CN105740114B

CN105740114B - Fault tolerance test method and device for mobile terminal

Info

Publication number: CN105740114B
Application number: CN201610053861.5A
Authority: CN
Inventors: 易礼艳; 钟彩锦; 焦露; 于凯
Original assignee: Huizhou TCL Mobile Communication Co Ltd
Current assignee: TCL Mobile Communication Technology Ningbo Ltd
Priority date: 2016-01-26
Filing date: 2016-01-26
Publication date: 2020-09-25
Anticipated expiration: 2036-01-26
Also published as: CN105740114A

Abstract

The invention discloses a fault tolerance test method and device for a mobile terminal. The fault-tolerant test device comprises a fault-tolerant test module which comprises: the abnormity simulation unit is used for acquiring an SIM instruction which is sent by the mobile terminal and used for operating the SIM card, simulating the abnormal operation of the mobile terminal on the SIM card according to the SIM instruction to generate error information and sending the error information to the mobile terminal; acquiring a state instruction which is sent by the mobile terminal and comprises error information, and sending an active instruction to the mobile terminal according to the state instruction so that the mobile terminal executes the active instruction; the result analysis unit is used for acquiring the result of the mobile terminal executing the active command and analyzing the result to obtain an analysis result; and the test report generating unit is used for generating a test report according to the analysis result. Through the mode, the fault tolerance test, result analysis and test report generation automation of the mobile terminal and the intelligent card can be realized, and the accuracy of the test result is improved.

Description

Fault tolerance test method and device for mobile terminal

Technical Field

The invention relates to the field of fault-tolerant testing of mobile terminals, in particular to a fault-tolerant testing method and device of a mobile terminal.

Background

Nowadays, mobile terminals are widely used, and functions of a Subscriber Identity Module (SIM)/Universal Subscriber Identity Module (USIM) are increasingly complex. Under the abnormal condition of the SIM/USIM, whether the mobile terminal has certain fault-tolerant capability continues to be normally used, most companies adopt SmartStation3 platform software provided by Collis company to simulate the abnormal scene of the SIM/USIM for verification in a mode of manual result judgment, and the following defects exist in the mode: SIM/USIM abnormal scenes simulated by SmartStation3 platform software are not comprehensive enough and low in efficiency; the manual result judgment consumes a large amount of manpower and material resources; the manual result judgment is not accurate enough.

Disclosure of Invention

The embodiment of the invention provides a fault tolerance test method and device for a mobile terminal, which can realize the automation of fault tolerance test, result analysis and test report generation of the mobile terminal and an intelligent card and improve the accuracy of test results.

The invention provides a fault-tolerant testing device of a mobile terminal, which is used for testing the fault-tolerant function of the mobile terminal to an SIM card, the fault-tolerant testing device is provided with an SIM card connector, the SIM card connector is connected with an SIM card interface of the mobile terminal, the fault-tolerant testing device comprises a fault-tolerant testing module, and the fault-tolerant testing module comprises: the abnormal simulation unit is used for simulating error information generated by abnormal operation of the mobile terminal on the SIM card according to the SIM instruction and sending the error information to the mobile terminal when the SIM card connector obtains the SIM instruction which is sent by the mobile terminal and used for operating the SIM card; the abnormity simulation unit is also used for acquiring a state instruction which is sent by the mobile terminal and comprises error information, and sending an active instruction to the mobile terminal through the SIM card connector according to the state instruction so that the mobile terminal can execute the active instruction; the result analysis unit is used for acquiring the result of the active command executed by the mobile terminal through the SIM card connector and analyzing the result to obtain an analysis result; and the test report generating unit is used for generating a test report according to the analysis result.

The SIM instruction comprises an operating file system instruction of the intelligent card or an operating intelligent card application tool box instruction.

Wherein, fault-tolerant testing arrangement still includes command processing module, and command processing module is used for: judging whether the SIM instruction is the SIM instruction needing fault tolerance test; if the SIM instruction is an SIM instruction which does not need to be subjected to fault tolerance test, directly returning a normal test result of the SIM instruction to the mobile terminal; and if the SIM instruction is the SIM instruction which needs to be subjected to the fault tolerance test, returning error information for simulating abnormal operation of the mobile terminal to the SIM card to the mobile terminal.

Wherein the anomaly simulation unit is configured to: and replacing the original return data and the original return status word in the first configuration file by error information aiming at the SIM instruction, and returning the error information to the mobile terminal, wherein the error information comprises the wrong replacement return data and the wrong replacement return status word.

Wherein the result analysis unit is configured to: acquiring a preset result of the mobile terminal executing the active instruction from the second configuration file; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed.

The invention also provides a fault-tolerant test method of the mobile terminal, which is applied to a fault-tolerant test device and is used for testing the fault-tolerant function of the mobile terminal to the SIM card, the fault-tolerant test device is provided with an SIM card connector, the SIM card connector is connected with the SIM card interface of the mobile terminal, and the fault-tolerant test method comprises the following steps: when the SIM card connector acquires an SIM instruction which is sent by the mobile terminal and used for operating the SIM card, generating error information according to the SIM instruction and sending the error information to the mobile terminal so as to simulate abnormal operation of the mobile terminal on the SIM card; acquiring a state instruction which is sent by the mobile terminal and comprises error information, and sending an active instruction to the mobile terminal through an SIM card connector according to the state instruction so that the mobile terminal executes the active instruction; obtaining a result of the mobile terminal executing the active command through the SIM card joint, and analyzing the result to obtain an analysis result; and generating a test report according to the analysis result.

The method comprises the following steps of generating error information according to the SIM instruction and sending the error information to the mobile terminal: if the SIM instruction is the SIM instruction which needs to be subjected to the fault tolerance test, returning error information for simulating abnormal operation of the mobile terminal to the SIM card to the mobile terminal; and if the SIM instruction is the SIM instruction which does not need to be subjected to the fault tolerance test, directly returning the normal test result of the SIM instruction to the mobile terminal.

The method comprises the following steps of generating error information according to the SIM instruction and sending the error information to the mobile terminal: and replacing the original return data and the original return status word in the first configuration file with error information and returning the error information to the mobile terminal, wherein the error information comprises the wrong replacement return data and the wrong replacement return status word.

Wherein, the step of analyzing the result to obtain the analysis result comprises the following steps: acquiring a preset result of the mobile terminal executing the active instruction from the second configuration file; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed.

Through the scheme, the invention has the beneficial effects that: according to the fault tolerance test method and device, error information generated by abnormal operation of the mobile terminal on the SIM card is simulated by the abnormity simulation unit according to the SIM instruction and is sent to the mobile terminal, the active instruction is sent to the mobile terminal through the SIM card head according to the state instruction which is sent by the mobile terminal and comprises the error information, so that the mobile terminal executes the active instruction, the result analysis unit obtains the result of executing the active instruction by the mobile terminal and analyzes the result to obtain an analysis result, the test report generation unit generates the test report according to the analysis result, automation of fault tolerance test, result analysis and test report generation of the mobile terminal and the intelligent card can be achieved, and the accuracy of the test result is improved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts. Wherein:

fig. 1 is a schematic structural diagram of a fault-tolerant test device of a mobile terminal according to a first embodiment of the present invention;

fig. 2 is a schematic structural diagram of a fault-tolerant test device of a mobile terminal according to a second embodiment of the present invention;

fig. 3 is a flowchart illustrating a fault tolerance testing method of a mobile terminal according to a first embodiment of the present invention;

FIG. 4 is a method for simulating an anomaly in a fault tolerance test of a mobile terminal according to an embodiment of the present invention;

FIG. 5 is a diagram illustrating a method for analyzing results of fault tolerance testing of a mobile terminal according to an embodiment of the present invention;

fig. 6 is a schematic diagram illustrating a test report generation method in a fault-tolerant test of a mobile terminal according to an embodiment of the present invention;

fig. 7 is a method for fault-tolerant testing of a mobile terminal according to a second embodiment of the present invention;

fig. 8 is a schematic structural diagram of a fault-tolerant test apparatus for a mobile terminal according to a third embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Fig. 1 is a schematic structural diagram of a fault-tolerant test apparatus for a mobile terminal according to a first embodiment of the present invention. As shown in fig. 1, the fault-tolerant test apparatus 10 is used for testing the fault-tolerant function of the mobile terminal to the SIM card. The fault-tolerant test device 10 is provided with an SIM card joint 11, the SIM card joint 11 is connected with an SIM card interface of the mobile terminal, and the fault-tolerant test device 10 comprises a fault-tolerant test module 12. The fault tolerance test module 12 includes: an anomaly simulation unit 120, a result analysis unit 121, and a test report generation unit 122. The abnormal simulation unit 120 is configured to, when the SIM card connector obtains an SIM instruction sent by the mobile terminal and used for operating the SIM card, simulate error information generated by abnormal operation of the mobile terminal on the SIM card according to the SIM instruction and send the error information to the mobile terminal. The anomaly simulation unit 120 is further configured to obtain a status instruction including error information sent by the mobile terminal, and send an active instruction to the mobile terminal through the SIM card according to the status instruction, so that the mobile terminal executes the active instruction. The result analysis unit 121 is configured to obtain a result of executing the active command by the mobile terminal through the SIM card connector, and analyze the result to obtain an analysis result. The test report generating unit 122 is configured to generate a test report according to the analysis result.

Referring to fig. 2, in the embodiment of the present invention, the fault-tolerant test apparatus 10 further includes a command monitoring module 13 and a command processing module 14. The fault tolerance test module 12 is connected to the command processing module 14, wherein the command monitoring module 13 is configured to monitor the command sent from the mobile terminal and distribute the command to the command processing module 14. The command processing module 14 distributes the SIM command and the status command to be subjected to the fault-tolerant test to the abnormal simulation unit 120, and distributes the result of the active command executed by the mobile terminal to the result analysis unit 121. The command processing module 14 is further configured to: and if the SIM instruction is the SIM instruction which does not need to be subjected to the fault tolerance test, directly returning the normal test result of the SIM instruction to the mobile terminal.

In the embodiment of the present invention, the SIM instruction is an operating file system instruction of the SIM card or an operating SIM card application toolkit instruction. The operating file system instructions of the SIM card include select, status, read bind, update bind, read record, update record, and the like. The instructions for operating the SIM card application toolkit include: terminalprofile, catch, envelope, terminal response, and the like.

Alternatively, the mobile terminal sends the result of the active command executed by the mobile terminal to the result analysis unit 121 by sending a terminal response command. In the embodiment of the present invention, the SIM command, the status command, and the terminal response command all include a fault tolerance flag bit for indicating whether to perform a fault tolerance test. If the fault tolerance flag is in the first state, preferably true, it indicates that the SIM command, the state command, or the terminal response command performs a fault tolerance test. Correspondingly, if the fault tolerance flag is in the second state, preferably false, it indicates that the SIM command, the state command, or the terminal response command does not perform the fault tolerance test.

In the embodiment of the present invention, the fault-tolerant test apparatus 10 sets in advance the SIM command to be subjected to the fault-tolerant test. The command processing module 14 determines whether the SIM command is the SIM command requiring fault tolerance testing. If the SIM command is a command that does not require fault-tolerant testing, the command processing module 14 directly performs normal testing and returns the test result to the mobile terminal. If the SIM command is a command requiring fault tolerance testing, the exception simulation unit 120 is configured to: and replacing the original return data and the original return status word in the first configuration file with the error information and returning the error information to the mobile terminal. Preferably, the first configuration file is preferably replacedata.xml, the exception simulation unit 120 finds data corresponding to an Application Protocol Data Unit (APDU) from the replacedata.xml of the first configuration file, assigns values to replacerestata and replacestdata, and returns the replacerestata and replacestdata to the mobile terminal instead of the original replaceData and Status Word. The data structure of the replayata is shown in table 1.

Table 1 data structure of replaydata

Attribute name	Storing code	Type (B)	Remarks for note
				Test case numbering	TestcaseID	Stirng
Test case name	TestcaseName	Stirng
				APDU data	replacedAPDU	Stirng
Returning data	replaceResData	Stirng
				Return status word	replaceStsData	Stirng

Xml, the specific data format of the first configuration file replayata is as follows:

at this time, the abnormal module unit 120 further sets the fault-tolerant flag bit to the first state, so as to facilitate the subsequent fault-tolerant test. Wherein the error information includes the erroneous substitute return data and the substitute return status word.

For status instructions. If the fault-tolerant flag bit in the status instruction is in the first state, that is, the status instruction includes error information obtained by the abnormal operation of the SIM card by the simulated mobile terminal returned to the mobile terminal by the abnormal simulation unit 120, the abnormal simulation unit 120 sends an active instruction to the mobile terminal according to the status instruction, so as to determine whether the mobile terminal can be normally used. Specifically, the anomaly simulation unit 120 reads the data simulating the active command from the first configuration file and returns the data to the mobile terminal, that is, the data simulating the active command replaces the original return data and the original return status word in the first configuration file and returns the data to the mobile terminal, so that the mobile terminal executes the active command and returns the execution result. If the fault-tolerant flag bit in the status instruction is in the second state, that is, the status instruction includes data of normal test returned to the mobile terminal by the command processing module 14, but not error information obtained by abnormal operation of the SIM card by the simulated mobile terminal returned to the mobile terminal by the abnormal simulation unit 120, the original return data and the original return status word in the first configuration file may be returned to the mobile terminal at this time.

Optionally, the mobile terminal executes the active command according to the data of the simulated active command returned by the abnormality simulation unit 120, and sends the result of executing the active command to the result analysis unit 121 in the form of a terminal response command. At this time, the fault-tolerant flag bit in the terminal response instruction is in a first state. The result analysis unit 121 obtains a result of the mobile terminal executing the active command, and analyzes the result to obtain an analysis result. Specifically, the result analysis unit 121 is configured to: acquiring a preset result of the mobile terminal executing the active instruction from the second configuration file; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed.

Preferably, the second profile is expecteddata. The result analysis unit 121 obtains a value of a preset result ExpectedTRData from the second configuration file expectedtata.xml according to the test case number (TestcaseID) and assigns the value to a subsequent analysis result. The data structure of the preset result ExpectedTRData is shown in table 2:

table 2 data structure of ExpectedTRData

Attribute name	Storing code	Type (B)	Remarks for note
				Test case numbering	TestcaseID	Stirng
Test case name	TestcaseName	Stirng
				Preset results	TestExpResult	Stirng

Xml, the data format of the second configuration file expecteddata is as follows:

meanwhile, the result analysis unit 121 also sets the fault-tolerant flag bit to the second state to indicate that the sub-fault-tolerant test is completed. If the fault-tolerant zone bit in the terminal response instruction is in the second state, namely the result that the terminal response instruction comprises the active instruction executed by the mobile terminal is not obtained by the fault-tolerant test, the return data and the state word of the current terminal response instruction are directly returned without analysis.

It can be seen that, in the above fault-tolerant test process, the fault-tolerant flag bit in the SIM instruction, the state instruction, and the terminal response instruction is defaulted to the second state. The anomaly simulation module 120 can execute the SIM command, the status command, or the result analysis module 121 to the terminal response command individually. Specifically, if the exception handling module 120 executes the status instruction, the corresponding SIM instruction is not executed first, the fault-tolerant flag bit in the status instruction is in the second state, and the exception handling module 120 directly returns the original return data and the return status word in the first configuration file. Similarly, if the result analysis module 121 executes the terminal response instruction, the fault-tolerant flag bit in the terminal response instruction is also in the second state, and the exception simulation module 120 does not complete the execution of the corresponding state instruction, the result analysis module 121 directly returns the return data and the state word of the terminal response instruction, and does not perform analysis.

According to the embodiment of the invention, the abnormal simulation unit simulates error information generated by abnormal operation of the mobile terminal on the SIM card according to the SIM instruction and sends the error information to the mobile terminal, and sends the active instruction to the mobile terminal according to the state instruction which is sent by the mobile terminal and comprises the error information, so that the mobile terminal executes the active instruction, the result analysis unit obtains the result of executing the active instruction by the mobile terminal and analyzes the result to obtain an analysis result, and the test report generation unit generates the test report according to the analysis result, so that the fault tolerance test, result analysis and test report generation automation of the mobile terminal and the intelligent card can be realized, and the accuracy of the test result is improved.

Fig. 3 is a flowchart illustrating a fault tolerance testing method of a mobile terminal according to a first embodiment of the present invention. As shown in fig. 3, the fault-tolerant test method is applied to a fault-tolerant test device for testing the fault-tolerant function of a mobile terminal to an SIM card, and the fault-tolerant test device is provided with an SIM card connector connected with an SIM card interface of the mobile terminal. The fault tolerance test method of the mobile terminal comprises the following steps:

step S10: when the SIM card connector acquires an SIM instruction which is sent by the mobile terminal and used for operating the SIM card, error information is generated according to the SIM instruction and sent to the mobile terminal so as to simulate abnormal operation of the mobile terminal on the SIM card.

In an embodiment of the invention, the SIM instructions comprise operating file system instructions for the smart card or operating a smart card application toolkit instructions. Before step S10, a SIM command to be tested for fault tolerance is preset. The SIM instruction includes a fault tolerance flag bit, and if the SIM instruction is an instruction that needs to perform a fault tolerance test, the fault tolerance flag bit is set to a first state, preferably true. If the SIM command is a command that does not require fault tolerance testing, the fault tolerance flag bit is set to a second state, preferably false.

In step S10, if the SIM command is a SIM command that does not require the fault tolerance test, the normal test result of the SIM command is directly returned to the mobile terminal. And if the SIM instruction is the SIM instruction which needs to be subjected to the fault tolerance test, returning error information for simulating abnormal operation of the mobile terminal to the SIM card to the mobile terminal. Specifically, the error information is substituted for the original return data and the original return status word in the first configuration file and returned to the mobile terminal, wherein the error information comprises the substituted return data and the substituted return status word with errors.

Step S11: and acquiring a state instruction which is sent by the mobile terminal and comprises error information, and sending the active instruction to the mobile terminal through the SIM card connector according to the state instruction so that the mobile terminal executes the active instruction.

The status command includes a fault tolerance flag. If the fault-tolerant flag bit is in the first state, it indicates that the status command includes the error information generated according to the SIM command in step S10, that is, the SIM command corresponding to the status command is a command requiring the fault-tolerant test, and the fault-tolerant test process is completed. At this time, in step S11, an active command is sent to the mobile terminal according to the status command, so as to determine whether the mobile terminal can still be used normally. Specifically, the data simulating the active command is read from the first configuration file and returned to the mobile terminal, that is, the data simulating the active command replaces the original return data and the original return status word in the first configuration file and is returned to the mobile terminal, so that the mobile terminal executes the active command and returns the execution result.

If the fault-tolerant flag bit in the status instruction is in the second state, that is, the status instruction includes the data of the normal test returned to the mobile terminal in step S10, instead of the error information obtained by simulating the abnormal operation of the mobile terminal on the SIM card, the original return data and the original return status word in the first configuration file may be returned to the mobile terminal.

Step S12: and obtaining a result of the mobile terminal executing the active command through the SIM card joint, and analyzing the result to obtain an analysis result.

The result of the mobile terminal executing the active command is included in the terminal response command. In step S12, the result of the mobile terminal executing the active command is obtained in the form of the terminal response command. The terminal response command also comprises a fault-tolerant flag bit. If the fault-tolerant flag bit is in the first state, the SIM instruction corresponding to the terminal response instruction is an instruction needing fault-tolerant testing, and the fault-tolerant testing process is completed. At this time, in step S12, when analyzing the result, obtaining a preset result of the mobile terminal executing the active command from the second configuration file; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed. Thus, a complete test process of the fault-tolerant test is completed, and the fault-tolerant flag bit is set to be in the second state.

It should be noted that the SIM command, the status command, and the terminal return command in the embodiment of the present invention may be executed separately, for example, the status command may not be executed until the SIM command is executed. In this embodiment, the status instruction is executed once every 30 milliseconds, and if the status instruction is executed, the SIM instruction is not executed, that is, the abnormal operation of the mobile terminal on the SIM card is not simulated, the fault-tolerant flag bit in the status instruction is in the second state, and the original return data and the original return status word in the first configuration file are returned to the mobile terminal. The SIM command is similar to the terminal return command and is not described again.

Step S13: and generating a test report according to the analysis result.

The following describes the anomaly simulation, result analysis, and test report generation, respectively.

The anomaly simulation of the embodiment of the invention is shown in fig. 4, and comprises the following steps:

step S100: and starting.

Step S101: and commanding monitoring. And monitoring the instruction sent by the mobile terminal to perform subsequent processing.

Step S102: and (5) command processing. And identifying the instruction sent by the mobile terminal so as to perform subsequent fault-tolerant test analysis.

Step S103: and judging whether the command is a SIM command. If yes, executing step S104; if not, the process jumps to execute step S108.

The SIM instruction in the embodiment of the invention is an operating file system instruction of the SIM card or an operating SIM card application tool kit instruction. The operating file system command of the SIM card includes select, status, read bank, update bank, read record, update record, etc. The instructions for operating the SIM card application toolkit include: tertiary profile, catch, envelope, tertiary response, and the like.

Step S104: and judging whether abnormal simulation is needed or not. If yes, executing step S105; if not, it jumps to step S110.

If the SIM instruction needs to be abnormally simulated, the fault tolerance test is performed on the SIM instruction, otherwise, the fault tolerance test is not performed on the SIM.

Step S105: and setting the fault-tolerant flag bit to be in a first state. The first state is used for indicating that the corresponding SIM instruction is processed by exception simulation.

Step S106: the return data and the return status word in the first configuration file are reset.

In step S106, if it is a SIM instruction, the error information is substituted for the return data and the return status word in the first configuration file. For example, when the mobile terminal adds a contact to the SIM/USIM card using the phonebook, the SIM/USIM card is simulated to return error information of 6F00, indicating an error that cannot be diagnosed.

If the command is a status command, the data of the active command replaces the return data and the return status word in the first configuration file. For example, the SIM/USIM is simulated to send a Setup Call command for determining whether the mobile terminal can still be used normally at this time.

Step S107: and returning the return data and the return status word to the mobile terminal. The substituted return data and return status word are returned to the mobile terminal for further fault tolerance testing. And then jumps to step S111.

Step S108: it is determined whether it is a status instruction. If yes, go to step S109; if not, the process jumps to execute step S110.

Step S109: and judging whether the fault-tolerant zone bit is in a first state or not. If yes, jumping to execute step S106; if not, step S110 is executed.

If the fault-tolerant zone bit of the state instruction is in the first state, the abnormal simulation of the SIM instruction corresponding to the state instruction is completed, namely the mobile terminal is simulated to perform abnormal operation on the SIM card according to the corresponding SIM instruction. The state instruction comprises error information obtained by simulating abnormal operation of the mobile terminal to the SIM card. If the fault-tolerant zone bit of the state instruction is not in the first state, the state instruction indicates that the SIM card is not abnormally operated by the mobile terminal according to the SIM instruction simulation corresponding to the state instruction, and the state instruction comprises data of normal test.

Step S110: and returning the original return data and the return status word to the mobile terminal.

In step S110, if the fault-tolerant flag bit in the SIM instruction or the status instruction is not in the first state, or is another instruction, that is, both instructions are not for performing the fault-tolerant test, it is only necessary to return the original return data and the return status word in the first configuration file to the mobile terminal. Thus, the fault tolerance test of one SIM instruction is completed.

Step S111: and judging whether the test is finished. If yes, go to step S112; if not, return to step S101. If not, indicating that the fault-tolerant test of the test cases is needed, returning to the step of command monitoring to obtain the SIM instruction sent by the mobile terminal again, and continuing to perform the fault-tolerant test of other test cases until the fault-tolerant test of all the test cases is completed.

Step S112: and generating a test report.

In the embodiment of the present invention, the SIM instruction and the status instruction further include a test case number. In step S112, a test report is generated according to the test case number and the returned test result.

It can be seen that the abnormal simulation shown in fig. 4 is performed automatically without manual participation, so that the simulation of the abnormal scene is comprehensive and efficient, thereby greatly saving manpower and improving the accuracy of the fault-tolerant test result.

Referring to fig. 5, the result analysis in the fault tolerance test of the embodiment of the present invention includes:

step S200: and starting.

Step S201: and commanding monitoring. And monitoring the instruction sent by the mobile terminal to perform subsequent processing.

Step S202: and (5) command processing. And identifying the instruction sent by the mobile terminal so as to analyze the subsequent fault-tolerant test result.

Step S203: and judging whether the command is a state command or a SIM command. If yes, jumping to execute step S207; if not, step S204 is performed.

Step S204: and judging whether the command is a terminal return command. If yes, go to step S205; if not, it jumps to execute step S208.

The terminal response instruction comprises a fault tolerance zone bit. If the fault-tolerant flag bit is in the first state, the terminal response instruction comprises a result of the mobile terminal executing the active instruction. If the fault-tolerant flag bit is in the second state, the result that the mobile terminal executes the active instruction is not included in the terminal response instruction, that is, the SIM instruction corresponding to the terminal response instruction is an instruction which does not need to perform the fault-tolerant test, or at least the corresponding state instruction does not complete the abnormal test.

Step S205: and (6) analyzing results.

The terminal return instruction further includes a test case number, and in step S205, result analysis is performed according to the terminal return instruction. Specifically, a preset result of the mobile terminal executing the active instruction is obtained from the second configuration file according to the test case number; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed. Thus, a complete test process of fault-tolerant test is completed, and the fault-tolerant flag bit is set to be in the second state

Step S206: and outputting the analysis result for generating a test report. And then jumps to step S208.

Step S207: and (6) performing exception simulation.

In step S207, when the mobile terminal sends the SIM command or the status command, the abnormal simulation is performed according to the SIM command or the status command, which is specifically shown in fig. 4 and is not described herein again.

Step S208: and returning the data to the mobile terminal.

In step S208, if the command is a SIM command or a status command, the result after exception simulation, i.e. the substitute return data and the substitute return status word, is returned, see fig. 4 in particular. And if the command is the terminal return command, the result of successful or failed test is sent to the mobile terminal.

Step S209: and judging whether all the test cases are executed. If yes, go to step S210; if not, the execution goes to step S201.

In step S209, if not, it indicates that a fault-tolerant test of the test case needs to be performed, and at this time, the step of command monitoring is returned to obtain the terminal return instruction sent by the mobile terminal again, and the result analysis of other test cases is continued until the result analysis of all test cases is completed.

Step S210: and generating a test report.

It can be seen that the result analysis in the fault-tolerant test shown in fig. 5 is performed automatically, without manual participation, thereby greatly saving manpower and improving the accuracy of the test result.

The following is described with respect to test report generation, respectively, with reference to fig. 6, including:

step S300: and starting.

Step S301: and commanding monitoring. And monitoring the instruction sent by the mobile terminal to perform subsequent processing.

Step S302: and (5) command processing. And identifying the instruction sent by the mobile terminal so as to generate a subsequent test report.

Step S303: and whether the terminal returns the instruction and the fault-tolerant flag bit is in the first state or not. If yes, go to step S304; if not, the execution goes to step S308.

And the fault-tolerant zone bit in the terminal response instruction is in a first state, which indicates that terminal return data included in the terminal response instruction is a result of the mobile terminal executing the active instruction. If the fault-tolerant flag bit is in the second state, the terminal return data of the terminal response instruction does not include the result of the active instruction executed by the mobile terminal, namely the SIM instruction corresponding to the terminal response instruction is an instruction which does not need to be subjected to fault-tolerant test, or at least the corresponding state instruction does not complete the abnormal test.

Step S304: and searching preset data from the second configuration file.

In the embodiment of the present invention, the terminal return instruction further includes a test case number. In step S304, the value of the preset data ExpectedTRData is searched in the second configuration file, preferably, expectedbata.

Step S305: and judging whether the data returned by the terminal is the same as the preset data. If yes, executing step S306; if not, it jumps to execute step S307.

In step S305, if the terminal return data is the same as the preset data, it indicates that the fault tolerance test is successful, and when the corresponding SIM command is abnormal, the mobile terminal may still operate normally, i.e. the mobile terminal has a certain fault tolerance capability for the SIM command. If not, the fault tolerance test is failed, and when the corresponding SIM instruction is abnormal, the mobile terminal cannot normally operate, namely the mobile terminal does not have fault tolerance to the SIM instruction. Thus, a complete test process of the fault-tolerant test is completed, and the fault-tolerant flag bit is set to be in the second state.

Step S306: and returning the test case number and the test success information. And then jumps to step S308.

Step S307: and returning the test case number and the test failure information.

Step S308: and sending the return data and the return status word to the mobile terminal. Returned here are the return data and return status word for the current instruction.

Step S309: and judging whether the test is finished. If yes, go to step S310; if not, the process jumps to execute step S301.

In step S309, if not, it indicates that the fault-tolerant test of the test case needs to be performed, and at this time, the step of command monitoring is returned to obtain the terminal return instruction sent by the mobile terminal again, and the result analysis of other test cases is continued to generate the test report until the test report generation of the result analysis of all test cases is completed.

Step S310: and generating a test report.

It can be seen that the fault-tolerant test report shown in fig. 6 is automatically generated, manual participation is not required, labor is greatly saved, and the accuracy of the test result is improved.

The three processes of the result analysis and the test report generation in the abnormal simulation and the fault-tolerant test are described above, and the implementation process of the total fault-tolerant test method formed by combining the three processes is shown in fig. 7. The method comprises the following steps:

step S400: and starting.

Step S401: and commanding monitoring. And monitoring the instruction sent by the mobile terminal to perform subsequent processing.

Step S402: and (5) command processing. And identifying the instruction sent by the mobile terminal so as to perform subsequent fault-tolerant test, result analysis and test report generation.

Step S403: and judging whether the command is a terminal return command. If not, go to step S404; if so, it jumps to execute step S410.

In step S403, if the command is a terminal return command, it indicates that analysis of the test result and generation of a report are required.

Step S404: it is determined whether it is a status instruction. If yes, go to step S407; if not, step S405 is performed.

In step S404, if the command is a status command, it indicates that the fault tolerance test result analysis is required. If not, it is a SIM instruction.

Step S405: and judging whether fault-tolerant testing is needed. If yes, go to step S406; if not, it jumps to execute step S414.

In step S405, if yes, it indicates that the SIM command needs to be subjected to a fault tolerance test, otherwise, the fault tolerance test is not required. In the embodiment of the present invention, whether the SIM command needs to perform the fault tolerance test may be preset.

Step S406: and setting the fault-tolerant flag bit to be in a first state. And then jumps to execute step S408.

In the embodiment of the present invention, the fault-tolerant flag bit in the SIM command is default to the second state, which means that no fault-tolerant test is required. If the SIM instruction needs to be subjected to the fault-tolerant test, the fault-tolerant flag bit in the SIM instruction is set to be in the first state, so that the subsequent fault-tolerant test is facilitated.

Step S407: whether the fault-tolerant flag bit is in the first state. If yes, go to step S408; if not, it jumps to execute step S414.

In step S407, when the fault-tolerant flag bit in the status instruction is in the first state, it indicates that an exception simulation needs to be performed according to the status instruction. When the fault-tolerant flag bit is not in the first state, namely in the second state, the fault-tolerant flag bit indicates that the state instruction does not need to be subjected to abnormal simulation.

Step S408: the return data and the return status word are replaced in the first configuration file.

Specifically, in step S408, if it is a SIM instruction, the error information is substituted for the return data and the return status word in the first configuration file. For example, when the mobile terminal adds a contact to the SIM/USIM card using the phonebook, the SIM/USIM card is simulated to return error information of 6F00, indicating an error that cannot be diagnosed.

If the status command indicates that the SIM command sent by the mobile terminal has been received before the status command, and the abnormal simulation has been performed, for example, when the mobile terminal has completed adding a contact to the SIM/USIM card using the phonebook, the simulated SIM/USIM card returns an error message of 6F 00. The data of the proactive command is now substituted for the return data and the return status word in the first configuration file. For example, the SIM/USIM is simulated to send a Setup Call command for determining whether the mobile terminal can still be used normally at this time.

Step S409: and returning the replaced return data and the return status word to the mobile terminal. And then jumps to step S415.

Step S410: and judging whether the fault-tolerant zone bit is in a first state or not. If so, step S411 is performed. If not, it jumps to execute step S414.

If the fault-tolerant flag bit is in the first state, it shows that fault-tolerant test result analysis needs to be performed according to the terminal return instruction, and the terminal response instruction comprises a result of executing the active instruction by the mobile terminal.

Step S411: and setting the fault-tolerant flag bit to be in a second state. Indicating when the fault-tolerant test has ended.

Step S412: and (6) analyzing results. Referring specifically to fig. 6, further description is omitted.

Step S413: and returning the analysis result for test report generation.

Step S414: and returning the return data and the return status word to the mobile terminal.

In step S414, if the SIM command does not require the fault tolerance test, or the status command or the terminal return command with the fault tolerance flag bit in the second state, the original return data and the return status word are directly returned to the mobile terminal.

Step S415: and judging whether the test is finished. If so, go to step S416; if not, the process jumps to execute step S401.

In step S415, if not, it indicates that the fault-tolerant test of the test case is still needed, and at this time, the step of command monitoring is returned to continue the fault-tolerant test and result analysis of other test cases until the fault-tolerant test and result analysis of all test cases are completed.

Step S416: and generating a test report.

The SIM instruction, the state instruction and the terminal return instruction sent by the mobile terminal also comprise a test case number. The fault-tolerant test method provided by the embodiment of the invention can be used for independently executing any one of the SIM instruction, the state instruction and the terminal return instruction, and judging whether to carry out fault-tolerant test on the corresponding test case or not according to the fault-tolerant zone bit in the SIM instruction, the state instruction and the terminal return instruction. And if the fault tolerance test is not carried out, returning the original return data and the return status word to the mobile terminal. Preferably, the status command sent by the mobile terminal is received and processed every 30 s. Therefore, the processes are automatically realized, the simulation of the abnormal scene is comprehensive and efficient, and the judgment of the test result is intelligent and specialized, so that the labor is greatly saved, and the precision of the test result is improved.

Fig. 8 is a schematic diagram of a hardware configuration of a fault-tolerant test apparatus for a mobile terminal according to a second embodiment of the present invention. As shown in fig. 8, the fault-tolerant test apparatus 20 of the mobile terminal includes: SIM card connector 21, processor 22, memory 23, and bus 24. The SIM card connector 21 is connected to a SIM card interface of the mobile terminal, and the SIM card connector 21, the processor 22 and the memory 23 are connected through a bus 24 to perform mutual communication.

The memory 23 stores programs. The processor 22 runs the program. When the SIM card connector acquires an SIM instruction which is sent by the mobile terminal and used for operating the SIM card, the program generates error information according to the SIM instruction and sends the error information to the mobile terminal through the SIM card connector 21 so as to simulate the abnormal operation of the mobile terminal on the SIM card.

The SIM card connector 21 obtains the status command including the error information sent by the mobile terminal, and the program further sends an active command to the mobile terminal through the SIM card connector according to the status command, so that the mobile terminal executes the active command.

The program also obtains the result of the mobile terminal executing the active command through the SIM card joint, analyzes the result to obtain an analysis result, and generates a test report according to the analysis result.

In an embodiment of the invention, the SIM instructions comprise operating file system instructions for the smart card or operating a smart card application toolkit instructions. The SIM command, the status command and the terminal response command all include a fault tolerance flag bit for indicating whether to perform a fault tolerance test. If the fault tolerance flag is in the first state, preferably true, it indicates that the SIM command, the state command, or the terminal response command performs a fault tolerance test. Correspondingly, if the fault tolerance flag is in the second state, preferably false, it indicates that the SIM command, the state command, or the terminal response command does not perform the fault tolerance test.

The program is also for: judging whether the SIM instruction is the SIM instruction needing fault tolerance test; and if the SIM instruction is the SIM instruction which does not need to be subjected to fault tolerance test, directly returning a normal test result of the SIM instruction to the mobile terminal. And if the SIM instruction is the SIM instruction which needs to be subjected to the fault tolerance test, returning the error information simulating the abnormal operation of the mobile terminal on the SIM card to the mobile terminal. Specifically, the error information is substituted for the original return data and the original return status word in the first configuration file and returned to the mobile terminal, wherein the error information comprises the substituted return data and the substituted return status word with errors.

Preferably, the first configuration file is preferably replacedata.xml, and the program finds data corresponding to an Application Protocol Data Unit (APDU) from the replacedata.xml of the first configuration file, assigns values to replacerestata and replaceStsData, and returns the replacerestata and replaceStsData to the mobile terminal instead of the original replanesdata and Status Word.

At this time, the program also sets the fault-tolerant flag bit to the first state, so as to facilitate the subsequent fault-tolerant test. Wherein the error information includes the erroneous substitute return data and the substitute return status word.

For the state instruction, if the fault-tolerant flag bit in the state instruction is in the first state, that is, the state instruction includes error information obtained by abnormal operation of the SIM card by the simulated mobile terminal returned to the mobile terminal when executing the SIM instruction, the program sends an active instruction to the mobile terminal according to the state instruction, so as to determine whether the mobile terminal can be normally used. Specifically, the program reads the data simulating the active command from the first configuration file and returns the data simulating the active command to the mobile terminal, that is, the data simulating the active command replaces the original return data and the original return status word in the first configuration file and returns the data simulating the active command to the mobile terminal, so that the mobile terminal executes the active command and returns an execution result. If the fault-tolerant flag bit in the state instruction is in the second state, that is, the state instruction includes data of normal test returned to the mobile terminal, but not error information obtained by abnormal operation of the simulated mobile terminal of the mobile terminal to the SIM card, the original return data and the original return state word in the first configuration file are returned to the mobile terminal.

And for the terminal return instruction, when the fault-tolerant flag bit in the terminal response instruction is in the first state, the program acquires the preset result of the mobile terminal executing the active instruction from the second configuration file. Preferably, the second profile is expecteddata. The program obtains the value of a preset result expectedTRData from a second configuration file expectedData.xml according to a test case number (TestcaseID) to assign values for subsequent analysis results; comparing the result of the mobile terminal executing the active command with a preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed.

The program also sets the fault-tolerant flag bit to a second state to indicate that the fault-tolerant test is completed. If the fault-tolerant zone bit in the terminal response instruction is in the second state, namely the result that the terminal response instruction comprises the active instruction executed by the mobile terminal is not obtained by the fault-tolerant test, the return data and the state word of the current terminal response instruction are directly returned without analysis.

In the several embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) or a processor (processor) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

In summary, according to the invention, the abnormal simulation unit simulates error information generated by abnormal operation of the mobile terminal on the SIM card according to the SIM instruction and sends the error information to the mobile terminal, and sends an active instruction to the mobile terminal through the SIM card according to a state instruction including the error information sent by the mobile terminal, so that the mobile terminal executes the active instruction, the result analysis unit obtains a result of executing the active instruction by the mobile terminal, and analyzes the result to obtain an analysis result, and the test report generation unit generates the test report according to the analysis result, thereby realizing automation of fault tolerance test, result analysis and test report generation of the mobile terminal and the smart card, and improving accuracy of the test result.

The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims

1. The fault-tolerant testing device of the mobile terminal is characterized in that the fault-tolerant testing device is used for testing the fault-tolerant function of a mobile terminal on an SIM card, the fault-tolerant testing device is provided with an SIM card connector, the SIM card connector is connected with an SIM card interface of the mobile terminal, the fault-tolerant testing device comprises a fault-tolerant testing module, and the fault-tolerant testing module comprises:

the abnormal simulation unit is used for simulating the abnormal operation of the mobile terminal on the SIM card according to the SIM instruction to generate error information and sending the error information to the mobile terminal when the SIM card connector obtains the SIM instruction which is sent by the mobile terminal and used for operating the SIM card;

the abnormity simulation unit is further used for acquiring a state instruction which is sent by the mobile terminal and comprises the error information, and sending an active instruction to the mobile terminal through the SIM card connector according to the state instruction so that the mobile terminal can execute the active instruction;

the result analysis unit is used for acquiring the result of the mobile terminal executing the active instruction through the SIM card connector and analyzing the result to obtain an analysis result;

and the test report generating unit is used for generating a test report according to the analysis result.

2. The fault tolerance test device of claim 1, wherein the SIM instructions comprise operating file system instructions or operating smart card application toolkit instructions for a smart card.

3. The fault tolerant test device of claim 1 further comprising a command processing module for: judging whether the SIM instruction is the SIM instruction needing fault tolerance test; if the SIM instruction is the SIM instruction which does not need to be subjected to fault tolerance test, directly returning a normal test result of the SIM instruction to the mobile terminal;

and if the SIM instruction is the SIM instruction which needs to be subjected to fault tolerance test, the abnormal simulation unit returns the error information which simulates the abnormal operation of the mobile terminal on the SIM card to the mobile terminal.

4. The fault-tolerant test device of claim 1, wherein the anomaly simulation unit is configured to: and aiming at the SIM instruction, replacing the original return data and the original return status word in the first configuration file with the error information and returning the error information to the mobile terminal, wherein the error information comprises the wrong replacement return data and the wrong replacement return status word.

5. The fault-tolerant test device of claim 1, wherein the result analysis unit is configured to:

acquiring a preset result of the mobile terminal executing the active instruction from a second configuration file;

comparing the result of the mobile terminal executing the active instruction with the preset result; if the two are the same, the fault tolerance test is successful; if the two are different, the fault-tolerant test is failed.

6. A fault-tolerant test method of a mobile terminal is characterized in that the fault-tolerant test method is applied to a fault-tolerant test device and is used for testing the fault-tolerant function of a mobile terminal to an SIM card, the fault-tolerant test device is provided with an SIM card connector, the SIM card connector is connected with an SIM card interface of the mobile terminal, and the fault-tolerant test method comprises the following steps:

when the SIM card connector acquires an SIM instruction which is sent by the mobile terminal and used for operating the SIM card, generating error information according to the SIM instruction and sending the error information to the mobile terminal so as to simulate abnormal operation of the mobile terminal on the SIM card;

acquiring a state instruction which is sent by the mobile terminal and comprises the error information, and sending an active instruction to the mobile terminal through the SIM card connector according to the state instruction so that the mobile terminal executes the active instruction;

obtaining a result of the mobile terminal executing the active instruction through the SIM card connector, and analyzing the result to obtain an analysis result;

and generating a test report according to the analysis result.

7. The fault-tolerance testing method according to claim 6, wherein the SIM instruction comprises an operating file system instruction of the smart card or an operating smart card application toolkit instruction.

8. The fault-tolerant test method of claim 6, wherein the step of generating an error message according to the SIM instruction and sending the error message to the mobile terminal comprises:

judging whether the SIM instruction is the SIM instruction needing fault tolerance test;

if the SIM instruction is the SIM instruction which needs to be subjected to fault tolerance test, returning the error information which simulates the abnormal operation of the mobile terminal on the SIM card to the mobile terminal;

and if the SIM instruction is the SIM instruction which does not need to be subjected to fault tolerance test, directly returning a normal test result of the SIM instruction to the mobile terminal.

9. The fault-tolerant test method of claim 6, wherein the step of generating an error message according to the SIM instruction and sending the error message to the mobile terminal comprises:

and replacing the original return data and the original return status word in the first configuration file with the error information and returning the error information to the mobile terminal, wherein the error information comprises the wrong replacement return data and the wrong replacement return status word.

10. The fault-tolerant test method of claim 6, wherein the step of analyzing the results to obtain analysis results comprises: