CN104268075B - A kind of method, device and mobile terminal of entrance test pattern - Google Patents
A kind of method, device and mobile terminal of entrance test pattern Download PDFInfo
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- CN104268075B CN104268075B CN201410485714.6A CN201410485714A CN104268075B CN 104268075 B CN104268075 B CN 104268075B CN 201410485714 A CN201410485714 A CN 201410485714A CN 104268075 B CN104268075 B CN 104268075B
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Abstract
The present invention is applied to technical field of measurement and test there is provided a kind of method, device and mobile terminal of entrance test pattern, and methods described includes：During start, whether detect in the subregion pre-set with flag bit；If it is, the value of the flag bit is read, and value and the corresponding relation of test pattern according to the flag bit pre-set, obtain the test pattern matched with the flag bit；Test pattern script corresponding with the test pattern is called, by the test pattern script startup program related to the test pattern, is tested into the test pattern.The present invention, it is not necessary to user's manual operations, can substantially reduce the maloperation into test pattern.Also, when compared with prior art, into the test pattern of needs, the program of startup is few, the test pattern of needs, lifting factory line efficiency can be more rapidly introduced into.
Description
Technical field
The invention belongs to technical field of measurement and test, more particularly to a kind of method, device and mobile terminal of entrance test pattern.
Background technology
Now, people are more and more to the demand of electronic product, and the yield of various electronic products is also constantly being improved, such as
Mobile phone industry, has many manufacturers to produce within 1 year ten million platform mobile phone.
Demand increases, and on the premise of delivery quality is ensured, if to improve production efficiency, just must constantly optimize
Production test flow.
However, existing technology, when testing electronic equipment, pre-sets different key combinations or thimble group
Close, a kind of key combination of each test pattern correspondence or thimble combination；Then, by tester's input and test pattern pair
Key combination or the thimble combination answered, electronic equipment are combined into corresponding survey according to the key combination or thimble that receive
Die trial formula.It is known that artificial manual operations is not only time-consuming, laborious, it is also easy to maloperation occur.
The content of the invention
The embodiments of the invention provide a kind of method, device and mobile terminal of entrance test pattern, it is intended to solves existing
The method for the entrance test pattern that technology is provided, not only time-consuming, laborious, the problem of being also easy to maloperation occur.
On the one hand there is provided a kind of method of entrance test pattern, methods described includes：
During start, whether detect in the subregion pre-set with flag bit；
If it is, the value of the flag bit is read, and value and pair of test pattern according to the flag bit pre-set
It should be related to, obtain the test pattern matched with the value of the flag bit；
Test pattern script corresponding with the test pattern is called, by the test pattern script startup and the test
The related program of pattern, is tested into the test pattern.
Further, after in the subregion for detecting and pre-setting whether with flag bit, in addition to：
If it is not, then normal boot-strap, and write in the subregion pre-set the value of flag bit.
Further, test pattern script corresponding with the test pattern is called described, by the test pattern pin
This startup program related to the test pattern, after being tested into the test pattern, in addition to：
Change the value of the flag bit or wipe the flag bit.
Further, the value or the erasing flag bit of the modification flag bit include：
After test terminates, pass through the value or the erasing flag bit of flag bit described in manual modification.
On the other hand there is provided a kind of device of entrance test pattern, described device includes：
Whether flag bit judging unit, during for starting shooting, detect in the subregion pre-set with flag bit；
Test pattern acquiring unit, for if it is, read the value of the flag bit, and according to the mark pre-set
The value of position and the corresponding relation of test pattern, obtain the test pattern matched with the value of the flag bit；
Test pattern enters unit, for calling test pattern script corresponding with the test pattern, by the test
The pattern script startup program related to the test pattern, is tested into the test pattern.
Further, described device also includes：
Flag bit writing unit, for if it is not, then normal boot-strap, and writes in the subregion pre-set flag bit
Value.
Further, described device also includes：
Flag bit setting unit, for changing the value of the flag bit or wiping the flag bit.
Further, the flag bit setting unit described in manual modification specifically for after test terminates, by indicating
The value of position wipes the flag bit.
Another further aspect is there is provided a kind of mobile terminal, and the mobile terminal includes the dress as described above for entering test pattern
Put.
In the embodiment of the present invention, the whole process for entering test pattern is automatically performed by mobile terminal, it is not necessary to user
Manual operations, can substantially reduce the maloperation into test pattern.Also, only included in test pattern script and the test mould
The corresponding program of formula, so, during into the test pattern, startup is must start up during the test of the test pattern
Program, unrelated, the unnecessary program of other tests corresponding with the test pattern need not start；These programs that must start up
The simply sub-fraction program in the Android system of mobile terminal.It is mobile when compared with prior art, into the test pattern of needs
All programs in Android system in terminal are both needed to start, and in the embodiment of the present invention, the program of startup is few, so phase
Than prior art, the test pattern of needs, lifting factory line efficiency can be more rapidly introduced into.
Brief description of the drawings
Fig. 1 is the implementation process figure of the method for the entrance test pattern that the embodiment of the present invention one is provided；
Fig. 2 is the structured flowchart of the device for the entrance test pattern that the embodiment of the present invention two is provided.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
In embodiments of the present invention, write after value to the subregion pre-set of flag bit corresponding with test pattern, open
After machine, the value of the flag bit is read, according to the test module that will enter of being worth to of the flag bit, is then called and the test
The corresponding test pattern script of pattern, by the test pattern script startup program related to the test pattern, into the survey
Die trial formula is tested.
The realization of the present invention is described in detail below in conjunction with specific embodiment：
Embodiment one
Fig. 1 shows the implementation process of the method for the entrance test pattern that the embodiment of the present invention one is provided, this method operation
In the electronic device, the present embodiment is illustrated by taking mobile terminal as an example, and details are as follows：
In step S101, during start, detect whether with flag bit in the subregion pre-set, if it is, performing
Step S102, otherwise, performs step S104.
In embodiments of the present invention, first using surface mounting technique (surface mount technology, SMT) by electricity
Subcomponent, such as resistance, electric capacity, transistor, integrated circuit, ROM are installed on printed circuit board (PCB), and form electricity by soldering
Gas is coupled；The software of download is burned onto on the mainboard of mobile terminal by replication tool again；Then, on Mobile terminal main board
A subregion is marked off in the memory of installation, such as ROM, for writing the value of flag bit.The value of the flag bit is used for identifying
Different test patterns, the corresponding different test pattern of value of different flag bits.
Wherein it is possible to pre-set the value of flag bit and the corresponding relation of test pattern.Such as, existing test pattern
Have：The test of hardware module cell current, the test of RF RF calibrations, wifi bluetooth calibration tests.It can set and hardware module list
The value that elementary current tests corresponding flag bit is 0, is 1 with the value of the corresponding flag bit of RF RF calibrations test；With wifi bluetooths
The value of the corresponding flag bit of calibration test is 2.
During start, mobile terminal reads the subregion divided in advance first, if the subregion is sky, then it represents that do not write mark
Will position, mobile terminal normal boot-strap；Otherwise, then the value of the flag bit in the subregion that write-in is divided in advance is read, if read
The value of flag bit is 1, then it represents that be to enter the test of RF RF calibrations.
In step s 102, the value of the flag bit is read, and according to the value and test pattern of the flag bit pre-set
Corresponding relation, obtain the test pattern matched with the value of the flag bit.
In embodiments of the present invention, mobile terminal is detected in the subregion pre-set with flag bit, then reads the mark
The value of will position, and the value of the flag bit is matched with pre-setting the value of flag bit with the corresponding relation of test pattern, obtain
To test pattern corresponding with the value of the flag bit.
Such as, it is 1 to pre-set RF RF calibrations and test the value of corresponding flag bit, then the value for reading the flag bit is
When 1, expression needs to enter the test of RF RF calibrations.
In step s 103, test pattern script corresponding with the test pattern is called, by the test pattern script
Start the program related to the test pattern, tested into the test pattern.
In embodiments of the present invention, the corresponding relation of test pattern and test pattern script is pre-set.Each test
Pattern one test pattern script of unique correspondence.Test pattern script includes the program related to test pattern, these programs
It is to enter after corresponding test pattern, it is necessary to the program started.
When the corresponding test pattern of value that mobile terminal detects the flag bit in the subregion divided in advance is RF radio frequencies school
During quasi- test, then RF test patterns script corresponding with the test of RF RF calibrations is called, by the script startup of RF test patterns and RF
The related program of test pattern.Wherein, the program related to RF test patterns is entered after RF test patterns, it is necessary to the journey started
Sequence includes modem modem programs and test port program, and other unnecessary programs are not just started.
In step S104, normal boot-strap writes the value of flag bit in the subregion pre-set.
In embodiments of the present invention, if started shooting, detect in the subregion pre-set not with flag bit, then it is just normally opened
Machine, writes the value of flag bit in the subregion pre-set.Wherein, the value of the flag bit of user's input is received by mobile terminal,
And write the value of the flag bit into the subregion pre-set.
Preferably, after step s 103, in addition to：
Change the value of the flag bit or wipe the flag bit.
Complete after test, can be changed in the subregion pre-set specifically, mobile terminal enters corresponding test pattern
Flag bit value, flag bit of the write-in into the subregion pre-set can also be wiped.
Wherein it is possible to the value or the erasing flag bit of flag bit described in manual modification.
It can be wiped after the test is ended by the erasing option of user's click test interface in the subregion pre-set
Flag bit, after erasure completion, mobile terminal-opening, restart, then perform step S101.
The instruction of the value for the setting flag bit that user inputs after the test is ended, can be received by test interface, is connect
The value of the flag bit of user's input is received, then, the value of the flag bit is write into the subregion pre-set, write-in is completed
Afterwards, mobile terminal-opening, restart, then perform step S101.
After the present embodiment, value to the subregion pre-set for writing flag bit corresponding with test pattern, the mark is read
The value of position, according to the test module that will enter of being worth to of the flag bit, then calls test corresponding with the test pattern
Pattern script, by the test pattern script startup program related to the test pattern, is tested into the test pattern.
The whole process for entering test pattern is automatically performed by mobile terminal, it is not necessary to user's manual operations, can substantially reduce into
Enter the maloperation of test pattern.Also, program corresponding with the test pattern is only included in test pattern script, so, enter
During the test pattern, startup simply carries out the program that must start up during the test of the test pattern, other and the test pattern
Unrelated, the unnecessary program of corresponding test need not start；These programs that must start up are the Android system of mobile terminal
Sub-fraction program in system.When compared with prior art, into the test pattern of needs, in the Android system in mobile terminal
All programs are both needed to start, and in the embodiment of the present invention, the program of startup is few, so compared with prior art, can be more
It is rapidly introduced into the test pattern of needs, lifting factory line efficiency.
Can one of ordinary skill in the art will appreciate that realizing that all or part of step in the various embodiments described above method is
To instruct the hardware of correlation to complete by program, corresponding program can be stored in a computer read/write memory medium
In, described storage medium, such as ROM/RAM, disk or CD.
Embodiment two
Fig. 2 shows the concrete structure block diagram of the device for the entrance test pattern that the embodiment of the present invention two is provided, in order to just
In explanation, the part related to the embodiment of the present invention illustrate only.The device 2 for entering test pattern can be built in movement
The unit of software unit, hardware cell or software and hardware combining in terminal, the device 2 for entering test pattern includes：Mark
Position judging unit 21, test pattern acquiring unit 22, test pattern enter unit 23 and flag bit writing unit 24.
Wherein, whether flag bit judging unit 21, during for starting shooting, detect in the subregion pre-set with flag bit；
Test pattern acquiring unit 22, for if it is, read the value of the flag bit, and according to the mark pre-set
The value of will position and the corresponding relation of test pattern, obtain the test pattern matched with the value of the flag bit；
Test pattern enters unit 23, for calling test pattern script corresponding with the test pattern, is surveyed by described
The die trial formula script startup program related to the test pattern, is tested into the test pattern.
Further, described device 2 also includes：
Flag bit writing unit 24, for if it is not, then normal boot-strap, and writes flag bit in the subregion pre-set
Value.
Further, described device 2 also includes：
Flag bit setting unit, for changing the value of the flag bit or wiping the flag bit.
Specifically, the flag bit setting unit, after test terminates, by the value of flag bit described in manual modification or
Wipe the flag bit.
The device of entrance test pattern provided in an embodiment of the present invention can be applied in foregoing corresponding embodiment of the method one
In, details will not be repeated here referring to the description of above-described embodiment one.
It is worth noting that, in said system embodiment, included unit is simply drawn according to function logic
Point, but above-mentioned division is not limited to, as long as corresponding function can be realized；In addition, each functional unit is specific
Title is also only to facilitate mutually distinguish, the protection domain being not intended to limit the invention.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
Any modifications, equivalent substitutions and improvements made within refreshing and principle etc., should be included in the scope of the protection.
Claims (7)
1. a kind of method of entrance test pattern, it is characterised in that methods described includes：
During start, whether detect in the subregion pre-set with flag bit；
If it is, the value of the flag bit is read, and the pass corresponding with test pattern of the value according to the flag bit pre-set
System, obtains the test pattern matched with the value of the flag bit, wherein, the value of the flag bit is used to identify different test moulds
Formula；
Test pattern script corresponding with the test pattern is called, by the test pattern script startup and the test pattern
Related program, is tested into the test pattern；
After described whether detect in the subregion that pre-sets with flag bit, in addition to：
If it is not, then normal boot-strap, and write in the subregion pre-set the value of flag bit.
2. the method as described in claim 1, it is characterised in that call test pattern corresponding with the test pattern described
Script, by the test pattern script startup program related to the test pattern, is tested into the test pattern
Afterwards, in addition to：
Change the value of the flag bit or wipe the flag bit.
3. method as claimed in claim 2, it is characterised in that the value of the modification flag bit wipes the mark
Position includes：
After test terminates, pass through the value or the erasing flag bit of flag bit described in manual modification.
4. a kind of device of entrance test pattern, it is characterised in that described device includes：
Whether flag bit judging unit, during for starting shooting, detect in the subregion pre-set with flag bit；
Test pattern acquiring unit, for if it is, read the value of the flag bit, and according to the flag bit pre-set
Value and the corresponding relation of test pattern, obtain the test pattern matched with the value of the flag bit, wherein, the value of the flag bit
The different test pattern for identifying；
Test pattern enters unit, for calling test pattern script corresponding with the test pattern, by the test pattern
The script startup program related to the test pattern, is tested into the test pattern；
Described device also includes：
Flag bit writing unit, for if it is not, then normal boot-strap, and writes in the subregion pre-set the value of flag bit.
5. device as claimed in claim 4, it is characterised in that described device also includes：
Flag bit setting unit, for changing the value of the flag bit or wiping the flag bit.
6. device as claimed in claim 5, it is characterised in that the flag bit setting unit in test specifically for terminating
Afterwards, the value or the erasing flag bit of flag bit described in manual modification are passed through.
7. a kind of mobile terminal, it is characterised in that the mobile terminal includes the entrance as described in any one of claim 4 to 6
The device of test pattern.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410485714.6A CN104268075B (en) | 2014-09-22 | 2014-09-22 | A kind of method, device and mobile terminal of entrance test pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410485714.6A CN104268075B (en) | 2014-09-22 | 2014-09-22 | A kind of method, device and mobile terminal of entrance test pattern |
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| CN104268075A CN104268075A (en) | 2015-01-07 |
| CN104268075B true CN104268075B (en) | 2017-08-18 |
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| CN104991137B (en) * | 2015-06-30 | 2018-02-02 | 小米科技有限责任公司 | Apparatus testing method and device |
| CN105357379A (en) * | 2015-10-27 | 2016-02-24 | 上海斐讯数据通信技术有限公司 | Method and system for making intelligent terminal still be effective after being restarted under specific mode |
| CN106250123B (en) * | 2016-07-26 | 2019-12-03 | 安徽皖通邮电股份有限公司 | A kind of system test mode and operational mode compatibility method |
| CN106503588A (en) * | 2016-10-31 | 2017-03-15 | 广东欧珀移动通信有限公司 | A kind of method for preventing loss of data in ciphering process, device and mobile terminal |
| CN106681714A (en) * | 2016-12-07 | 2017-05-17 | 乐视控股（北京）有限公司 | Method and device for setting program environments and electronic equipment |
| CN107087164A (en) * | 2017-04-20 | 2017-08-22 | 广州视源电子科技股份有限公司 | Method and device for starting equipment |
| CN108170568B (en) * | 2017-12-26 | 2021-10-26 | 深圳市奇虎智能科技有限公司 | Delivery test method and device of intelligent equipment and flashing package generation method and device |
| CN109683039B (en) * | 2018-12-21 | 2021-06-08 | 思必驰科技股份有限公司 | Offline detection method and system for electronic product |
| CN109933471A (en) * | 2019-03-05 | 2019-06-25 | 歌尔科技有限公司 | Method, apparatus, computer readable storage medium are surveyed in Android device and its production |
| CN110164502A (en) * | 2019-04-12 | 2019-08-23 | 深圳市金泰克半导体有限公司 | Internal storage testing method, device, computer equipment and storage medium |
| CN110208632A (en) * | 2019-07-09 | 2019-09-06 | 深圳创维数字技术有限公司 | A kind of method, system and storage medium for electromagnetic compatibility testing |
| CN111538632B (en) * | 2020-04-27 | 2023-08-08 | Oppo（重庆）智能科技有限公司 | Inspection method, inspection system, and storage medium |
| CN111786852B (en) * | 2020-06-30 | 2022-08-26 | 展讯通信（上海）有限公司 | Test method and related equipment |
| CN114157593A (en) * | 2021-10-18 | 2022-03-08 | 深圳市亿联无限科技有限公司 | Method for realizing and switching router factory mode |
| CN114598401B (en) * | 2022-05-09 | 2022-09-27 | 荣耀终端有限公司 | Radio frequency test method, Bluetooth device, electronic device and radio frequency test system |
| CN115755844A (en) * | 2022-11-15 | 2023-03-07 | 北斗星通智联科技有限责任公司 | ECU (electronic control Unit) automatic test method and device, electronic equipment and storage medium |
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