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CN104885363A - Semiconductor switch arrangement - Google Patents

Semiconductor switch arrangement Download PDF

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Publication number
CN104885363A
CN104885363A CN201280078041.1A CN201280078041A CN104885363A CN 104885363 A CN104885363 A CN 104885363A CN 201280078041 A CN201280078041 A CN 201280078041A CN 104885363 A CN104885363 A CN 104885363A
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China
Prior art keywords
semiconductor switch
current
switch
switching device
semiconductor
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Chinese (zh)
Inventor
马尔科·塔卡拉
泰勒·肯塔拉
哈里·马特拉尔
马蒂·克基普罗
托米·兰塔宁
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ABB AB
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ABB AB
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027Measuring means of, e.g. currents through or voltages across the switch

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  • Driving Mechanisms And Operating Circuits Of Arc-Extinguishing High-Tension Switches (AREA)

Abstract

一种半导体开关设备,该开关设备对于每个电流相包括第一半导体开关(2a)、第二半导体开关(2b)、第一二极管(3a)、第二二极管(3b)、用于从所述半导体开关的输入线和输出线测量电压的装置、以及与所述半导体开关串联地布置的用于测量电流的装置(8)。另外地,该设备包括控制元件(14),所述控制元件(14)被配置成在零电压点下接通半导体开关设备并且在零电流点下关断半导体开关。

A semiconductor switching device comprising, for each current phase, a first semiconductor switch (2a), a second semiconductor switch (2b), a first diode (3a), a second diode (3b), with Means for measuring voltage from input and output lines of said semiconductor switch, and means (8) for measuring current arranged in series with said semiconductor switch. Additionally, the device comprises a control element (14) configured to switch on the semiconductor switching device at a point of zero voltage and to switch off the semiconductor switch at a point of zero current.

Description

半导体开关设备semiconductor switchgear

背景技术Background technique

本发明涉及用于切换电路的方法和设备。The present invention relates to methods and apparatus for switching circuits.

与常规机械开关相关联的问题之一是在关断时在触点表面之间往往产生电弧,这导致开关的磨损。One of the problems associated with conventional mechanical switches is that arcing tends to occur between the contact surfaces when turned off, which causes wear on the switch.

发明内容Contents of the invention

因而,本方案的目的是提供一种新方法以及一种用于实现该方法的设备。通过由独立权利要求中所陈述的内容所表征的方法和设备来实现本发明的目的。本发明的优选实施方式在从属权利要求中公开。Therefore, the purpose of this solution is to provide a new method and a device for implementing the method. The objects of the invention are achieved by a method and a device which are characterized by what is stated in the independent claims. Preferred embodiments of the invention are disclosed in the dependent claims.

该方案基于下述构思:利用对于每个电流相的成对的半导体开关和与每个半导体开关串联地连接的二极管的特性逐步地使电路从接通切换为关断,其中,每个二极管可以是另一半导体开关的外部二极管或内部二极管。The solution is based on the idea of switching the circuit stepwise from on to off using the properties of a pair of semiconductor switches for each current phase and a diode connected in series with each semiconductor switch, wherein each diode can is the external or internal diode of another semiconductor switch.

该方案的方法和设备的有利特征是:可以布置对电路的零电压连接和零电流断开,这使得能够提供在关断时不产生电弧的方案。An advantageous feature of the method and device of this solution is that a zero-voltage connection and a zero-current disconnection to the circuit can be arranged, which makes it possible to provide a solution that does not generate arcs when switched off.

附图说明Description of drawings

下面将参照所附(附加)附图借助优选实施方式来更详细地描述该方案,在附图中:The solution will be described in more detail below by means of a preferred embodiment with reference to the attached (additional) drawings, in which:

图1a和图1b是对于1相AC电路的半导体开关设备的示意图;Figures 1a and 1b are schematic diagrams of semiconductor switching devices for 1-phase AC circuits;

图2示意性地示出了用于切换电路中的电流的方法;Figure 2 schematically illustrates a method for switching current in a circuit;

图3示意性地示出了用于切换电路中的电流的另一方法;Figure 3 schematically illustrates another method for switching current in a circuit;

图4是示出在包括半导体开关设备的电路中在接通事件期间相电压和相电流关于时间的示意性曲线图;Figure 4 is a schematic graph showing phase voltage and phase current versus time during a turn-on event in a circuit comprising a semiconductor switching device;

图5是示出在包括半导体开关设备的电路中在关断事件期间相电压和相电流关于时间的示意性曲线图;Figure 5 is a schematic graph showing phase voltage and phase current versus time during a turn-off event in a circuit comprising a semiconductor switching device;

图6示意性地示出了一种实施方式的半导体开关设备;Fig. 6 schematically shows a semiconductor switching device according to an embodiment;

图7示意性地示出了另一实施方式的半导体开关设备;Fig. 7 schematically shows a semiconductor switching device of another embodiment;

图8按照框图示意性地示出了对于3相AC电路的半导体开关设备;Fig. 8 schematically shows a semiconductor switching device for a 3-phase AC circuit according to a block diagram;

图9按照框图示意性地示出了在零电压情况下接通3相半导体开关设备;FIG. 9 shows schematically according to a block diagram the switching on of a 3-phase semiconductor switching device at zero voltage;

图10按照框图示意性地示出了在零电流情况下关断3相半导体开关设备;Fig. 10 shows schematically according to a block diagram the switching off of a 3-phase semiconductor switching device in the case of zero current;

图11按照框图示意性地示出了对于包括主动式撬棒的实施方式的过电流关断逻辑;FIG. 11 schematically illustrates overcurrent shutdown logic for an embodiment including an active crowbar in block diagram form;

图12示意性地示出了对于包括串联隔离开关的3相AC电路的半导体开关设备的实施方式;以及Fig. 12 schematically shows an embodiment of a semiconductor switching device for a 3-phase AC circuit comprising series isolating switches; and

图13示意性地示出了用于在过电流事件下关断电路的方法。Figure 13 schematically illustrates a method for shutting down a circuit in an overcurrent event.

具体实施方式Detailed ways

在图中,用相同的附图标记指示相似的结构和/或功能的部分和部件。In the figures, similar structural and/or functional parts and components are denoted by the same reference numerals.

图1a和图1b是对于1相AC电路的半导体开关设备的示意图。图1a中示出的实施方式包括与1相交流(AC)电路连接的半导体开关设备1。图1a的半导体开关设备包括并联地连接的第一半导体开关2a和第二半导体开关2b。第一二极管3a与第一半导体开关2a串联地连接,并且第二二极管3b与第二半导体开关2b串联地连接,使得第一二极管和第二二极管的正向偏置方向与同所述二极管串联地连接的相应的第一半导体开关和第二半导体开关的内部二极管的正向偏置方向相反。该图中还示出了1相AC源4、输入电阻器5a、输入电感器5b、负载电流10、负载电阻器6a和负载电感器。另外地,图1a的设备还包括用于测量电压的装置7和用于测量电流的装置8,所述用于测量电流的装置8与所述半导体开关串联地布置以测量电流。优选地,半导体开关设备还包括过电压保护元件9,该过电压保护元件9用于吸收通过在过电流事件中使电路关断而产生的感应能量。因而,过电压保护元件9可以用于限制跨半导体开关的电压以防止半导体开关中断(break)。图1a的半导体开关设备可以用于控制在零电压点下接通电路并且在零电流点下关断电路。Figures 1a and 1b are schematic diagrams of a semiconductor switching device for a 1-phase AC circuit. The embodiment shown in Figure 1 a comprises a semiconductor switching device 1 connected to a 1-phase alternating current (AC) circuit. The semiconductor switching device of FIG. 1a comprises a first semiconductor switch 2a and a second semiconductor switch 2b connected in parallel. The first diode 3a is connected in series with the first semiconductor switch 2a, and the second diode 3b is connected in series with the second semiconductor switch 2b, such that the forward bias of the first diode and the second diode The direction is opposite to the forward bias direction of the inner diodes of the respective first and second semiconductor switches connected in series with said diodes. Also shown in the figure are 1-phase AC source 4, input resistor 5a, input inductor 5b, load current 10, load resistor 6a and load inductor. Additionally, the device of FIG. 1 a also comprises means for measuring voltage 7 and means for measuring current 8 arranged in series with said semiconductor switch for measuring current. Preferably, the semiconductor switching device further comprises an overvoltage protection element 9 for absorbing inductive energy generated by shutting down the circuit in an overcurrent event. Thus, the overvoltage protection element 9 may be used to limit the voltage across the semiconductor switch to prevent the semiconductor switch from breaking. The semiconductor switching device of FIG. 1 a can be used to control switching on a circuit at a point of zero voltage and switching off a circuit at a point of zero current.

可以通过根据图2的方法来实现在零电压点下的接通,其中,响应于接通电路的命令来检测201相电压的极性。可以通过用于测量电压的装置7来检测相电压的极性。然后,可以使与反向偏置的二极管串联地连接的半导体开关接通202为导通状态。这意指,如果电压为正,则使第二半导体开关2b接通为导通状态,并且如果电压为负,则使第一半导体开关2a接通为导通状态。此时,主电路中没有电流流动,这是因为与被接通为导通状态的半导体开关2b、2a串联地连接的相应的二极管3b或二极管3a反向偏置,因而阻止了电路中的电流流动。当相电压的极性被改变时,电流通过在导通状态下的半导体开关以及在相电流的极性变化之后沿正向连接的相应的二极管开始在主电路中流动,所述在导通状态下的半导体开关取决于电压的原始极性为第一半导体开关2a或第二半导体开关2b,并且所述相应的二极管取决于电压原始极性为相应的第一二极管3a或第二二极管3b。同时,响应于相电压的极性变化来使仍被关断的另一半导体开关接通203为导通状态,所述另一半导体开关为在原始所检测到的电压极性期间与沿正向连接的二极管串联地连接的半导体开关。因此,电流在两种电流极性期间在主电路中流动。此外,可以通过用于测量电压的装置7来检测相电压的第二极性变化。因而,主电路在零电压下被接通。这是接通电路的有益方式,原因是可以避免电流尖峰并且不存在与接通事件相关的电压冲击,从而例如可以避免电磁干扰。Switching on at the point of zero voltage can be achieved by the method according to FIG. 2 , wherein the polarity of the phase voltages is detected 201 in response to a command to switch on the circuit. The polarity of the phase voltages can be detected by the means 7 for measuring voltages. A semiconductor switch connected in series with the reverse biased diode can then be turned 202 into a conductive state. This means that if the voltage is positive, the second semiconductor switch 2b is turned on to the conductive state, and if the voltage is negative, the first semiconductor switch 2a is turned on to the conductive state. At this time, no current flows in the main circuit because the corresponding diode 3b or diode 3a connected in series with the semiconductor switch 2b, 2a which is switched on to the conductive state is reverse biased, thus preventing the current flow in the circuit flow. When the polarity of the phase voltage is changed, the current starts to flow in the main circuit through the semiconductor switch in the conducting state and the corresponding diode connected in the forward direction after the polarity change of the phase current, which in the conducting state The lower semiconductor switch is the first semiconductor switch 2a or the second semiconductor switch 2b depending on the original polarity of the voltage, and the corresponding diode is the corresponding first diode 3a or the second diode depending on the original polarity of the voltage Tube 3b. Simultaneously, the other semiconductor switch, which is still turned off during the originally detected voltage polarity and in the positive direction The connected diodes are connected in series with the semiconductor switches. Therefore, current flows in the main circuit during both current polarities. Furthermore, a second polarity change of the phase voltages can be detected by the means 7 for measuring voltages. Thus, the main circuit is turned on at zero voltage. This is an advantageous way of switching on a circuit, since current spikes can be avoided and there are no voltage surges associated with switching on events, so that for example electromagnetic interference can be avoided.

图4中示出了使用这样的设备并且根据这样的方法接通电路的示例,其中,示出了相电压12和相电流11关于时间的变化。在示例中,开关设备在时间t0的时刻接收到接通电路的命令,并且由于相电压为负,所以第一半导体开关2a被接通为导通状态。当相电压12在时间t1的时刻改变极性时,相电流11开始在主电路中流动,并且在相同时刻第二半导体开关2b也被接通为导通状态。An example of using such a device and switching on a circuit according to such a method is shown in FIG. 4 , in which the variation of the phase voltage 12 and phase current 11 with respect to time is shown. In the example, the switching device receives a command to turn on the circuit at the instant of time t0 , and since the phase voltage is negative, the first semiconductor switch 2a is turned on into a conducting state. When the phase voltage 12 changes polarity at the instant of time t1 , the phase current 11 starts to flow in the main circuit, and at the same instant the second semiconductor switch 2b is also turned on to a conducting state.

可以通过根据图3的方法来实现在零电流点下的关断,其中,响应于关断电路的命令来检测301相电压的极性和相电流的极性。可以通过用于测量电压的装置7来检测相电压的极性和相电压的极性变化,并且可以通过用于测量电流的装置8来检测相电流的极性和相电流的极性变化。响应于相电压的极性和相电流的极性相同来使与反向偏置的二极管3a、3b串联地连接的半导体开关2a、2b关断302为非导通状态。这意指,如果电压和电流二者均为正,则使第二半导体开关2b关断为非导通状态,并且如果电压和电流二者均为负,则使第一半导体开关2a关断为非导通状态。如果相电压的极性和相电流的极性不相同,即,一者为负而另一者为正,则不采取动作直到检测到相电压和相电流的极性相同为止。因而,当相电流正在改变其方向时,相电流由于与仍在导通状态下的半导体开关2a、2b串联地连接的二极管3a、3b被反向偏置而不再具有电流路径,另一方面,在非导通状态下的另一半导体开关也阻止电流流动。然后,在从步骤302中关断另一半导体开关起经过了基本上等于AC半循环的时间之后使仍在导通状态下的半导体开关关断303为非导通状态。以这种方式可以确保电压的极性和电流的极性与半导体开关导通电流方向相反。还应当监测相电压以确保不再由于相电流与相电压之间的相位差而使电流接通。这是关断电路的有益方式,原因是在零电流下的关断事件防止产生会对设备本身或其他设备造成电磁干扰的电压尖峰。另外地,可能不需要使用机械开关的快速关断,这可以延长机械开关的寿命。Switching off at the zero current point can be achieved by the method according to Fig. 3, wherein the polarity of the phase voltage and the polarity of the phase current are detected 301 in response to a command to switch off the circuit. The polarity of the phase voltages and the change in polarity of the phase voltages can be detected by the means for measuring voltage 7 and the polarity of the phase currents and the change in polarity of the phase currents can be detected by means for measuring the current 8 . The semiconductor switches 2a, 2b connected in series with the reverse biased diodes 3a, 3b are turned off 302 into a non-conductive state in response to the phase voltage being of the same polarity as the phase current being of the same polarity. This means that if both the voltage and current are positive, the second semiconductor switch 2b is turned off into a non-conductive state, and if both the voltage and current are negative, the first semiconductor switch 2a is turned off into non-conductive state. If the polarity of the phase voltage and the phase current are not the same, ie one is negative and the other is positive, no action is taken until the same polarity of the phase voltage and phase current is detected. Thus, when the phase current is changing its direction, the phase current no longer has a current path due to the reverse bias of the diode 3a, 3b connected in series with the semiconductor switch 2a, 2b still in the conducting state, on the other hand , another semiconductor switch in the non-conducting state also prevents current flow. Then, the semiconductor switch still in the conducting state is turned off 303 to a non-conducting state after a time substantially equal to an AC half cycle has elapsed since the other semiconductor switch was turned off in step 302 . In this way it can be ensured that the polarity of the voltage and the polarity of the current are opposite to the direction in which the semiconductor switch conducts the current. The phase voltages should also be monitored to ensure that the current is no longer switched on due to the phase difference between the phase current and the phase voltage. This is a beneficial way to turn off a circuit because a turn-off event at zero current prevents voltage spikes that could cause electromagnetic interference to the device itself or to other devices. Additionally, it may not be necessary to use a fast turn off of the mechanical switch, which can extend the life of the mechanical switch.

图5中示出了使用这样的设备并且根据这样的方法关断电路的示例,其中,示出了相电压12和相电流11关于时间的变化。在示例中,开关设备在时间t0的时刻接收到关断电路的命令,在该时刻相电压12和相电流11二者均为负,首先使第一半导体开关2a关断为非导通状态。当相电流11在时间t1的时刻改变其方向时,电流不再具有电流路径并且主电路中的电流被关断。当在时间t2的时刻经过了基本上等于AC半循环的时间时,第二半导体开关2b也被关断为非导通状态以防止电流在下一半循环期间返回。换句话说,在图5中,基本上t2-t0=T/2。这使设备和方法独立于与该设备连接的电路的频率,从而使得相同的设备能够在任意频率例如50Hz、60Hz或400Hz的电路中使用。An example of using such a device and switching off a circuit according to such a method is shown in FIG. 5 , where the variation of the phase voltage 12 and phase current 11 with respect to time is shown. In the example, the switching device receives a command to turn off the circuit at time t0 , at which point the phase voltage 12 and the phase current 11 are both negative, first turning off the first semiconductor switch 2a to a non-conductive state . When the phase current 11 changes its direction at the instant of time t 1 , the current no longer has a current path and the current in the main circuit is switched off. When a time substantially equal to the AC half cycle has elapsed at the instant of time t2 , the second semiconductor switch 2b is also turned off into a non-conductive state to prevent the current from returning during the next half cycle. In other words, in FIG. 5 , basically t 2 -t 0 =T/2. This makes the device and method independent of the frequency of the circuit to which the device is connected, thereby enabling the same device to be used in circuits of any frequency such as 50 Hz, 60 Hz or 400 Hz.

图1b示出了更简单且更具成本效益的半导体开关设备1。在这种实施方式中,第一半导体开关2a和第二半导体开关2b串联地连接,因而第一半导体开关2a的内部二极管(所谓的体二极管)代替第二二极管3b,并且第二半导体开关2b的内部二极管(所谓的体二极管)代替第一二极管3a。除此之外,连接可以相似,并且这种实施方式能够以相同方式实现图2和图3中示出的方法。可以在对于半导体开关的内部二极管所指定的最大正向电流足以用于正在讨论的所述应用的情况下使用这种实施方式。Figure 1b shows a simpler and more cost-effective semiconductor switching device 1 . In this embodiment, the first semiconductor switch 2a and the second semiconductor switch 2b are connected in series, so that the internal diode (so-called body diode) of the first semiconductor switch 2a replaces the second diode 3b, and the second semiconductor switch The inner diode of 2b (the so-called body diode) replaces the first diode 3a. Apart from that, the connections can be similar and such an embodiment can implement the methods shown in Figures 2 and 3 in the same way. This embodiment can be used where the specified maximum forward current for the internal diode of the semiconductor switch is sufficient for the application in question.

图6示出了一种实施方式的半导体开关设备,其中,该半导体开关设备还包括主开关13。半导体开关设备1例如在所有其他方面可以与图1a和图1b中示出的半导体开关设备相似,并且可以使用半导体开关设备1来实现图2和图3的方法。在图6中,半导体开关2a、2b和二极管3a、3b与图1a的半导体开关2a、2b和二极管3a、3b相似。主开关13可以包括机械开关,该机械开关可以是例如在短路事件中特别有益的超快速双稳定机械开关,然而在不同的实施方式中可以使用不同类型的机械开关。在这样的实施方式中,主开关13可以在接收到接通电路的命令的时刻处于非导通状态下。然后,可以根据结合图2说明的方法来接通半导体开关2a、2b以接通电路中的电流。然后,当半导体开关2a、2b二者均在导通状态下时,可以使主开关13接通为导通状态。然后,由于更低通态损耗而可以使电流路径从半导体开关2a、2b分支换向至主开关13分支。然后,可以使半导体开关2a、2b关断为非导通状态。FIG. 6 shows an embodiment of a semiconductor switching device, wherein the semiconductor switching device also includes a main switch 13 . The semiconductor switching device 1 can eg be similar in all other respects to the semiconductor switching device shown in FIGS. 1a and 1b and the method of FIGS. 2 and 3 can be implemented using the semiconductor switching device 1 . In FIG. 6, the semiconductor switches 2a, 2b and diodes 3a, 3b are similar to the semiconductor switches 2a, 2b and diodes 3a, 3b of FIG. 1a. The main switch 13 may comprise a mechanical switch, such as an ultra-fast bistable mechanical switch which is particularly beneficial in short circuit events, although different types of mechanical switches may be used in different embodiments. In such an embodiment, the main switch 13 may be in a non-conductive state at the moment the command to close the circuit is received. The semiconductor switches 2a, 2b can then be switched on according to the method explained in conjunction with FIG. 2 to switch on the current in the circuit. Then, when both the semiconductor switches 2a, 2b are in the conductive state, the main switch 13 can be turned on to be in the conductive state. The current path can then be commutated from the semiconductor switch 2a, 2b branch to the main switch 13 branch due to lower on-state losses. Then, the semiconductor switches 2a, 2b can be turned off in a non-conductive state.

当接收到关断电路的命令时,首先可以使半导体开关2a、2b接通为导通状态。然后,可以使主开关13关断为非导通状态。此后,例如,如结合图3所描述的,可以使主电路关断以阻止电流流动。When a command to turn off the circuit is received, firstly the semiconductor switches 2a, 2b can be turned on to be in a conducting state. Then, the main switch 13 can be turned off to a non-conductive state. Thereafter, for example, as described in connection with FIG. 3 , the main circuit may be turned off to prevent current flow.

图7示出了在其他方面可以与图6的实施方式相似的另一实施方式,而半导体开关2a、2b和二极管3a、3b部分与图1b的半导体开关2a、2b和二极管3a、3b部分相似。Fig. 7 shows another embodiment which may otherwise be similar to the embodiment of Fig. 6, while the semiconductor switches 2a, 2b and the diodes 3a, 3b part are similar to those of Fig. 1b .

图8按照框图示出了对于3相AC电路的半导体开关设备。在上述半导体开关设备1的3相AC应用中,可以对于每个相单独应用根据图1a、图1b、图6或图7的半导体开关设备以及根据图2和/或图3的方法。图8还示出了可以在控制半导体开关设备过程中使用的控制元件14和一些其他的部件和单元。相同的控制元件14可以被配置成用在1相应用和3相应用二者中。Fig. 8 shows a semiconductor switching device for a 3-phase AC circuit as a block diagram. In a 3-phase AC application of the semiconductor switching device 1 described above, the semiconductor switching device according to Fig. 1 a, Fig. 1 b, Fig. 6 or 7 and the method according to Fig. 2 and/or Fig. 3 can be applied individually for each phase. Fig. 8 also shows a control element 14 and some other components and units that may be used in controlling the semiconductor switching device. The same control element 14 may be configured for use in both 1-phase and 3-phase applications.

3相开关的主开关13可以包括机械开关,例如,超快速双稳定机械开关。半导体开关设备1还可以包括:可选地包括二极管3a、3b的半导体开关2a、2b、过电压保护元件9、相线的用于测量电压的装置7以及用于测量电流的装置8,所述用于测量电流的装置8与半导体开关串联地布置以测量相线的电流8。在不同的实施方式中,半导体开关设备1还可以包括下述内容中至少一者:图形用户接口15、控制元件14(例如,可编程集成电路(IC),如现场可编程门阵列(FPGA)、微控制器(MCU)或数字信号处理器(DSP))、主动式撬棒(active crowbar)17、主动式撬棒的电流测量电路16、包括用于确定最大电流值的装置19和用于确定最大电流速率的装置20的过电流保护电路18、相线的主开关驱动电路21、相线的半导体开关驱动电路22以及主动式撬棒的驱动电路23。The main switch 13 of the 3-phase switch may comprise a mechanical switch, eg an ultra-fast bistable mechanical switch. The semiconductor switching device 1 may also comprise: semiconductor switches 2a, 2b optionally including diodes 3a, 3b, an overvoltage protection element 9, means for measuring voltage 7 of the phase lines and means for measuring current 8, said A device 8 for measuring current is arranged in series with the semiconductor switch for measuring the current 8 of the phase conductor. In different embodiments, the semiconductor switching device 1 may also include at least one of the following: a graphical user interface 15, a control element 14 (for example, a programmable integrated circuit (IC), such as a field programmable gate array (FPGA) , microcontroller (MCU) or digital signal processor (DSP)), active crowbar (active crowbar) 17, current measurement circuit 16 of active crowbar, including means 19 for determining the maximum current value and for The overcurrent protection circuit 18 of the device 20 for determining the maximum current rate, the main switch drive circuit 21 of the phase line, the semiconductor switch drive circuit 22 of the phase line and the drive circuit 23 of the active crowbar.

3相半导体开关设备中的每个相包括与半导体开关2a、2b和过电压保护元件9并联地连接的主开关13。优选地,这种半导体开关可以完全可控制使得可以使该半导体开关随意接通以及关断。半导体开关2a、2b可以包括绝缘栅双极型晶体管(IGBT)、栅极可关断晶闸管(GTO)或集成栅极换向晶闸管(IGCT)。Each phase of the 3-phase semiconductor switching device comprises a main switch 13 connected in parallel with the semiconductor switches 2 a , 2 b and the overvoltage protection element 9 . Preferably, such a semiconductor switch is fully controllable such that it can be switched on and off at will. The semiconductor switches 2a, 2b may comprise insulated gate bipolar transistors (IGBTs), gate turn-off thyristors (GTOs) or integrated gate commutated thyristors (IGCTs).

根据实施方式,图形用户接口15可以连接至控制元件14。图形用户接口可以被配置成:接收来自用户的输入以设置3相半导体开关设备的设定值;向3相半导体开关设备提供命令;并且具有来自3相半导体开关设备的状态信息和测量结果。According to an embodiment, a graphical user interface 15 may be connected to the control element 14 . The graphical user interface may be configured to: receive input from a user to set a set point for the 3-phase semiconductor switching device; provide commands to the 3-phase semiconductor switching device; and have status information and measurements from the 3-phase semiconductor switching device.

根据实施方式,相线的用于测量电压的装置7可以连接至控制元件14。可以根据每个相从开关部件13、2a、2b的输入端和输出端测量电压。控制元件14可以基于通过用于测量电压的装置7得到的电压测量结果来控制3相开关的接通功能。控制元件14还可以使用电压测量结果来控制3相开关的正常关断功能。According to an embodiment, the device 7 for measuring the voltage of the phase line can be connected to the control element 14 . The voltage can be measured from the input and output of the switching means 13, 2a, 2b according to each phase. The control element 14 can control the switching function of the 3-phase switch on the basis of the voltage measurement obtained by the device 7 for measuring voltage. The control element 14 may also use the voltage measurements to control the normal shutdown function of the 3-phase switch.

根据实施方式,相线的用于测量电流的装置8可以连接至控制元件14并且连接至过电流保护电路18。在每个相中用于测量电流的装置8可以在开关部件13、2a、2b与可选择的主动式撬棒电路之间与该开关部件13、2a、2b串联地连接。控制元件14可以基于通过相线的用于测量电流的装置8得到的电流测量结果来控制开关的正常关断功能。连接至相线的用于测量电流的装置8并且连接至控制元件14的过电流保护电路18可以处理通过相线的用于测量电流的装置8得到的电流测量结果,并且该过电流保护电路18可以向控制元件提供下述信息类型中的至少之一:相电流的绝对值的最大值和相电流的电流变化率的最大值。控制元件14可以使用其内部比较器来对所确定的最大值与参考值进行比较。然后,控制元件14可以检测出在所确定的最大值大于参考值的情况下的过电流事件。例如,可以在图形用户接口15中设定参考值。According to an embodiment, the device 8 for measuring the current of the phase line can be connected to the control element 14 and to the overcurrent protection circuit 18 . The device 8 for measuring the current in each phase can be connected in series with the switching element 13, 2a, 2b between the switching element 13, 2a, 2b and an optional active crowbar circuit. The control element 14 can control the normal shut-off function of the switch on the basis of current measurements obtained by means 8 of the phase conductors for measuring current. An overcurrent protection circuit 18 connected to the means 8 for measuring current of the phase line and connected to the control element 14 can process the current measurement obtained by the means 8 for measuring current of the phase line, and the overcurrent protection circuit 18 At least one of the following types of information may be provided to the control element: a maximum value of the absolute value of the phase current and a maximum value of the current rate of change of the phase current. The control element 14 can use its internal comparator to compare the determined maximum value with a reference value. The control element 14 may then detect an overcurrent event in case the determined maximum value is greater than the reference value. For example, the reference value can be set in the graphical user interface 15 .

根据实施方式,主动式撬棒的电流测量装置连接至控制元件14。主动式撬棒的电流测量装置与主动式撬棒的半导体开关串联地连接以测量经过主动式撬棒的半导体开关的电流。控制元件14基于电流测量结果来控制主动式撬棒的半导体开关。According to an embodiment, the current measuring device of the active crowbar is connected to the control element 14 . The active crowbar current measuring device is connected in series with the active crowbar semiconductor switch to measure the current through the active crowbar semiconductor switch. The control element 14 controls the semiconductor switches of the active crowbar on the basis of the current measurement.

根据实施方式,相的半导体开关的驱动电路22可以连接在控制元件14与相的半导体开关2a、2b之间。控制元件可以被配置成生成至相的半导体开关的驱动电路22的控制信号以使半导体开关接通或关断。According to an embodiment, the drive circuit 22 of the semiconductor switches of the phases can be connected between the control element 14 and the semiconductor switches 2a, 2b of the phases. The control element may be configured to generate a control signal to the drive circuit 22 of the semiconductor switch of the phase to switch the semiconductor switch on or off.

根据实施方式,相的主开关驱动电路21可以连接在控制元件14与相的主开关13之间。控制元件14可以被配置成生成至相的主开关驱动电路21的控制信号,以使主开关13的触点——在某些的实施方式中为机械触点——移动至断开位置或闭合位置。According to an embodiment, the phase main switch drive circuit 21 may be connected between the control element 14 and the phase main switch 13 . The control element 14 may be configured to generate a control signal to the main switch drive circuit 21 of the phase to move the contacts, in some embodiments mechanical contacts, of the main switch 13 to an open position or a closed position. Location.

根据实施方式,半导体开关设备包括所谓的主动式撬棒17,该主动式撬棒17可以用来在过流事件中关断时给出对于感应负载电流的电流路径。主动式撬棒的驱动电路23可以连接在控制元件14与主动式撬棒17之间。然后,控制元件14可以被配置成生成至主动式撬棒的驱动电路23的控制信号,该控制信号使主动式撬棒的半导体开关接通或关断。这样的实施方式的益处是:在这样的关断事件中存储在负载中的能量可以被吸收在负载的电阻部分中而不是使负载能量仅吸收在过电压保护元件9中。这能够延长过电压保护元件的寿命。According to an embodiment, the semiconductor switching device comprises a so-called active crowbar 17 which can be used to give a current path for the inductive load current when switching off in an overcurrent event. The driving circuit 23 of the active crowbar can be connected between the control element 14 and the active crowbar 17 . The control element 14 may then be configured to generate a control signal to the drive circuit 23 of the active crowbar that switches the semiconductor switch of the active crowbar on or off. The benefit of such an embodiment is that the energy stored in the load during such a switch-off event can be absorbed in the resistive part of the load instead of having the load energy only absorbed in the overvoltage protection element 9 . This can prolong the lifetime of the overvoltage protection element.

因而,在每个相线中,半导体开关可以包括两个半导体开关2a、2b。以上结合其他实施方式讨论了不同类型的合适的半导体开关的一些示例。对于每个半导体开关,还可以存在串联地连接的二极管3a、3b。一个相中的这两个二极管半导体开关对可以反向并联地连接,使得在半导体开关被接通时,正电流即从源至负载的电流流过包括第一半导体开关2a和第一二极管3a的二极管半导体对,并且负电流即从负载至源的电流流过包括第二半导体开关2b和第二二极管3b的另一二极管半导体对。可以使用例如结合其他实施方式所描述的过电压保护元件9作为过电压保护装置。这些过电压保护元件9可以与主开关13和半导体开关2a、2b并联地连接以限制在开关两端的电压,并且在过电流事件中电流中断时吸收主电路的感应能量。Thus, in each phase line, the semiconductor switches may comprise two semiconductor switches 2a, 2b. Some examples of different types of suitable semiconductor switches are discussed above in connection with other embodiments. For each semiconductor switch there may also be a diode 3a, 3b connected in series. The two pairs of diode semiconductor switches in one phase may be connected in antiparallel such that when the semiconductor switches are switched on, a positive current, i.e. a current from source to load, flows through the pair comprising the first semiconductor switch 2a and the first diode 3a, and the negative current, ie the current from the load to the source, flows through another diode-semiconductor pair comprising the second semiconductor switch 2b and the second diode 3b. An overvoltage protection element 9 such as that described in connection with the other embodiments can be used as overvoltage protection device. These overvoltage protection elements 9 may be connected in parallel with the main switch 13 and the semiconductor switches 2a, 2b to limit the voltage across the switches and absorb the inductive energy of the main circuit when the current is interrupted in an overcurrent event.

根据实施方式,半导体开关2a、2b可以均通过包括驱动器例如光耦合器驱动电路的半导体开关驱动电路22来单独进行控制。在不同的实施方式中,并联的主开关13可以通过包括驱动器例如光耦合器驱动器的主开关驱动电路21来进行控制。使用光耦合器是有益的,这是因为光耦合器提供初级侧(primary)与次级侧(secondary)之间的良好的电压隔离以及低传播延迟。可以通过用于测量电压的装置7从开关部件2a、2b、3a、3b、13的两侧——从源侧(U_nS)和负载侧(U_nL)——测量电压。使用用于测量电流的装置8例如电流传感器来测量相线中的电流,该电流传感器具有良好的精度、宽频率带宽以及初级侧与次级侧之间的良好电流隔离(galvanic isolation)。例如,闭环霍尔效应电流传感器可以是适当的。过电流保护电路可以包括模拟电子器件。According to an embodiment, the semiconductor switches 2a, 2b may each be individually controlled by a semiconductor switch drive circuit 22 comprising a driver such as an optocoupler drive circuit. In different embodiments, the parallel main switches 13 may be controlled by a main switch drive circuit 21 comprising a driver, eg an optocoupler driver. Using optocouplers is beneficial because optocouplers provide good voltage isolation between the primary and secondary sides and low propagation delay. The voltage can be measured from both sides of the switching elements 2a, 2b, 3a, 3b, 13—from the source side (U_nS) and the load side (U_nL)—by means of the device 7 for measuring voltage. The current in the phase conductor is measured using means 8 for measuring current, such as a current sensor with good accuracy, wide frequency bandwidth and good galvanic isolation between the primary and secondary sides. For example, a closed loop Hall effect current sensor may be suitable. The overcurrent protection circuit may include analog electronics.

根据实施方式,可以根据与结合图2所描述的方法基本上相似的方法在零电压下在没有电磁干扰的情况下完成接通3相半导体开关设备,但是自然地,必须使该切换对于每个相而独立。可以使用半导体开关2a、2b来完成零电压切换,并且可以保持主开关断开,只要所有半导体开关被接通即可,如结合例如图6和图7所描述的。在每个相中可以基于跨半导体开关的电压——在图9中称为U_nS与U_nL——的极性来接通该半导体开关,其中,S指的是源,L指的是负载,并且n指的是每个电压相。如果跨开关的电压为正,则使相的第二半导体开关2b接通(在图9的框图中用S2、S4、S6来表示),并且如果跨开关的电压为负,则使相的第一半导体开关2a接通(在图9的框图中用S1、S3、S5来表示)。在接通一个半导体开关之后,然后,与该半导体开关串联的二极管3a、3b被反向偏置。因此,在相线中没有电流流动直到跨开关部件的电压的极性改变时为止。当电流流过一个半导体开关时,使相的另一半导体开关也接通。在3相系统中,如果连接了中性线,则在一个相被接通之后,主电路中的电流开始流动,并且如果中性线未被连接,则在两个相被接通之后,主电路中的电流开始流动。在所有相线被接通之后,所有相的可选择的主开关13被接通。由于半导体开关的更高通态电压因而使电流换向至主开关的分支。图9中按照表示3相应用的正常接通逻辑的框图示出了这些原理。According to an embodiment, switching on a 3-phase semiconductor switching device can be done at zero voltage without electromagnetic interference according to a method substantially similar to that described in connection with FIG. 2 , but naturally this switching must be made for each Phase and independent. Zero voltage switching can be done using the semiconductor switches 2a, 2b, and the main switch can be kept off as long as all semiconductor switches are switched on, as described in connection with eg FIGS. 6 and 7 . The semiconductor switches can be turned on in each phase based on the polarity of the voltage across them, referred to as U_nS and U_nL in FIG. 9 , where S refers to source, L refers to load, and n refers to each voltage phase. If the voltage across the switches is positive, the second semiconductor switch 2b of the phase is turned on (indicated by S2, S4, S6 in the block diagram of Figure 9), and if the voltage across the switches is negative, the second semiconductor switch 2b of the phase is turned on. A semiconductor switch 2a is switched on (indicated by S1, S3, S5 in the block diagram of FIG. 9). After switching on a semiconductor switch, the diodes 3a, 3b connected in series with the semiconductor switch are then reverse biased. Hence, no current flows in the phase conductor until the polarity of the voltage across the switching means changes. When current flows through one semiconductor switch, the other semiconductor switch of the phase is also turned on. In a 3-phase system, current in the main circuit starts to flow after one phase is switched on if the neutral wire is connected, and after both phases are switched on if the neutral wire is not connected. The current in the circuit starts to flow. After all phase conductors are switched on, the selectable main switches 13 of all phases are switched on. The current is commutated to the branch of the main switch due to the higher on-state voltage of the semiconductor switch. These principles are shown in Figure 9 in terms of a block diagram representing the normal-on logic for a 3-phase application.

根据实施方式,可以在零电流下完成关断3相半导体开关设备,从而防止在关断感应负载时在机械触点之间产生电弧。可以根据与以上结合例如图3所描述的原理相同的原理使用半导体开关来完成零电流关断。为了实现此效果,首先需要通过接通半导体开关来使相电流换向至该半导体开关,并且然后以与结合例如图6和图7所说明的1相AC应用的方式相似的方式关断超快速开关。在关断事件中,可以使用相线的用于测量电流的装置8和用于测量电压的装置7来实现使用半导体开关的零电流关断。如结合例如图3所说明的,基于相电压的极性和相电流的极性而对于每个相独立地关断半导体开关。如果一个相中的电流为正,即,电流从源指向负载,则使其中负电流流动的第二半导体开关2b(在图10的框图中用S2、S4、S6表示)关断。如果一个相中的电流为负,则使其中正电流流动的第一半导体开关2a(在图10的框图中用S1、S3、S5表示)关断。在图10中,相电流由I_n指示,其中,n指的是每个相,相电压由U_n指示,其中,n指的是每个相。现在,在相线的一个半导体开关被关断之后,该相中的电流不会中断直到相电流的极性改变时为止。然后,还可以在AC半循环(在图10中称为1/2电网周期或半电网周期)的延迟之后使仍在导通状态下的另一半导体开关关断。由于电流与电压之间的可能相位差,所以必须在相电压的极性与相电流的极性相同时完成关断事件。否则,电流可以再次接通。在3相AC应用中,如果中性线被连接,则在所有相被关断之后关断主电路中的电流,并且如果中性线未被连接,则在两个相被关断之后关断主电路中的电流。图10中按照表示3相应用的正常关断逻辑的框图示出了这些原理。According to an embodiment, switching off a 3-phase semiconductor switching device can be done at zero current, thereby preventing arcing between mechanical contacts when switching off an inductive load. Zero current turn-off can be accomplished using semiconductor switches according to the same principles as described above in connection with eg FIG. 3 . To achieve this effect, the phase current needs to be commutated to the semiconductor switch first by turning it on and then turning off the ultra-fast switch. In the event of a switch-off, a zero-current switch-off using semiconductor switches can be achieved using the means for measuring current 8 and the means for measuring voltage 7 of the phase conductors. As explained in connection with eg FIG. 3 , the semiconductor switches are turned off independently for each phase based on the polarity of the phase voltage and the polarity of the phase current. If the current in one phase is positive, ie the current is directed from the source to the load, the second semiconductor switch 2b (denoted S2, S4, S6 in the block diagram of Fig. 10) where the negative current flows is turned off. If the current in one phase is negative, the first semiconductor switch 2a (denoted S1, S3, S5 in the block diagram of Fig. 10) in which the positive current flows is turned off. In FIG. 10 , phase currents are indicated by I_n, where n refers to each phase, and phase voltages are indicated by U_n, where n refers to each phase. Now, after a semiconductor switch of a phase line has been switched off, the current flow in this phase is not interrupted until the polarity of the phase current changes. The other semiconductor switch, which is still in the conducting state, can then also be turned off after a delay of the AC half cycle (called 1/2 grid cycle or half grid cycle in FIG. 10 ). Due to the possible phase difference between current and voltage, the turn-off event must be done when the polarity of the phase voltage is the same as that of the phase current. Otherwise, the current can be switched on again. In 3-phase AC applications, the current in the main circuit is switched off after all phases are switched off if the neutral is connected, and after both phases are switched off if the neutral is not connected current in the main circuit. These principles are shown in Figure 10 in terms of a block diagram representing the normal shutdown logic for a 3-phase application.

可以通过根据图13的方法来实现在过电流事件下的关断。根据实施方式,可以基于电流值和/或基于电流变化率来完成3相AC开关的过电流保护。根据实施方式,控制元件14可以基于通过用于测量电流的装置8所确定的电流值来检测131过电流事件。控制元件可以响应于一个相中的电流的测量值大于预定电流限定值来检测过电流事件。在一些实施方式中,可以在用户接口例如图形用户接口中设定电流限定值。用户接口可以为例如已结合其他的实施方式描述的用户接口。Shutdown in an overcurrent event can be achieved by the method according to FIG. 13 . According to an embodiment, the overcurrent protection of the 3-phase AC switch can be done based on the current value and/or based on the rate of change of the current. According to an embodiment, the control element 14 may detect 131 an overcurrent event based on the current value determined by the means 8 for measuring current. The control element may detect an overcurrent event in response to a measurement of current in one phase being greater than a predetermined current limit. In some embodiments, the current limit can be set in a user interface, such as a graphical user interface. The user interface may be, for example, the user interface described in connection with other implementations.

根据实施方式,控制元件14可以基于电流变化率来检测过电流事件。控制元件可以响应于一个相中的电流变化率的测量值大于电流变化率限定值来检测131过电流事件。在一些实施方式中,可以在用户接口例如图形用户接口中设定电流变化率限定值。用户接口可以为例如已结合其他的实施方式描述的用户接口。基于电流变化率进行过电流保护的优点在于:可以在较低过电流值下检测指示过电流的异常电流变化率,这从系统角度出发在异常电流变化率处于危险水平之前很多,这降低了部件的应力。因而,该检测方法比基于电流水平的传统过电流保护更安全,这是因为到关断时过电流没有达到相同高值。在其他的实施方式中,可以使用电流值和电流变化率二者用于检测过电流事件。According to an embodiment, the control element 14 may detect an overcurrent event based on the rate of change of current. The control element may detect 131 an overcurrent event in response to the measured value of the rate of change of current in one phase being greater than a current rate of change limit. In some embodiments, the current rate of change limit can be set in a user interface, such as a graphical user interface. The user interface may be, for example, the user interface described in connection with other implementations. The advantage of overcurrent protection based on the rate of current change is that the abnormal rate of current change indicating an overcurrent can be detected at a lower overcurrent value, which is much before the abnormal rate of current change is at a dangerous level from a system perspective, which reduces the of stress. Thus, this detection method is safer than conventional overcurrent protection based on current level, because the overcurrent does not reach the same high value by the time of shutdown. In other embodiments, both the current value and the rate of change of current may be used for detecting an overcurrent event.

根据实施方式,在检测到过电流事件之后,控制元件14可以生成132至半导体开关2a、2b的接通信号以及至主开关13的关断信号以使电流换向至半导体开关2a、2b。在预定时间之后,当主开关13的触点之间的绝缘间隙充分时,控制元件14可以生成133至半导体开关2a、2b的关断信号以中断主电路中的电流。充分的绝缘间隙是在绝缘间隙的击穿电压大于与开关部件2a、2b、13并联地连接的过电压保护元件9的保护电平即钳位电压的情况下。在半导体开关2a、2b被关断之后,跨开关部件的电压由于主电路中的电感器而开始增大。当电压达到保护电平时,过电压保护元件形成在开关部件两端的低电阻分流器。然后,使存储在主电路的电感器中的能量吸收134在过电压保护元件9中。在不同的实施方式中,主开关13的隔离间隙可以包括空气或其他隔离物质或者其组合。According to an embodiment, after detecting an overcurrent event, the control element 14 may generate 132 an ON signal to the semiconductor switches 2a, 2b and an OFF signal to the main switch 13 to commutate current to the semiconductor switches 2a, 2b. After a predetermined time, when the insulation gap between the contacts of the main switch 13 is sufficient, the control element 14 may generate 133 a switch-off signal to the semiconductor switches 2a, 2b to interrupt the current flow in the main circuit. A sufficient insulation gap is when the breakdown voltage of the insulation gap is greater than the protection level, ie the clamping voltage, of the overvoltage protection element 9 connected in parallel to the switching elements 2 a , 2 b , 13 . After the semiconductor switches 2a, 2b are switched off, the voltage across the switching components starts to increase due to the inductor in the main circuit. When the voltage reaches a protection level, the overvoltage protection element forms a low resistance shunt across the switching element. The energy stored in the inductor of the main circuit is then absorbed 134 in the overvoltage protection element 9 . In different embodiments, the isolation gap of the main switch 13 may include air or other isolation substances or a combination thereof.

过电压保护元件9的寿命通常取决于吸收在过电压保护元件中的能量。瞬变越大,过电压保护元件的总寿命将越短。因而,基于电流变化率进行过电流保护的显著益处在于:该过电流保护比基于电流值进行的过电流保护更快速地检测到过电流事件,从而使过电流瞬变小得多。因而,这将进一步增加过电压保护元件寿命。The lifetime of the overvoltage protection element 9 generally depends on the energy absorbed in the overvoltage protection element. The larger the transient, the shorter the overall lifetime of the overvoltage protection components will be. Thus, a significant benefit of rate-of-current-based overcurrent protection is that it detects overcurrent events faster than current value-based overcurrent protection, resulting in much smaller overcurrent transients. Thus, this will further increase the lifetime of the overvoltage protection element.

根据实施方式,可以在其中负载电感器相对大的系统中使用所谓的主动式撬棒电路来进一步增加过电压保护元件9的寿命。图11是示出了在这样的实施方式中在如上所描述的主动式撬棒被连接的情况下的过电流关断逻辑的框图。因而,这样的主动式撬棒电路可以连接至负载侧。可以以与结合其他实施方式所描述的方式相似的方式来检测111过电流事件。可以以与结合图13在步骤132和133中所描述的方式相似的方式来关断半导体开关设备1,其中,例如,步骤112和113对应于步骤132,并且步骤114和115对应于步骤133。然而,在包括这样的主动式撬棒17的实施方式中,在生成至相线的半导体开关2a、2b的关断信号115之后,控制元件14然后可以生成至主动式撬棒的半导体开关的接通信号116。因而,可以通过使负载能量吸收在负载的电阻部分中而非过电压保护元件中的主动式撬棒来对感应负载电流进行换向。在其中负载是主动式负载且存储有感应能量和机械能量二者的实施方式中,机械能量可能通过主动式撬棒来维持或者甚至增大电流,这最终会毁坏半导体。在这样的实施方式中,可以提供主动式撬棒的电流测量电路16来通过测量经过主动式撬棒17的半导体开关的电流来防止这种情况,其中该电流测量电路16可以包括例如电流传感器。而且,主动式撬棒的电流测量电路16可以连接至控制元件14,该控制元件14可以响应于电流值大于预定撬棒电流限定值来生成至主动式撬棒17的半导体开关的关断信号。此后,可以使负载能量的剩余部分吸收在过电压保护元件9中。According to an embodiment, a so-called active crowbar circuit can be used in systems where the load inductor is relatively large to further increase the lifetime of the overvoltage protection element 9 . Figure 11 is a block diagram illustrating the overcurrent shutdown logic in such an embodiment with an active crowbar as described above connected. Thus, such an active crowbar circuit can be connected to the load side. An overcurrent event may be detected 111 in a manner similar to that described in connection with other embodiments. The semiconductor switching device 1 can be switched off in a manner similar to that described in steps 132 and 133 in connection with FIG. However, in an embodiment comprising such an active crowbar 17, after generating the switch-off signal 115 to the semiconductor switches 2a, 2b of the phase line, the control element 14 may then generate a connection to the semiconductor switches of the active crowbar. Signal 116. Thus, the inductive load current can be commutated by an active crowbar that absorbs the load energy in the resistive part of the load rather than in the overvoltage protection element. In embodiments where the load is an active load and stores both inductive and mechanical energy, the mechanical energy may maintain or even increase the current through the active crowbar, which would eventually destroy the semiconductor. In such an embodiment, an active crowbar current measurement circuit 16 may be provided to prevent this by measuring the current through the semiconductor switch of the active crowbar 17, which current measurement circuit 16 may include, for example, a current sensor. Furthermore, the current measurement circuit 16 of the active crowbar may be connected to a control element 14 which may generate a shutdown signal to the semiconductor switch of the active crowbar 17 in response to a current value greater than a predetermined crowbar current limit. Thereafter, the remainder of the load energy can be absorbed in the overvoltage protection element 9 .

根据另一实施方式,可以使用用于驱动主动式撬棒的光耦合器驱动电路23来检测大于预定撬棒电流限度值的电流值,其中,该光耦合器驱动电路23包括对主动式撬棒17的半导体开关的集成去饱和检测,并且该光耦合器驱动电路23进一步向控制元件14给出故障状态反馈。这种驱动器可以包括例如IGBT驱动器,该IGBT驱动器在IGBT的集电极与发射极之间的电压高于限定值时检测到过电流事件。根据实施方式,驱动器可以响应于检测到主动式撬棒的半导体开关的去饱和来自动地关断主动式撬棒的半导体开关并且向控制元件14给出故障状态反馈。在接收到故障信号之后,控制元件然后可以生成至驱动器的用于激活驱动器的复位信号,并且可以在需要时再次接通主动式撬棒的半导体开关。这种实施方式的益处在于:例如,通过使用这种类型的光耦合器驱动电路,可以省去主动式撬棒的电流测量电路16,但在图8中示出了光耦合器驱动电路和电流测量电路16二者。According to another embodiment, an optocoupler driving circuit 23 for driving an active crowbar may be used to detect a current value greater than a predetermined crowbar current limit value, wherein the optocoupler driving circuit 23 includes an active crowbar The integrated desaturation detection of the semiconductor switch of 17, and the optocoupler drive circuit 23 further gives fault status feedback to the control element 14. Such drivers may include, for example, IGBT drivers that detect an overcurrent event when the voltage between the collector and emitter of the IGBT is higher than a defined value. According to an embodiment, the driver may automatically turn off the semiconductor switch of the active crowbar and give fault status feedback to the control element 14 in response to detecting desaturation of the semiconductor switch of the active crowbar. After receiving the fault signal, the control element can then generate a reset signal to the driver for activating the driver and can switch on the semiconductor switch of the active crowbar again if required. The benefit of this embodiment is that, for example, by using this type of optocoupler drive circuit, the current measurement circuit 16 of the active crowbar can be omitted, but the optocoupler drive circuit and current Measuring circuit 16 both.

图12示意性地示出了对于3相AC电路的半导体开关设备的实施方式,该实施方式可以例如与图8中示出的实施方式相似,但对于每个相包括串联隔离开关24。例如,这样的开关可以用于开关设备的电流隔离以确保在维护工作期间的电气安全。根据某些实施方式,可以在上述实施方式中的任意实施方式中提供这样的串联隔离开关24。Fig. 12 schematically shows an embodiment of a semiconductor switching device for a 3-phase AC circuit, which may eg be similar to the embodiment shown in Fig. 8, but comprising a series isolating switch 24 for each phase. For example, such switches can be used for galvanic isolation of switchgear to ensure electrical safety during maintenance work. According to certain embodiments, such a series disconnect switch 24 may be provided in any of the embodiments described above.

对于本领域内技术人员明显的是随着技术进步本发明构思可以以各种方式实现。本发明及其实施方式不限于以上所描述的示例而可以在权利要求的范围内进行改变。It will be obvious to a person skilled in the art that as technology advances, the inventive concept can be implemented in various ways. The invention and its embodiments are not limited to the examples described above but may vary within the scope of the claims.

Claims (15)

1. for a semiconductor switching device for commutation circuit, wherein, described switchgear comprises mutually for each electric current:
First semiconductor switch and the second semiconductor switch, described first semiconductor switch and described second semiconductor switch can be controlled to arbitrarily turn on and off;
First diode and the second diode, described first diode and described second diode are for controlling available current path;
For from the input line of described semiconductor switch and the device of output line measuring voltage;
For measuring the device of electric current, itself and described semiconductor switch in series arrange the electric current measuring phase line; And
Control element, its order being configured to turn on and off in response to the described circuit of connection by controlling described semiconductor switch in response to voltage measurements and current measurement result is connected described semiconductor switching device and under zero-current point, is turned off described semiconductor switch in response to the order turning off described circuit under no-voltage point.
2. semiconductor switching device according to claim 1, wherein, described first semiconductor switch and described second semiconductor switch of described semiconductor switching device are connected in series, and described first diode and described second diode comprise the internal body diodes of described semiconductor switch and be used to control described available current path.
3. semiconductor switching device according to claim 1, wherein, described first semiconductor switch of described semiconductor switching device is connected in parallel with described second semiconductor switch, described first diode and described first semiconductor switch are connected in series, and described second diode and described second semiconductor switch are connected in series, make the forward bias direction of described first diode and described second diode to described Diode series the forward bias direction of internal body diodes of the first corresponding semiconductor switch of being connected and the second semiconductor switch contrary.
4. semiconductor switching device according to any one of claim 1 to 3, wherein, described semiconductor switching device also comprises main switch, and described main switch and described semiconductor switch are connected to realize lower on-state loss in the on-state in parallel.
5. semiconductor switching device according to any one of claim 1 to 4, wherein, described circuit is 3 phase AC circuit.
6. semiconductor switching device according to any one of claim 1 to 4, wherein, described circuit is 1 phase AC circuit.
7. semiconductor switching device according to any one of claim 1 to 6, wherein, described semiconductor switching device also comprises overvoltage protection element mutually for each.
8. semiconductor switching device according to any one of claim 1 to 7, wherein, described semiconductor switching device also comprises active crow bar.
9. semiconductor switching device according to any one of claim 1 to 8, wherein, described semiconductor switching device also comprises the series connection isolating switch for electric current isolation mutually for each electric current.
10. semiconductor switching device according to any one of claim 1 to 9, wherein, described control element is configured to:
The polarity of phase voltage is detected in response to the order of connecting described circuit;
Make with back-biased described Diode series the described semiconductor switch that is connected connect as conducting state; And
Change in polarity in response to described phase voltage makes to connect as conducting state with the described semiconductor switch be connected during original detected polarity of voltage forward biased described Diode series.
11. semiconductor switching device according to any one of claim 1 to 9, wherein, described control element is configured to:
The polarity of phase voltage and the polarity of phase current is detected in response to the order turning off described circuit;
Polarity in response to described phase voltage is identical with the polarity of described phase current make with back-biased described Diode series the semiconductor switch that is connected turn off; And
From turn off to have passed through second half conductor switch be substantially equal to the AC semi-cyclic time after still described semiconductor switch is in the on-state turned off as nonconducting state.
12. semiconductor switching device according to any one of claim 7 to 9, wherein, described control element is configured to:
One of at least carry out detection of excessive current event in response in following situation: one mutually in the measured value of electric current be greater than scheduled current limit value; And one mutually in the measured value of current changing rate be greater than current changing rate limit value;
Generate the connection signal of extremely described semiconductor switch and commutate to described semiconductor switch to the cut-off signals of described main switch to make electric current;
The cut-off signals of extremely described semiconductor switch is generated to interrupt the electric current in main circuit after the scheduled time;
Make to be stored in energy absorption in the inductor of main circuit after electric current in main circuit is interrupted in described overvoltage protection element.
13. 1 kinds of methods for the electric current in commutation circuit, described circuit comprises semiconductor switching device, described semiconductor switching device comprises the first semiconductor switch, the second semiconductor switch, the first diode, the second diode, for from the input line of described semiconductor switch and the device of output line measuring voltage and the device for measuring electric current, described method comprises:
The polarity of phase voltage is detected in response to the order of connecting described circuit;
Make with back-biased Diode series the semiconductor switch that is connected connect as conducting state; And
Change in polarity in response to described phase voltage makes to connect as conducting state with the semiconductor switch be connected during original detected polarity of voltage forward biased described Diode series.
14. methods according to claim 13, described method also comprises:
The polarity of phase voltage and the polarity of phase current is detected in response to the order turning off described circuit;
Polarity in response to described phase voltage is identical with the polarity of described phase current make with back-biased described Diode series the semiconductor switch that is connected turn off; And
From turn off to have passed through second half conductor switch be substantially equal to the AC semi-cyclic time after still described semiconductor switch is in the on-state turned off as nonconducting state.
15. methods according to claim 13 or 14, wherein, described semiconductor switch also comprises overvoltage protection element, and described method also comprises:
One of at least carry out detection of excessive current event in response in following situation: one mutually in the measured value of electric current be greater than scheduled current limit value; And one mutually in the measured value of current changing rate be greater than current changing rate limit value;
Generate the connection signal of extremely described semiconductor switch and commutate to described semiconductor switch to the cut-off signals of main switch to make electric current;
The cut-off signals of extremely described semiconductor switch is generated to interrupt the electric current in main circuit after the scheduled time;
Make to be stored in energy absorption in the inductor of main circuit after electric current in main circuit is interrupted in described overvoltage protection element.
CN201280078041.1A 2012-12-28 2012-12-28 Semiconductor switch arrangement Pending CN104885363A (en)

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Application publication date: 20150902