CN105044114B - A kind of electrolytic capacitor appearance packaging defect image detecting system and method - Google Patents
A kind of electrolytic capacitor appearance packaging defect image detecting system and method Download PDFInfo
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Abstract
The present invention discloses a kind of electrolytic capacitor appearance packaging defect image detecting system, including feed well unit, upper surface image collecting unit, lower surface image collecting unit, side surface image acquisition units, central processor unit, display unit and substandard product culling unit；The feed well unit presses tooth to capacitance into between-line spacing feeding by vibrating disk, the outlet of vibrating disk is feed well, vibrating disk is the concavity disk that a people has helix, feed well is the transmission transparent cell that two rectangular slabs limit, it is driven among transparent cell and is equipped with electrolytic capacitor detection station, electrolytic capacitor pin is inserted in transparent cell lower end；Transparent cell is set there are three station, and three directional images to electrolytic capacitor collected using upper surface image acquisition, side surface Image Acquisition and lower surface image carry out image procossing, identify the defective unqualified production of appearance.
Description
Technical field
The present invention relates to a kind of electrolytic capacitor appearance packaging defect inspection methods, are based especially on the electricity of Digital Image Processing
Solve capacitance appearance packaging defect detecting system and detection method.
Background technology
Judge currently, also relying on artificial visual for the fault detection of electrolytic capacitor outer packaging, i.e., is seen by human eye
Examine whether capacitance plastics package circular edge upper and lower surfaces of is regular, whether bound edge is aligned with capacitance edge, there whether have to be outstanding
Edge breakage, whether the positive and negative anodes character position of capacitive surface is correct, whether positive and negative anodes symbol is corresponding with the length pin of capacitance
Unanimously, whether type information prints the defects of correct.Artificial to detect that there is labour demands one by one big, speed is slow, efficiency is low
Under problem, drastically influence the productivity and economic benefit of enterprise.
Invention content
In view of the above technical problems, purpose of the present invention is to provide a kind of simple in structure, can replace manually-operated capacitance
Appearance packaging defect automatic checkout system and method improve detection efficiency.
The present invention solves above-mentioned technical problem and uses following technical scheme：A kind of electrolytic capacitor appearance packaging defect image inspection
Examining system, it is characterized in that including feed well unit, light source Unit one, upper surface image collecting unit, optoelectronic switch Unit one, light
Unit two, source, lower surface image collecting unit, light source Unit three, optoelectronic switch Unit three, side surface image acquisition units, center
Processor unit, display unit and substandard product culling unit；The feed well unit by vibrating disk press tooth to capacitance into
The outlet of between-line spacing feeding, vibrating disk is feed well 1-2, and vibrating disk is the concavity disk that a people has helix, feed well two
The transmission transparent cell that rectangular slab limits is equipped with 5 detection station of electrolytic capacitor among transmission transparent cell, and 6 pin of electrolytic capacitor is inserted
In transparent cell lower end；It is set on transparent cell there are three station, light source Unit one is located at the upper surface image collecting unit 2 of station one
Surface provides light for upper surface image collecting unit, and upper surface image collecting unit is detected in optoelectronic switch Unit one
Appearance images acquisition is carried out to the upper surface of capacitance after capacitance；Light source Unit two is located at the lower surface image acquisition positioned at station two
The underface of unit 3 provides light for lower surface image collecting unit, and lower surface image collecting unit is in optoelectronic switch Unit two
Appearance images acquisition is carried out to the lower surface of capacitance after detecting electrolytic capacitor；Light source Unit three is located at the side surface figure of station three
As the side of collecting unit, light is provided for side surface image acquisition units, side surface image acquisition units are in optoelectronic switch three
Unit carries out appearance images continuous acquisition after detecting capacitance to the side surface of capacitance, and station San Tong method is rotary work station, rotation
Station 1-3 drives pin that capacitance is made to rotate a circle, and optoelectronic switch Unit three, which detects, triggers rotation when capacitance enters station three, i.e.,
Stepper motor swivel plate band dynamic condenser on feed well on station rotates a circle.Central processor unit input terminal receives image
Signal is used for carrying out analyzing processing, the display unit display acquisition image of central processor unit connection to the three-view drawing picture of acquisition
And handling result, substandard product culling unit will detect that the defective substandard product of appearance packaging is rejected.
Further, upper and lower surface image carry out respectively coloured image gray processing, image denoising, image enhancement, region segmentation,
Image normalization, defects detection；Side image carries out coloured image gray processing, image denoising, image enhancement, image and spells respectively
It connects, region segmentation, image normalization, defects detection；The cromogram that the coloured image gray processing is used for obtaining in video camera
As being converted into gray level image, the image denoising is used for carrying out noise remove to gray level image, and the image enhancement is used for
Contrast enhancing is carried out to image, the region segmentation is used for being partitioned into area to be tested, and the image normalization is used for
The normalizeds such as rotated, cut and scaled to image to be detected, the defects detection is used for returning to be detected
One changes image and existing standard normalized image template carries out defect recognition, and the image mosaic is used for rotating a circle
Capacitance acquires image mosaic into the complete side image of a width；
It is as follows：
Step 001. optoelectronic switch one detects capacitance, triggers upper surface image collecting unit camera captures images；
Upper surface coloured image is converted into gray level image by step 002.；
Step 003. is filtered removal picture noise to upper surface gray level image；
Step 004. carries out image enhancement to enhance the contrast of image to the upper surface gray level image after denoising；
Step 005. carries out region segmentation to enhanced upper surface image, specifically includes below step：
Step 0051. carries out edge detection to enhanced upper surface image using sobel edge detection operators；
Step 0052. utilizes hough change detection capacitances upper surface appearance edge circular curve to upper surface image edge；
Step 0053. label connection capacitance appearance edge circular curve region, the upper surface area to be detected divided
Domain；
Step 006. particularly, if having character mark information in the packaging of upper surface, also needs to carry out character mark detection, including
Following steps：
The upper surface area to be tested that step 0061. obtains segmentation does horizontally or vertically Gray Projection, is partitioned into capacitance
The specification information region of upper surface appearance；
Step 0062. utilizes straight line where the upper left corner in the specification information area to be tested image of upper surface and lower left corner pixel
The angle for deviateing vertical direction rotates to vertical direction the upper surface area to be tested that step 0053 obtains；Wherein upper left
Angle pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, to find from bottom to up
First pixel.
Cut zone image is normalized in step 007., specifically includes below step：
Step 0071. is each up and down at the edge of the circle to the upper surface area to be tested image cropping of rotation to vertical direction
The square-shaped image of 5 pixels；It is to carry out software rotation to any direction image photographed to be allowed to and standard form image
Orientation is consistent, and specific rotation angle is shown in step 0062, cutting be also intended to it is consistent with standard form, in order not to lose any letter
Breath, does small range expansion.
Step 0072. to the upper surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 008. is by the standard upper table face die plate in normalized upper surface area to be tested image and image data base
Image (its acquisition process is also through step 001-007) carries out XOR operation, and the judgement that operation result is more than threshold value is upper surface
It is unqualified.
Step 009. optoelectronic switch two detects capacitance, triggers lower surface image collecting unit camera captures images；
Lower surface coloured image is converted into gray level image by step 0010.；
Step 0011. is filtered removal picture noise to lower surface gray level image；
Step 0012. carries out image enhancement to enhance the contrast of image to the lower surface gray level image after denoising；
Step 0013. carries out region segmentation to enhanced lower surface image, specifically includes below step：
Step 00131. carries out edge detection to enhanced lower surface image using sobel edge detection operators；
Step 00132. utilizes hough change detection capacitances lower surface appearance edge circular curve to lower surface image edge；
Step 00133. label connection capacitance appearance edge circular curve region, the lower surface area to be tested divided, here
Label be the meaning that image processing field software outlines round edge circle with rectangle frame；
Step 0014. particularly, if having character mark information in the packaging of lower surface, also need to carry out character mark detection (
Can be used as center or the edge flag in region), which is characterized in that include the following steps：
The lower surface area to be tested that step 00141. obtains segmentation does horizontally or vertically Gray Projection, is partitioned into capacitance
The specification information region of lower surface appearance；
Step 00142. is straight using the upper left corner in the specification information area to be tested image of lower surface and lower left corner pixel place
The angle that line deviates vertical direction rotates to vertical direction the lower surface area to be tested that step 00133 obtains；Wherein
Top left corner pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, from bottom to up
First pixel found.
Cut zone image is normalized in step 0015., specifically includes below step：
Step 00151. to rotate to vertical direction lower surface area to be tested image cropping at the edge of the circle up and down
The square-shaped image of each 5 pixels；
Step 00152. to the lower surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 0016. is by the standard following table face die plate in normalized lower surface area to be tested image and image data base
Image (its acquisition process is also through step 009-0015) carries out XOR operation, and the judgement that operation result is more than threshold value is lower surface
It is unqualified.
Step 0017. optoelectronic switch three detects capacitance, triggers side surface image acquisition units camera captures images, simultaneously
Swivel plate band dynamic condenser on triggering feed well rotates a circle；
Multiple side surface coloured images are converted into gray level image by step 0018.；
Step 0019. is filtered removal picture noise respectively to multiple side surface gray level images；
Step 0020. carries out image enhancement to enhance the comparison of image respectively to multiple side surface gray level images after denoising
Degree；
Step 0021. carries out image mosaic to enhanced multiple side surface images, specifically includes following steps：
Step 00211. extracts characteristic point respectively in the left and right ends of enhanced multiple side images；
Step 00212. carries out homotopy mapping to the characteristic point that left and right ends extract；
Step 00213. carries out image co-registration according to match point, obtains spliced whole picture side image.
The whole picture side image that step 0022. obtains splicing does horizontally or vertically Gray Projection, is partitioned into capacitive side table
The specification information region of face appearance；
Step 0023. utilizes straight line where the upper left corner in the specification information area to be tested image of side surface and lower left corner pixel
The angle contralateral surface area to be tested for deviateing vertical direction is rotated to vertical direction；Wherein top left corner pixel be from a left side to
The right side, first pixel found from top to bottom, lower left corner pixel are first pixels found from bottom to up from left to right
Point.
Cut zone image is normalized in step 0024., specifically includes below step：
Step 00241. to rotate to vertical direction side surface area to be tested image cropping at away from edge up and down
The square-shaped image of each 5 pixels；
Step 00242. to the side surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 0025. is by the standard side surface template in normalized side surface area to be tested image and image data base
Image (its acquisition process is also through step 0017-0024) carries out XOR operation, and the judgement that operation result is more than threshold value is following table
Face is unqualified.
Standard upper surface template image is to handle to generate using step 001~007 by qualified products to get, under standard
Surface template image is to handle to generate using step 009~0015 by qualified products to get, and standard Side shuttering image is by closing
Lattice product is handled to generate using step 0017~0024 and be got.
The long pin direction of capacitance that the optoelectronic switch detects can be positive in appearance images in conjunction with being used for differentiating
Symbol direction.
The display unit whole can show vision inspection process.
Substandard product can be added as needed on to pick by defect classification display unit display function and different defect classifications
The device removed.
The picture number for carrying out image mosaic is chosen according to the visual field of side surface collecting unit camera.The image enhancement
For carrying out contrast enhancing to image, the region segmentation is used for being partitioned into area to be tested, the image normalization
For the normalizeds such as image to be detected being rotated, being cut and being scaled, the defects detection is used for to be detected
Normalized image and existing standard normalized image template carry out defect recognition, the image mosaic is used for rotation one
The capacitance in week acquires image mosaic into the complete side image of a width.
The invention has the advantages that a kind of electrolytic capacitor appearance packaging defect image detecting system of present invention proposition and side
Method has following advantageous effects using above technical scheme compared with existing manual manipulative techniques：For the first time outside capacitance
It sees in detection and applies, can realize whether the upper and lower surfactant package edge packed to capacitor packages and side type information are deposited
Defect or mistake situations such as automation, intellectualized detection, detection process algorithm is effective, and speed is fast, verification and measurement ratio height etc.
Advantage.
(1) a kind of electrolytic capacitor appearance packaging defect image detecting system that the present invention designs, simple in structure, at low cost,
It realizes and is easy, is multiple functional, can realize the automatic detection of capacitance appearance packaging defect, effectively increase detection efficiency.
(2) a kind of electrolytic capacitor appearance packaging defect image detection method for designing of the present invention, be particular for capacitance outside
It sees detection feature and is designed, algorithm is effective, and under the conditions of not increasing the complexity of algorithm, discrimination is high, operation
Speed is fast, and reliability is high.
Description of the drawings
Fig. 1 is the functional block diagram of electrolytic capacitor appearance packaging defect image detecting system of the present invention；
Fig. 2 is electrolytic capacitor appearance packaging defect image detection method functional block diagram of the present invention；
Fig. 3 is operating diagram.
Specific implementation mode
Specific embodiments of the present invention will be described in further detail with reference to the accompanying drawings of the specification.
As shown in Figure 1,3, the present invention devises a kind of electrolytic capacitor appearance packaging defect image detecting system, including charging
Slot unit 1, light source Unit one, upper surface image collecting unit 3, optoelectronic switch Unit one, light source Unit two, lower surface image are adopted
Collect unit 4, light source Unit three, optoelectronic switch Unit three, side surface image acquisition units 5, central processor unit, display unit
With substandard product culling unit.The feed well unit presses tooth to capacitance into between-line spacing feeding, vibrating disk by vibrating disk 1-1
Outlet be feed well 1-2, vibrating disk be a people have helix concavity disk, can by electrolytic capacitor automatically line up electrolysis electricity
Hold the downward arrangement of pin, feed well is the transparent cell that two rectangular slabs limit, and electrolytic capacitor 5, electrolysis are placed among transparent cell
6 pin of capacitance is inserted in transparent cell lower end；It is set on transparent cell there are three station, light source Unit one is located at the upper surface image of station one
The surface of collecting unit 2 provides light for upper surface image collecting unit, and upper surface image collecting unit is in optoelectronic switch one
Unit carries out appearance images acquisition after detecting capacitance to the upper surface of capacitance；Light source Unit two is located at the following table positioned at station two
The underface of face image acquisition units 3 provides light for lower surface image collecting unit, and lower surface image collecting unit is in photoelectricity
Switch Unit two carries out appearance images acquisition after detecting electrolytic capacitor to the lower surface of capacitance；Light source Unit three is located at station three
Side surface image acquisition units side, provide light for side surface image acquisition units, side surface image acquisition units exist
Optoelectronic switch Unit three carries out appearance images continuous acquisition after detecting capacitance to the side surface of capacitance, and station San Tong method is rotation
Station, rotary work station 1-3 drive pin that capacitance is made to rotate a circle, and optoelectronic switch Unit three is detected and touched when capacitance enters station three
Tuorbillion turns, i.e., the stepper motor swivel plate band dynamic condenser on feed well on station rotates a circle.Central processor unit input terminal
It receives picture signal to be used for carrying out analyzing processing to the three-view drawing picture of acquisition, the display unit of central processor unit connection is shown
Acquisition image and handling result, substandard product culling unit will detect that the defective substandard product of appearance packaging is picked
It removes.There are two electrolytic capacitors to export for feed well unit tool, and one is in the outlet of electrolytic capacitor certified products, another goes out for defective work
Mouthful, defendant in feed well cell transparent slot is judged that underproof product is allocated to another frame equipped with a manipulator.
Central processor unit is used for carrying out analyzing processing to the three-view drawing picture of acquisition, display unit display acquisition image and
Handling result, substandard product culling unit will detect that the defective substandard product of appearance packaging is rejected.
As shown in Fig. 2, a kind of electrolytic capacitor appearance packaging defect image detection method utilizes upper surface image acquisition, side table
Three directional images that face Image Acquisition and lower surface image collect carry out image procossing, identify that appearance is defective and do not conform to
Lattice product.It is characterized in that, upper and lower surface image carries out coloured image gray processing, image denoising (linear filtering method, intermediate value respectively
Filter method, Wiener Filter Method, Fourier transformation and wavelet transformation), (such as histogram, low-pass filter, histogram are equal for image enhancement
The methods of weighing apparatusization), region segmentation, image normalization (Normalized Grey Level combined method), defects detection.Side image carries out coloured silk respectively
Color image gray processing, image denoising, image enhancement, image mosaic, region segmentation, image normalization, defects detection.Described
Coloured image gray processing is used for the coloured image that video camera obtains being converted into gray level image, and the image denoising is used for ash
It spends image and carries out noise remove, the image enhancement is used for carrying out contrast enhancing to image, and the region segmentation is used for
It is partitioned into area to be tested, the image normalization is used for the normalizings such as being rotated, cut and scaled to image to be detected
Change is handled, and the defects detection is used for lacking normalized image to be detected and existing standard normalized image template
Identification is fallen into, the image mosaic is used for acquiring image mosaic into the complete side image of a width to the capacitance to rotate a circle.Tool
Steps are as follows for body：
Step 001. optoelectronic switch one detects capacitance, triggers upper surface image collecting unit camera captures images；
Upper surface coloured image is converted into gray level image by step 002.；
Step 003. is filtered removal picture noise to upper surface gray level image；
Step 004. carries out image enhancement to enhance the contrast of image to the upper surface gray level image after denoising；
Step 005. carries out region segmentation to enhanced upper surface image, specifically includes below step：
Step 0051. carries out edge detection to enhanced upper surface image using sobel edge detection operators；
Step 0052. is to top surface edge imagery exploitation hough change detection capacitances upper surface appearance edge circular curve；
Step 0053. label connection capacitance appearance edge circular curve region, the upper surface area to be detected divided
Domain；
Step 006. particularly, if having character mark information in the packaging of upper surface, also needs to carry out character mark detection, special
Sign is, includes the following steps：
The upper surface area to be tested that step 0061. obtains segmentation does horizontally or vertically Gray Projection, is partitioned into capacitance
The specification information region of upper surface appearance；
Step 0062. utilizes straight line where the upper left corner in the specification information area to be tested image of upper surface and lower left corner pixel
The angle for deviateing vertical direction rotates to vertical direction the upper surface area to be tested that step 0053 obtains；Wherein upper left
Angle pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, to find from bottom to up
First pixel.
Cut zone image is normalized in step 007., specifically includes below step：
Step 0071. is each up and down at the edge of the circle to the upper surface area to be tested image cropping of rotation to vertical direction
The square-shaped image of 5 pixels；
Step 0072. to the upper surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 008. is by the standard upper table face die plate in normalized upper surface area to be tested image and image data base
Image (its acquisition process is also through step 001-007) carries out XOR operation, and the judgement that operation result is more than threshold value is upper surface
It is unqualified.
Step 009. optoelectronic switch two detects capacitance, triggers lower surface image collecting unit camera captures images；
Lower surface coloured image is converted into gray level image by step 0010.；
Step 0011. is filtered removal picture noise to lower surface gray level image；
Step 0012. carries out image enhancement to enhance the contrast of image to the lower surface gray level image after denoising；
Step 0013. carries out region segmentation to enhanced lower surface image, specifically includes below step：
Step 00131. carries out edge detection to enhanced lower surface image using sobel edge detection operators；
Step 00132. is to lower surface edge imagery exploitation hough change detection capacitances lower surface appearance edge circular curve；
Step 00133. label connection capacitance appearance edge circular curve region, the lower surface area to be detected divided
Domain；
Step 0014. particularly, if having character mark information in the packaging of lower surface, also needs to carry out character mark detection,
It is characterized in that, includes the following steps：
The lower surface area to be tested that step 00141. obtains segmentation does horizontally or vertically Gray Projection, is partitioned into capacitance
The specification information region of lower surface appearance；
Step 00142. is straight using the upper left corner in the specification information area to be tested image of lower surface and lower left corner pixel place
The angle that line deviates vertical direction rotates to vertical direction the lower surface area to be tested that step 00133 obtains；Wherein
Top left corner pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, from bottom to up
First pixel found.
Cut zone image is normalized in step 0015., specifically includes below step：
Step 00151. to rotate to vertical direction lower surface area to be tested image cropping at the edge of the circle up and down
The square-shaped image of each 5 pixels；
Step 00152. to the lower surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 0016. is by the standard following table face die plate in normalized lower surface area to be tested image and image data base
Image (its acquisition process is also through step 009-0015) carries out XOR operation, and the judgement that operation result is more than threshold value is lower surface
It is unqualified.
Step 0017. optoelectronic switch three detects capacitance, triggers side surface image acquisition units camera captures images, simultaneously
Swivel plate band dynamic condenser on triggering feed well rotates a circle；
Multiple side surface coloured images are converted into gray level image by step 0018.；
Step 0019. is filtered removal picture noise respectively to multiple side surface gray level images；
Step 0020. carries out image enhancement to enhance the comparison of image respectively to multiple side surface gray level images after denoising
Degree；
Step 0021. carries out image mosaic to enhanced multiple side surface images, specifically includes following steps：
Step 00211. extracts characteristic point respectively in the left and right ends of enhanced multiple side images；
Step 00212. carries out homotopy mapping to the characteristic point that left and right ends extract；
Step 00213. carries out image co-registration according to match point, obtains spliced whole picture side image.
The whole picture side image that step 0022. obtains splicing does horizontally or vertically Gray Projection, is partitioned into capacitive side table
The specification information region of face appearance；
Step 0023. utilizes straight line where the upper left corner in the specification information area to be tested image of side surface and lower left corner pixel
The angle contralateral surface area to be tested for deviateing vertical direction is rotated to vertical direction；Wherein top left corner pixel be from a left side to
The right side, first pixel found from top to bottom, lower left corner pixel are first pixels found from bottom to up from left to right
Point.
Cut zone image is normalized in step 0024., specifically includes below step：
Step 00241. to rotate to vertical direction side surface area to be tested image cropping at away from edge up and down
The square-shaped image of each 5 pixels；
Step 00242. to the side surface area to be tested image scaling after cutting to size determined pixel point (such as 160 ×
160) regulation calibrates image；
Step 0025. is by the standard side surface template in normalized side surface area to be tested image and image data base
Image (its acquisition process is also through step 0017-0024) carries out XOR operation, and the judgement that operation result is more than threshold value is following table
Face is unqualified.
Further, a kind of electrolytic capacitor appearance packaging defect image detecting system and method that the present invention designs, it is described
Standard upper surface template image is to handle to generate using step 001~007 by qualified products to get, standard lower surface template image
It is to be handled using step 009~0015 by qualified products.
As a kind of optimal technical scheme, the long pin direction of capacitance that the optoelectronic switch detects can be in conjunction with use
To differentiate positive symbol direction in appearance images.
As a kind of optimal technical scheme, the display unit whole can show vision inspection process.
As a kind of optimal technical scheme, substandard product can be added as needed on and shown by defect classification display unit
The device that function and different defect classifications are rejected.
A kind of electrolytic capacitor appearance packaging defect image detection method that the present invention designs, as a kind of optimization technique side
Case chooses the picture number for carrying out image mosaic according to the visual field of side surface collecting unit camera.
A kind of electrolytic capacitor appearance packaging defect image detecting system and detection method that the present invention designs can replace passing
The lengthy and tedious detection operating process for artificial visual of uniting automatically determines electrolytic capacitor packaging external appearance and whether there is defect, and display is single
Member can entirely differentiate period fact with real-time display, can also (surface defect as above, side positive and negative anodes lack according to defect classification
Sunken, side model defect information and following table planar defect) classification rejecting.It is operated relative to traditional artificial detection, present invention design
System and method have that simple in structure, detection efficiency is high, differentiation rate is high, speed is fast, reliability is high, is easily achieved, and cost
The advantages of cheap, strong applicability.Typical product packaging quality is such as：The edge of plastic package is not aligned capacitance edge, plastics
The edge breakage of bound edge.
To sum up, the electrolytic capacitor appearance packaging defect of view-based access control model imaging device designed by establishing and implementing the present invention
Image detecting system and method, can realize to capacitor packages packaging on upper and lower surface packaging edge, side positive and negative anodes mark,
Side type information carries out high efficiency, effective automatic detection with the presence or absence of situations such as defect or mistake, has a vast market
Application prospect and economic value.
Embodiments of the present invention are explained in detail above in conjunction with attached drawing, but the present invention is not limited to above-mentioned implementations
Mode within the knowledge of a person skilled in the art can also be without departing from the purpose of the present invention
It makes a variety of changes.
Claims (6)
1. a kind of electrolytic capacitor appearance packaging defect image detection method, it is characterized in that being based on following detecting system, detecting system
Including feed well unit, light source Unit one, upper surface image collecting unit, optoelectronic switch Unit one, light source Unit two, lower surface
Image acquisition units, light source Unit three, optoelectronic switch Unit three, side surface image acquisition units, central processor unit, display
Unit and substandard product culling unit；The feed well unit presses tooth to capacitance into between-line spacing feeding by vibrating disk, vibrates
The outlet of disk is feed well, and vibrating disk is a concavity disk with helix, and feed well is that the transmission that two rectangular slabs limit is saturating
Flume, transmission transparent cell centre are equipped with electrolytic capacitor detection station, and electrolytic capacitor pin is inserted in transparent cell lower end；It is set on transparent cell
There are three station, light source Unit one is located at the surface of the upper surface image collecting unit of station one, is acquired for upper surface image
Unit provides light, and upper surface image collecting unit carries out the upper surface of capacitance after optoelectronic switch Unit one detects capacitance
Appearance images acquire；Light source Unit two is located at the underface of the lower surface image collecting unit positioned at station two, is lower surface figure
As collecting unit offer light, lower surface image collecting unit is after optoelectronic switch Unit two detects electrolytic capacitor to capacitance
Lower surface carries out appearance images acquisition；Light source Unit three is located at the side of the side surface image acquisition units of station three, is side table
Face image acquisition units provide light, and side surface image acquisition units are after optoelectronic switch Unit three detects capacitance to capacitance
Side surface carries out appearance images continuous acquisition, and station San Tong method is rotary work station, rotary work station（1-3）Drive pin that capacitance is made to revolve
It circles, optoelectronic switch Unit three, which detects, triggers rotation when capacitance enters station three, i.e., the stepping electricity on feed well on station
Machine swivel plate band dynamic condenser rotates a circle；Central processor unit input terminal receives picture signal for the three-view drawing picture to acquisition
Analyzing processing is carried out, the display unit display acquisition image and handling result, substandard product of central processor unit connection pick
Except unit will detect that the defective substandard product of appearance packaging is rejected；
In image detecting method, the upper and lower surface image of acquisition is subjected to coloured image gray processing, image denoising, image respectively and is increased
By force, region segmentation, image normalization, defects detection；The side image of acquisition carries out coloured image gray processing respectively, image is gone
It makes an uproar, image enhancement, image mosaic, region segmentation, image normalization, defects detection；The coloured image gray processing is used for will
The coloured image that video camera obtains is converted into gray level image, and the image denoising is used for carrying out noise remove to gray level image,
The image enhancement is used for carrying out contrast enhancing to image, and the region segmentation is used for being partitioned into area to be tested, institute
The image normalization stated is used for being rotated, cut and scaled normalized, the defects detection to image to be detected
For carrying out defect recognition, the image mosaic to normalized image to be detected and existing standard normalized image template
For acquiring image mosaic into the complete side image of a width to the capacitance to rotate a circle；
It is as follows：
Step 001. optoelectronic switch one detects capacitance, triggers upper surface image collecting unit camera captures images；
Upper surface coloured image is converted into gray level image by step 002.；
Step 003. is filtered removal picture noise to upper surface gray level image；
Step 004. carries out image enhancement to enhance the contrast of image to the upper surface gray level image after denoising；
Step 005. carries out region segmentation to enhanced upper surface image, specifically includes below step：
Step 0051. carries out edge detection to enhanced upper surface image using sobel edge detection operators；
Step 0052. utilizes hough change detection capacitances upper surface appearance boundary curve to upper surface image edge；
Step 0053. label connection capacitance appearance boundary curve region, the upper surface area to be tested divided；
If having character mark information in the packaging of step 006. upper surface, also needs to carry out character mark detection, include the following steps：
The upper surface area to be tested that step 0061. obtains segmentation does horizontally or vertically Gray Projection, is partitioned into capacitance upper table
The specification information region of face appearance；
Step 0062. is inclined using straight line where the upper left corner in the specification information area to be tested image of upper surface and lower left corner pixel
Angle from vertical direction rotates to vertical direction the upper surface area to be tested that step 0053 obtains；The wherein upper left corner
Pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, to find from bottom to up
First pixel；
Cut zone image is normalized in step 007., specifically includes below step：
Step 0071. is to rotating to the upper surface area to be tested image cropping of vertical direction into edge each 5 pictures up and down
The square-shaped image of element；
Step 0072. to the upper surface area to be tested image scaling after cutting extremelyPixel calibrates image；
Step 008. is by the standard upper surface Prototype drawing in normalized upper surface area to be tested image and image data base
Picture, acquisition process are also through step 001-007, carry out XOR operation, and operation result is more than that the judgement of threshold value does not conform to for upper surface
Lattice；
Step 009. optoelectronic switch two detects capacitance, triggers lower surface image collecting unit camera captures images；
Lower surface coloured image is converted into gray level image by step 0010.；
Step 0011. is filtered removal picture noise to lower surface gray level image；
Step 0012. carries out image enhancement to enhance the contrast of image to the lower surface gray level image after denoising；
Step 0013. carries out region segmentation to enhanced lower surface image, specifically includes below step：
Step 00131. carries out edge detection to enhanced lower surface image using sobel edge detection operators；
Step 00132. utilizes hough change detection capacitances lower surface appearance boundary curve to lower surface image edge；
Step 00133. label connection capacitance appearance boundary curve region, the lower surface area to be tested divided；
Step 0014. particularly, if lower surface packaging on have character mark information, also need carry out character mark detection, including with
Lower step：
The lower surface area to be tested that step 00141. obtains segmentation does horizontally or vertically Gray Projection, is partitioned under capacitance
The specification information region of appearance；
Step 00142. is inclined using straight line where the upper left corner in the specification information area to be tested image of lower surface and lower left corner pixel
Angle from vertical direction rotates to vertical direction the lower surface area to be tested that step 00133 obtains；Wherein upper left
Angle pixel is that from left to right, first pixel found from top to bottom, lower left corner pixel is from left to right, to find from bottom to up
First pixel；
Cut zone image is normalized in step 0015., specifically includes below step：
Step 00151. is to rotating to the lower surface area to be tested image cropping of vertical direction into edge each 5 pictures up and down
The square-shaped image of element；
Step 00152. to the lower surface area to be tested image scaling after cutting extremelyPixel calibrates image；
Step 0016. is by the standard lower surface Prototype drawing in normalized lower surface area to be tested image and image data base
As carrying out XOR operation, acquisition process is also through step 009-0015；Operation result is more than that the judgement of threshold value does not conform to for lower surface
Lattice；
Step 0017. optoelectronic switch three detects capacitance, triggers side surface image acquisition units camera captures images, touches simultaneously
Swivel plate band dynamic condenser on hair feed well rotates a circle；
Multiple side surface coloured images are converted into gray level image by step 0018.；
Step 0019. is filtered removal picture noise respectively to multiple side surface gray level images；
Step 0020. carries out image enhancement to enhance the contrast of image respectively to multiple side surface gray level images after denoising；
Step 0021. carries out image mosaic to enhanced multiple side surface images, specifically includes following steps：
Step 00211. extracts characteristic point respectively in the left and right ends of enhanced multiple side images；
Step 00212. carries out homotopy mapping to the characteristic point that left and right ends extract；
Step 00213. carries out image co-registration according to match point, obtains spliced whole picture side image；
The whole picture side image that step 0022. obtains splicing does horizontally or vertically Gray Projection, is partitioned into outside capacitance side surface
The specification information region of sight；
Step 0023. is inclined using straight line where the upper left corner in the specification information area to be tested image of side surface and lower left corner pixel
Angle contralateral surface area to be tested from vertical direction is rotated to vertical direction；Wherein top left corner pixel be from a left side to
The right side, first pixel found from top to bottom, lower left corner pixel are first pixels found from bottom to up from left to right
Point；
Cut zone image is normalized in step 0024., specifically includes below step：
Step 00241. is to rotating the side surface area to be tested image cropping to vertical direction into each 5 up and down away from edge
The square-shaped image of pixel；
Step 00242. calibrates figure to the regulation of the side surface area to be tested image scaling after cutting to size determined pixel point
Picture；
Step 0025. is by the standard side surface Prototype drawing in normalized side surface area to be tested image and image data base
As carrying out XOR operation, acquisition process is also through step 0017-0024, and operation result is more than that the judgement of threshold value does not conform to for lower surface
Lattice.
2. a kind of electrolytic capacitor appearance packaging defect image detection method according to claim 1, it is characterised in that：The mark
Quasi- upper surface template image is to handle to generate using step 001 ~ 007 by qualified products to get, and standard lower surface template image is
It handles to generate using step 009 ~ 0015 by qualified products and get, standard Side shuttering image is to use step by qualified products
0017 ~ 0024 processing, which generates, to be got.
3. a kind of electrolytic capacitor appearance packaging defect image detection method according to claim 1, it is characterised in that：The light
The long pin direction of capacitance that electric switch detects, which can combine, is used for differentiating positive symbol direction in appearance images.
4. a kind of electrolytic capacitor appearance packaging defect image detection method according to claim 1, it is characterised in that：Described
Display unit whole can show vision inspection process.
5. a kind of electrolytic capacitor appearance packaging defect image detection method according to claim 1, it is characterised in that：It can root
According to the device for needing to add substandard product by defect classification display unit display function and the rejecting of different defect classifications.
6. a kind of electrolytic capacitor appearance packaging defect image detection method according to claim 1, it is characterised in that：According to side
The visual field of surface image collecting unit camera chooses the picture number for carrying out image mosaic.
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Effective date of registration: 20190717 Address after: Nanjing City, Jiangsu province 210007 Yudaojie Camp No. 2 Box 32 (Institute of Communication Engineering) Patentee after: National University of Defense Technology Address before: Nanjing City, Jiangsu province 210007 Yudaojie Camp No. 2 Box 32 (Institute of Communication Engineering) Patentee before: PLA University OF SCIENCE AND TECHNOLOGY |