CN105758600A - Vibration test fixture - Google Patents
Vibration test fixture Download PDFInfo
- Publication number
- CN105758600A CN105758600A CN201610109243.8A CN201610109243A CN105758600A CN 105758600 A CN105758600 A CN 105758600A CN 201610109243 A CN201610109243 A CN 201610109243A CN 105758600 A CN105758600 A CN 105758600A
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- CN
- China
- Prior art keywords
- pilot hole
- vibration test
- test fixture
- clamping groove
- base block
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
- G01M7/027—Specimen mounting arrangements, e.g. table head adapters
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention discloses a vibration test fixture, which includes a master fixture and at least one sub fixture. The master fixture is provided with at least one installation portion. The sub fixture is fixed detachably to the installation portion. The sub fixture comprises a cover plate and a base connected cooperatively. The base is provided with a clamping groove. A pressing projection corresponding to the position of the clamping groove is disposed on the cover plate. The pressing projection matches the clamping groove. By arranging a test chip in the clamping groove of the sub fixture and by using the pressing projection on the cover plate for tight abutment, the invention can achieve the purpose of limiting the degree of freedom of the test chip in all directions, achieve stable clamping of the test chip, avoid damage to the test chip due to the loosening in the vibration test.
Description
Technical field
The present invention relates to vibration testing device technical field, especially relate to a kind of vibration test fixture.
Background technology
Along with the fast development of microelectric technique, the function of IC products becomes increasingly complex, and integrated level is more and more higher, and package pins quantity gets more and more, and sector application also scope progressively expands.It is tested by working environment and condition that reliability test is used by analog equipment actual field, is to ensure that the important means of IC products reliability.Wherein, vibration test in its intended transport and uses the vibration resistance in environment for evaluating equipment, its object is to find the defect in product design, technique, manufacture, fully grasp product stress response characteristic and weak link, judge whether product reaches intended q&r with this.
Fixture in vibration test is the component realizing being connected between testpieces with vibration table, mainly realizes two functions: testpieces is fixed on a vibration table by (a);B the mechanical energy of vibration table is passed to testpieces by (), make to experience intended vibration on testpieces.In GJB548, GJB360, vibration test all requires to be rigidly fixed on vibration table device securely, and lead-in wire or cable also should be suitably fixing, and requires that device stands the vibration test examination of regulation respectively at three axial directions.Additionally; owing to the criterion in vibration test standard is shell, goes between or be sealed with the sign of defect or damage; or labelling obscures; all should regard as inefficacy; therefore, vibration test fixture is except can except the fixing sample of rigidity, in addition it is also necessary to the shell of sample, lead-in wire are suitably protected; in order to avoid causing additional injuries, the accuracy of result of the test otherwise can be affected.
For IC products, traditional vibration test fixture is mainly made up of cover plate and base plate, is realized the location of IC chip by the clamping of cover plate and base plate.Along with increasing of IC chip number of pin, the reduction of lead pin pitch, traditional vibration test fixture occurs in that and is difficult to be tightly fastened the problems such as chip, easy damaged chip carrier and pin.For fine pitch, multi-pipe pin, large scale integrated circuit product vibration test fixture demand, there is presently no applicable technical scheme.
Summary of the invention
Based on this, the invention reside in the defect overcoming prior art, a kind of vibration test fixture is provided, the clamping making chip consolidates and not easily loosens, avoid shell and pin damage, and test efficiency and stringency of test are high, meet the vibration test fixture demand of fine pitch, multi-pipe pin, large scale integrated circuit product.
The object of the present invention is achieved like this:
A kind of vibration test fixture, including female fixture and at least one sub-folder tool, described female fixture is provided with at least one installation portion, and described sub-folder tool is detachably secured to described installation portion;
Described sub-folder tool includes the cooperate cover plate connected and base, and described base is provided with clamping groove, and described cover plate is provided with the compression boss corresponding with described clamping groove location, described compression boss and described clamping slot fit.
Below further technical scheme is illustrated:
Further, described base includes interconnective first base block and the second base block, the end face of described first base block is provided with the first holding tank, and the end face of described second base block is provided with the second holding tank, described first holding tank and described second holding tank and cooperatively forms described clamping groove.
Further, the side of described first base block is provided with at least one keeper, and the side that described second base block is relative with described keeper is provided with at least one hole, location, and described keeper and hole, described location are connected.
Further, also including the first locking member, the side that described first base block deviates from described keeper is provided with the first pilot hole, and described second base block is provided with the second pilot hole, and described locking member is arranged in described first pilot hole and described second pilot hole.
Further, the cell wall of described clamping groove is provided with at least two arc section.
Further, described clamping groove is provided with ledge structure, and described compression boss includes first order boss, and described first order boss coordinates clamping with described ledge structure.
Further, described compression boss also includes second level boss, and described second level boss is arranged on described first order boss.
Further, also include the second locking member, described cover plate is provided with at least one the 3rd pilot hole, and described base is provided with at least one fourth pilot hole corresponding with described 3rd pilot hole position, and described second locking member is arranged in described 3rd pilot hole and described 4th pilot hole.
Further, described female fixture is tetragonal body structure, and four sides of described tetragonal body structure are equipped with at least 4 described installation portions.
The beneficial effects of the present invention is:
1) above-mentioned vibration test fixture is by being positioned in the described clamping groove of described sub-folder tool by test chip, and pushed against by the described compression boss on described cover plate, the purpose of restriction test chip all directions degree of freedom can be reached, realize the stabilizing grip to test chip, avoid because of loosening, test chip being caused damage in vibration-testing is tested, affect the accuracy of result of the test.
2) frame mode that above-mentioned vibration test fixture uses by adopting female fixture and sub-fixture combination, it is possible to install multiple sub-folder tool in single test and multiple chips are carried out vibration-testing simultaneously, thus being greatly improved testing efficiency.
Accompanying drawing explanation
Fig. 1 is the structural representation of the vibration test fixture described in the embodiment of the present invention;
Fig. 2 is the exploded perspective view of the sub-folder tool described in the embodiment of the present invention;
Fig. 3 is the structural representation of the base described in the embodiment of the present invention.
Description of reference numerals:
100, female fixture, 120, installation portion, 200, sub-folder tool, 220, cover plate, 222, compress boss, 240, base, 242, clamping groove, 243, arc section, the 244, first base block, 245, the first holding tank, 246, the second base block, the 247, second holding tank, 248, keeper, 249, hole, location, 300, the first locking member, the 320, first pilot hole, the 340, second pilot hole, 360, the 3rd pilot hole, 380, the 4th pilot hole, 400, ledge structure, 520, first order boss, 540, second level boss, the 600, second locking member.
Detailed description of the invention
Below embodiments of the invention are described in detail:
As shown in Fig. 1, Fig. 2, a kind of vibration test fixture, including female fixture 100 and at least one sub-folder tool 200, described female fixture 100 is provided with at least one installation portion 120, and described sub-folder tool 200 is detachably secured to described installation portion 120;
Described sub-folder tool 200 includes the cooperate cover plate 220 connected and base 240, described base 240 is provided with clamping groove 242, described cover plate 220 is provided with the compression boss 222 corresponding with described clamping groove 242 position, and described compression boss 222 coordinates with described clamping groove 242.
When carrying out vibration test, in order to ensure test chip life-span and test result accurate, typically require and ensure that the clamping of test chip consolidates, namely will not occur to loosen in dither process, damage because being collided, therefore typically require according to principle of six-point fixing to the movement limiting in chip all directions and rotation.To sum up, above-mentioned vibration test fixture by being positioned in the described clamping groove 242 of described sub-folder tool 200 by test chip, and pushed against by the described compression boss 222 on described cover plate 220, the purpose of restriction test chip all directions degree of freedom can be reached, realize the stabilizing grip to test chip, avoid because of loosening, test chip being caused damage in vibration-testing is tested, affect the accuracy of result of the test.
In addition, when carrying out vibration test, described female fixture 100 functions as the switching component that described sub-folder tool 200 is connected with vibration table, primary responsibility stator fixture, and be connected with vibration table rigidly, should meet simultaneously and complete three axial vibration tests of integrated circuit with minimum vibration number.Additionally, described female fixture 100 adopts aluminum alloy materials to make, and which is provided with multiple countersunk head screwed hole for assembling with vibration table, its four sides are respectively distributed four groups of screwed holes and are used for fixing described sub-folder tool 200, by this screwed hole, described sub-folder being had 200 and be fixed on described female fixture 100, being connected fixing with oscillating table horizontal sliding table for described female fixture 100 thus completing assembly process again through bolt.
In a preferred embodiment, described clamping groove 242 is the cell body of rectangular configuration, chip is fixed clamping by the mode clamped by diagonal angle, coordinate the pressuring action of described compression boss again, it is possible to realize restriction x, y, movement on tri-directions of z and rotational motion, guaranteeing that chip will not loosen in vibration-testing process, thus ensureing that the ic shell of chip and pin will not damage because of shock, under the premise ensureing its safety, guaranteeing the accuracy of test data.Certainly, in other examples, described clamping groove 242 can also is that other shape of such as circle, the triangle etc. with the form fit testing chip.
Additionally, the frame mode that above-mentioned vibration test fixture uses by adopting described female fixture 100 and described sub-folder tool 200 combination, multiple described sub-folder tool 200 can be installed in single test and multiple chips are carried out vibration-testing simultaneously, thus being greatly improved testing efficiency.Such as in a preferred embodiment, described female fixture 100 is tetragonal body structure, and four sides of described tetragonal body structure are equipped with at least 4 described installation portions 120.Namely 16 chips can be carried out test job by a vibration-testing test simultaneously, substantially increase testing efficiency, the measurement direction that changes by change coordinate system can to x simultaneously, y, z tri-axially tests, complete detection work in all directions by minimum testing time, further increasing work efficiency.
As shown in Figure 2, described base 240 includes interconnective first base block 244 and the second base block 246, the end face of described first base block 244 is provided with the first holding tank 245, the end face of described second base block 246 is provided with the second holding tank 247, described first holding tank 245 and described second holding tank 247 and cooperatively forms described clamping groove 242.
Described clamping groove 242 is formed by the first holding tank 245 of described first base block 244 and the second mutual split of holding tank 247 of described second base block 246, the side of test chip can well be clamped, restriction Chip Vertical moves axially movement and the rotation in outer all degree of freedom directions in the bottom surface of clamping groove, guarantee that clamping is firm, afterwards again through by described cover plate 220 and described base 240 assembly connection, it is possible to chip is completely fixed.
As it is shown on figure 3, further, the cell wall of described clamping groove 242 is provided with at least two arc section 243.At the cell wall place of described clamping groove 242, arc section 243 described at least two are set, preferably at least one described arc section 243 is respectively set on the cell wall of described first holding tank 245 and the cell wall of described second holding tank 247, can coordinate with the right angle of test chip with the described clamping groove 242 after facilitating processing thus better contact gripping preferably.Certainly, in other examples, being also applied for generally circular in shape or oval chip, described clamping groove can not also require to process the structure of above-mentioned arc section.
The side of described first base block 244 is provided with at least one keeper 248, and the side that described second base block 246 is relative with described keeper 248 is provided with at least one hole 249, location, and described keeper 248 and hole, described location 249 are connected.Wherein, when carrying out clamping, described first base block 244 and described second base block 246 are connected by described keeper 248 and hole, described location 249, good pre-determined bit effect can be played, guarantee follow-up described first base block 244 and the higher assembling quality of described second base block 246, to reduce the test error in data that rigging error is brought, it can in addition contain the bonding strength improved between them, it is ensured that the assembling steadiness of vibration test fixture.
Refer to Fig. 1, above-mentioned vibration test fixture also includes the first locking member 300, the side that described first base block 244 deviates from described keeper 248 is provided with the first pilot hole 320, described second base block 246 is provided with the second pilot hole 340, and described locking member 300 is arranged in described first pilot hole 320 and described second pilot hole 340.
Above-mentioned first pilot hole 320 is through hole, the screwed hole of described second pilot hole 340, when described first saddle 244 and described second base block 246 are fixedly connected, described first locking member 300 is arranged in described first pilot hole 320 and described second pilot hole 340 and just can realize good fixing connection purpose by threaded engagement, this attachment structure is simple to operate, reliable operation, mounting or dismounting are convenient.
Described clamping groove 242 is provided with ledge structure 400, and described compression boss 222 includes first order boss 520, and described first order boss 520 coordinates clamping with described ledge structure 400.The sidewall of described clamping groove 242 arranges described ledge structure 400 and can hold the pin of chip preferably; protection pin is avoided being subject to crushing in vibration test process; in addition; ensure that the described first order boss 520 of described compression boss 222 coordinates with described ledge structure 400; can better described cover plate 220 be installed on precalculated position; prevent described cover plate 220 from arbitrarily moving when vibration test, it is ensured that the stability of assembling structure simultaneously.
Further, described compression boss 222 also includes second level boss 540, and described second level boss 540 is arranged on described first order boss 520.Described second level boss 540 is the frustum cone structure being fixedly arranged on described first order boss 520, and when placing chip and being assembled on described base 240 by described cover plate 220, described frustum cone structure compresses chip surface just, plays good being fixed effect.
Refer to Fig. 1, above-mentioned vibration test fixture also includes the second locking member 600, described cover plate 220 is provided with at least one the 3rd pilot hole 360, described base 240 is provided with at least one fourth pilot hole 380 corresponding with described 3rd pilot hole 360 position, and described second locking member 600 is arranged in described 3rd pilot hole 360 and described 4th pilot hole 380.
Described cover plate 220 and described base 240 are arranged in the thread connecting mode of described 3rd pilot hole 360 and described 4th pilot hole 380 by described second locking member 600, good assembling effect can be played, and this assembling simple in construction, mounting or dismounting are convenient, low cost of manufacture.Certainly, other attachment structure mode can also be adopted in other embodiment.It should be pointed out that, that above-mentioned " first, second ... " is only used for the difference of similar item and refers to, the not restriction to protection domain.
Each technical characteristic of embodiment described above can combine arbitrarily, for making description succinct, the all possible combination of each technical characteristic in above-described embodiment is not all described, but, as long as the combination of these technical characteristics is absent from contradiction, all it is considered to be the scope that this specification is recorded.
Embodiment described above only have expressed the several embodiments of the present invention, and it describes comparatively concrete and detailed, but can not therefore be construed as limiting the scope of the patent.It should be pointed out that, for the person of ordinary skill of the art, without departing from the inventive concept of the premise, it is also possible to making some deformation and improvement, these broadly fall into protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (9)
1. a vibration test fixture, it is characterised in that including female fixture and at least one sub-folder tool, described female fixture is provided with at least one installation portion, and described sub-folder tool is detachably secured to described installation portion;
Described sub-folder tool includes the cooperate cover plate connected and base, and described base is provided with clamping groove, and described cover plate is provided with the compression boss corresponding with described clamping groove location, described compression boss and described clamping slot fit.
2. vibration test fixture according to claim 1, it is characterized in that, described base includes interconnective first base block and the second base block, the end face of described first base block is provided with the first holding tank, the end face of described second base block is provided with the second holding tank, described first holding tank and described second holding tank and cooperatively forms described clamping groove.
3. vibration test fixture according to claim 2, it is characterized in that, the side of described first base block is provided with at least one keeper, and the side that described second base block is relative with described keeper is provided with at least one hole, location, and described keeper and hole, described location are connected.
4. vibration test fixture according to claim 3, it is characterized in that, also include the first locking member, the side that described first base block deviates from described keeper is provided with the first pilot hole, described second base block is provided with the second pilot hole, and described locking member is arranged in described first pilot hole and described second pilot hole.
5. vibration test fixture according to claim 1, it is characterised in that the cell wall of described clamping groove is provided with at least two arc section.
6. vibration test fixture according to claim 1, it is characterised in that described clamping groove is provided with ledge structure, described compression boss includes first order boss, and described first order boss coordinates clamping with described ledge structure.
7. vibration test fixture according to claim 6, it is characterised in that described compression boss also includes second level boss, and described second level boss is arranged on described first order boss.
8. vibration test fixture according to claim 1, it is characterized in that, also include the second locking member, described cover plate is provided with at least one the 3rd pilot hole, described base is provided with at least one fourth pilot hole corresponding with described 3rd pilot hole position, and described second locking member is arranged in described 3rd pilot hole and described 4th pilot hole.
9. vibration test fixture according to claim 1, it is characterised in that described female fixture is tetragonal body structure, and four sides of described tetragonal body structure are equipped with at least 4 described installation portions.
Priority Applications (1)
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CN201610109243.8A CN105758600A (en) | 2016-02-26 | 2016-02-26 | Vibration test fixture |
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CN201610109243.8A CN105758600A (en) | 2016-02-26 | 2016-02-26 | Vibration test fixture |
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CN105758600A true CN105758600A (en) | 2016-07-13 |
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CN201610109243.8A Pending CN105758600A (en) | 2016-02-26 | 2016-02-26 | Vibration test fixture |
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Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106248333A (en) * | 2016-10-09 | 2016-12-21 | 中国工程物理研究院总体工程研究所 | A kind of vibration test fixture device with sealing function |
CN106441763A (en) * | 2016-10-09 | 2017-02-22 | 中国工程物理研究院总体工程研究所 | Transitional coupling device of conical shell used for vibration test |
CN108593279A (en) * | 2018-05-28 | 2018-09-28 | 中国电子科技集团公司第二十四研究所 | A kind of big dual-in-line device height acceleration centrifugal test universal fixturing |
CN108760210A (en) * | 2018-08-09 | 2018-11-06 | 北京中星时代科技有限公司 | A kind of infrared thermal imagery movement vibration experiment test fixture |
CN109638635A (en) * | 2019-01-10 | 2019-04-16 | 苏州联讯仪器有限公司 | Fixation device for chip of laser |
CN110497339A (en) * | 2019-08-26 | 2019-11-26 | 中国电子科技集团公司第二十四研究所 | A kind of 3D integrates the mechanical test fixture and clamping method of micro-system component |
CN110561295A (en) * | 2019-08-19 | 2019-12-13 | 北京遥感设备研究所 | Can eliminate joint clearance and increase mechanical test frock of connection rigidity |
CN111175646A (en) * | 2020-02-20 | 2020-05-19 | 中国科学院半导体研究所 | Chip clamp |
CN111609983A (en) * | 2020-04-16 | 2020-09-01 | 上海航天设备制造总厂有限公司 | Universal vibration and impact test tool for rotary mechanism products |
CN112611529A (en) * | 2020-11-20 | 2021-04-06 | 南京航空航天大学 | Vibration test ability promotes anchor clamps |
CN113084704A (en) * | 2021-03-17 | 2021-07-09 | 东莞市新美洋技术有限公司 | Polishing tool and polishing device |
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CN205404066U (en) * | 2016-02-26 | 2016-07-27 | 工业和信息化部电子第五研究所 | Vibration test anchor clamps |
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CN201974186U (en) * | 2010-12-13 | 2011-09-14 | 华东光电集成器件研究所 | Flat package acceleration centrifugal test fixture of integrated circuit |
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Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106248333A (en) * | 2016-10-09 | 2016-12-21 | 中国工程物理研究院总体工程研究所 | A kind of vibration test fixture device with sealing function |
CN106441763A (en) * | 2016-10-09 | 2017-02-22 | 中国工程物理研究院总体工程研究所 | Transitional coupling device of conical shell used for vibration test |
CN108593279A (en) * | 2018-05-28 | 2018-09-28 | 中国电子科技集团公司第二十四研究所 | A kind of big dual-in-line device height acceleration centrifugal test universal fixturing |
CN108760210A (en) * | 2018-08-09 | 2018-11-06 | 北京中星时代科技有限公司 | A kind of infrared thermal imagery movement vibration experiment test fixture |
CN109638635A (en) * | 2019-01-10 | 2019-04-16 | 苏州联讯仪器有限公司 | Fixation device for chip of laser |
CN110561295A (en) * | 2019-08-19 | 2019-12-13 | 北京遥感设备研究所 | Can eliminate joint clearance and increase mechanical test frock of connection rigidity |
CN110561295B (en) * | 2019-08-19 | 2021-02-26 | 北京遥感设备研究所 | Can eliminate joint clearance and increase mechanical test frock of connection rigidity |
CN110497339A (en) * | 2019-08-26 | 2019-11-26 | 中国电子科技集团公司第二十四研究所 | A kind of 3D integrates the mechanical test fixture and clamping method of micro-system component |
CN111175646A (en) * | 2020-02-20 | 2020-05-19 | 中国科学院半导体研究所 | Chip clamp |
CN111609983A (en) * | 2020-04-16 | 2020-09-01 | 上海航天设备制造总厂有限公司 | Universal vibration and impact test tool for rotary mechanism products |
CN112611529A (en) * | 2020-11-20 | 2021-04-06 | 南京航空航天大学 | Vibration test ability promotes anchor clamps |
CN113084704A (en) * | 2021-03-17 | 2021-07-09 | 东莞市新美洋技术有限公司 | Polishing tool and polishing device |
CN113084704B (en) * | 2021-03-17 | 2022-05-06 | 东莞市新美洋技术有限公司 | Polishing jig and polishing device |
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Application publication date: 20160713 |