CN105632957A - Method and device for testing battery slices - Google Patents
Method and device for testing battery slices Download PDFInfo
- Publication number
- CN105632957A CN105632957A CN201510969748.7A CN201510969748A CN105632957A CN 105632957 A CN105632957 A CN 105632957A CN 201510969748 A CN201510969748 A CN 201510969748A CN 105632957 A CN105632957 A CN 105632957A
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- test
- station
- clamping position
- cell piece
- cell
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a method for testing battery slices. A clamping and positioning station is arranged in front of a test station; when one battery slice is subjected to performance test on the test station, a to-be-tested battery slice on the clamping and positioning station is clamped and positioned; and after the battery slice on the test station is tested, the to-be-tested battery slice on the clamping and positioning station is transmitted to the test station for performance test. The invention further discloses a device for testing the battery slices. The device comprises a transport track, wherein the transport track is provided with a clamping and positioning assembly and a test assembly; the clamping and positioning station and the test station are sequentially arranged in the transport direction of the transport track; the clamping and positioning assembly is arranged on the clamping and positioning station; and the test assembly is arranged on the test station. The device and the method disclosed by the invention have the advantages of being high in test efficiency, accurate to position and the like.
Description
Technical field
The invention mainly relates to technical field of solar batteries, refer in particular to a kind of cell slice test method and device.
Background technology
In solar energy crystal silicon battery production process, last procedure is exactly that the final electrical property to cell piece detects, Cleaning Principle is to utilize flat rubber belting that cell piece is delivered to below an analog solar light source one by one, the conducting probe being connected to monitor is pressed on the main grid of cell piece, analog solar light source irradiation cell piece simultaneously, monitor obtains the relevant unit for electrical property parameters of cell piece according to the generating data of test cell piece. The depressed position of conducting probe is that machinery repeats, and the main grid live width of cell piece is 1mm, for ensureing that test repeatability is high, it is desirable to when cell piece step-wise displacement is below solar simulator, repetitive positioning accuracy is better than 0.1mm.
When being test station below cell piece step-wise displacement to solar simulator than more conventional method, first with a mechanical grip mechanism, cell piece carried out a clamping position, to be pressed under conducting probe on grid line again, and then solar simulator flash of light makes cell piece generate electricity, obtain the electrical quantity of cell piece. Such method needs to increase a clamping and the action unclamped under conducting probe before pressure, it is necessary to takies the 0.5s cycle, affects equipment capacity. Additionally in the transmitting procedure of photovoltaic crystal silicon battery, many use flat rubber beltings are as the transmission medium of cell piece or silicon chip, in the significantly high efficiency test process of positioning accuracy request, the positioning accuracy request that cell piece stepping is moved within 0.1mm to ensure the repeatability of probe and grid line, in conventional flat rubber belting conveying, there is skidding in cell piece High Speed Transfer process and between flat rubber belting and cause that position error is more than 0.5mm, well below positioning accuracy request, cause measurement error.
Summary of the invention
The technical problem to be solved in the present invention is that for the technical problem that prior art exists, the present invention provides the method for testing of a kind of easy and simple to handle, cell piece that accurate positioning, testing efficiency are high, and provides the test device that a kind of simple in construction, accurate positioning and testing efficiency are high accordingly.
For solving above-mentioned technical problem, the technical scheme that the present invention proposes is:
A kind of cell slice test method, is provided with clamping position station in the front being positioned at described test station, when described cell piece carries out performance test in test station, the cell piece to be tested on described clamping position station is carried out clamping position; After the cell slice test in test station completes, the cell piece to be tested transmission on described clamping position station is made directly performance test to test station.
Further improvement as technique scheme:
The process that described cell piece transmits from clamping position station to test station, mesuring battary sheet is fixed on described transporting rail so that it is with transporting rail synchronous transfer.
By the mode of vac sorb, mesuring battary is fixed on described transporting rail.
The invention also discloses a kind of cell slice test device, including transporting rail, described transporting rail is provided with clamping position assembly and test suite, on the transmission direction of described transporting rail, it is disposed with clamping position station and test station, described clamping position assembly is arranged on described clamping position station, and described test suite is installed in described test station.
Further improvement as technique scheme:
Described transmission track includes the transmission band of one or more, and described transmission band is arranged in juxtaposition along cell piece direction of transfer.
Also include vac sorb assembly, described vac sorb assembly includes vacuum generator and vacuum pump bar, described vacuum generator communicates with the cavity within described vacuum pump bar, described vacuum pump bar is positioned at the lower section of described transmission band, the upper surface of described vacuum pump bar offers multiple through hole communicated with cavity, and described transmission band is provided with multiple adsorption hole corresponding with through hole.
The width of described vacuum pump bar is less than the width of described transmission band.
Compared with prior art, it is an advantage of the current invention that:
1, the method for testing of the cell piece of the present invention, the clamping position carried out at same station at present work and test job are moved to former and later two stations respectively and is synchronously performed operation, namely when carrying out cell slice test, cell piece on clamping position station then carries out clamping position work, thus saving the testing time of cell piece, improve testing efficiency.
2, the method for testing of the cell piece of the present invention, the process that cell piece transmits from clamping position station to test station, is fixed on cell piece on transporting rail, thus avoiding the relative movement of cell piece and transporting rail when mobile, it is ensured that the reliability of test.
3, the test device of the cell piece of the present invention, not only has an advantage as above described in method, and simple in construction, easily operated.
Accompanying drawing explanation
Fig. 1 is the test apparatus structure schematic diagram of the present invention.
Fig. 2 be the present invention test device in the perspective view of transporting rail and vac sorb assembly.
Fig. 3 be the present invention test device in the side-looking structural representation of transporting rail and vac sorb assembly.
Fig. 4 be the present invention test device in the structural representation of clamping position assembly.
Number in the figure represents: 1, transmission band; 11, adsorption hole; 2, cell piece; 3, clamping position assembly; 31, holder; 4, test suite; 41, conducting probe; 42, solar energy analog light source; 43, monitor; 5, vac sorb assembly; 51, vacuum pump bar; 52, vacuum generator.
Detailed description of the invention
Below in conjunction with Figure of description and specific embodiment, the invention will be further described.
As shown in Figures 1 to 4, the cell slice test method of the present embodiment, the front being positioned at test station is provided with clamping position station, when cell piece 2 carries out performance test in test station, the cell piece to be tested 2 on clamping position station is carried out clamping position; After the cell piece 2 in test station has been tested, the cell piece to be tested 2 on clamping position station transmits to test station and is made directly performance test. The method of testing of the cell piece of the present invention, the clamping position carried out at same station at present work and test job are moved to former and later two stations respectively and is synchronously performed operation, namely when carrying out cell piece 2 and testing, cell piece 2 on clamping position station then carries out clamping position work, thus saving the testing time of cell piece 2, improve testing efficiency.
In the present embodiment, the process that cell piece 2 transmits from clamping position station to test station, mesuring battary sheet 2 is fixed on transporting rail so that it is with transporting rail synchronous transfer, thus avoiding the relative movement of cell piece 2 and transporting rail when mobile, ensure the grid line reliable contacts of the conducting probe 41 when testing and solaode, improve the reliability of test.
In the present embodiment, by the mode of vac sorb, mesuring battary is fixed on transporting rail, it is easy to accomplish and good fixing effect.
The invention also discloses a kind of cell slice test device, including transporting rail, transporting rail is provided with clamping position assembly 3 and test suite 4, on the transmission direction of transporting rail, being disposed with clamping position station and test station, clamping position assembly 3 is arranged on clamping position station, and test suite 4 is installed in test station, clamping position and test job carry out simultaneously, improve testing efficiency.
In the present embodiment, test suite 4 is for detecting the electrical performance indexes of cell piece 2, including solar energy analog light source 42, conducting probe 41 and monitor 43, after cell piece 2 moves to test station, 41 times pressures of conducting probe form good contact with cell piece 2 main gate line, then solar energy analog light source 42 glistens, and monitor 43 records the generating parameter of cell piece 2 to obtain the relevant unit for electrical property parameters of solar battery sheet 2. Wherein clamping position assembly 3 includes the holder 31 that is positioned at 2 weeks sides of solar battery sheet, when cell piece 2 transmits to clamping position station, the holder 31 of cell piece 2 front end and rear end is raised above, then move forward and backward and cell piece 2 front and back position is adjusted, the position that the holder 31 of the left and right sides moves left and right cell piece about 2 simultaneously simultaneously is adjusted, thus cell piece 2 is positioned at predeterminated position.
In the present embodiment, transmission track includes two transmission bands 1, and transmission band 1 is arranged in juxtaposition along cell piece 2 direction of transfer, is wherein evenly arranged with multiple vacuum absorption holes 11 on transmission band 1, additionally vac sorb assembly 5 includes vacuum generator 52 and vacuum pump bar 51, vacuum generator 52 communicates with the cavity within vacuum pump bar 51, for forming the vacuum environment within vacuum pump bar 51, vacuum pump bar 51 is positioned at the lower section of transmission band 1 and being with transmission and 1 contacts, the upper surface of vacuum pump bar 51 offers multiple through hole communicated with cavity, transmission is provided with multiple adsorption hole 11 corresponding with through hole with 1, when being transmitted, vacuum generator 52 makes vacuum pump bar 51 internal generation vacuum, owing to transmission band 1 and vacuum pump bar 51 upper surface are provided with hole, it is with on 1 so that the cell piece 2 being shelved on transmission band 1 is adsorbed on transmission, ensure that the cell piece 2 behind location does not produce relative displacement with transmission band 1, ensure the reliability of test, transmission band 1 is by step motor drive, from the transmission of clamping position station to test station, transmission band 1 moves fixed length distance. additionally the width of vacuum pump bar 51 is less than transmitting the width with 1, to ensure the vacuum impact on transmitting with 1 transmission.
The cell slice test device of the present invention positions before testing, vac sorb is relied on to ensure positioning precision again, save the test station clamping position time, as monolithic battery sheet 2 saves 0.5s, monolithic battery sheet 2 test period is down to 2s from 2.5s, thus the production capacity of unit interval is risen to 1800 from 1440, it is possible to realize the 25% of production capacity and promote.
Below being only the preferred embodiment of the present invention, protection scope of the present invention is not limited merely to above-described embodiment, and all technical schemes belonged under thinking of the present invention belong to protection scope of the present invention. It should be pointed out that, for those skilled in the art, some improvements and modifications without departing from the principles of the present invention, should be regarded as protection scope of the present invention.
Claims (7)
1. a cell slice test method, it is characterized in that, the front being positioned at described test station is provided with clamping position station, when described cell piece (2) carries out performance test in test station, the cell piece to be tested (2) on described clamping position station is carried out clamping position; After the cell piece (2) in test station has been tested, cell piece to be tested (2) transmission on described clamping position station is made directly performance test to test station.
2. cell slice test method according to claim 1, it is characterized in that, the process that described cell piece (2) transmits from clamping position station to test station, mesuring battary sheet (2) is fixed on described transporting rail so that it is with transporting rail synchronous transfer.
3. cell slice test method according to claim 2, it is characterised in that mesuring battary is fixed on described transporting rail by the mode of vac sorb.
4. a cell slice test device, including transporting rail, described transporting rail is provided with clamping position assembly (3) and test suite (4), it is characterized in that, on the transmission direction of described transporting rail, being disposed with clamping position station and test station, described clamping position assembly (3) is arranged on described clamping position station, and described test suite (4) is installed in described test station.
5. cell piece according to claim 4 (2) test device, it is characterised in that described transmission track includes the transmission band (1) of one or more, and described transmission band (1) is arranged in juxtaposition along cell piece (2) direction of transfer.
6. cell slice test device according to claim 5, it is characterized in that, also include vac sorb assembly (5), described vac sorb assembly (5) includes vacuum generator (52) and vacuum pump bar (51), described vacuum generator (52) communicates with the cavity of described vacuum pump bar (51) inside, described vacuum pump bar (51) is positioned at the lower section of described transmission band (1), the upper surface of described vacuum pump bar (51) offers multiple through hole communicated with cavity, and described transmission band (1) is provided with multiple adsorption hole (11) corresponding with through hole.
7. cell slice test device according to claim 6, it is characterised in that the width of described vacuum pump bar (51) is less than the width of described transmission band (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510969748.7A CN105632957A (en) | 2015-12-22 | 2015-12-22 | Method and device for testing battery slices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510969748.7A CN105632957A (en) | 2015-12-22 | 2015-12-22 | Method and device for testing battery slices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105632957A true CN105632957A (en) | 2016-06-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510969748.7A Pending CN105632957A (en) | 2015-12-22 | 2015-12-22 | Method and device for testing battery slices |
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| CN (1) | CN105632957A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106362964A (en) * | 2016-08-29 | 2017-02-01 | 中国电子科技集团公司第四十八研究所 | Solar cell testing and separating device |
| CN107478944A (en) * | 2017-09-13 | 2017-12-15 | 深圳市德宇智能装备有限公司 | A kind of survey short-circuit mechanism for cylindrical lithium battery film-making winding integrated machine |
| CN116865673A (en) * | 2023-07-04 | 2023-10-10 | 苏州伟信智能科技有限公司 | Tool clamp capable of simultaneously measuring electrical properties of multiple solar cells |
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| CN1769920A (en) * | 2004-10-16 | 2006-05-10 | 曼兹自动化股份公司 | Test system of solar energy battery |
| CN201497798U (en) * | 2009-07-28 | 2010-06-02 | 天津力神电池股份有限公司 | Full-automatic battery performance testing device |
| CN202549806U (en) * | 2012-03-27 | 2012-11-21 | 致茂电子(苏州)有限公司 | Guide device for guiding solar silicon wafer and detection machine of guide device |
| CN102800616A (en) * | 2012-07-16 | 2012-11-28 | 杭州塞利仕科技有限公司 | Calibration mechanism and method for calibrating solar cell |
| CN103372698A (en) * | 2012-04-19 | 2013-10-30 | 宁夏小牛自动化设备有限公司 | Full-automatic series welding line for solar cells |
| CN104931090A (en) * | 2015-06-10 | 2015-09-23 | 潍坊路加精工有限公司 | Test tool and test method thereof |
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2015
- 2015-12-22 CN CN201510969748.7A patent/CN105632957A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1769920A (en) * | 2004-10-16 | 2006-05-10 | 曼兹自动化股份公司 | Test system of solar energy battery |
| CN201497798U (en) * | 2009-07-28 | 2010-06-02 | 天津力神电池股份有限公司 | Full-automatic battery performance testing device |
| CN202549806U (en) * | 2012-03-27 | 2012-11-21 | 致茂电子(苏州)有限公司 | Guide device for guiding solar silicon wafer and detection machine of guide device |
| CN103372698A (en) * | 2012-04-19 | 2013-10-30 | 宁夏小牛自动化设备有限公司 | Full-automatic series welding line for solar cells |
| CN102800616A (en) * | 2012-07-16 | 2012-11-28 | 杭州塞利仕科技有限公司 | Calibration mechanism and method for calibrating solar cell |
| CN104931090A (en) * | 2015-06-10 | 2015-09-23 | 潍坊路加精工有限公司 | Test tool and test method thereof |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106362964A (en) * | 2016-08-29 | 2017-02-01 | 中国电子科技集团公司第四十八研究所 | Solar cell testing and separating device |
| CN107478944A (en) * | 2017-09-13 | 2017-12-15 | 深圳市德宇智能装备有限公司 | A kind of survey short-circuit mechanism for cylindrical lithium battery film-making winding integrated machine |
| CN107478944B (en) * | 2017-09-13 | 2022-06-10 | 安徽思骏新材料有限公司 | Short circuit measuring mechanism for cylindrical lithium battery sheet-making and winding all-in-one machine |
| CN116865673A (en) * | 2023-07-04 | 2023-10-10 | 苏州伟信智能科技有限公司 | Tool clamp capable of simultaneously measuring electrical properties of multiple solar cells |
| CN116865673B (en) * | 2023-07-04 | 2024-04-26 | 苏州伟信智能科技有限公司 | Tool clamp capable of simultaneously measuring electrical properties of multiple solar cells |
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Application publication date: 20160601 |