CN106959166A - The measurement apparatus and method of any repetition rate femtosecond laser time jitter - Google Patents
The measurement apparatus and method of any repetition rate femtosecond laser time jitter Download PDFInfo
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- CN106959166A CN106959166A CN201710097721.2A CN201710097721A CN106959166A CN 106959166 A CN106959166 A CN 106959166A CN 201710097721 A CN201710097721 A CN 201710097721A CN 106959166 A CN106959166 A CN 106959166A
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- 238000005259 measurement Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims abstract description 20
- 230000033228 biological regulation Effects 0.000 claims description 13
- 239000013078 crystal Substances 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 6
- 238000005070 sampling Methods 0.000 claims description 6
- 230000005622 photoelectricity Effects 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims 2
- 230000010287 polarization Effects 0.000 claims 1
- 238000009738 saturating Methods 0.000 claims 1
- 230000003252 repetitive effect Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 238000013481 data capture Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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Abstract
The present invention discloses a kind of measurement apparatus for any repetition rate femtosecond laser time jitter.The device is based on the method that balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering, pass through data collecting card collection voltages signal, and error signal is extracted by software processing so that the system is used successfully to the measurement of the time jitter of any repetitive frequency laser.The present invention successfully solves the problems, such as the measurement of any repetition rate femtosecond laser time jitter, with it is simple efficiently and it is practical the characteristics of.
Description
Technical field
It is more particularly to a kind of the present invention relates to ultra-fast optical field, non-linear optical field and digital processing field
The measurement apparatus and method of any repetition rate femtosecond laser time jitter.
Background technology
In ultra-fast optical field and high power pulsed laser device field, it is high that coherently combined has been considered as following raising
The effective ways of power pulsed laser peak power density.The premise that femtosecond laser coherent closes beam be between precise control light beam when
Jitter, balance cross-correlation detection method is the effective ways of current femtosecond laser time jitter measurement, with high precision, measurement
The characteristics of light path is simply and processing method is simple.But existing balance cross-correlation detection method is analog circuitry processes mode,
Suitable for high repetition frequency femtosecond laser (tens of MHz), it is not particularly suited for handling below MHz femtosecond lasers.However, in high power
Impulse laser unit field, the femtosecond laser of coherently combined is generally low-repetition-frequency (below KHz).It is low heavy it is therefore desirable to propose
The detection method of the time jitter signal of complex frequency (below KHz) femtosecond laser.
The content of the invention
The invention aims to solve the measurement of low repetition frequency femtosecond laser (below KHz) time jitter.The device
The method that original balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering is improved, passes through data
Capture card collection voltages signal, and error signal is extracted by software processing so that the system is used successfully to any repetition rate
The measurement of the time jitter of laser.The measurement that the present invention successfully solves any repetition rate femtosecond laser time jitter is asked
Topic, with it is simple efficiently and it is practical the characteristics of.
In order to realize foregoing invention purpose, technical solution of the invention is as follows：
By data collecting card, electric signal obtained by balance photodetector in balance cross-correlation detection method is extracted,
The processing such as filtering, so as to obtain the time jitter information of laser.
A kind of measuring method for any repetition rate femtosecond laser time jitter, is comprised the following steps that：
Step 1, the second light beam of regulation, make it pass through 1/2nd wave plates, the first light beam of regulation and the second light beam, make first
Light beam and the second light beam reach that room and time is overlapped at Glan prism；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal, make two class frequency-doubled effects most strong, produce first via frequency multiplication
Light；
Step 3, regulation dichroic mirror, make remaining fundamental frequency light again pass by two class frequency doubling nonlinear crystal, and occur two classes times
Frequency effect, produces the second road frequency doubled light；
Step 4, regulation high reflective mirror and the angle for balancing photodetector, make the first via and the second road frequency doubled light in balance light
After response on electric explorer is equal, subtract each other voltage signal by balancing photodetector output, this subtracts each other voltage signal and included
The time difference information of first light beam and the second light beam；
Step 5, the voltage signal that subtracts each other exported by data collecting card to balance photodetector are acquired and conveyed
Handled, comprised the following steps that to signal processing module：
First, selection sampling configuration is sampled for N；
Then, adopted according to the first light beam or the sample rate N of the first light beam repetition frequency setting capture card, i.e. sample rate N=
The sample frequency ÷ light beam repetition rates of truck；
Finally, the signal in each sampling period is filtered processing, chooses maximum, be to survey error signal.
The described measuring method for any Repetition-radted laser time jitter, it is characterised in that described photoelectricity is visited
The bandwidth and the repetition rate of the first light beam or the second light beam for surveying device match.
The described measuring method for any Repetition-radted laser time jitter, it is characterised in that described data are adopted
The frequency acquisition of truck and the bandwidth of photodetector match, i.e., the maximum sample frequency of data collecting card is more than balance photoelectricity
It is more than the three times of detector bandwidth.
The described measuring method for any Repetition-radted laser time jitter, described signal processing module collection speed
Rate is identical with the repetition rate of the first light beam or the second light beam.
The described measuring method for any Repetition-radted laser time jitter, it is characterised in that pass through regulation first
The intensity of light beam and the second light beam, makes the described intensity for subtracting each other voltage signal be more than the strong of balance photodetector noise signal
Degree.
Compared with prior art, the beneficial effects of the invention are as follows：
1) solve balance photo-detection method at present and be not used to asking for below MHz femtosecond lasers time jitter measurement
Topic, the present apparatus can be used for the measurement of any repetition rate femtosecond laser time jitter；
2) have signal to noise ratio adjustable, the distortionless feature of signal；
3) there is convenient experimental operation, it is simple efficient and practical the features such as.
Brief description of the drawings
Fig. 1 is the structural representation of the measurement apparatus of any repetition rate femtosecond laser time jitter of the invention
Fig. 2 is data acquisition and signal processing flow figure
Embodiment
The present invention will be described in detail with reference to the accompanying drawings and examples.
The invention aims to solve the measurement of low repetition frequency femtosecond laser (below KHz) time jitter.The device
The method that original balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering is improved, passes through data
Capture card collection voltages signal, and error signal is extracted by software processing so that the system is used successfully to any repetition rate
The measurement of the time jitter of laser.The measurement that the present invention successfully solves any repetition rate femtosecond laser time jitter is asked
Topic, with it is simple efficiently and it is practical the characteristics of.
A kind of measurement apparatus for any repetition rate femtosecond laser time jitter, is comprised the following steps that：
Step 1, the second light beam 2 of regulation, make it pass through 1/2nd wave plates 3, the first light beam 1 of regulation and the second light beam 2, make
First light beam 1 and the second light beam 2 reach that room and time is overlapped at Glan prism 4；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal 6, make two class frequency-doubled effects most strong, produce first via frequency multiplication
Light；
Step 3, regulation dichroic mirror 7, make remaining fundamental frequency light again pass by two class frequency doubling nonlinear crystal 6, and occur two classes
Frequency-doubled effect, produces the second road frequency doubled light；
Step 4, regulation high reflective mirror 8 and the angle for balancing photodetector 9, make the first via and the second road frequency doubled light in balance
After response on photodetector is equal, subtract each other voltage signal by balancing the output of photodetector 9, this subtracts each other voltage signal bag
Time difference information containing the first light beam 1 and the second light beam 2；
Step 5, the voltage signal that subtracts each other exported by 10 pairs of balance photodetectors 9 of data collecting card are acquired and defeated
Deliver to signal processing module 11 to be handled, comprise the following steps that：
First, selection sampling configuration is sampled for N；
Then, according to the first light beam 1 or the sample rate N, i.e. sample rate N=of the repetition frequency setting capture card of the first light beam 2
The sample frequency ÷ light beam repetition rates of capture card；
Finally, the signal in each sampling period is filtered processing, chooses maximum, be to survey error signal.
Using light beam repetition rate as 1000Hz, a width of 0.1MHz of photodetector strings is balanced, noise is 2.0mV, and data are adopted
Truck picking rate is 2MHz, then program processing speed is, gathers 2000 data from balance photodetector per 1ms, and carry
The maximum in 2000 data points is taken, the maximum is the data for including time jitter information.
Finally it should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention and it is unrestricted.Although ginseng
The present invention is described in detail according to embodiment, it will be understood by those within the art that, to the technical side of the present invention
Case is modified or equivalent, and without departure from the spirit and scope of technical solution of the present invention, it all should cover in the present invention
Right among.
Claims (7)
1. a kind of measurement apparatus of any repetition rate femtosecond laser time jitter, it is characterised in that including the first light beam (1),
It is second light beam (2), 1/2nd wave plates (3), Glan prism (4), dichroic mirror (5), two class frequency doubling nonlinear crystal (6), double-colored
Mirror (7), high reflective mirror (8), balance photodetector (9), data collecting card (10) and signal processing module (11)；
Described the first light beam (1) is with the second light beam (2) for the two beam directions of propagation are orthogonal, polarization direction is identical, repeat frequency
Rate identical fundamental frequency light to be measured, the second light beam (2) is after 1/2nd wave plates (3) transmission, with the first light beam (1) in Glan rib
After the light that mirror (4) place is closed after beam, conjunction beam crosses dichroic mirror (5) transmission through first, two class frequency doubling nonlinear crystal (6) are injected, and produce
Raw first via frequency doubled light, the first via frequency doubled light is incided on balance photodetector (9) through the second dichroic mirror (7), remaining
After fundamental frequency light reflects through the second dichroic mirror (7), two class frequency doubling nonlinear crystal (6) are injected, the second road frequency doubled light are produced, this second
Road frequency doubled light after the first dichroic mirror (5) and high reflective mirror (8) reflection, is incided on balance photodetector (9) successively；
The output end of described balance photodetector (9) is connected with the input of data collecting card (10), the data collecting card
(10) output end is connected with the input of signal processing module (11).
2. the measurement apparatus of any repetition rate femtosecond laser time jitter according to claim 1, it is characterised in that institute
The first dichroic mirror (5) stated is that fundamental frequency light is high thoroughly, frequency doubled light is high instead, the dichroic mirror that incident angle is 45 °, the second dichroic mirror (7)
For the high saturating, dichroic mirror that incident angle is 0 ° of the high anti-, frequency doubled light of fundamental frequency light.
3. a kind of measuring method of any repetition rate femtosecond laser time jitter, it is characterised in that comprise the following steps：
Step 1, the second light beam of regulation (2), make it pass through 1/2nd wave plates (3), the first light beam of regulation (1) and the second light beam
(2) the first light beam (1) and the second light beam (2), is made to reach that room and time is overlapped at Glan prism (4) place；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal (6), make two class frequency-doubled effects most strong, produce first via frequency multiplication
Light；
Step 3, regulation dichroic mirror (7), make remaining fundamental frequency light again pass by two class frequency doubling nonlinear crystal (6), and occur two classes
Frequency-doubled effect, produces the second road frequency doubled light；
The angle of step 4, regulation high reflective mirror (8) and balance photodetector (9), makes the first via and the second road frequency doubled light in balance
After response on photodetector is equal, subtract each other voltage signal by balancing photodetector (9) output, this subtracts each other voltage signal
Time difference information comprising the first light beam (1) and the second light beam (2)；
Step 5, the voltage signal that subtracts each other exported by data collecting card (10) to balance photodetector (9) are acquired and defeated
Deliver to signal processing module (11) to be handled, comprise the following steps that：
First, selection sampling configuration is sampled for N；
Then, according to the first light beam (1) or the sample rate N of the first light beam (2) repetition frequency setting capture card, i.e. sample rate N=
The sample frequency ÷ light beam repetition rates of capture card；
Finally, the signal in each sampling period is filtered processing, chooses maximum, be to survey error signal.
4. the measuring method according to claim 3 for any Repetition-radted laser time jitter, it is characterised in that institute
The bandwidth and the repetition rate of the first light beam (1) or the second light beam (2) for the photodetector (9) stated match.
5. the measuring method according to claim 3 for any Repetition-radted laser time jitter, it is characterised in that institute
The bandwidth of the frequency acquisition and photodetector (9) of the data collecting card (10) stated matches, i.e. the maximum of data collecting card is adopted
Sample frequency is more than more than the three times of balance photodetector bandwidth.
6. at the measuring method according to claim 3 for any Repetition-radted laser time jitter, described signal
Manage module (11) acquisition rate identical with the repetition rate of the first light beam (1) or the second light beam (2).
7. the measuring method according to claim 3 for any Repetition-radted laser time jitter, it is characterised in that logical
The intensity of the first light beam (1) and the second light beam (2) is overregulated, the described intensity for subtracting each other voltage signal is more than balance photoelectricity and visits
Survey the intensity of device (9) noise signal.
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| CN201710097721.2A CN106959166B (en) | 2017-02-22 | 2017-02-22 | The measuring device and method of any repetition rate femtosecond laser time jitter |
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| CN201710097721.2A CN106959166B (en) | 2017-02-22 | 2017-02-22 | The measuring device and method of any repetition rate femtosecond laser time jitter |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109489838A (en) * | 2018-10-25 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of high-precision pulse Jitter characteristic measurement method |
| CN110954224A (en) * | 2019-11-26 | 2020-04-03 | 北京无线电计量测试研究所 | Time jitter frequency spectrum measuring device and method |
| CN114459621A (en) * | 2022-02-10 | 2022-05-10 | 中国空间技术研究院 | Superconducting X-ray detector time jitter calibration system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005252145A (en) * | 2004-03-08 | 2005-09-15 | Nippon Telegr & Teleph Corp <Ntt> | Optical pulse pair generator and terahertz electromagnetic wave generator |
| CN102680099A (en) * | 2012-05-04 | 2012-09-19 | 北京航空航天大学 | Method and system for generating and detecting terahenz pulse |
| CN105911793A (en) * | 2016-06-28 | 2016-08-31 | 山东大学 | Cascaded optical frequency converter based on monolithic phosphate crystal and application of cascaded optical frequency converter |
-
2017
- 2017-02-22 CN CN201710097721.2A patent/CN106959166B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005252145A (en) * | 2004-03-08 | 2005-09-15 | Nippon Telegr & Teleph Corp <Ntt> | Optical pulse pair generator and terahertz electromagnetic wave generator |
| CN102680099A (en) * | 2012-05-04 | 2012-09-19 | 北京航空航天大学 | Method and system for generating and detecting terahenz pulse |
| CN105911793A (en) * | 2016-06-28 | 2016-08-31 | 山东大学 | Cascaded optical frequency converter based on monolithic phosphate crystal and application of cascaded optical frequency converter |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109489838A (en) * | 2018-10-25 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of high-precision pulse Jitter characteristic measurement method |
| CN109489838B (en) * | 2018-10-25 | 2020-01-31 | 北京无线电计量测试研究所 | high-precision pulse time domain jitter characteristic measuring method |
| CN110954224A (en) * | 2019-11-26 | 2020-04-03 | 北京无线电计量测试研究所 | Time jitter frequency spectrum measuring device and method |
| CN114459621A (en) * | 2022-02-10 | 2022-05-10 | 中国空间技术研究院 | Superconducting X-ray detector time jitter calibration system and method |
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| CN106959166B (en) | 2019-04-19 |
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