CN106841038B - Gas spectrum testing device based on ellipsoidal structure - Google Patents
Gas spectrum testing device based on ellipsoidal structure Download PDFInfo
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- CN106841038B CN106841038B CN201710176551.7A CN201710176551A CN106841038B CN 106841038 B CN106841038 B CN 106841038B CN 201710176551 A CN201710176551 A CN 201710176551A CN 106841038 B CN106841038 B CN 106841038B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
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Abstract
The invention discloses a gas spectrum testing device based on an ellipsoid structure, which comprises an incident light processing unit, an emergent light processing unit and an ellipsoid measuring unit; according to the invention, by means of the propagation characteristics of light in the ellipsoidal structure, the emergent light position and the photoreceptor position are respectively fixed on the left focus and the right focus of the ellipsoidal measuring unit, the concave lens is arranged on the right side of the left focus, the charge coupling element is arranged on the right focus, the light emitted by the concave lens diverges in multiple angles through the mirror surface of the ellipsoidal measuring unit, and the light passes through the gas sample and is reflected into the charge coupling element, so that the optical path of the gas sample passing through the ellipsoidal measuring unit is ensured to be fixed.
Description
Technical Field
The invention relates to a spectrum analyzer, in particular to a gas spectrum testing device based on an ellipsoidal structure.
Background
Spectroscopic analysis techniques have been widely used to measure chemical composition and relative content of substances. The technology has the advantages of simplicity in operation, sensitivity in response and accuracy in data. However, when the fixed light Cheng Guangpu is needed for measurement, the device in the prior art only fixes the positions of the emergent light outlet and the photosensitive device, so that the emergent light directly enters the photosensitive device through the gas sample to fix the optical path of the whole optical path. The problem that exists is that this structure makes light can only penetrate into the photosensitive device with fixed angle, greatly increased because of inhomogeneous, the change of spatial position, the change of incident angle of sample and the influence of reflection, scattering, the polarization of light to measurement data, lead to measurement result reproducibility poor, monitor the defect that the precision is low.
Disclosure of Invention
The invention aims to provide a gas spectrum testing device based on an ellipsoidal structure, which is characterized in that by means of the propagation characteristics of light in an ellipsoidal structure, the emergent light position and the photoreceptor position are respectively fixed on the left focus and the right focus of the ellipsoidal measuring unit, a concave lens is arranged on the left focus, a charge coupling element is arranged on the right focus, the light emitted by the concave lens diverges in multiple angles through the mirror surface of the ellipsoidal measuring unit, passes through a gas sample and is reflected into the charge coupling element, the fixation of the optical path of the gas sample passing through the ellipsoidal measuring unit is ensured, the influence on the measuring result caused by the shape and angle change of incident light and the uneven distribution of the gas sample is reduced, the repeatability of measurement is improved, the aplanatic and multi-angle spectrum measurement of the gas sample is realized, and the device has the advantages of simple structure, low cost and accurate monitoring result.
The specific technical scheme for realizing the aim of the invention is as follows:
the gas spectrum testing device based on the ellipsoidal structure is characterized by comprising an incident light processing unit, an emergent light processing unit and an ellipsoidal measuring unit, wherein the incident light processing unit consists of a monochromator, a light source, an incident light channel and a concave lens, and the monochromator is provided with a light inlet and a light outlet; the emergent light processing unit consists of a fixed transverse axis, a fixed longitudinal axis, a charge coupling element and an upper mechanism; the ellipsoidal measuring unit is an ellipsoidal shell made of metal, the inner wall of the ellipsoidal shell is coated with a white specular reflection material, an equatorial long radius and an equatorial short radius are arranged in the ellipsoidal shell, a left focus and a right focus are respectively arranged on the equatorial long radius, an air inlet, an air outlet and an air pressure monitoring port are formed in the ellipsoidal shell, and an air pressure sensor is arranged on the air pressure monitoring port.
The incident light channel of the incident light processing unit is arranged on an extension line of the equator long radius, the left focus penetrates to the outer side of the ellipsoidal measuring unit, the concave lens is arranged at the tail end of the incident light channel, the left focus of the concave lens coincides with the left focus of the ellipsoidal measuring unit, the monochromator and the light source are both arranged at the outer side of the ellipsoidal measuring unit, the light outlet of the monochromator is arranged at the starting end of the incident light channel, and the light source is in optical connection with the light inlet of the monochromator.
The fixed vertical axis of the emergent light processing unit is arranged on the equatorial short radius of the ellipsoidal measuring unit, the fixed transverse axis is arranged on the equatorial long radius of the ellipsoidal measuring unit and is positioned between the right focus and the fixed transverse axis, the charge coupling element is arranged at one end of the fixed transverse axis and coincides with the right focus of the ellipsoidal measuring unit, the upper computer is arranged at the outer side of the ellipsoidal measuring unit, the cable passes through the fixed vertical axis and the fixed transverse axis to connect the charge coupling element with the upper computer, and the cable also connects the upper computer with the monochromator.
The incident light channel is a tubular piece with the outer surface coated with white specular reflection materials.
The fixed vertical axis and the fixed horizontal axis are tubular pieces with the outer surfaces coated with white specular reflection materials.
The charge-coupled device is a back-illuminated thin charge-coupled photosensor with a wavelength range of selected bands of 2 microns to 300 microns.
The monochromator is provided with a light inlet and a light outlet, and the wavelength range of the selected wave band is 5 micrometers to 200 micrometers.
According to the invention, by means of the propagation characteristics of light in the ellipsoidal structure, the emergent light position and the photoreceptor position are respectively fixed on the left focus and the right focus of the ellipsoidal measuring unit, the concave lens is arranged on the left focus, the charge coupling element is arranged on the right focus, the light emitted by the concave lens diverges in multiple angles through the mirror surface of the ellipsoidal measuring unit, passes through the gas sample and is reflected into the charge coupling element, the fixation of the optical path of the gas sample passing through the ellipsoidal measuring unit is ensured, the influence on the measuring result caused by the shape and angle change of the incident light and the uneven distribution of the gas sample is reduced, the repeatability of measurement is improved, the aplanatic and multi-angle spectral measurement of the gas sample is realized, and the ellipsoidal measuring device has the advantages of simple structure, low cost and accurate monitoring result.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention;
fig. 2 is a schematic structural diagram of an ellipsoidal measurement unit according to the present invention.
Detailed Description
Referring to fig. 1 and 2, the present invention includes an incident light processing unit 1, an emergent light processing unit 2 and an ellipsoidal measuring unit 3, wherein the incident light processing unit 1 is composed of a monochromator 12, a light source 13, an incident light channel 10 and a concave lens 11, and the monochromator 12 is provided with a light inlet and a light outlet; the emergent light processing unit 2 is composed of a fixed transverse axis 21, a fixed vertical axis 22, a charge coupling element 25 and an upper computer 24; the ellipsoidal measurement unit 3 is an ellipsoidal shell made of metal, the inner wall of the ellipsoidal shell is coated with a white specular reflection material, an equatorial long radius and an equatorial short radius are arranged in the ellipsoidal shell, a left focus and a right focus are respectively arranged on the equatorial long radius, an air inlet 31, an air outlet 32 and an air pressure monitoring port are arranged on the ellipsoidal shell, and an air pressure sensor 34 is arranged on the air pressure monitoring port.
The incident light channel 10 of the incident light processing unit 1 is arranged on an extension line with the long radius of the equator, and penetrates to the outer side of the ellipsoidal measuring unit 3 from the left focus, the concave lens 11 is arranged at the tail end of the incident light channel 10 and coincides with the left focus of the ellipsoidal measuring unit 3, the monochromator 12 and the light source 13 are both arranged at the outer side of the ellipsoidal measuring unit 3, the light outlet of the monochromator 12 is arranged at the initial end of the incident light channel 10, and the light source 13 is in optical connection with the light inlet of the monochromator 12.
The fixed vertical axis 22 of the emergent light processing unit 2 is arranged on the equatorial short radius of the ellipsoidal measuring unit 3, the fixed transverse axis 21 is arranged on the equatorial long radius of the ellipsoidal measuring unit 3 and is positioned between the right focus and the fixed transverse axis 21, the charge coupling element 25 is arranged at one end of the fixed transverse axis 21 and coincides with the right focus of the ellipsoidal measuring unit 3, the upper computer 24 is arranged at the outer side of the ellipsoidal measuring unit 3, the cable passes through the fixed vertical axis 22 and the fixed transverse axis 21 to connect the charge coupling element 25 with the upper computer 24, and the cable also connects the upper computer 24 with the monochromator 12.
The incident light channel 10 is a tubular member coated with a white specular reflective material on its outer surface.
The fixed longitudinal axis 22 and the fixed transverse axis 21 are tubular members with the outer surfaces coated with white specular reflection materials.
The CCD 25 is a back-illuminated thin CCD sensor with a selected wavelength band in the range of 2 microns to 300 microns.
The monochromator 12 is provided with a light inlet and a light outlet, and the wavelength range of the selected wave band is 5 micrometers to 200 micrometers.
Examples
This embodiment takes the charge-coupled device 25 with a wavelength in the selected band of 2 microns to 300 microns and the monochromator 12 with a wavelength in the selected band of 5 microns to 200 microns as examples.
Early preparation work
Referring to fig. 1 and 2, in order to facilitate automatic completion of the test process, the invention is used in cooperation with a program controller and a computer, electromagnetic valves are arranged on an air inlet 31 and an air outlet 32, and an air pump is connected to the air outlet 32; the computer is connected with a program controller, and the program controller is respectively connected with a switch of the light source 13 on the incident light processing unit 1, the upper computer 24 on the emergent light processing unit 2, the electromagnetic valve of the air inlet 31 and the air outlet 32 on the ellipsoid measuring unit 3, the air pump and the air pressure sensor 34.
Dispensing of gas samples
Referring to fig. 1 and 2, when analyzing a gas sample, a sample storage bottle is connected to an air inlet 31 of an ellipsoidal measurement unit 3, a program controller controls an air pump to start, a set air pressure value is obtained in the ellipsoidal measurement unit 3, an air pressure sensor 34 transmits the detected air pressure value to the program controller, when the air pressure value reaches the set value, the program controller controls the air pump to close, an electromagnetic valve of the air inlet 31 and an air outlet 32 to close, after the air pressure in the ellipsoidal measurement unit 3 is stable, the program controller starts an upper computer 24 to input dispersed wavelength signals to a monochromator 12, and collects corresponding wavelength light intensity signals through a charge coupling element 25, and the upper computer 24 simultaneously records the wavelength signals output by the monochromator 12 and the light intensity signals of corresponding wavelength lights of the charge coupling element 25, and successfully depicts a spectrogram of the corresponding gas sample through computer processing.
Testing process of gas spectrum
Referring to fig. 1 and 2, when an analysis gas sample is charged into an ellipsoidal measurement unit 3 and reaches a set air pressure value, a program controller turns on a switch of a light source 13, polychromatic light of the light source 13 enters a monochromator 12 and is dispersed by the monochromator 12 to obtain monochromatic light required by experiments, the monochromatic light passes through the ellipsoidal measurement unit 3 through an incident light channel 10 to reach a concave lens 11, the left focus of the concave lens 11 coincides with the left focus of the ellipsoidal measurement unit 3, the parallel incident monochromatic light is scattered at the concave lens 11, reverse extension lines of the scattered light are all passed through the left focus of the ellipsoidal measurement unit 3, the monochromatic light is scattered by the concave lens 11 and then is emitted to the inner surface of the ellipsoidal measurement unit 3, and then reflected to a right focus by the inner surface of the ellipsoidal measurement unit 3, as the charge coupling element 25 coincides with the right focus of the ellipsoidal measurement unit 3, the monochromatic light is collected at the right focus by the charge coupling element 25 and is converted into an electric signal, and the upper computer 24 simultaneously records a light intensity signal of the corresponding wavelength light outputted by the monochromator 12, and a successful spectrogram of the corresponding gas is depicted by processing.
Referring to fig. 1 and 2, the incident light channel 10 and the charge coupling element 25 of the present invention are both disposed on the equatorial long radius of the ellipsoidal measurement unit 3 and the extension line thereof, the fixed longitudinal axis 22 is disposed on the equatorial short radius of the ellipsoidal measurement unit 3, and the fixed longitudinal axis 22 is disposed between the incident light channel 10 and the charge coupling element 25, so as to block the monochromatic light parallel to the monochromator 12, prevent the incident monochromatic light from directly entering the charge coupling element 25 without being reflected by the specular surface of the ellipsoidal measurement unit 3, and avoid the reduction of the expected optical path.
Referring to fig. 1 and 2, the invention adopts the electrical connection among the monochromator 12, the upper computer 24 and the charge coupling element 25, so that the upper computer 24 can control the wavelength of the optical signal dispersed by the monochromator 12, meanwhile, the charge coupling element 25 transmits the light intensity signal of the light with the corresponding wavelength, the upper computer 24 records the wavelength of the optical signal dispersed by the monochromator 12 and the light intensity signal of the light with the corresponding wavelength transmitted by the charge coupling element 25, and the spectrogram of the corresponding gas sample is successfully drawn through the computer processing, thereby ensuring the fixation of the optical path of the gas sample in the ellipsoidal measuring unit 3.
Referring to fig. 1 and 2, the invention adopts a concave lens 11 with a circular mirror surface at the light port of an incident light channel 10, namely, at the right side of the left focus of an ellipsoidal measurement unit 3, so that the left focus of the concave lens 11 coincides with the left focus of the ellipsoidal measurement unit 3, a charge coupling element 25 is arranged at the right focus of the ellipsoidal measurement unit 3, the concave lens 11 scatters parallel light injected by a monochromator 12, the parallel light scatters in multiple directions in the ellipsoidal measurement unit 3, and the scattered light is concentrated to be injected into the charge coupling element after being specularly reflected by the inner wall of the ellipsoidal measurement unit 3, thereby successfully solving the problem that the emitted light of the incident light channel 10 can only be injected from a single channel.
The invention also adopts the back-illuminated thin charge coupled photosensor as the charge coupled element 25, so that the measurement result is more accurate, and the photosensitive wave band range is wider.
Claims (5)
1. The gas spectrum testing device based on the ellipsoidal structure is characterized by comprising an incident light processing unit (1), an emergent light processing unit (2) and an ellipsoidal measuring unit (3), wherein the incident light processing unit (1) consists of a monochromator (12), a light source (13), an incident light channel (10) and a concave lens (11), and a light inlet and a light outlet are arranged on the monochromator (12);
the emergent light processing unit (2) is composed of a fixed transverse axis (21), a fixed vertical axis (22), a charge coupling element (25) and an upper computer (24);
the ellipsoidal measuring unit (3) is an ellipsoidal shell made of metal, the inner wall of the ellipsoidal shell is coated with white specular reflection materials, an equatorial long radius and an equatorial short radius are arranged in the ellipsoidal shell, a left focus and a right focus are respectively arranged on the equatorial long radius, an air inlet (31), an air outlet (32) and an air pressure monitoring port are formed in the ellipsoidal shell, and an air pressure sensor (34) is arranged on the air pressure monitoring port;
the incident light channel (10) of the incident light processing unit (1) is arranged on an extension line of the equator long radius of the ellipsoidal measuring unit (3), the left focus penetrates to the outer side of the ellipsoidal measuring unit (3), the concave lens (11) is arranged at the tail end of the incident light channel (10), the left focus of the concave lens (11) coincides with the left focus of the ellipsoidal measuring unit (3), the monochromator (12) and the light source (13) are both arranged at the outer side of the ellipsoidal measuring unit (3), the light outlet of the monochromator (12) is arranged at the starting end of the incident light channel (10), and the light source (13) is in optical connection with the light inlet of the monochromator (12);
the fixed vertical axis (22) of the emergent light processing unit (2) is arranged on the equatorial short radius of the ellipsoidal measuring unit (3), the fixed transverse axis (21) is arranged on the equatorial long radius of the ellipsoidal measuring unit (3) and is positioned between the right focus and the fixed transverse axis (21), the charge coupling element (25) is arranged at one end of the fixed transverse axis (21) and coincides with the right focus of the ellipsoidal measuring unit (3), the upper computer (24) is arranged at the outer side of the ellipsoidal measuring unit (3), and the cable passes through the fixed vertical axis (22) and the fixed transverse axis (21) to connect the charge coupling element (25) with the upper computer (24) and connects the upper computer (24) with the monochromator (12).
2. A gas spectroscopic testing device based on an ellipsoidal structure according to claim 1, wherein the incident light channel (10) is a tubular member with an outer surface coated with a white specular reflective material.
3. A gas spectrum testing device based on an ellipsoidal structure according to claim 1, wherein the fixed longitudinal axis (22) and the fixed transverse axis (21) are tubular members coated with a white specular reflective material on their outer surfaces.
4. A gas spectrum testing device based on an ellipsoidal structure according to claim 1, wherein the charge-coupled device (25) is a back-illuminated thin-type charge-coupled photosensor with a wavelength range of 2-300 μm.
5. The gas spectrum testing device based on an ellipsoidal structure according to claim 1, wherein the monochromator (12) is provided with a light inlet and a light outlet, and the wavelength range of the selected wavelength band is 5-200 microns.
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| CN201710176551.7A CN106841038B (en) | 2017-03-23 | 2017-03-23 | Gas spectrum testing device based on ellipsoidal structure |
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| CN201710176551.7A CN106841038B (en) | 2017-03-23 | 2017-03-23 | Gas spectrum testing device based on ellipsoidal structure |
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| CN106841038B true CN106841038B (en) | 2023-05-12 |
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| CN108226071B (en) * | 2018-01-23 | 2023-07-25 | 华东师范大学 | Gas spectrum testing device based on parabolic structure |
| US12019017B2 (en) | 2020-02-07 | 2024-06-25 | Lumileds Llc | Gas sensing with porous scattering material |
| CN117309798A (en) * | 2023-09-27 | 2023-12-29 | 深圳宇问测量技术有限公司 | Gas sensor light path design method, structure of reflecting surface thereof and manufacturing process |
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| CN1228839A (en) * | 1996-08-28 | 1999-09-15 | 汉斯·戈兰·伊瓦尔德·马丁 | Gas detector |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6862090B2 (en) * | 2001-08-09 | 2005-03-01 | Therma-Wave, Inc. | Coaxial illumination system |
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- 2017-03-23 CN CN201710176551.7A patent/CN106841038B/en active Active
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| CN1228839A (en) * | 1996-08-28 | 1999-09-15 | 汉斯·戈兰·伊瓦尔德·马丁 | Gas detector |
| CN2762115Y (en) * | 2005-01-14 | 2006-03-01 | 合肥亚太科技发展有限公司 | CMOS environment monitoring spectrograph |
| CN202794024U (en) * | 2012-08-20 | 2013-03-13 | 北京普析通用仪器有限责任公司 | Sample cell used for measuring molecular spectral absorption |
| CN104359850A (en) * | 2014-11-19 | 2015-02-18 | 太原理工大学 | Infrared gas sensor based on three-ellipsoid absorption chamber structure |
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