CN106571114A - Test circuit and working method thereof - Google Patents
Test circuit and working method thereof Download PDFInfo
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- CN106571114A CN106571114A CN201610972671.3A CN201610972671A CN106571114A CN 106571114 A CN106571114 A CN 106571114A CN 201610972671 A CN201610972671 A CN 201610972671A CN 106571114 A CN106571114 A CN 106571114A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
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Abstract
The invention discloses a test circuit and a working method thereof. The test circuit comprises a first test unit, a second test unit, and a judgment unit. The first test unit outputs first to-be-tested signals of each column of pixel units. The second test unit outputs second to-be-tested signals of each row of pixel units. The judgment unit judges whether each single pixel unit is short-circuited according to the first to-be-tested signals and the second to-be-tested signals. Under the condition of not increasing the procedure of the production process, the working performance of a display panel can be evaluated in the process of production, and the position of short circuit can be located accurately. Thus, the performance and yield of products are improved.
Description
Technical field
The present invention relates to display technology field, more particularly to a kind of test circuit and its method of work.
Background technology
Array base palte row actuation techniques (Gate Driver on Array, GOA) are directly drive circuit to be produced on into battle array
On row substrate, so as to replace by a kind of Technology of the driving chip of external silicon wafer to manufacture.The technology can reduce technological process,
Process costs are reduced, the integrated level of display panels is improved.
The production process of display floater is complicated, and abnormal being likely to so that product appearance is bad occurs in any technique.In addition,
Due to the impact of granule among production process, also easily there is short circuit phenomenon in the inside of display floater.Accordingly, it would be desirable to one kind can
Timely and effectively judge the display floater whether test circuit of effective operation.Existing test circuit can only judge display floater
It is whether working properly on the whole, it is impossible to determine the particular location of the display floater operation irregularity.Therefore, existing test electricity
The particular location that road investigation short circuit occurs is relatively difficult.
The content of the invention
To solve the above problems, the present invention provides a kind of test circuit and its method of work, at least partly solves existing
The relatively difficult problem of the short-circuit particular location for occurring of test circuit investigation.
For this purpose, the present invention provides a kind of test circuit, including the first test cell, the second test cell and judging unit,
The judging unit is connected respectively with first test cell, second test cell, the first test cell difference
It is connected with each column pixel cell, second test cell is connected respectively with every row pixel cell；
First test cell is used to export the first measured signal of each column pixel cell；
Second test cell is used to export the second measured signal of often row pixel cell；
The judging unit is used to judge single pixel list according to first measured signal and second measured signal
Whether unit is short-circuit.
Optionally, first test cell include multiple first test modules, first test module with it is corresponding
Single column of pixels unit connect, second test cell include multiple second test modules, second test module with it is corresponding
Single row of pixels unit connection；
First test module is used to export the first measured signal of corresponding single column of pixels unit；
Second test module is used to export the second measured signal of corresponding single row of pixels unit.
Optionally, first test module includes the first signal input line, the first output line and first crystal
Pipe, first signal input line is connected with the grid of the first transistor, first output line and described first
The first pole connection of transistor, the second pole of the first transistor is connected with the single column of pixels unit；
First signal input line is used for the first test signal of input so that the first transistor conducting；
First output line is used to export the of the single column of pixels unit when the first transistor is turned on
One measured signal.
Optionally, first test module include the first signal input line, first voltage end, the first output line with
And the first transistor, first signal input line is connected with the grid of the first transistor, the first voltage end and institute
State the first pole connection of the first transistor, pixel cell among the second pole of the first transistor and the single column of pixels unit
Driving transistor grid connection, first output line is connected with the drain electrode of the driving transistor；
First signal input line is used for the first test signal of input so that the first transistor conducting；
The first voltage end is used for the input voltage signal when the first transistor is turned on；
First output line is to be measured for first according to the voltage signal output single column of pixels unit
Signal.
Optionally, second test module includes secondary signal input line, secondary signal output lead and the second crystal
Pipe, the secondary signal input line is connected with the grid of the transistor seconds, the secondary signal output lead and described second
The first pole connection of transistor, the second pole of the transistor seconds is connected with the single row of pixels unit；
The secondary signal input line is used for the second test signal of input so that transistor seconds conducting；
The secondary signal output lead is used to export the of the single row of pixels unit when the transistor seconds is turned on
Two measured signals.
Optionally, the judging unit includes the first comparison module, the second comparison module and judge module, first ratio
It is connected with first test cell compared with module, second comparison module is connected with second test cell, the judgement
Module is connected respectively with first comparison module, second comparison module；
First comparison module is used to be compared first measured signal with default first standard signal, with
Determine whether corresponding single column of pixels unit is short-circuit；
Second comparison module is used to be compared second measured signal with default second standard signal, with
Determine whether corresponding single row of pixels unit is short-circuit；
The judge module is used for comparative result and the ratio of second comparison module according to first comparison module
Relatively result judges whether single pixel unit is short-circuit.
Optionally, the judge module includes the first acquisition submodule, the second acquisition submodule and judging submodule, described
Judging submodule is connected respectively with first acquisition submodule, second acquisition submodule；
First acquisition submodule is used to obtain the single column of pixels unit of short circuit；
Second acquisition submodule is used to obtain the single row of pixels unit of short circuit；
The judging submodule is used for the single column of pixels unit of short circuit is single with what the single row of pixels unit of short circuit had
Pixel cell is judged as short circuit.
A kind of method of work of test circuit, the test circuit includes the first test cell, the second test cell and sentences
Disconnected unit, the judging unit is connected respectively with first test cell, second test cell, and first test is single
Unit is connected respectively with each column pixel cell, and second test cell is connected respectively with every row pixel cell；
The method of work of the test circuit includes：
First test cell exports the first measured signal of each column pixel cell；
Second test cell exports the second measured signal of often row pixel cell；
The judging unit judges that single pixel unit is according to first measured signal and second measured signal
No short circuit.
Optionally, the judging unit includes the first comparison module, the second comparison module and judge module, first ratio
It is connected with first test cell compared with module, second comparison module is connected with second test cell, the judgement
Module is connected respectively with first comparison module, second comparison module；
The judging unit judges that single pixel unit is according to first measured signal and second measured signal
The step of no short circuit includes：
First comparison module is compared first measured signal with default first standard signal, to determine
Whether corresponding single column of pixels unit is short-circuit；
Second comparison module is compared second measured signal with default second standard signal, to determine
Whether corresponding single row of pixels unit is short-circuit；
The judge module is according to the comparative result of first comparison module and the comparison knot of second comparison module
Fruit judges whether single pixel unit is short-circuit.
Optionally, the judge module includes the first acquisition submodule, the second acquisition submodule and judging submodule, described
Judging submodule is connected respectively with first acquisition submodule, second acquisition submodule；
The judge module is according to the comparative result of first comparison module and the comparison knot of second comparison module
Fruit judges whether the step of short circuit includes single pixel unit：
First acquisition submodule obtains the single column of pixels unit of short circuit；
Second acquisition submodule obtains the single row of pixels unit of short circuit；
The single pixel that the judging submodule has the single column of pixels unit of short circuit with the single row of pixels unit of short circuit
Unit judges are short circuit.
The present invention has following beneficial effects：
Among test circuit that the present invention is provided and its method of work, the test circuit include the first test cell, the
Two test cells and judging unit, the first measured signal of the first test cell output each column pixel cell, described second
Second measured signal of the test cell every row pixel cell of output, the judging unit is according to first measured signal and described
Second measured signal judges whether single pixel unit is short-circuit, such that it is able in the case where the technological process of production is not increased,
The service behaviour of display floater is evaluated in production process, the position of short circuit generation can be accurately positioned, improve product
Performance and yield.
Description of the drawings
Fig. 1 is a kind of structural representation of test circuit that the embodiment of the present invention one is provided；
Fig. 2 is the sequential chart of the first test signal of test circuit shown in Fig. 1；
Fig. 3 is the sequential chart of the second test signal of test circuit shown in Fig. 1；
Fig. 4 is a kind of structural representation of test circuit that the embodiment of the present invention two is provided；
Fig. 5 is a kind of flow chart of the method for work of test circuit that the embodiment of the present invention three is provided.
Specific embodiment
To make those skilled in the art more fully understand technical scheme, the present invention is carried below in conjunction with the accompanying drawings
For test circuit and its method of work be described in detail.
Embodiment one
Fig. 1 is a kind of structural representation of test circuit that the embodiment of the present invention one is provided.As shown in figure 1, the test
Circuit include the first test cell 101, the second test cell 102 and judging unit 103, the judging unit 103 respectively with institute
State the first test cell 101, second test cell 102 to connect, first test cell 101 respectively with each column pixel list
Unit's connection, second test cell 102 is connected respectively with every row pixel cell.Display floater 100 includes pixel unit array,
The pixel unit array includes multirow pixel cell and multiple row pixel cell, and single column of pixels unit and single row of pixels unit have
One pixel cell 104.The technical scheme first-selection that the present embodiment is provided judges whether are single column of pixels unit and single row of pixels unit
Short circuit, further according to above-mentioned judged result the total pixel cell of the single column of pixels unit and the single row of pixels unit is judged
Whether 104 is short-circuit such that it is able to is accurately positioned the particular location of short circuit generation.
In the present embodiment, first test cell 101 is used to export the first measured signal of each column pixel cell, described
Second test cell 102 is used to export the second measured signal of often row pixel cell, and the judging unit 103 is used for according to described
First measured signal and second measured signal judge whether single pixel unit 104 is short-circuit, such that it is able to not increase life
In the case of production. art flow process, the service behaviour of display floater is evaluated in process of production, short circuit can be accurately positioned
The position of generation, improves the performance and yield of product.
Referring to Fig. 1, first test cell 101 includes multiple first test modules 201, first test module
201 include multiple second test modules 202 with the connection of corresponding single column of pixels unit, second test cell 102, described the
Two test modules 202 connect with corresponding single row of pixels unit.First test module 201 is used to export corresponding single-row picture
First measured signal of plain unit, second test module 202 is used to export the second to be measured of corresponding single row of pixels unit
Signal.The first test module 201 that the present embodiment is provided is corresponded with single column of pixels unit so that the first letter to be measured of output
Number also can correspond with single column of pixels unit.When the conclusion of short circuit is drawn by the first measured signal, can be according to one
One corresponding relation obtains the particular location of the single column of pixels unit being short-circuited.In the same manner, the second test mould that the present embodiment is provided
Block 202 and single row of pixels unit are corresponded so that the second measured signal of output also can be with a pair of single row of pixels unit 1
Should.When the conclusion of short circuit is drawn by the second measured signal, the single file being short-circuited can be obtained according to one-to-one relationship
The particular location of pixel cell, so as to improve the accuracy of short circuit judgement.
In the present embodiment, first test module 201 includes that the first signal input line TestInput1, the first signal are defeated
Outlet Test Output1 and the first transistor T1, the first signal input line Test Input1 and the first crystal
The grid connection of pipe T1, the first output line Test Output1 are connected with first pole of the first transistor T1,
Second pole of the first transistor T1 is connected with the single column of pixels unit.Fig. 2 is tested for first of test circuit shown in Fig. 1
The sequential chart of signal.As shown in Fig. 2 the first signal input line Test Input1 are input into the first test signal so that described
The first transistor T1 is turned on, when the first transistor T1 is turned on, the first output line Test Output1 outputs
First measured signal of the single column of pixels unit.First measured signal is used for whether judging corresponding single column of pixels unit
Short circuit, so as to improve the accuracy of short circuit judgement.
In the present embodiment, second test module 202 includes secondary signal input line Test Input2, secondary signal
Output lead Test Output2 and transistor seconds T2, the secondary signal input line Test Input2 is brilliant with described second
The grid connection of body pipe T2, first pole of the secondary signal output lead Test Output2 and transistor seconds T2 connects
Connect, second pole of the transistor seconds T2 is connected with the single row of pixels unit.Fig. 3 is second of test circuit shown in Fig. 1
The sequential chart of test signal.As shown in figure 3, the secondary signal input line Test Input2 be input into the second test signal so that
The transistor seconds T2 conductings, when the transistor seconds T2 is turned on, the secondary signal output lead Test Output2
Export the second measured signal of the single row of pixels unit.Second measured signal is used to judge corresponding single row of pixels unit
It is whether short-circuit, so as to improve the accuracy of short circuit judgement.
Referring to Fig. 1, the judging unit 103 includes the first comparison module 203, the second comparison module 204 and judge module
205, first comparison module 203 is connected with first test cell 101, second comparison module 204 and described
Two test cells 102 connect, the judge module 205 respectively with first comparison module 203, second comparison module
204 connections.First comparison module 203 is compared first measured signal with default first standard signal, with
Determine whether corresponding single column of pixels unit is short-circuit.Second comparison module 204 by second measured signal with it is default
Whether the second standard signal is compared, short-circuit to determine corresponding single row of pixels unit.The judge module 205 is according to described
The comparative result of the comparative result of the first comparison module and second comparison module judges whether single pixel unit is short-circuit.It is excellent
Choosing, the judge module 205 includes the first acquisition submodule, the second acquisition submodule and judging submodule, judgement
Module is connected respectively with first acquisition submodule, second acquisition submodule.First acquisition submodule is used to obtain
The single column of pixels unit of short circuit is taken, second acquisition submodule is used to obtain the single row of pixels unit of short circuit, judgement
It is short circuit that module is used for the single column of pixels unit of the short circuit single pixel unit judges total with the single row of pixels unit of short circuit,
Such that it is able in the case where the technological process of production is not increased, comment the service behaviour of display floater in process of production
Valency, can be accurately positioned the position of short circuit generation, improve the performance and yield of product.
The test circuit that the present embodiment is provided includes the first test cell, the second test cell and judging unit, described the
One test cell exports the first measured signal of each column pixel cell, second test cell output often row pixel cell the
Two measured signals, the judging unit judges single pixel unit according to first measured signal and second measured signal
It is whether short-circuit, such that it is able in the case where the technological process of production is not increased, in process of production to the workability of display floater
Can be evaluated, the position of short circuit generation can be accurately positioned, be improved the performance and yield of product.
Embodiment two
Fig. 4 is a kind of structural representation of test circuit that the embodiment of the present invention two is provided.As shown in figure 4, the test
Circuit include the first test cell 101, the second test cell 102 and judging unit 103, the judging unit 103 respectively with institute
State the first test cell 101, second test cell 102 to connect, first test cell 101 respectively with each column pixel list
Unit's connection, second test cell 102 is connected respectively with every row pixel cell.Display floater 100 includes pixel unit array,
The pixel unit array includes multirow pixel cell and multiple row pixel cell, and single column of pixels unit and single row of pixels unit have
One pixel cell 104.The technical scheme first-selection that the present embodiment is provided judges whether are single column of pixels unit and single row of pixels unit
Short circuit, further according to above-mentioned judged result the total pixel cell of the single column of pixels unit and the single row of pixels unit is judged
Whether 104 is short-circuit such that it is able to is accurately positioned the particular location of short circuit generation.
In the present embodiment, first test cell 101 is used to export the first measured signal of each column pixel cell, described
Second test cell 102 is used to export the second measured signal of often row pixel cell, and the judging unit 103 is used for according to described
First measured signal and second measured signal judge whether single pixel unit 104 is short-circuit, such that it is able to not increase life
In the case of production. art flow process, the service behaviour of display floater is evaluated in process of production, short circuit can be accurately positioned
The position of generation, improves the performance and yield of product.
Referring to Fig. 4, first test cell 101 includes multiple first test modules 201, first test module
201 include multiple second test modules 202 with the connection of corresponding single column of pixels unit, second test cell 102, described the
Two test modules 202 connect with corresponding single row of pixels unit.First test module 201 is used to export corresponding single-row picture
First measured signal of plain unit, second test module 202 is used to export the second to be measured of corresponding single row of pixels unit
Signal.The first test module 201 that the present embodiment is provided is corresponded with single column of pixels unit so that the first letter to be measured of output
Number also can correspond with single column of pixels unit.When the conclusion of short circuit is drawn by the first measured signal, can be according to one
One corresponding relation obtains the particular location of the single column of pixels unit being short-circuited.In the same manner, the second test mould that the present embodiment is provided
Block 202 and single row of pixels unit are corresponded so that the second measured signal of output also can be with a pair of single row of pixels unit 1
Should.When the conclusion of short circuit is drawn by the second measured signal, the single file being short-circuited can be obtained according to one-to-one relationship
The particular location of pixel cell, so as to improve the accuracy of short circuit judgement.
In the present embodiment, first test module 201 includes the first signal input line Test Input1, first voltage
End, the first output line Test Output1 and the first transistor T1, the first signal input line Test Input1 with
The grid connection of the first transistor T1, the first voltage end is connected with first pole of the first transistor T1, described
Second pole of the first transistor T1 is connected with the grid of the driving transistor of pixel cell among the single column of pixels unit, described
First output line Test Output1 are connected with the drain electrode of the driving transistor.The present embodiment will by ELVDD leads
Pixel cell connection among single column of pixels unit, therefore ELVDD leads are the metal routings of longitudinal direction among display floater 100.
In the present embodiment, because the driving energy Dipeptiven of driving transistor is strong, driving current is too big, it is impossible to directly drawn by normal transistor
Go out measured signal, therefore the present embodiment is connected second pole of the first transistor T1 with the grid of the driving transistor,
The first output line Test Output1 are connected with the drain electrode of the driving transistor, so as to draw measured signal.
Referring to Fig. 2, the first signal input line Test Input1 are input into the first test signal so that the first crystal
Pipe T1 is turned on, when the first transistor T1 is turned on, first voltage end input voltage signal.When driving transistor is
During NMOS, the voltage signal is negative voltage, and when driving transistor is PMOS, the voltage signal is positive voltage.In voltage
In the presence of signal, the first output line Test Output1 export the first letter to be measured of the single column of pixels unit
Number.Now, first measured signal is IELVDD.The first measured signal IELVDDFor judging corresponding single column of pixels list
Whether unit is short-circuit, so as to improve the accuracy of short circuit judgement.
In the present embodiment, second test module 202 includes secondary signal input line Test Input2, secondary signal
Output lead Test Output2 and transistor seconds T2, the secondary signal input line Test Input2 is brilliant with described second
The grid connection of body pipe T2, first pole of the secondary signal output lead Test Output2 and transistor seconds T2 connects
Connect, second pole of the transistor seconds T2 is connected with the single row of pixels unit.The present embodiment passes through VREFP leads by single file
Pixel cell connection among pixel cell, therefore VREFP leads are metal routings horizontal among display floater 100.Referring to
Fig. 3, the secondary signal input line Test Input2 are input into the second test signal so that transistor seconds T2 conductings, when
When the transistor seconds T2 is turned on, the secondary signal output lead Test Output2 export the of the single row of pixels unit
Two measured signals.Now, second measured signal is IVREFP.The second measured signal IVREFPFor judging corresponding list
Whether row pixel cell is short-circuit, so as to improve the accuracy of short circuit judgement.
It is as follows that the present embodiment describes concrete test process by taking ELVDD leads as an example：Open the of ELVDD leads successively first
One transistor T1, writes down the electric current I of every stringELVDD, by IELVDDIt is converted into test voltage.By the test voltage and this row
Row sequence number is stored among RAM.Pre-set the theoretical value or normal value V of ELVDD leads0, by the test voltage among RAM
Successively with V0It is compared, compares V0Greatly " 1 " is just labeled as, illustrates that this row has short circuit, compare V0It is little to be just labeled as " 0 ", illustrate this row
Normally.The test process of VREFP leads is identical with ELVDD leads, it is hereby achieved that following Tables 1 and 2.
Table 1 is the short-circuit conditions look-up table of ELVDD leads
| 1 | 0 | 0 |
| 1 | 0 | 0 |
| 1 | 0 | 0 |
Table 2 is the short-circuit conditions look-up table of VREFP leads
| 0 | 0 | 0 |
| 1 | 1 | 1 |
| 0 | 0 | 0 |
The present embodiment can clearly state which has short circuit with which row by searching Tables 1 and 2.Need explanation
It is that above-mentioned Tables 1 and 2 is a kind of citing, not all situation does not constitute limiting the scope of the invention.In addition,
The arrangement position of matrix element and the arrangement position of pixel cell are corresponding among Tables 1 and 2, for example, the first row first of matrix
Row are exactly the pixel cell of the first row first row of display floater.The present embodiment represents the short-circuit condition of the i-th row jth row with Pij,
If Pij=0, illustrate that the i-th row jth row are not short-circuited, on the contrary then there is short circuit in explanation.If Pij=1 in table 1, while
Pij=1 in table 2, then can determine that the pixel cell that the i-th row jth is arranged is short-circuit condition, so can be obtained by accurate short circuit
Generation position.
The test circuit that the present embodiment is provided includes the first test cell, the second test cell and judging unit, described the
One test cell exports the first measured signal of each column pixel cell, second test cell output often row pixel cell the
Two measured signals, the judging unit judges single pixel unit according to first measured signal and second measured signal
It is whether short-circuit, such that it is able in the case where the technological process of production is not increased, in process of production to the workability of display floater
Can be evaluated, the position of short circuit generation can be accurately positioned, be improved the performance and yield of product.
Embodiment three
Fig. 5 is a kind of flow chart of the method for work of test circuit that the embodiment of the present invention three is provided.Referring to Fig. 1 and Fig. 5,
The test circuit includes the first test cell 101, the second test cell 102 and judging unit 103, the judging unit 103
Be connected with first test cell 101, second test cell 102 respectively, first test cell 101 respectively with often
Row pixel cell connects, and second test cell 102 is connected respectively with every row pixel cell.Display floater 100 includes pixel
Cell array, the pixel unit array includes multirow pixel cell and multiple row pixel cell, single column of pixels unit and single file picture
Plain unit has a pixel cell 104.The technical scheme first-selection that the present embodiment is provided judges single column of pixels unit and single file picture
Whether plain unit is short-circuit, judges what the single column of pixels unit and the single row of pixels unit had further according to above-mentioned judged result
Whether pixel cell 104 is short-circuit such that it is able to be accurately positioned the particular location of short circuit generation.
The method of work of the test circuit includes：
Step 1001, first test cell export the first measured signal of each column pixel cell.
Step 1002, second test cell export the second measured signal of often row pixel cell.
Step 1003, the judging unit judge single picture according to first measured signal and second measured signal
Whether plain unit is short-circuit.
Referring to Fig. 1, the judging unit 103 includes the first comparison module 203, the second comparison module 204 and judge module
205, first comparison module 203 is connected with first test cell 101, second comparison module 204 and described
Two test cells 102 connect, the judge module 205 respectively with first comparison module 203, second comparison module
204 connections.The judging unit judges that single pixel unit is according to first measured signal and second measured signal
The step of no short circuit includes：First comparison module is compared first measured signal with default first standard signal
Compared with whether short-circuit to determine corresponding single column of pixels unit；Second comparison module by second measured signal with it is default
The second standard signal be compared, it is whether short-circuit to determine corresponding single row of pixels unit；The judge module is according to described
The comparative result of the comparative result of the first comparison module and second comparison module judges whether single pixel unit is short-circuit.
In the present embodiment, the judge module includes the first acquisition submodule, the second acquisition submodule and judging submodule,
The judging submodule is connected respectively with first acquisition submodule, second acquisition submodule.The judge module root
Whether judge single pixel unit according to the comparative result of first comparison module and the comparative result of second comparison module
The step of short circuit includes：First acquisition submodule obtains the single column of pixels unit of short circuit；Second acquisition submodule is obtained
Take the single row of pixels unit of short circuit；The judging submodule is total to the single column of pixels unit of short circuit with the single row of pixels unit of short circuit
Some single pixel unit judges are short circuit.Therefore, first acquisition submodule obtains the single column of pixels unit of short circuit, described
Second acquisition submodule obtain short circuit single row of pixels unit, the judging submodule by short circuit single column of pixels unit with short circuit
The total single pixel unit judges of single row of pixels unit be short circuit, such that it is able in the situation for not increasing the technological process of production
Under, the service behaviour of display floater is evaluated in process of production, the position of short circuit generation can be accurately positioned, improve and produce
The performance and yield of product.
Among the method for work of the test circuit that the present embodiment is provided, the test circuit include the first test cell, the
Two test cells and judging unit, the first measured signal of the first test cell output each column pixel cell, described second
Second measured signal of the test cell every row pixel cell of output, the judging unit is according to first measured signal and described
Second measured signal judges whether single pixel unit is short-circuit, such that it is able in the case where the technological process of production is not increased,
The service behaviour of display floater is evaluated in production process, the position of short circuit generation can be accurately positioned, improve product
Performance and yield.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement for adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (10)
1. a kind of test circuit, it is characterised in that described to sentence including the first test cell, the second test cell and judging unit
Disconnected unit is connected respectively with first test cell, second test cell, first test cell respectively with each column
Pixel cell connects, and second test cell is connected respectively with every row pixel cell；
First test cell is used to export the first measured signal of each column pixel cell；
Second test cell is used to export the second measured signal of often row pixel cell；
The judging unit is used to judge that single pixel unit is according to first measured signal and second measured signal
No short circuit.
2. test circuit according to claim 1, it is characterised in that first test cell includes the multiple first tests
Module, first test module connects with corresponding single column of pixels unit, and second test cell is surveyed including multiple second
Die trial block, second test module connects with corresponding single row of pixels unit；
First test module is used to export the first measured signal of corresponding single column of pixels unit；
Second test module is used to export the second measured signal of corresponding single row of pixels unit.
3. test circuit according to claim 2, it is characterised in that first test module includes the first signal input
Line, the first output line and the first transistor, first signal input line is connected with the grid of the first transistor,
First output line is connected with the first pole of the first transistor, the second pole and the list of the first transistor
Row pixel cell connects；
First signal input line is used for the first test signal of input so that the first transistor conducting；
First output line is treated for exporting the first of the single column of pixels unit when the first transistor is turned on
Survey signal.
4. test circuit according to claim 2, it is characterised in that first test module includes the first signal input
Line, first voltage end, the first output line and the first transistor, first signal input line and the first transistor
Grid connection, the first voltage end is connected with the first pole of the first transistor, the second pole of the first transistor
Be connected with the grid of the driving transistor of pixel cell among the single column of pixels unit, first output line with it is described
The drain electrode connection of driving transistor；
First signal input line is used for the first test signal of input so that the first transistor conducting；
The first voltage end is used for the input voltage signal when the first transistor is turned on；
First output line is used to export the first measured signal of the single column of pixels unit according to the voltage signal.
5. test circuit according to claim 2, it is characterised in that second test module includes secondary signal input
Line, secondary signal output lead and transistor seconds, the secondary signal input line is connected with the grid of the transistor seconds,
The secondary signal output lead is connected with the first pole of the transistor seconds, the second pole and the list of the transistor seconds
Row pixel cell connects；
The secondary signal input line is used for the second test signal of input so that transistor seconds conducting；
The secondary signal output lead is treated for exporting the second of the single row of pixels unit when the transistor seconds is turned on
Survey signal.
6. test circuit according to claim 1, it is characterised in that the judging unit include the first comparison module, the
Two comparison modules and judge module, first comparison module is connected with first test cell, second comparison module
It is connected with second test cell, the judge module connects respectively with first comparison module, second comparison module
Connect；
First comparison module is used to be compared first measured signal with default first standard signal, to determine
Whether corresponding single column of pixels unit is short-circuit；
Second comparison module is used to be compared second measured signal with default second standard signal, to determine
Whether corresponding single row of pixels unit is short-circuit；
The judge module is used for the comparison knot of the comparative result according to first comparison module and second comparison module
Fruit judges whether single pixel unit is short-circuit.
7. test circuit according to claim 6, it is characterised in that the judge module include the first acquisition submodule,
Second acquisition submodule and judging submodule, the judging submodule is obtained respectively with first acquisition submodule, described second
Take submodule connection；
First acquisition submodule is used to obtain the single column of pixels unit of short circuit；
Second acquisition submodule is used to obtain the single row of pixels unit of short circuit；
The judging submodule is used for the single column of pixels unit of the short circuit single pixel total with the single row of pixels unit of short circuit
Unit judges are short circuit.
8. a kind of method of work of test circuit, it is characterised in that the test circuit includes the first test cell, the second test
Unit and judging unit, the judging unit is connected respectively with first test cell, second test cell, and described
One test cell is connected respectively with each column pixel cell, and second test cell is connected respectively with every row pixel cell；
The method of work of the test circuit includes：
First test cell exports the first measured signal of each column pixel cell；
Second test cell exports the second measured signal of often row pixel cell；
The judging unit judges whether single pixel unit is short according to first measured signal and second measured signal
Road.
9. the method for work of test circuit according to claim 8, it is characterised in that the judging unit includes the first ratio
Compared with module, the second comparison module and judge module, first comparison module is connected with first test cell, and described second
Comparison module is connected with second test cell, and the judge module compares respectively with first comparison module, described second
Compared with module connection；
The judging unit judges whether single pixel unit is short according to first measured signal and second measured signal
The step of road, includes：
First comparison module is compared first measured signal with default first standard signal, to determine correspondence
Single column of pixels unit it is whether short-circuit；
Second comparison module is compared second measured signal with default second standard signal, to determine correspondence
Single row of pixels unit it is whether short-circuit；
The judge module is sentenced according to the comparative result of first comparison module and the comparative result of second comparison module
Whether disconnected single pixel unit is short-circuit.
10. the method for work of test circuit according to claim 9, it is characterised in that the judge module includes first
Acquisition submodule, the second acquisition submodule and judging submodule, the judging submodule respectively with first acquisition submodule,
The second acquisition submodule connection；
The judge module is sentenced according to the comparative result of first comparison module and the comparative result of second comparison module
Whether the step of short circuit includes disconnected single pixel unit：
First acquisition submodule obtains the single column of pixels unit of short circuit；
Second acquisition submodule obtains the single row of pixels unit of short circuit；
The single pixel unit that the judging submodule has the single column of pixels unit of short circuit with the single row of pixels unit of short circuit
It is judged as short circuit.
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| CN106571114B (en) | 2020-04-17 |
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