CN106878636B - 缺陷像素点检测方法、装置及图像处理芯片 - Google Patents
缺陷像素点检测方法、装置及图像处理芯片 Download PDFInfo
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- CN106878636B CN106878636B CN201710076331.7A CN201710076331A CN106878636B CN 106878636 B CN106878636 B CN 106878636B CN 201710076331 A CN201710076331 A CN 201710076331A CN 106878636 B CN106878636 B CN 106878636B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
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- Transforming Light Signals Into Electric Signals (AREA)
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CN106878636A CN106878636A (zh) | 2017-06-20 |
CN106878636B true CN106878636B (zh) | 2019-11-29 |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108956550A (zh) * | 2018-06-12 | 2018-12-07 | 华灿光电(浙江)有限公司 | 一种光致发光光谱处理的方法和装置 |
CN109697714B (zh) * | 2018-11-26 | 2021-08-17 | 联想(北京)有限公司 | 一种信息检测方法、设备及计算机存储介质 |
CN111768357B (zh) * | 2019-03-29 | 2024-03-01 | 银河水滴科技(北京)有限公司 | 一种图像检测的方法及装置 |
CN111553905B (zh) * | 2020-04-30 | 2022-11-01 | 展讯通信(上海)有限公司 | 图像检测方法、设备、装置及存储介质 |
CN112666178B (zh) * | 2020-12-14 | 2024-06-18 | 杭州当虹科技股份有限公司 | 一种户外led大屏坏点在线监控方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1295255A (zh) * | 1999-10-27 | 2001-05-16 | 三洋电机株式会社 | 影像信号处理装置及像素缺陷的检测方法 |
CN101715050A (zh) * | 2009-11-20 | 2010-05-26 | 北京中星微电子有限公司 | 一种图像传感器坏点检测的方法和系统 |
CN102055918A (zh) * | 2009-11-02 | 2011-05-11 | 索尼公司 | 像素缺陷检测和校正设备和方法、成像装置、和程序 |
CN103379293A (zh) * | 2012-04-11 | 2013-10-30 | 佳能株式会社 | 摄像设备和摄像设备的控制方法 |
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JP5664255B2 (ja) * | 2011-01-14 | 2015-02-04 | ソニー株式会社 | 画像処理装置、および画像処理方法、並びにプログラム |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1295255A (zh) * | 1999-10-27 | 2001-05-16 | 三洋电机株式会社 | 影像信号处理装置及像素缺陷的检测方法 |
CN102055918A (zh) * | 2009-11-02 | 2011-05-11 | 索尼公司 | 像素缺陷检测和校正设备和方法、成像装置、和程序 |
CN101715050A (zh) * | 2009-11-20 | 2010-05-26 | 北京中星微电子有限公司 | 一种图像传感器坏点检测的方法和系统 |
CN103379293A (zh) * | 2012-04-11 | 2013-10-30 | 佳能株式会社 | 摄像设备和摄像设备的控制方法 |
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Effective date of registration: 20191225 Address after: Unit D88, floor 2, convention and Exhibition Center, No.1, Software Park Road, Tangjiawan Town, hi tech Zone, Zhuhai City, Guangdong Province Patentee after: Jianrong Integrated Circuit Technology (Zhuhai) Co., Ltd. Address before: 518000 Guangdong city of Shenzhen province science and Technology Park of Nanshan District high new technology building B505 Fu'an Co-patentee before: Jianrong Integrated Circuit Technology (Zhuhai) Co., Ltd. Patentee before: Jian Rong semiconductor (Shenzhen) Co., Ltd. Co-patentee before: ZHUHAI HUANGRONG INTEGRATED CIRCUIT TECHNOLOGY CO., LTD. |
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Effective date of registration: 20220406 Address after: Rooms 1306-1309, 13 / F, 19 science Avenue West, Hong Kong Science Park, Shatin, New Territories, China Patentee after: BUILDWIN INTERNATIONAL (ZHUHAI) LTD. Address before: Unit D88, 2 / F, convention and Exhibition Center, No.1 Software Park Road, Tangjiawan Town, hi tech Zone, Zhuhai, Guangdong 519000 Patentee before: BUILDWIN INTERNATIONAL (ZHUHAI) Ltd. |
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