CN105466889A - An acquisition method for surface illuminance of a complex organization in spatial frequency domain imaging - Google Patents
An acquisition method for surface illuminance of a complex organization in spatial frequency domain imaging Download PDFInfo
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- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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Abstract
The invention relates to an acquisition method for surface illuminance of a complex organization in spatial frequency domain imaging. The method includes (1) generating a gray scale image with a modulated frequency, loading a digital micromirror device, projecting a laser light source to the surface of the digital micromirror device so that light projected from the digital micromirror device is sinusoidal modulation light with a certain spatial frequency, and performing system calibration by adopting the surface of a diffuse reflection plate as a reference plane to obtain a three-dimensional height image of the surface of the complex organization, (2) amending gray scale distribution in the gray scale image in the step (1), loading the digital micromirror device with the amended gray scale image, subjecting the complex organization to light output to allow the surface illuminance distribution of the complex organization to meet regularities of sine distribution, and acquiring a surface illuminance distribution image of the complex organization through a CCD camera, and (3) correcting the surface illuminance distribution image acquired by the CCD camera. The method reduces illuminance data acquisition errors caused by non-uniform heights, and increases the projection efficiency and projection precision of light.
Description
Technical field
The invention belongs to biomedical engineering technology field, be specifically related to the acquisition method of complex organization's surface illuminance in a kind of spatial frequency domain imaging.
Background technology
Spatial frequency domain imaging is a kind of emerging medical imaging technology.In the past conventional reflectance spectrum or the spectral technology that diffuses can only carry out the measurement of certain some optical parameter value (absorption coefficient and scattering coefficient), can not carry out large-scale optical parameter value imaging.And spatial frequency domain imaging can carry out wide field imaging, meet the requirement that large area detects.Spatial frequency domain imaging is under the jurisdiction of the category of diffused light imaging, its principle is: select the diffuse reflector of diffuse reflectance known (being generally 97%-100%) as a reference plane, electroencephalogram with certain space frequency is projected organizer to be measured and reference planes respectively, organizer to be measured and the reference planes Illumination Distribution that diffuses at Sine Modulated light stimulus lower surface is gathered respectively by CCD camera, combine with specific optical transport model and rebuild in organizer the distribution of the optical parametric carrying organizer's function information and clinical pathology information, thus the optical parametric imaging completed whole organizer to be measured.
Spatial frequency domain imaging requirements organizer to be measured surface is a little positioned at sustained height with reference planes, be thus used for the uniform plane organizer of effects on surface and carry out optical parametric imaging.When application space frequency domain imaging carries out optical parametric imaging to the complex organization's body with certain profile, because complex organization's surface each point and reference planes are not in sustained height, thus two adverse effects can be brought to the collection of its surface light illumination:
1. complex organization surface each point height disunity, make to project reference planes not identical with the illuminance of complex organization surface corresponding point, the electroencephalogram thus projecting complex organization surface does not meet Sine distribution rule;
2. because complex organization's surface each point is not identical with the distance of CCD camera yet, the intensity of illumination distribution of the complex organization surface that CCD camera collects also inevitably can be subject to the interference that high modulation brings, and makes the distortion that useful data occurs to a certain degree.
Summary of the invention
In order to make up the defect of spatial frequency domain imaging, overcome the deficiency that it gathers the complex organization's surface illuminance with profile, the present invention proposes the acquisition method of complex organization's surface illuminance in a kind of spatial frequency domain imaging, utilize the method that the electroencephalogram projecting complex organization surface can be made to meet the distribution of sinusoidal rule, reduce the illuminance Acquisition Error that height disunity brings, eliminate above-mentioned two adverse effects.Main technical schemes of the present invention is divided into following two steps:
The acquisition method of complex organization's surface illuminance in a kind of spatial frequency domain imaging, use the spatial frequency domain imaging system obtaining function with profile, comprise LASER Light Source (8), digital micromirror device (9), CCD camera (12), computing machine (13), diffuse reflector (11) five parts, the projected area of digital micromirror device and the collection area of CCD camera overlap, and the aperture diaphragm of CCD camera and digital micromirror device are in same level height, the acquisition method of complex organization's surface illuminance is:
1. generate one and be loaded into digital micromirror device with the gray scale picture of modulating frequency, by laser light source projects to digital micromirror device surface, the light that digital micromirror device is launched is the electroencephalogram with certain space frequency.Choose diffuse reflector surface and carry out system calibrating as a reference plane, electroencephalogram is projected respectively reference planes and complex organization surface.The intensity of illumination distribution image of reference planes and complex organization surface is gathered respectively by CCD camera, the change of phase differential in the image collected for twice before and after computer recognizing, the height difference that can obtain complex organization surface and reference planes distributes, thus obtains the three-dimensional height map of complex organization surface;
The three-dimensional height map of the complex organization surface 2. 1. obtained according to step, modify steps 1. in grey value profile in gray scale picture.Amended gray scale picture is loaded into digital micromirror device light output is carried out to complex organization's body, make the intensity of illumination distribution of complex organization surface meet Sine distribution rule, gathered the intensity of illumination distribution image of complex organization surface by CCD camera;
3. according to the feature of lambert surface diffuse reflection model, the light intensity sent from complex organization surface be inversely proportional to distance square, the intensity of illumination distribution image of the complex organization surface that CCD camera collects is revised.
The invention has the beneficial effects as follows: because the electroencephalogram projecting complex organization surface meets the distribution of sinusoidal rule, and it is identical with the illuminance that reference planes corresponding point receive, thus complex organization's body equivalence is become the plane tissue being in sustained height with reference planes, greatly reduce the illuminance data acquisition errors because height disunity brings.Use digital micromirror device accurately to control light output, the illuminance that each point in complex organization surface is received is easy to adjustment, improves projection efficiency and the projection precision of light.
Accompanying drawing explanation
Fig. 1 is digital micromirror device internal structural map
Fig. 2 is the structural drawing of a pixel micromirrors module in digital micromirror device
Fig. 3 is the spatial frequency domain imaging system structural drawing obtaining function with profile
Specific implementation
Fig. 1 is the internal structural map of digital micromirror device, and its Inner Constitution is 912*1140 pixel micromirrors module (1), and the surface area of each pixel micromirrors module is 7.56*7.56um
2, a pixel micromirrors module represents a pixel, and the image of output is made up of these pixels exactly.Digital micromirror device represents the gray shade scale electrical signal data of brightness accordingly by receiving, control all pixel micromirrors modules and carry out light output.Here electrical signal data is resolution 912*1140,2
nthe gray scale picture (2) of gray shade scale, uses programming software to generate by computing machine.Be loaded on the circuit board of digital micromirror device by the gray scale picture of generation, with the gray-scale value of its corresponding pixel points in each pixel micromirrors module identifiable design gray scale picture, when having light to project pixel micromirrors Modular surface, its illuminance exported is directly proportional to gray-scale value.Thus, when on laser light source projects to digital micromirror device, the gray scale picture of the image that digital micromirror device exports and input is completely the same, maintain the light distribution that gray scale picture is all, this to input the mode that required gray scale picture controls output image, the accurate modulation to complex organization's surface single-point illuminance and correction can be completed.
Fig. 2 is the structural representation of a pixel micromirrors module in digital micromirror device, and a pixel micromirrors module is made up of pixel micromirrors (3), the pillar (4) supporting micro mirror, mirror holder (7), electrode one (5) and electrode two (6).Between pixel micromirrors and mirror holder, remove part organic sacrificing layer by plasma etching and generate clearance, mirror holder is integrated on chip.The material of pixel micromirrors is aluminium alloy, and electrode one and electrode two can change himself voltage under the driving of electrical signal data, and produce electrostatic attraction between pixel micromirrors.Different according to the position of electrostatic attraction, pixel micromirrors can produce the deflection angle in two kinds of directions.When pixel micromirrors is subject to the electrostatic attraction of electrode one, produce the deflection angle with horizontal direction+10 °, now pixel micromirrors can reflected incident light on objective body; When pixel micromirrors is subject to the electrostatic attraction of electrode two, produce the deflection angle with horizontal direction-10 °, by absorption bundle of planes absorbing incident light, cannot by reflected incident light on objective body.Inner at digital micromirror device, each pixel micromirrors module identifies the gray-scale value with its corresponding pixel points in inputted gray scale picture automatically, the time (dutycycle) of control electrode one maintenance per second+10 ° of deflection angles, when having light to project digital micromirror device, just can launch the image consistent with input gray level picture.
Fig. 3 is based on the spatial frequency domain imaging system structural drawing obtaining function with profile of the present invention, and it is made up of LASER Light Source (8), digital micromirror device (9), CCD camera (12), computing machine (13), diffuse reflector (11) five part.The collection area of the projected area of digital micromirror device and CCD camera overlaps, and the aperture diaphragm of CCD camera and digital micromirror device are in same level height, and the diffuse reflectance of diffuse reflector is 97%.In figure 3, the specific implementation of complex organization surface illuminance collection is:
1. pass through computer programming Software Create one with the gray scale picture (14) of modulating frequency, be loaded into digital micromirror device.By laser light source projects to digital micromirror device surface, the light that digital micromirror device is launched is the electroencephalogram with certain space frequency.Choose diffuse reflector surface and carry out system calibrating as a reference plane, electroencephalogram is projected respectively reference planes and complex organization surface (10), now reference planes are not identical with the illuminance of complex organization surface corresponding point, only have the intensity of illumination distribution of reference planes to obey Sine distribution rule.Gathered the intensity of illumination distribution image of reference planes and complex organization surface respectively by CCD camera, the change of phase differential in the image collected for twice before and after computer recognizing, the height difference that can obtain complex organization surface and reference planes is distributed as:
D is the distance of digital micromirror device and CCD camera aperture diaphragm, and l is the height that digital micromirror device arrives reference planes,
collect the phase difference value in two width images before and after expression CCD camera for twice, f is the spatial frequency of electroencephalogram, x and y denotation coordination, can obtain the three-dimensional height map of complex organization surface according to the method;
2. according to inverse square law, the square distance of illuminance and pointolite is inversely proportional to.Digital micromirror device, as secondary souce, because its size is less, thus can be used as pointolite.Relative to reference planes, complex organization body distance digital micromirror device is comparatively near, and the beam intensity ratio that its surface receives is comparatively strong, in order to make the intensity of illumination distribution projecting complex organization surface meet Sine distribution rule, need to step 1. in gray scale picture make an amendment.
The grey value profile supposing the gray scale picture 1. in step is G
0(x, y).Because complex organization's body distance digital micromirror device is comparatively near, the picture that gray-scale value is lower should be used.According to inverse square law, gray scale picture gray-scale value G (x, the y) distribution that complex organization's body projection electroencephalogram uses be should be:
G(x,y)＝[G
0(x,y)×(l-h(x,y))
2]/l
2
L and h (x, y) is known, is respectively digital micromirror device 1. and distributes to the height of the Distance geometry complex organization surface of reference planes.Amended picture is loaded on the circuit board of digital micromirror device, during to complex organization's body projection Sine Modulated light, use amended grey value profile for G (x, the output image of gray scale picture control figure micro mirror device y), the intensity of illumination distribution that for this reason can realize complex organization surface obeys the object of Sine distribution rule.
3., after CCD camera has gathered the illuminance of complex organization surface, need to revise collecting intensity of illumination distribution image.According to the feature of lambert surface diffuse reflection model, the light intensity sent from complex organization surface be inversely proportional to distance square.The pixel value supposing the illuminance image of the complex organization surface that CCD camera collects is A
0(x, y), then revised pixel value A (x, y) is:
A(x,y)＝[A
0(x,y)×(l-h(x,y)
2)]/l
2
L and h (x, y) is known, is respectively digital micromirror device 1. and distributes to the height of the Distance geometry complex organization surface of reference planes, utilizes above-mentioned three steps can complete collection to complex organization's surface illuminance in spatial frequency domain imaging.
Claims (1)
1. the acquisition method of complex organization's surface illuminance in a spatial frequency domain imaging, use the spatial frequency domain imaging system obtaining function with profile, comprise LASER Light Source (8), digital micromirror device (9), CCD camera (12), computing machine (13), diffuse reflector (11) five parts, the projected area of digital micromirror device and the collection area of CCD camera overlap, and the aperture diaphragm of CCD camera and digital micromirror device are in same level height, the acquisition method of complex organization's surface illuminance is:
1. a gray scale picture with modulating frequency is generated, be loaded into digital micromirror device, by laser light source projects to digital micromirror device surface, the light that digital micromirror device is launched is the electroencephalogram with certain space frequency, choose diffuse reflector surface and carry out system calibrating as a reference plane, electroencephalogram is projected respectively reference planes and complex organization surface; The intensity of illumination distribution image of reference planes and complex organization surface is gathered respectively by CCD camera, the change of phase differential in the image collected for twice before and after computer recognizing, the height difference that can obtain complex organization surface and reference planes distributes, thus obtains the three-dimensional height map of complex organization surface.
The three-dimensional height map of the complex organization surface 2. 1. obtained according to step, modify steps 1. in grey value profile in gray scale picture.Amended gray scale picture is loaded into digital micromirror device light output is carried out to complex organization's body, make the intensity of illumination distribution of complex organization surface meet Sine distribution rule, gathered the intensity of illumination distribution image of complex organization surface by CCD camera.
3. according to the feature of lambert surface diffuse reflection model, the light intensity sent from complex organization surface be inversely proportional to distance square, the intensity of illumination distribution image of the complex organization surface that CCD camera collects is revised.
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Cited By (6)
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| CN106950196A (en) * | 2017-03-20 | 2017-07-14 | 浙江大学 | A kind of method and apparatus of Non-Destructive Testing agricultural product optical property parameter |
| CN107607040A (en) * | 2017-08-11 | 2018-01-19 | 天津大学 | A kind of three-dimensional scanning measurement device and method suitable for High Reflective Surface |
| CN109682814A (en) * | 2019-01-02 | 2019-04-26 | 华中农业大学 | A method of with organizer's surface illuminance in the amendment spatial frequency domain imaging of TOF depth camera |
| CN114018819A (en) * | 2021-03-22 | 2022-02-08 | 北京航空航天大学 | Optical characteristic measuring method, device and system based on space frequency domain imaging |
| CN114354599A (en) * | 2021-12-15 | 2022-04-15 | 江苏大学 | Portable crop early disease detection device and method based on spatial frequency domain imaging |
| US11861897B2 (en) | 2021-12-15 | 2024-01-02 | Jiangsu University | Portable apparatus for detecting early crop diseases based on spatial frequency domain imaging and detection method using same |
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| CN114018819A (en) * | 2021-03-22 | 2022-02-08 | 北京航空航天大学 | Optical characteristic measuring method, device and system based on space frequency domain imaging |
| CN114354599A (en) * | 2021-12-15 | 2022-04-15 | 江苏大学 | Portable crop early disease detection device and method based on spatial frequency domain imaging |
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| CN114354599B (en) * | 2021-12-15 | 2024-01-05 | 江苏大学 | Device and method for portable detection of early crop diseases based on space frequency domain imaging |
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