CN105225697B - The method of analog voltage measurement and adjusting based on memory test instrument - Google Patents
The method of analog voltage measurement and adjusting based on memory test instrument Download PDFInfo
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- CN105225697B CN105225697B CN201510694983.8A CN201510694983A CN105225697B CN 105225697 B CN105225697 B CN 105225697B CN 201510694983 A CN201510694983 A CN 201510694983A CN 105225697 B CN105225697 B CN 105225697B
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Abstract
The present invention provides the methods of a kind of analog voltage measurement based on memory test instrument and adjusting, comprising: the output port of analog voltage is connected to the test input mouth of memory test instrument as the output of memory；The target zone that the first comparison voltage and the second comparison voltage are adjusted as analog voltage is set in memory test instrument；So that the output port of analog voltage exports multiple analog voltages, and memory test instrument is sequentially input in order, to read that the analog voltage of input measures in memory test instrument as a result, and the result of reading is stored in predetermined document；Taken out in the predetermined document reading as a result, finding out reading 0 and reading analog voltage input range corresponding to the result that 1 all fails；Intermediate voltage value in analog voltage input range is selected as best test voltage value.
Description
Technical field
The present invention relates to semiconductor test field, it is more particularly related to a kind of based on memory test instrument
The method of analog voltage measurement and adjusting.
Background technique
In order to reduce influence of the technique change to circuit performances such as flash memories, more and more analog voltages need to modify
(trimming), that is, it measures and adjusts.In order to reduce embedded flash memory body (EFlash) testing cost, increasingly with survey number
It is more, and the measurement of analog voltage can only be executed sequentially.
Moreover, test trend is, the measurement of analog circuit and adjusting specific gravity of shared cost in testing process are more next
It is higher.So the time for reducing analog voltage measurement and adjusting is imperative in order to control testing cost.
Summary of the invention
The technical problem to be solved by the present invention is to for drawbacks described above exists in the prior art, providing one kind be can reduce
The method of the analog voltage measurement based on memory test instrument and adjusting of the time of analog voltage measurement and adjusting.
In order to achieve the above technical purposes, according to the present invention, a kind of analog voltage based on memory test instrument is provided
Measurement and the method adjusted, comprising: the output port of analog voltage is connected to memory test instrument as the output of memory
Test input mouth；The first comparison voltage and the second comparison voltage is set in memory test instrument to adjust as analog voltage
Target zone；So that the output port of analog voltage exports multiple analog voltages, and memory is sequentially input in order
Tester, to read that the analog voltage of input measures in memory test instrument as a result, and being stored in the result of reading
Predetermined document；Taken out in the predetermined document reading as a result, finding out reading 0 and reading mould corresponding to the result that 1 all fails
Quasi- voltage value input range；Intermediate voltage value in analog voltage input range is selected as best test voltage value.
Preferably, the first comparison voltage is greater than the second comparison voltage.
Preferably, memory test instrument exports result 1 when the analog voltage of input is greater than the first comparison voltage.
Preferably, memory test instrument exports result 0 when the analog voltage of input is less than the second comparison voltage.
Preferably, memory test instrument is less than the first comparison voltage and electric greater than the second comparison in the analog voltage of input
Output reads 0 and reads 1 result all to fail when pressure.
It preferably, is in order sequence from low to high
It preferably, is in order sequence from low to high.
Preferably, the voltage difference between the two neighboring analog voltage in the multiple analog voltage is equal.
The method of analog voltage measurement and adjusting according to the preferred embodiment of the invention based on memory test instrument can
The complicated precision measurement unit of substitution measures handle, and complicated measurement movement becomes simple functional test；And it can be effectively
Reduce for about 90% or more testing time.
Detailed description of the invention
In conjunction with attached drawing, and by reference to following detailed description, it will more easily have more complete understanding to the present invention
And its adjoint advantage and feature is more easily to understand, in which:
Fig. 1 schematically shows the analog voltage measurement according to the preferred embodiment of the invention based on memory test instrument
With the flow chart of the method for adjusting.
Fig. 2 schematically shows the analog voltage measurements according to the preferred embodiment of the invention based on memory test instrument
With the schematic diagram of the method for adjusting.
It should be noted that attached drawing is not intended to limit the present invention for illustrating the present invention.Note that indicating that the attached drawing of structure can
It can be not necessarily drawn to scale.Also, in attached drawing, same or similar element indicates same or similar label.
Specific embodiment
In order to keep the contents of the present invention more clear and understandable, combined with specific embodiments below with attached drawing in of the invention
Appearance is described in detail.
Fig. 1 schematically shows the analog voltage measurement according to the preferred embodiment of the invention based on memory test instrument
With the flow chart of the method for adjusting, memory test instrument is based on Fig. 2 schematically shows according to the preferred embodiment of the invention
Analog voltage measurement and adjusting method schematic diagram.
As depicted in figs. 1 and 2, the analog voltage measurement according to the preferred embodiment of the invention based on memory test instrument and
The method of adjusting includes:
First step S1: the output port of analog voltage is connected to the survey of memory test instrument as the output of memory
Try input port；
Second step S2: the first comparison voltage VOH and the second comparison voltage VOL are set in memory test instrument as mould
The target zone that quasi- voltage is adjusted；Wherein, the first comparison voltage VOH is greater than the second comparison voltage VOL.
Third step S3: so that the output port of analog voltage exports multiple analog voltages, and in order (for example,
Sequence from low to high or sequence from low to high) memory test instrument is sequentially input, to read the analog voltage of input
The result (reading 0 or 1) measured in memory test instrument, and the result of reading is stored in predetermined document；Preferably, described more
The voltage difference between two neighboring analog voltage in a analog voltage is equal.
Specifically, memory test instrument exports result 1 when the analog voltage of input is greater than the first comparison voltage VOH.
Memory test instrument exports result 0 when the analog voltage of input is less than the second comparison voltage VOL.Memory test instrument is defeated
The analog voltage entered less than the first comparison voltage VOH and be greater than the second comparison voltage VOL when output read 0 and read 1 all fail
As a result.
Four steps S4: taken out in the predetermined document reading as a result, finding out reading 0 and reading 1 result all to fail
Corresponding analog voltage input range；
5th step S5: the intermediate voltage value in analog voltage input range is selected as best test voltage value.
The measurement and adjusting of subsequent analog circuit can use the best test voltage value as a result,.
Specifically, as shown in Fig. 2, preceding 6 gears are all to read 0 by (P), rear 5 gears are all to read 1 by (P)；Gear
6,7,8,9,10 target zone in analog voltage reads 0 reading 1 and all fails (F), then intervening gears 8 are best gear.
The method of analog voltage measurement and adjusting according to the preferred embodiment of the invention based on memory test instrument is at least
With following advantages:
(1) complicated PMU (Precision Measurement Unit, precision measurement unit) measurement can be substituted；
(2) complicated measurement movement is become simple functional test；
(3) it can be effectively reduced for about 90% or more testing time.
In addition, it should be noted that, unless stated otherwise or point out, the otherwise term " first " in specification, "
Two ", the descriptions such as " third " are used only for distinguishing various components, element, the step etc. in specification, each without being intended to indicate that
Component, element, the logical relation between step or ordinal relation etc..
It is understood that although the present invention has been disclosed in the preferred embodiments as above, above-described embodiment not to
Limit the present invention.For any person skilled in the art, without departing from the scope of the technical proposal of the invention,
Many possible changes and modifications all are made to technical solution of the present invention using the technology contents of the disclosure above, or are revised as
With the equivalent embodiment of variation.Therefore, anything that does not depart from the technical scheme of the invention are right according to the technical essence of the invention
Any simple modifications, equivalents, and modifications made for any of the above embodiments still fall within the range of technical solution of the present invention protection
It is interior.
Claims (4)
1. a kind of method of analog voltage measurement and adjusting based on memory test instrument, characterized by comprising:
The output port of analog voltage is connected to the test input mouth of memory test instrument as the output of memory；
The target zone that the first comparison voltage and the second comparison voltage are adjusted as analog voltage is set in memory test instrument,
Wherein the first comparison voltage is greater than the second comparison voltage；
So that the output port of analog voltage exports multiple analog voltages, and memory test instrument is sequentially input in order,
To read that the analog voltage of input measures in memory test instrument as a result, and the result of reading is stored in predetermined text
Shelves；
Taken out in the predetermined document reading as a result, finding out reading 0 and reading analog voltage corresponding to the result that 1 all fails
It is worth input range, wherein memory test instrument exports result 1 when the analog voltage of input is greater than the first comparison voltage, deposits
Reservoir tester exports result 0 when the analog voltage of input is less than the second comparison voltage, and memory test instrument is in input
Analog voltage exports reading 0 less than the first comparison voltage and when being greater than the second comparison voltage and reads 1 result all to fail；
Intermediate voltage value in analog voltage input range is selected as best test voltage value.
2. the method for the analog voltage measurement and adjusting according to claim 1 based on memory test instrument, feature exist
In being in order sequence from low to high.
3. the method for the analog voltage measurement and adjusting according to claim 1 based on memory test instrument, feature exist
In being in order sequence from low to high.
4. the method for the analog voltage measurement and adjusting according to claim 1 based on memory test instrument, feature exist
In the voltage difference between two neighboring analog voltage in the multiple analog voltage is equal.
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| CN201510694983.8A CN105225697B (en) | 2015-10-22 | 2015-10-22 | The method of analog voltage measurement and adjusting based on memory test instrument |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102638263A (en) * | 2012-04-24 | 2012-08-15 | 上海宏力半导体制造有限公司 | Testing device and corresponding testing method |
| CN103943050A (en) * | 2013-01-17 | 2014-07-23 | 瑞鼎科技股份有限公司 | Driving circuit with built-in self-test function |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8558726B2 (en) * | 2011-12-29 | 2013-10-15 | Stmicroelectronics Asia Pacific Pte. Ltd. | Testing of analog-to-digital converters |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102638263A (en) * | 2012-04-24 | 2012-08-15 | 上海宏力半导体制造有限公司 | Testing device and corresponding testing method |
| CN103943050A (en) * | 2013-01-17 | 2014-07-23 | 瑞鼎科技股份有限公司 | Driving circuit with built-in self-test function |
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