CN104916709B - A kind of structure is metal oxide multilayer film/silica-based solar cell - Google Patents
A kind of structure is metal oxide multilayer film/silica-based solar cell Download PDFInfo
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims description 32
- 239000000377 silicon dioxide Substances 0.000 title claims description 16
- 229910044991 metal oxide Inorganic materials 0.000 title description 3
- 150000004706 metal oxides Chemical group 0.000 title 1
- 239000010408 film Substances 0.000 claims abstract description 166
- 229910052751 metal Inorganic materials 0.000 claims abstract description 79
- 239000002184 metal Substances 0.000 claims abstract description 79
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 69
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 69
- 239000010703 silicon Substances 0.000 claims abstract description 69
- 238000002161 passivation Methods 0.000 claims abstract description 41
- 238000000034 method Methods 0.000 claims abstract description 34
- 239000010409 thin film Substances 0.000 claims abstract description 31
- 229910052709 silver Inorganic materials 0.000 claims abstract description 25
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000004332 silver Substances 0.000 claims abstract description 24
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 23
- 238000002360 preparation method Methods 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 8
- 238000002207 thermal evaporation Methods 0.000 claims description 36
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 12
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 10
- 238000000151 deposition Methods 0.000 claims description 10
- 239000010931 gold Substances 0.000 claims description 9
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 7
- 229910021419 crystalline silicon Inorganic materials 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 238000004140 cleaning Methods 0.000 claims description 6
- XOLBLPGZBRYERU-UHFFFAOYSA-N SnO2 Inorganic materials O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 5
- JKQOBWVOAYFWKG-UHFFFAOYSA-N molybdenum trioxide Inorganic materials O=[Mo](=O)=O JKQOBWVOAYFWKG-UHFFFAOYSA-N 0.000 claims description 5
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 5
- 238000001704 evaporation Methods 0.000 claims description 4
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
- 229910052681 coesite Inorganic materials 0.000 claims description 3
- 229910052906 cristobalite Inorganic materials 0.000 claims description 3
- 229910052682 stishovite Inorganic materials 0.000 claims description 3
- 229910052905 tridymite Inorganic materials 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 2
- 230000008020 evaporation Effects 0.000 claims 3
- 229910052593 corundum Inorganic materials 0.000 claims 2
- 239000013078 crystal Substances 0.000 claims 2
- 229910001845 yogo sapphire Inorganic materials 0.000 claims 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims 1
- 239000004411 aluminium Substances 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 229910052731 fluorine Inorganic materials 0.000 claims 1
- 239000011737 fluorine Substances 0.000 claims 1
- 229920005591 polysilicon Polymers 0.000 claims 1
- 230000006798 recombination Effects 0.000 abstract description 4
- 238000005215 recombination Methods 0.000 abstract description 4
- 238000009792 diffusion process Methods 0.000 abstract description 3
- 238000011031 large-scale manufacturing process Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 229910006404 SnO 2 Inorganic materials 0.000 abstract description 2
- 238000005468 ion implantation Methods 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 description 32
- 239000011248 coating agent Substances 0.000 description 22
- 238000000576 coating method Methods 0.000 description 22
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 11
- 238000000231 atomic layer deposition Methods 0.000 description 9
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 7
- 229910018125 Al-Si Inorganic materials 0.000 description 7
- 229910018520 Al—Si Inorganic materials 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 7
- 230000003647 oxidation Effects 0.000 description 7
- 238000007254 oxidation reaction Methods 0.000 description 7
- 229910021417 amorphous silicon Inorganic materials 0.000 description 6
- 239000011787 zinc oxide Substances 0.000 description 6
- 230000008021 deposition Effects 0.000 description 5
- 238000005566 electron beam evaporation Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- -1 etc. Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 229910005331 FeSi2 Inorganic materials 0.000 description 1
- 229910052774 Proactinium Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
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- Y02E10/547—Monocrystalline silicon PV cells
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Abstract
本发明公开了一种结构为氧化物‑金属多层膜/硅基太阳电池,该太阳电池的结构从上至下依次包括:银电极、氧化物‑金属多层膜、钝化层、硅基体和全铝背电极,所述的氧化物‑金属多层膜由第一氧化物薄膜、金属薄膜和第二氧化物薄膜复合而成,所述的第一氧化物薄膜或第二氧化物薄膜为MoO3薄膜、掺锡In2O3薄膜、掺氟SnO2薄膜或掺铝ZnO薄膜,所述的金属薄膜为Ag薄膜、Au薄膜或Al薄膜。该电池可以避免传统的热扩散或者离子注入法制备发射极引起的俄歇复合和死层现象。还公开了上述结构为氧化物‑金属多层膜/硅基太阳电池的制备方法,该方法制作工序少,适合大规模生产,整个制备过程无需高温。
The invention discloses a structure of an oxide-metal multilayer film/silicon-based solar cell. The structure of the solar cell includes, from top to bottom, a silver electrode, an oxide-metal multilayer film, a passivation layer, and a silicon substrate. and an all-aluminum back electrode, the oxide-metal multilayer film is composed of a first oxide film, a metal film and a second oxide film, and the first oxide film or the second oxide film is MoO 3 thin film, tin-doped In 2 O 3 thin film, fluorine-doped SnO 2 thin film or aluminum-doped ZnO thin film, the metal thin film is Ag thin film, Au thin film or Al thin film. The battery can avoid the Auger recombination and dead layer phenomena caused by the traditional thermal diffusion or ion implantation method to prepare the emitter. Also disclosed is a method for preparing the oxide-metal multilayer film/silicon-based solar cell with the above-mentioned structure. The method has few manufacturing steps and is suitable for large-scale production, and the entire preparation process does not require high temperature.
Description
技术领域technical field
本发明属于太阳电池技术领域,具体涉及一种具有氧化物-金属多层膜结构/硅基太阳电池及其制备方法。The invention belongs to the technical field of solar cells, and in particular relates to an oxide-metal multilayer film structure/silicon-based solar cell and a preparation method thereof.
背景技术Background technique
太阳电池最常见的结构是无机材料体系的p-n结类型的构造,根据材料异同可分为同质结与异质结。异质结(Heterojunction,HJ)是指两种不同的半导体材料组成的p-n结,在1951年由Gubanov等人提出了异质结的概念。异质结太阳电池可以避免高温扩散过程,在低温下通过蒸镀薄膜与硅衬底形成p-n结。目前硅基异质结太阳电池主要包括a-Si:H/c-Si异质结太阳电池(Heterojunction with intrinsic Thinlayer,HIT)、AZO/Si异质结太阳电池、IBC-SHJ太阳电池、β-FeSi2/Si异质结太阳电池。其中HIT太阳电池最初在1968年Grigorovici通过热蒸发的方法在硅表面沉积非晶硅,由于非晶硅薄膜的缺陷态密度较高,因此效率比较低。后来随着PECVD的技术发展,沉积的非晶硅中含有氢,能够对硅与非晶硅接触界面层实现很好的钝化,HIT电池于2014年取得了25.6%的效率。但是HIT太阳电池目前存在以下问题:一、设备昂贵,并且原材料属于高危险性化学物品。二、为获得低界面态的非晶硅/晶体硅界面,对工艺和设备要求比较高。三、非晶硅会对光具有寄生吸收,减少了短路电流密度。因此需要寻找新的材料,与硅结合形成新型异质结太阳电池。The most common structure of solar cells is the p-n junction structure of inorganic material system, which can be divided into homojunction and heterojunction according to the similarities and differences of materials. Heterojunction (Heterojunction, HJ) refers to a p-n junction composed of two different semiconductor materials. The concept of heterojunction was proposed by Gubanov et al. in 1951. Heterojunction solar cells can avoid the high-temperature diffusion process, and form p-n junctions with silicon substrates by evaporating thin films at low temperatures. At present, silicon-based heterojunction solar cells mainly include a-Si:H/c-Si heterojunction solar cells (Heterojunction with intrinsic Thinlayer, HIT), AZO/Si heterojunction solar cells, IBC-SHJ solar cells, β- FeSi2/Si heterojunction solar cells. Among them, the HIT solar cell was initially deposited on the surface of silicon by Grigorovici in 1968 by thermal evaporation method. Due to the high density of defect states in the amorphous silicon film, the efficiency is relatively low. Later, with the development of PECVD technology, the deposited amorphous silicon contains hydrogen, which can achieve a good passivation of the contact interface layer between silicon and amorphous silicon. The HIT battery achieved an efficiency of 25.6% in 2014. However, HIT solar cells currently have the following problems: 1. The equipment is expensive, and the raw materials are high-risk chemicals. Second, in order to obtain an amorphous silicon/crystalline silicon interface with a low interface state, the requirements for technology and equipment are relatively high. 3. Amorphous silicon has parasitic absorption of light, which reduces the short-circuit current density. Therefore, it is necessary to find new materials and combine them with silicon to form new heterojunction solar cells.
近些年掺F的SnO2(FTO)、掺In的Sn2O3(ITO)、掺Al的ZnO(AZO)、MoO3等氧化物薄膜材料已经在太阳电池领域获得了广泛的应用。为了进一步改善薄膜的光学和电学特性,并且能够实现低温制备透明导电薄膜,通过在透明导电薄膜中间插入一层金属层,主要作为氧化物/金属/氧化物多层结构透明导电氧化物电极,例如MoO3/Ag/MoO3、ITO/Ag/ITO、AZO/Ag/AZO等。因为他们不仅有较低的电阻率,而且氧化物/金属/氧化物复合结构的薄膜能有效的阻止金属层的反射,因为金属层和氧化物层之间的等离子体耦合作用,使其在可见光范围增加的透过率。这种氧化物层中间内嵌金属层的三明治结构中,金属层的生长方式随着厚度的增加,从不连续的岛状结构,变成连续的薄膜,其获得较低的方块电阻。In recent years, oxide thin film materials such as F-doped SnO 2 (FTO), In-doped Sn 2 O 3 (ITO), Al-doped ZnO (AZO), and MoO 3 have been widely used in the field of solar cells. In order to further improve the optical and electrical properties of the film, and to achieve low-temperature preparation of transparent conductive films, a metal layer is inserted in the middle of the transparent conductive film, mainly as an oxide/metal/oxide multilayer transparent conductive oxide electrode, such as MoO 3 /Ag/MoO 3 , ITO/Ag/ITO, AZO/Ag/AZO, etc. Because they not only have low resistivity, but also the thin film of oxide/metal/oxide composite structure can effectively prevent the reflection of the metal layer, because the plasmonic coupling between the metal layer and the oxide layer makes it visible in the visible light range of increased transmittance. In this sandwich structure with a metal layer embedded in the middle of the oxide layer, the growth method of the metal layer changes from a discontinuous island structure to a continuous film as the thickness increases, which results in a lower sheet resistance.
但目前这种氧化物层中间内嵌金属层结构的透明导电薄膜,仅用于有机染料敏化太阳电池中,作为低温制备透明导电薄膜。该氧化物-金属多层膜尚未用于硅片或者硅薄膜中制成太阳电池。However, at present, the transparent conductive film with a metal layer embedded in the middle of the oxide layer is only used in organic dye-sensitized solar cells as a low-temperature preparation of transparent conductive films. The oxide-metal multilayer film has not been used in silicon wafers or silicon thin films to make solar cells.
发明内容Contents of the invention
本发明所要解决的第一个技术问题是提供一种结构为氧化物-金属多层膜/硅基太阳电池,该太阳电池将氧化物-金属多层膜用于硅片或者硅薄膜中作为电池的发射极,形成的氧化物-金属多层膜/硅基太阳电池,可以避免传统的热扩散或者离子注入法制备发射极引起的俄歇复合和死层现象。The first technical problem to be solved by the present invention is to provide a structure that is an oxide-metal multilayer film/silicon-based solar cell, which uses an oxide-metal multilayer film in a silicon wafer or a silicon thin film as a battery The oxide-metal multilayer film/silicon-based solar cell formed by the emitter can avoid the Auger recombination and dead layer phenomenon caused by the traditional thermal diffusion or ion implantation method to prepare the emitter.
本发明所要解决的第二个技术问题是提供上述结构为氧化物-金属多层膜/硅基太阳电池的制备方法,该方法制作工序少,适合大规模生产,整个制备过程无需高温。The second technical problem to be solved by the present invention is to provide a preparation method for the oxide-metal multilayer film/silicon-based solar cell with the above-mentioned structure. This method has fewer manufacturing steps and is suitable for large-scale production. The entire preparation process does not require high temperature.
本发明的第一个技术问题是通过以下技术方案来实现的:一种结构为氧化物-金属多层膜/硅基太阳电池,该太阳电池的结构从上至下依次包括:银电极、氧化物-金属多层膜、钝化层、硅基体和全铝背电极,所述的氧化物-金属多层膜由第一氧化物薄膜、金属薄膜和第二氧化物薄膜复合而成,所述的第一氧化物薄膜或第二氧化物薄膜为MoO3薄膜、掺锡In2O3薄膜、掺氟SnO2薄膜或掺铝ZnO薄膜,所述的金属薄膜为Ag薄膜、Au薄膜或Al薄膜。The first technical problem of the present invention is achieved through the following technical solutions: a structure is an oxide-metal multilayer film/silicon-based solar cell, and the structure of the solar cell includes from top to bottom: silver electrode, oxide Object-metal multilayer film, passivation layer, silicon substrate and all-aluminum back electrode, the oxide-metal multilayer film is composed of a first oxide film, a metal film and a second oxide film, and the The first oxide film or the second oxide film is MoO3 film, tin - doped In2O3 film, fluorine- doped SnO2 film or aluminum-doped ZnO film, and the metal film is Ag film, Au film or Al film .
本发明通过将氧化物-金属多层膜与硅片或者硅薄膜结合形成氧化物-金属多层膜/硅基太阳电池,氧化物包括掺铝氧化锌(AZO)、MoO3、氧化铟锡(ITO)、掺氟SnO2薄膜等,金属包括Ag、Au或Al等,硅包括单晶硅、多晶硅或硅薄膜等。电池的光吸收层主要是硅,氧化物-金属多层膜起到发射极、减反射、导电的作用,并且整个制备工艺处于低温的状态,并且设备简单,成本较低,环境友好。The present invention forms an oxide-metal multilayer film/silicon-based solar cell by combining an oxide-metal multilayer film with a silicon wafer or a silicon film, and the oxide includes aluminum-doped zinc oxide (AZO), MoO 3 , indium tin oxide ( ITO), fluorine-doped SnO2 film, etc., metals include Ag, Au or Al, etc., silicon includes single crystal silicon, polycrystalline silicon or silicon film, etc. The light-absorbing layer of the battery is mainly silicon, and the oxide-metal multilayer film plays the role of emitter, anti-reflection, and conductivity, and the entire preparation process is in a low-temperature state, and the equipment is simple, low in cost, and environmentally friendly.
所述的第一氧化物薄膜的厚度优选为10~20nm,所述的金属薄膜的厚度优选为2~15nm,所述第二氧化物薄膜的厚度优选为30~50nm。The thickness of the first oxide film is preferably 10-20 nm, the thickness of the metal film is preferably 2-15 nm, and the thickness of the second oxide film is preferably 30-50 nm.
所述硅基体可以为单晶硅片、多晶硅片或硅薄膜。单晶硅片或多晶硅片为P型或N型单晶硅片或多晶硅片。The silicon substrate can be a single crystal silicon wafer, a polycrystalline silicon wafer or a silicon thin film. Single crystal silicon wafer or polycrystalline silicon wafer is P type or N type single crystal silicon wafer or polycrystalline silicon wafer.
本发明的第二个技术问题是通过以下技术方案来实现的:上述具有氧化物-金属多层膜结构/硅基太阳电池的制备方法,包括以下步骤:The second technical problem of the present invention is achieved by the following technical scheme: the above-mentioned preparation method of oxide-metal multilayer film structure/silicon-based solar cell comprises the following steps:
(1)选取晶体硅片,清洗后,在晶体硅片的前表面沉积钝化层;(1) Select a crystalline silicon wafer, after cleaning, deposit a passivation layer on the front surface of the crystalline silicon wafer;
(2)在步骤(1)制备的钝化层上沉积第一氧化物薄膜;(2) depositing a first oxide film on the passivation layer prepared in step (1);
(3)在步骤(2)制备的第一氧化物薄膜上蒸镀金属薄膜;(3) vapor-depositing a metal film on the first oxide film prepared in step (2);
(4)在步骤(3)制备的金属薄膜上沉积第二氧化物薄膜;(4) depositing a second oxide film on the metal film prepared in step (3);
(5)在步骤(4)沉积的第二氧化物薄膜上设置银电极作为前表面电极,在晶体硅的背面设置全铝背电极。(5) A silver electrode is set on the second oxide film deposited in step (4) as the front surface electrode, and an all-aluminum back electrode is set on the back surface of the crystalline silicon.
在上述具有氧化物-金属多层膜结构/硅基太阳电池的制备方法中:In the above preparation method with oxide-metal multilayer film structure/silicon-based solar cell:
步骤(1)中清洗优选采用RCA工艺清洗。Cleaning in step (1) is preferably done by RCA process.
步骤(1)中所述的钝化层为SiO2、TiO2、Al2O3或Si3N4,其厚度为1~15nm,采用热氧化、PECVD、原子层沉积或磁控溅射法制得。The passivation layer described in step (1) is SiO 2 , TiO 2 , Al 2 O 3 or Si 3 N 4 , with a thickness of 1-15 nm, and is prepared by thermal oxidation, PECVD, atomic layer deposition or magnetron sputtering have to.
步骤(2)中第一氧化物薄膜和步骤(4)中第二氧化物薄膜采用电阻式热蒸发、电子束蒸发或磁控溅射法制得。The first oxide thin film in step (2) and the second oxide thin film in step (4) are prepared by resistive thermal evaporation, electron beam evaporation or magnetron sputtering.
步骤(3)中金属薄膜采用电阻式热蒸发法蒸镀制得。In step (3), the metal thin film is obtained by vapor deposition by resistance thermal evaporation.
步骤(4)中采用丝网印刷法或掩膜网版电阻式热蒸发法制备银栅线作为银电极,银栅线的宽度0.5~1mm,高度为200~300nm。In step (4), silver grid lines are prepared as silver electrodes by screen printing method or masked screen resistive thermal evaporation method, the width of the silver grid lines is 0.5-1mm, and the height is 200-300nm.
步骤(4)中采用电阻式热蒸发法蒸镀制得全铝背电极。In step (4), the all-aluminum back electrode is prepared by vapor deposition by resistive thermal evaporation method.
与现有技术相比,本发明具有如下优点:Compared with prior art, the present invention has following advantage:
(1)本发明中的电池结构简单,制造工序少,适合大规模生产;(1) The battery structure in the present invention is simple, and manufacturing process is few, is suitable for large-scale production;
(2)利用氧化物-金属多层膜作为电池的发射极能够有效减少高掺杂引起的俄歇复合和死层,能减少复合,增强太阳电池的短波响应,提高电池的短路电流;(2) Using the oxide-metal multilayer film as the emitter of the battery can effectively reduce the Auger recombination and dead layer caused by high doping, reduce recombination, enhance the short-wave response of the solar cell, and increase the short-circuit current of the battery;
(3)本发明电池整个制备过程中,没有高温过程,能够在低温下制备高效电池;(3) During the whole preparation process of the battery of the present invention, there is no high-temperature process, and high-efficiency batteries can be prepared at low temperatures;
(4)本发明通过钝化层对氧化物-金属多层膜与硅片或者硅薄膜接触界面进行钝化,能减少缺陷态;(4) The present invention passivates the contact interface between the oxide-metal multilayer film and the silicon wafer or silicon film through the passivation layer, which can reduce the defect state;
(5)本发明制备的具有氧化物-金属多层膜/硅基太阳电池是一种全新结构的氧化物-金属-氧化物多层膜硅基太阳电池;(5) The oxide-metal multilayer film/silicon-based solar cell prepared by the present invention is a new structure oxide-metal-oxide multilayer silicon-based solar cell;
(6)与HIT、微晶硅/晶体硅等异质结太阳电池相比,本发明中采用氧化物-金属-氧化物多层膜作为电池的发射极,具有制备工艺简洁、器件性能好,设备简单,成本低廉,节能环保的优点;(6) Compared with heterojunction solar cells such as HIT and microcrystalline silicon/crystalline silicon, the oxide-metal-oxide multilayer film is used as the emitter of the battery in the present invention, which has simple preparation process and good device performance. The advantages of simple equipment, low cost, energy saving and environmental protection;
(7)本发明中的具有氧化物-金属多层膜/硅基太阳电池,其光电转换效率较高,拥有一定的应用前景。(7) The oxide-metal multilayer film/silicon-based solar cell in the present invention has high photoelectric conversion efficiency and has certain application prospects.
附图说明Description of drawings
图1是本发明实施例1-7中的第一氧化物-金属-第二氧化物氧化物-金属多层膜硅基太阳电池的结构图,其中1为银电极,2为氧化物-金属多层膜,3为钝化层,4为硅基体,5为全铝背电极;Fig. 1 is the structural diagram of the first oxide-metal-second oxide oxide-metal multilayer film silicon-based solar cell in the embodiment 1-7 of the present invention, wherein 1 is silver electrode, 2 is oxide-metal Multi-layer film, 3 is the passivation layer, 4 is the silicon substrate, 5 is the all-aluminum back electrode;
图2是图1中的氧化物-金属多层膜的结构示意图,其中21为第一氧化物薄膜,22为金属薄膜,23为第二氧化物薄膜;Fig. 2 is a schematic structural view of the oxide-metal multilayer film in Fig. 1, wherein 21 is a first oxide film, 22 is a metal film, and 23 is a second oxide film;
图3是实施例1中制备的MoO3/Ag/MoO3多层膜硅基太阳电池的电流密度-电压(J-V)图;Fig. 3 is the current density-voltage (JV) figure of MoO 3 /Ag/MoO 3 multilayer film silicon-based solar cells prepared in embodiment 1;
图4是实施例1中所制备的MoO3/Ag/MoO3氧化物-金属多层膜太阳电池的光学特性图,在可见光部分最高透过率达到了85%,在波长为300~1200nm范围内氧化物-金属多层膜的平均透过率为55%,平均反射率为30.8%。Fig. 4 is the optical characteristic diagram of the MoO 3 /Ag/MoO 3 oxide-metal multilayer film solar cell prepared in Example 1, the highest transmittance in the visible light part reaches 85%, and the wavelength is 300~1200nm range The average transmittance of the inner oxide-metal multilayer film is 55%, and the average reflectance is 30.8%.
具体实施方式detailed description
下面将结合附图和具体实施例进一步阐明本发明的内容,但这些实施例并不限制本发明的保护范围。The content of the present invention will be further clarified below in conjunction with the drawings and specific embodiments, but these embodiments do not limit the protection scope of the present invention.
实施例1Example 1
如图1中所示,本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,该太阳电池的结构从上至下依次包括:银电极1、氧化物-金属多层膜2、钝化层3、硅基体4和全铝背电极5,氧化物-金属多层膜2由第一氧化物薄膜21、金属薄膜22和第二氧化物薄膜23复合而成,其中第一氧化物薄膜21和第二氧化物薄膜23为MoO3薄膜,金属薄膜22为Ag薄膜,钝化层3为SiO2钝化层。As shown in Figure 1, the structure provided by this embodiment is an oxide-metal multilayer film/silicon-based solar cell, and the structure of the solar cell includes from top to bottom: a silver electrode 1, an oxide-metal multilayer film 2. The passivation layer 3, the silicon substrate 4 and the all-aluminum back electrode 5, the oxide-metal multilayer film 2 is composed of a first oxide film 21, a metal film 22 and a second oxide film 23, wherein the first The oxide film 21 and the second oxide film 23 are MoO 3 films, the metal film 22 is an Ag film, and the passivation layer 3 is a SiO 2 passivation layer.
其中第一氧化物薄膜的厚度为10~20nm,金属薄膜的厚度为2~15nm,第二氧化物薄膜的厚度为30~50nm。Wherein the thickness of the first oxide film is 10-20 nm, the thickness of the metal film is 2-15 nm, and the thickness of the second oxide film is 30-50 nm.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用干氧热氧化工艺在硅片表面形成SiO2钝化层,设置热氧化的温度为850℃,氧化时间为1~10min,在硅片表面形成2~15nm的二氧化硅;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, then use the dry oxygen thermal oxidation process to form a SiO2 passivation layer on the surface of the silicon wafer, set the thermal oxidation temperature to 850°C, and the oxidation time to 1 ~10min, 2~15nm silicon dioxide is formed on the surface of the silicon wafer;
其中RCA清洗工艺主要包括SPM(H2SO4:H2O2=3:1)去除有机物,DHF(HF:H2O=1:30)去除氧化层,用APM(NH4OH:H2O2:H2O=1:1:5)去除颗粒,HPM(HCl:H2O2:H2O=1:1:6)去除金属杂质。The RCA cleaning process mainly includes SPM (H 2 SO 4 :H 2 O 2 =3:1) to remove organic matter, DHF (HF:H 2 O =1:30) to remove oxide layer, and APM (NH 4 OH:H 2 O 2 :H 2 O=1:1:5) removes particles, and HPM (HCl:H 2 O 2 :H 2 O=1:1:6) removes metal impurities.
(2)然后通过电阻式热蒸发镀膜机在钝化层表面制备MoO3薄膜,真空度大约为5×10-4Pa,膜的厚度为10~20nm;(2) Then prepare a MoO 3 thin film on the surface of the passivation layer by a resistive thermal evaporation coating machine, the vacuum degree is about 5×10 -4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电阻式热蒸发镀膜机蒸镀金、银、或者铝薄膜,真空度约为8×10-4Pa,膜厚为2~15nm;(3) Use a resistive thermal evaporation coating machine to vapor-deposit gold, silver, or aluminum films, the vacuum degree is about 8×10 -4 Pa, and the film thickness is 2-15nm;
(4)然后再次使用电阻式热蒸发镀膜机制备MoO3薄膜,真空度约为5×10-4Pa,膜的厚度为30~50nm;(4) Then use the resistance thermal evaporation coating machine again to prepare the MoO 3 thin film, the vacuum degree is about 5×10 -4 Pa, and the thickness of the film is 30-50nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-SiO2-MoO3/Ag/MoO3-Ag电池,该电池的效率如附图3中所示,本实施例制备的MoO3/Ag/MoO3多层膜硅基太阳电池的短路电流密度为27.012mA/cm2,开路电压为0.464V,填充因子为63.17%,效率为7.92%,本实施例制备的MoO3/Ag/MoO3氧化物-金属多层膜太阳电池的光学特性图见图4中所示,从图4中可以看出,在可见光部分最高透过率达到了85%,在波长为300~1200nm范围内氧化物-金属多层膜的平均透过率为55%,平均反射率为30.8%。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-SiO 2 -MoO 3 /Ag/MoO 3 -Ag battery is obtained, and the efficiency of the battery is shown in Figure 3. The MoO 3 /Ag/MoO 3 prepared in this example The short-circuit current density of the multilayer silicon-based solar cell is 27.012mA/cm 2 , the open-circuit voltage is 0.464V, the fill factor is 63.17%, and the efficiency is 7.92%. The MoO 3 /Ag/MoO 3 oxide prepared in this example- The optical characteristics of the metal multilayer film solar cell are shown in Figure 4. It can be seen from Figure 4 that the highest transmittance in the visible light part reaches 85%, and the oxide-metal multilayer solar cell has a wavelength of 300-1200nm The average transmittance of the layer film is 55%, and the average reflectance is 30.8%.
实施例2Example 2
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,钝化层3为Al2O3钝化层。The structure provided in this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the passivation layer 3 is an Al 2 O 3 passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用原子层沉积(ALD)技术在硅片表面沉积一层Al2O3钝化层,设置沉积温度为200℃,Al(TMA)、N2、H2O的脉冲时间分别为:0.1s、10s和0.1s,流速分别为:150sccm、150sccm和200sccm,进行10~30个循环,在硅片表面沉积1~3nm的氧化铝;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, then use atomic layer deposition (ALD) technology to deposit a layer of Al 2 O 3 passivation layer on the surface of the silicon wafer, set the deposition temperature to 200°C, The pulse time of Al(TMA), N 2 , and H 2 O are: 0.1s, 10s, and 0.1s, respectively, and the flow rates are: 150sccm, 150sccm, and 200sccm, respectively, and 10-30 cycles are performed to deposit 1-3nm on the surface of the silicon wafer. alumina;
(2)然后通过电阻式热蒸发镀膜机在钝化层表面制备MoO3薄膜,真空度为5×10- 4Pa,膜的厚度为10~20nm;(2) Then prepare a MoO 3 thin film on the surface of the passivation layer by a resistive thermal evaporation coating machine, the vacuum degree is 5×10 - 4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电阻式热蒸发镀膜机蒸镀银薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Use a resistive thermal evaporation coating machine to vapor-deposit silver film, the vacuum degree is 8×10 -4 Pa, and the film thickness is 2-15nm;
(4)然后再次使用电阻式热蒸发镀膜机制备MoO3薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use the resistance thermal evaporation coating machine again to prepare the MoO 3 thin film, the degree of vacuum is 5×10 -4 Pa, and the thickness of the film is 30-50 nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-Al2O3-MoO3/Ag/MoO3-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-Al 2 O 3 -MoO 3 /Ag/MoO 3 -Ag battery is produced.
实施例3Example 3
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,钝化层3为TiO2钝化层。The structure provided in this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the passivation layer 3 is a TiO2 passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用原子层沉积(ALD)技术在硅片表面沉积一层TiO2钝化层,设置沉积温度为200~300℃,TiCl4、N2、H2O的脉冲时间分别为:1s、3s和1s,流速分别为:150sccm、150sccm和200sccm,进行10~30个循环,在硅片表面沉积1~3nm的二氧化钛;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, and then use atomic layer deposition (ALD) technology to deposit a layer of TiO2 passivation layer on the surface of the silicon wafer, set the deposition temperature to 200-300 °C, The pulse times of TiCl 4 , N 2 , and H 2 O are: 1s, 3s, and 1s, respectively, and the flow rates are: 150sccm, 150sccm, and 200sccm, respectively, and 10-30 cycles are performed to deposit 1-3nm titanium dioxide on the surface of the silicon wafer;
(2)然后通过电阻式热蒸发镀膜机在钝化层表面制备MoO3薄膜,真空度为5×10- 4Pa,膜的厚度为10~20nm;(2) Then prepare a MoO 3 thin film on the surface of the passivation layer by a resistive thermal evaporation coating machine, the vacuum degree is 5×10 - 4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电阻式热蒸发镀膜机蒸镀银薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Use a resistive thermal evaporation coating machine to vapor-deposit silver film, the vacuum degree is 8×10 -4 Pa, and the film thickness is 2-15nm;
(4)然后再次使用电阻式热蒸发镀膜机制备MoO3薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use the resistance thermal evaporation coating machine again to prepare the MoO 3 thin film, the degree of vacuum is 5×10 -4 Pa, and the thickness of the film is 30-50 nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-TiO2-MoO3/Ag/MoO3-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-TiO 2 -MoO 3 /Ag/MoO 3 -Ag battery is produced.
实施例4Example 4
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,钝化层3为Si3N4钝化层。The structure provided in this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the passivation layer 3 is a Si 3 N 4 passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用等离子体增强的化学气相沉积(PECVD)技术在硅片表面沉积一层Si3N4钝化层,设置沉积温度为200~300℃,压强为5×10-3Pa,NH3:SiH4为60:45sccm,1~3min之后形成2~6nm的氮化硅;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, then use plasma enhanced chemical vapor deposition (PECVD) technology to deposit a layer of Si 3 N 4 passivation layer on the surface of the silicon wafer, set the deposition temperature 200-300°C, pressure 5×10 -3 Pa, NH 3 : SiH 4 60:45 sccm, 2-6nm silicon nitride formed after 1-3 minutes;
(2)然后通过电阻式热蒸发镀膜机在钝化层表面制备MoO3薄膜,真空度为5×10- 4Pa,膜的厚度为10~20nm;(2) Then prepare a MoO 3 thin film on the surface of the passivation layer by a resistive thermal evaporation coating machine, the vacuum degree is 5×10 - 4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电阻式热蒸发镀膜机蒸镀金、银、或者铝薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Use a resistive thermal evaporation coating machine to vapor-deposit gold, silver, or aluminum films with a vacuum degree of 8×10 -4 Pa and a film thickness of 2 to 15 nm;
(4)然后再次使用电阻式热蒸发镀膜机制备MoO3薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use the resistance thermal evaporation coating machine again to prepare the MoO 3 thin film, the degree of vacuum is 5×10 -4 Pa, and the thickness of the film is 30-50 nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-Si3N4-MoO3/Ag/MoO3-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-Si 3 N 4 -MoO 3 /Ag/MoO 3 -Ag battery is produced.
实施例5Example 5
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,第一氧化物薄膜21为ITO薄膜,第二氧化物薄膜23为MoO3薄膜,钝化层3为氧化铝钝化层。The structure provided by this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the first oxide film 21 is an ITO film, and the second oxide film 23 is a MoO3 film. Layer 3 is an aluminum oxide passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用原子层沉积(ALD)技术在硅片表面沉积一层钝化层,设置沉积温度为200℃,Al(TMA)、N2、H2O的脉冲时间分别为:0.1s、10s和0.1s,流速分别为:150sccm、150sccm和200sccm,进行10~30个循环,在硅片表面沉积1~3nm的氧化铝;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, and then use atomic layer deposition (ALD) technology to deposit a passivation layer on the surface of the silicon wafer, set the deposition temperature to 200 ° C, Al(TMA) The pulse time of , N 2 , and H 2 O is: 0.1s, 10s, and 0.1s, respectively, and the flow rates are: 150sccm, 150sccm, and 200sccm, respectively, and 10-30 cycles are performed to deposit 1-3nm aluminum oxide on the surface of the silicon wafer;
(2)然后通过电子束蒸发镀膜机在钝化层表面制备ITO薄膜,真空度为5×10-4Pa,膜的厚度为10~20nm;(2) Then prepare an ITO thin film on the surface of the passivation layer by an electron beam evaporation coating machine, the vacuum degree is 5 × 10 -4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电阻式热蒸发镀膜机蒸镀金银薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Use a resistive thermal evaporation coating machine to vapor-deposit gold and silver films, the vacuum degree is 8×10 -4 Pa, and the film thickness is 2-15nm;
(4)然后再次使用电子束蒸发制备镀膜机制备MoO3薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use electron beam evaporation again to prepare a coating machine to prepare a MoO 3 thin film, the vacuum degree is 5×10 -4 Pa, and the thickness of the film is 30-50 nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-Al2O3-ITO/Ag/ITO-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-Al 2 O 3 -ITO/Ag/ITO-Ag battery is produced.
实施例6Example 6
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,第一氧化物薄膜21为AZO薄膜,第二氧化物薄膜23为AZO薄膜,钝化层3为氧化铝钝化层。The structure provided in this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the first oxide film 21 is an AZO film, the second oxide film 23 is an AZO film, and the passivation Layer 3 is an aluminum oxide passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用原子层沉积(ALD)技术在硅片表面沉积一层钝化层,设置沉积温度为200℃,Al(TMA)、N2、H2O的脉冲时间分别为:0.1s、10s和0.1s,流速分别为:150sccm、150sccm和200sccm,进行10~30个循环,在硅片表面沉积1~3nm的氧化铝;(1) Clean the n-type or p-type single crystal silicon wafer with RCA process, and then use atomic layer deposition (ALD) technology to deposit a passivation layer on the surface of the silicon wafer, set the deposition temperature to 200 ° C, Al(TMA) The pulse time of , N 2 , and H 2 O is: 0.1s, 10s, and 0.1s, respectively, and the flow rates are: 150sccm, 150sccm, and 200sccm, respectively, and 10-30 cycles are performed to deposit 1-3nm aluminum oxide on the surface of the silicon wafer;
(2)然后通过射频磁控溅射在钝化层表面制备AZO薄膜,真空度为5×10-4Pa,膜的厚度为10~20nm;(2) Then prepare an AZO film on the surface of the passivation layer by radio frequency magnetron sputtering, the degree of vacuum is 5 × 10 -4 Pa, and the thickness of the film is 10-20nm;
(3)再使用电子束蒸发制备铝薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Electron beam evaporation is used to prepare an aluminum thin film, the vacuum degree is 8×10 -4 Pa, and the film thickness is 2-15 nm;
(4)然后再次使用电子束蒸发制备AZO薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use electron beam evaporation to prepare AZO film again, the vacuum degree is 5×10 -4 Pa, and the thickness of the film is 30-50nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-Al2O3-AZO/Ag/AZO-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-Al 2 O 3 -AZO/Ag/AZO-Ag battery is produced.
实施例7Example 7
本实施例提供的结构为氧化物-金属多层膜/硅基太阳电池,与实施例1不同的是,第一氧化物薄膜21为AZO薄膜,第二氧化物薄膜23为AZO薄膜,钝化层3为二氧化硅钝化层。The structure provided in this embodiment is an oxide-metal multilayer film/silicon-based solar cell. The difference from Embodiment 1 is that the first oxide film 21 is an AZO film, the second oxide film 23 is an AZO film, and the passivation Layer 3 is a silicon dioxide passivation layer.
上述结构为氧化物-金属多层膜/硅基太阳电池,通过以下方法制备获得:The above structure is an oxide-metal multilayer film/silicon-based solar cell, which is prepared by the following method:
(1)将n型或者p型单晶硅片用RCA工艺进行清洗,接着使用干氧热氧化工艺在硅片表面沉积一层钝化层,设置热氧化的温度为850℃,氧化时间为1~10min,在硅片表面形成2~15nm的二氧化硅;(1) Clean the n-type or p-type single crystal silicon wafer with the RCA process, then use the dry oxygen thermal oxidation process to deposit a passivation layer on the surface of the silicon wafer, set the thermal oxidation temperature to 850°C, and the oxidation time to 1 ~10min, 2~15nm silicon dioxide is formed on the surface of the silicon wafer;
(2)然后通过射频磁控溅射在钝化层表面制备ZnO薄膜,真空度为5×10-4Pa,膜的厚度为10~20nm;(2) Then prepare a ZnO thin film on the surface of the passivation layer by radio frequency magnetron sputtering, the degree of vacuum is 5 × 10 -4 Pa, and the thickness of the film is 10-20nm;
(3)再使用射频磁控溅射金薄膜,真空度为8×10-4Pa,膜厚为2~15nm;(3) Then use radio frequency magnetron sputtering gold thin film, the vacuum degree is 8×10 -4 Pa, and the film thickness is 2-15nm;
(4)然后再次使用射频磁控溅射制备ZnO薄膜,真空度为5×10-4Pa,膜的厚度为30~50nm;(4) Then use radio frequency magnetron sputtering to prepare ZnO film again, the degree of vacuum is 5×10 -4 Pa, and the thickness of film is 30~50nm;
(5)采用掩膜网版电阻式热蒸发镀膜机蒸镀银栅线,作为前表面电极,栅线宽度0.5~1mm,高度200~300nm;最后利用电阻式热蒸发蒸镀全铝背面电极,最终制得Al-Si(n或p)-Al2O3-ZnO/Ag/ZnO-Ag电池。(5) Using mask screen resistive thermal evaporation coating machine to vapor-deposit silver grid lines as the front surface electrodes, the width of the grid lines is 0.5-1mm, and the height is 200-300nm; finally, the all-aluminum back electrode is evaporated by resistive thermal evaporation, Finally, an Al-Si(n or p)-Al 2 O 3 -ZnO/Ag/ZnO-Ag battery is produced.
显然,上述内容只是为了说明本发明的特点,而并非对本发明的限制,有关技术领域的普通技术人员根据本发明在相应的技术领域做出的变化应属于本发明的保护范畴。Apparently, the above content is only to illustrate the characteristics of the present invention, but not to limit the present invention. Changes made by persons of ordinary skill in the relevant technical field in the corresponding technical field according to the present invention shall belong to the protection scope of the present invention.
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