/O port output level value VccOr 0V.Collected column line voltage value and each when according to scanning array
Voltage value on root line can list equation solution according to Kirchhoff's law.And the circuit is controlled in real work
The output level of device I/O port processed is related with driving current, and Fig. 3 is its port when STC single-chip microcontroller I/O port is set height respectively, set low
Voltage and current relationship curve synoptic diagram, it is known that there are output resistances when I/O port output level.On the other hand, connecting line and
For connector contacts there is also lead resistance, wiper resistance, the resistance that adds up is RLx, x=s, 1,2 ..., M.Therefore, above-mentioned two factor
Lead to the voltage value and V on each lineccOr 0V is unequal, and the measurement error of resistance in array is made to become larger.
In order to overcome Fig. 2 reading circuit there are the shortcomings that, eliminate controller I/O port direct driving circuit when output electricity
The influence of resistance and connection cables, the contact resistance of cable connector, the invention proposes a kind of two-wire driving line, column voltages to adopt entirely
The resistive sensor array measurement method of two dimension of sample is arranged using operational amplifier and for each line of resistive sensor array
Two connecting lines eliminate the influences of above-mentioned several factors.
Fig. 4 shows the circuit diagram of the resistive sensor array measuring device of the present invention, as shown in figure 4, include add in
Share measuring resistance R known to the row of N resistance value in the resistive sensor array of M × N two dimension of line and alignmentsj, j=1,
2 ..., N, measuring resistance row constitute (M+1) × N resistance of a new shared line and alignment together with resistive sensor array
Array；For ease of calculation, the resistance value of N number of measuring resistance is preferably identical.Measuring device of the present invention further includes controller
And (M+1) a operational amplifier altogether corresponding to the every a line of electric resistance array.Unlike Fig. 2 circuit, the present invention is Resistor Array Projector
Each line of column is provided with two connecting lines, and one end of this two connecting lines is connected to a bit with corresponding line, Mei Yigen
Line distinguishes the output end of corresponding operational amplifier by its two connecting lines, inverting input terminal is connected, every a line
The non-inverting input terminal of operational amplifier is connected with corresponding controller I/O port.In real work, according to operation amplifier
The disconnected effect of the void of device, non-inverting input terminal electric current is 0, therefore does not have driving current when the I/O port output level of controller, can be disappeared
The influence of existing output resistance when except I/O port direct driving circuit.On the other hand, due to operational amplifier inverting input terminal
Input impedance and the lead resistance of every a line connecting line and the cumulative resistance RL of connector contacts resistancexBig, the operation compared to very
The disconnected effect of the void of amplifier can eliminate RL in circuitxInfluence, x=s, 1,2 ..., M.Meanwhile in the driving energy of operational amplifier
Under the premise of power is enough, according to its empty short effect, the voltage follow operational amplifier non-inverting input terminal electricity of current each line
Buckling, i.e., the voltage in array on each line are equal to the voltage V of controller I/O port outputccOr 0V.Thus realize
Existing output resistance, the lead resistance for being drivingly connected line and its connector contacts electricity when controller I/O port direct driving circuit
The accumulation resistance R of resistanceLxVirtual isolation, x=s, 1,2 ..., M, and then improve measurement accuracy.
When being measured using measuring circuit shown in Fig. 4 specifically according to the following steps:
The I/O port output low level that step 1, controller control are connect with measuring resistance row, and remaining M I/O port
Export high level；Controller acquires the voltage of N root alignment by the N number of ADC sample port connecting with N alignment at the same time,
The column voltage of j-th strip alignment is denoted as V at this timesj, j=1,2 ..., N；
Step 2, controller successively control the I/O port being connect with the i-th row of the resistive sensor array of M × N two dimension and export
Low level, and remaining M I/O port exports high level；Controller is sampled by the N number of ADC connecting with N alignment at the same time
The voltage of port processing N root alignment, the column voltage of j-th strip alignment is denoted as V at this timeij, i=1,2 ..., M, j=1,2 ..., N；
Step 3, the resistance value that each resistive sensor in the resistive sensor array of two dimension is calculated using following formula:
In formula, RijIndicate the resistance value for the resistive sensor that the i-th row jth arranges in the resistive sensor array of two dimension, Rsj
Indicate to access the resistance value of the measuring resistance of jth column in the resistive sensor array of two dimension, VccIndicate controller I/O port institute
The high level voltage of output.
Fig. 5 is shown in measuring device of the present invention when the drive level of measuring resistance row is low level, every in array
Current direction on column column direction, the s behavioral standard resistance row of electric resistance array in figure, remaining M behavior measured physical quantity are sensitive
Resistance row.The I/O port that controller control corresponds to measuring resistance row exports low level (0), remaining M high electricity of I/O port output
Flat (Vcc), M high level VccOperational amplifier through corresponding row is respectively by line xr1、xr2、…、xrMAct on the 1st column resistance
R11、…、RM1, the 2nd column resistance R12、…、RM2..., Nth column resistance R1N、…、RMN, finally it is collected to the corresponding standard electric of each column
Hinder Rs1、…、RsN, through xrsOutflow.Meanwhile controller controls N number of ADC sample port and acquires voltage value on N number of alignment, that is, marks
Quasi- voltage Vs1、Vs2、…、VsN。
By taking the 1st column resistance as an example, the 1st column resistor currents rule when being low level that Fig. 6 is the drive level of measuring resistance row
Rough schematic view, the drive level of array Plays resistance row is low level, high level VccIt is respectively acting on the 1st column resistance
R11、…、RM1By Rs1To ground terminal, Vs1The standard voltage value of 1st column alignment when for measuring resistance row drive level being low level,
According to Kirchhoff's current law (KCL), obtain
The electric current that Fig. 7 is the drive level of the 1st row physical quantity sensitive resistance when being low level in array on each column column direction
Flow to schematic diagram.The s behavioral standard resistance row of electric resistance array in figure, remaining M behavior measured physical quantity sensitive resistance row.The figure
By taking the drive level of the 1st row physical quantity sensitive resistance is low level as an example, the I/O port that controller control corresponds to the 1st row is exported
Low level (0) controls remaining M row I/O port output high level (Vcc), M high level VccOperational amplifier point through corresponding row
Not by line xrs、xr2、…、xrMAct on the 1st column resistance Rs1、R21、…、RM1, the 2nd column resistance Rs2、R22、…、RM2..., N
Column resistance RsN、R2N、…、RMN, finally it is collected to the corresponding resistance R of each column11、…、R1N, through xr1Outflow.Meanwhile controller controls
N number of ADC sample port acquires the voltage value on N number of alignment, i.e., when the drive level of the 1st row physical quantity sensitive resistance is low level
Column voltage V11、V12、…、V1N。
By taking the 1st column resistance as an example, Fig. 8 be the 1st row physical quantity sensitive resistance drive level be low level when the 1st column resistance
The rough schematic view of electric current rule, the drive level of the 1st row physical quantity sensitive resistance is low level, high level V in arrayccRespectively
Act on the 1st column resistance Rs1、R21、…、RM1By R11To ground terminal, V111st column alignment when for the 1st row drive level being low level
Voltage value obtained according to Kirchhoff's current law (KCL)
Two equatioies as obtained in Fig. 6, Fig. 8, converted can be obtained respectively
Two formulas above are subtracted each other, R can be obtained11Resistance value be
By taking the 1st column resistance as an example, Fig. 9 is that the drive level of the i-th row physical quantity sensitive resistance row of the invention is low level
When the 1st column resistor current rule rough schematic view, the drive level of the i-th row physical quantity sensitive resistance is low level in array,
High level VccIt is respectively acting on the 1st column resistance Rs1、R11、…、RM1By Ri1To ground terminal, Vi1It is low electricity for the i-th row drive level
The usually voltage value of the 1st column alignment is obtained according to Kirchhoff's current law (KCL)
Likewise, the 1st column resistance R in array can be obtainedi1Resistance value, i=1,2 ..., M and the 1st column any one
The expression formula of testing resistance.
When due to applying low level to certain row in two-dimentional electric resistance array every time, N number of sample port of controller is adopted simultaneously
Collect the voltage value on N root alignment, successively the jth column of two-dimentional electric resistance array is analyzed as a result, j=1,2 ..., N can be obtained
Into array, the resistance value of M testing resistance of jth column is
In above formula, i=1,2 ..., M.
Through the above steps, the computation formula of all resistive sensor resistances in the resistive sensor array of two dimension can be obtained
Are as follows:
By analyzing above, the resistance value of all physical quantity sensitive resistances in resistive sensor array, Jin Ertong may finally be obtained
Cross the physical quantity that resistance-physical quantity converts available sensitive resistance present position.
It is emphasized that: above-mentioned row, column is relative concept, and those skilled in the art can exchange it completely, equally
It can reach corresponding technical effect.
Claims (2)
1. a kind of resistive sensor array measuring device, the resistive sensor array is classified as M × N two dimension of common row line and alignment
Resistive sensor array；The measuring device includes: measuring resistance row and controller；The measuring resistance row includes row of N
Measuring resistance known to resistance value is added in the resistive sensor array as new a line, to obtain one newly
Shared line and alignment (M+1) × N electric resistance array；It is characterized in that, the measuring device further includes that (M+1) a operation is put
Big device corresponds, each operation with (M+1) line of (M+1) × N electric resistance array of the new shared line and alignment
The inverting input terminal of amplifier, output end pass through a connecting line respectively and connect with its corresponding line；The controller has
At least (M+1) a I/O port and at least N number of ADC sample port, (M+1) a I/O port therein and (M+1) a operation
The non-inverting input terminal of amplifier connects one to one, N number of ADC sample port therein and the new shared line and alignment
(M+1) N alignment of × N electric resistance array connects one to one.
2. a kind of resistive sensor array measurement method, the resistive sensor array is classified as M × N two dimension of common row line and alignment
Resistive sensor array；It is characterized in that, measured using device as described in claim 1, specifically includes the following steps:
The I/O port output low level that step 1, controller control are connect with measuring resistance row, and remaining M I/O port output
High level；Controller acquires the voltage of N root alignment by the N number of ADC sample port connecting with N alignment at the same time, at this time
The column voltage of j-th strip alignment is denoted as Vsj, j=1,2 ..., N；
Step 2, controller successively control the I/O port being connect with the i-th row of the resistive sensor array of M × N two dimension and export low electricity
It is flat, and remaining M I/O port exports high level；Controller passes through N number of ADC sample port for connecting with N alignment at the same time
The voltage of N root alignment is acquired, the column voltage of j-th strip alignment is denoted as V at this timeij, i=1,2 ..., M, j=1,2 ..., N；
Step 3, the resistance value that each resistive sensor in the resistive sensor array of two dimension is calculated using following formula:
In formula, RijIndicate the resistance value for the resistive sensor that the i-th row jth arranges in the resistive sensor array of two dimension, RsjIt indicates
Access the resistance value for the measuring resistance that jth arranges in the resistive sensor array of two dimension, VccIndicate that controller I/O port is exported
High level voltage.
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| CN106813783B (en) * | 2017-01-20 | 2019-10-15 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
| CN116465436A (en) * | 2022-01-11 | 2023-07-21 | 腾讯科技（深圳）有限公司 | Resistive sensor circuit, non-electric physical quantity sensing method and electronic equipment |
| WO2023211373A2 (en) * | 2022-04-25 | 2023-11-02 | National University Of Singapore | Read-out apparatus and method for a sensor array |
| CN115628761B (en) * | 2022-09-30 | 2023-10-13 | 华南理工大学 | Low-power-consumption anti-disturbance resistance type sensor and wearable equipment |
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| CN105424095A (en) * | 2016-01-04 | 2016-03-23 | 东南大学 | Quick readout circuit for two-dimensional resistive sensor array and readout method thereof |
| CN105675024A (en) * | 2016-01-04 | 2016-06-15 | 东南大学 | Data reading method and device for resistance sensor array |
| CN105628061A (en) * | 2016-01-28 | 2016-06-01 | 东南大学 | Resistive sensor array fast readout circuit based on two-wire system isopotential method |
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