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CA2436880A1 - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

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Publication number
CA2436880A1
CA2436880A1 CA 2436880 CA2436880A CA2436880A1 CA 2436880 A1 CA2436880 A1 CA 2436880A1 CA 2436880 CA2436880 CA 2436880 CA 2436880 A CA2436880 A CA 2436880A CA 2436880 A1 CA2436880 A1 CA 2436880A1
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Canada
Prior art keywords
ion trap
mass spectrometer
mbar
electrodes
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2436880
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French (fr)
Other versions
CA2436880C (en
Inventor
Robert Harold Bateman
Jeff Brown
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
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Micromass UK Ltd
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Filing date
Publication date
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Publication of CA2436880A1 publication Critical patent/CA2436880A1/en
Application granted granted Critical
Publication of CA2436880C publication Critical patent/CA2436880C/en
Anticipated expiration legal-status Critical
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

A mass spectrometer is disclosed comprising at least a first and second ion trap T1,T2 which are arranged in series. A relatively high AC or RF voltage is applied to the electrodes forming the first ion trap T1 in order to improve the trapping of energetic or high mass to charge ratio ions. The relatively high AC or RF
voltage applied to the first ion trap T1 also has the effect of raising the low mass cut-off of the first ion trap. The second ion trap T2 arranged downstream of the first ion trap T1 is arranged to have a lower low mass cut-off than the first ion trap T1, and hence ions which are not trapped in the first ion trap T1 are trapped in the second ion trap T2.

Claims (76)

1. A mass spectrometer comprising:
a first ion trap and a second ion trap wherein said first ion trap is arranged to have, in use, a first low mass cut-off and said second ion trap is arranged to have, in use, a second low mass cut-off, said second low mass cut-off being lower than said first low mass cut-off so that at least some ions having mass to charge ratios lower than said first low mass cut-off which are not trapped in said first ion trap are trapped in said second ion trap.
2. A mass spectrometer as claimed in claim 1, wherein said first ion trap comprises a quadrupole ion trap.
3. A mass spectrometer as claimed in claim 2, wherein said first ion trap comprises a 3D (Paul) quadrupole ion trap comprising a ring electrode and two end-cap electrodes, said ring electrode and said end-cap electrodes having a hyperbolic surface.
4. A mass spectrometer as claimed in claim 2, wherein said first ion trap comprises one or more cylindrical ring electrodes and two substantially planar end-cap electrodes.
5. A mass spectrometer as claimed in claim 2, wherein said first ion trap comprises one, two, three or more than three ring electrodes and two substantially planar end-cap electrodes.
6. A mass spectrometer as claimed in claim 4 or 5, wherein an end-cap electrode of said first ion trap comprises a sample or target plate.
7. A mass spectrometer as claimed in claim 6, wherein said sample or target plate comprises a substrate with a plurality of sample regions.
8. A mass spectrometer as claimed in claim 6 or 7, wherein said sample or target plate is arranged in a microtitre format.
9. A mass spectrometer as claimed in claim 6, 7 or 8, wherein the pitch spacing between samples on said sample or target plate is approximately or exactly 18 mm, 9 mm, 4.5 mm, 2.25 mm or 1.125 mm.
10. A mass spectrometer as claimed in any of claims 6-9, wherein up to or at least 48, 96, 384, 1536 or 6144 samples are arranged to be received on said sample or target plate.
11. A mass spectrometer as claimed in any of claims 6-10, wherein a laser beam or electron beam is targeted in use at said sample or target plate.
12. A mass spectrometer as claimed in any of claims 4-11, wherein an end-cap electrode of said first ion trap comprises a mesh or grid.
13. A mass spectrometer as claimed in claim 2, wherein said first ion trap comprises a 2D (linear) quadrupole ion trap comprising a plurality of rod electrodes and two end electrodes.
14. A mass spectrometer as claimed in claim 1, wherein said first ion trap is selected from the group consisting of: (i) a segmented ring set comprising a plurality of electrodes having apertures through which ions are transmitted; and (ii) a Penning ion trap.
15. A mass spectrometer as claimed in any preceding claim, wherein a first AC or RF voltage having a first amplitude is applied to said first ion trap.
16. A mass spectrometer as claimed in claim 15, wherein said first amplitude is selected from the group consisting of : (i) 0-250 V pp; (ii) 250-500 V pp; (iii) 500-75O V pp; (iv) 750-1000 V pp; (v) 1000-1250 V pp; (vi) 1250-1500 V pp; (vii) 1500-1750 V pp; (viii) 1750-2000 V pp;
(ix) 2000-2250 V pp; (x) 2250-2500 V pp; (xi) 2500-2750 V pp;
(xii) 2750-3000 V pp; (xiii) 3000-3250 V pp; (xiv) 3250-3500 V pp; (xv) 3500-3750 V pp; (xvi) 3750-4000 V pp; (xvii) 4000-4250 V pp; (xviii) 4250-4500 V pp; (xix) 4500-4750 V pp;
(xx) 4750-5000 V pp; (xxi) 5000-5250 V pp; (xxii) 5250-5500 V pp; (xxiii) 5500-5750 V pp; (xxiv) 5750-6000 V pp; (xxv) 6000-6250 V pp; (xxvi) 6250-6500 V pp; (xxvii) 6500-6750 V pp; (xxviii) 6750-7000 V pp; (xxix) 7000-7250 V pp; (xxx) 7250-7500 V pp; (xxxi) 7500-7750 V pp; (xxxii) 7750-8000 V pp; (xxxiii) 8000-8250 V pp; (xxxiv) 8250-8500 V pp; (xxxv) 8500-8750 V pp; (xxxvi) 8750-9000 V pp; (xxxvii) 9250-9500 V pp; (xxxviii) 9500-9750 V pp; (xxxix) 9750-10000 V pp; and (x1) >10000 V pp.
17. A mass spectrometer as claimed in claim 15 or 16, wherein said first AC or RF voltage has a frequency within a range selected from the group consisting of:
(i) < 100 kHz; (ii) 100-200 kHz; (iii) 200-400 kHz; (iv) 400-600 kHz; (v) 600-800 kHz; (vi) 800-1000 kHz; (vii) 1.0-1.2 MHz; (viii) 1.2-1.4 MHz; (ix) 1.4-1.6 MHz; (x) 1.6-1.8 MHz; (xi) 1.8-2.0 MHz; and (xii) > 2.0 MHz.
18. A mass spectrometer as claimed in any preceding claim, wherein said second ion trap comprises a quadrupole ion trap.
19. A mass spectrometer as claimed in claim 18, wherein said second ion trap comprises a 3D (Paul) quadrupole ion trap comprising a ring electrode and two end-cap electrodes, said ring electrode and said end-cap electrodes having a hyperbolic surface.
20. A mass spectrometer as claimed in claim 18, wherein said second ion trap comprises one or more cylindrical ring electrodes and two substantially planar end-cap electrodes.
21. A mass spectrometer as claimed in claim 18, wherein said second ion trap comprises one, two, three or more than three ring electrodes and two substantially planar end-cap electrodes.
22. A mass spectrometer as claimed in claim 20 or 21, wherein one of more end-cap electrodes of said second ion trap comprise a mesh or grid.
23. A mass spectrometer as claimed in claim 18, wherein said second ion trap comprises a 2D (linear) quadrupole ion trap comprising a plurality of rod electrodes and two end electrodes.
24. A mass spectrometer as claimed in any of claims 1-17, wherein said second ion trap is selected from the group consisting of: (i) a segmented ring set comprising a plurality of electrodes having apertures through which ions are transmitted; and (ii) a Penning ion trap.
25. A mass spectrometer as claim in any of claims 18-24, wherein a second AC or RF voltage having a second amplitude is applied to said second ion trap.
26. A mass spectrometer as claimed in claim 25, wherein said second amplitude is selected from the group consisting of : (i) 0-250 V pp; (ii) 250-500 V pp; (iii) 500-750 V pp; (iv) 750-1000 V pp; (v) 1000-1250 V pp; (vi) 1250-1500 V pp; (vii) 1500-1750 V pp; (viii) 1750-2000 V pp;
(ix) 2000-2250 V pp; (x) 2250-2500 V pp; (xi) 2500-2750 V pp;
(xii) 2750-3000 V pp; (xiii) 3000-3250 V pp; (xiv) 3250-3500 V pp; (xv) 3500-3750 V pp; (xvi) 3750-4000 V pp; (xvii) 4000-4250 V pp; (xviii) 4250-4500 V pp; (xix) 4500-4750 V pp;
(xx) 4750-5000 V pp; (xxi) 5000-5250 V pp; (xxii) 5250-5500 V pp; (xxiii) 5500-5750 V pp; (xxiv) 5750-6000 V pp; (xxv) 6000-6250 V pp; (xxvi) 6250-6500 V pp; (xxvii) 6500-6750 V pp; (xxviii) 6750-7000 V pp; (xxix) 7000-7250 V pp; (xxx) 7250-7500 V pp; (xxxi) 7500-7750 V pp; (xxxii) 7750-8000 V pp; (xxxiii) 8000-8250 V pp; (xxxiv) 8250-8500 V pp; (xxxv) 8500-8750 V pp; (xxxvi) 8750-9000 V pp; (xxxvii) 9250-9500 V pp; (xxxviii) 9500-9750 V pp; (xxxix) 9750-10000 V pp; and (x1) >10000 V pp.
27. A mass spectrometer as claimed in claim 25 or 26, wherein said second AC or RF voltage has a frequency within a range selected from the group consisting of:
(i) < 100 kHz; (ii) 100-200 kHz; (iii) 200-400 kHz; (iv) 400-600 kHz; (v) 600-800 kHz; (vi) 800-1000 kHz; (vii) 1.0-1.2 MHz; (viii) 1.2-1.4 MHz; (ix) 1.4-1.6 MHz; (x) 1.6-1.8 MHz; (xi) 1.8-2.0 MHz; and (xii) > 2.0 MHz.
28. A mass spectrometer as claimed in any preceding claim, wherein the amplitude of an AC or RF voltage applied to said first ion trap is greater than the amplitude of an AC or RF voltage applied to said second ion trap.
29. A mass spectrometer as claimed in claim 28, wherein the amplitude of an AC or RF voltage applied to said first ion trap is greater than the amplitude of an AC or RF voltage applied to said second ion trap by at least x V pp and wherein x is selected from the group consisting of: (i) 5; (ii) 10; (iii) 20; (iv) 30; (v) 40: (vi) 50;
(vii) 60; (viii) 70; (ix) 80; (x) 90; (xi) 100; (xii) 110; (xiii) 120; (xiv) 130; (xv) 140; (xvi) 150; (xvii) 160; (xviii) 170; (xix) 180; (xx) 190; (xxi) 200; (xxii) 250; (xxiii) 300; (xxiv) 350; (xxv) 400; (xxvi) 450;
(xxvii) 500; (xxviii) 550; (xxix) 600; (xxx) 650; (xxxi) 700; (xxxii) 750; (xxxiii) 800; (xxxiv) 850; (xxxv) 900;
(xxxvi) 950; and (xxxvii) 1000.
30. A mass spectrometer as claimed in any preceding claim, wherein said first ion trap and/or said second ion trap is maintained at a pressure selected from the group consisting of: (i) greater than or equal to 0.0001 mbar; (ii) greater than or equal to 0.0005 mbar; (iii) greater than or equal to 0.001 mbar; (iv) greater than or equal to 0.005 mbar; (v) greater than or equal to 0.01 mbar; (vi) greater than or equal to 0.05 mbar;
(vii) greater than or equal to 0.1 mbar; (viii) greater than or equal to 0.5 mbar; (ix) greater than or equal to 1 mbar; (x) greater than or equal to 5 mbar; and (xi) greater than or equal to 10 mbar.
31. A mass spectrometer as claimed in any preceding claim, wherein said first ion trap and/or said second ion trap is maintained at a pressure selected from the group consisting of: (i) less than or equal to 10 mbar;
(ii) less than or equal to 5 mbar; (iii) less than or equal to 1 mbar; (iv) less than or equal to 0.5 mbar;
(v) less than or equal to 0.1 mbar; (vi) less than or equal to 0.05 mbar; (vii) less than or equal to 0.01 mbar; (viii) less than or equal to 0.005 mbar; (ix) less than or equal to 0.001 mbar; (x) less than or equal to 0.0005 mbar; and (xi) less than or equal to 0.0001 mbar.
32. A mass spectrometer as claimed in any preceding claim, wherein said first ion trap and/or said second ion trap is maintained, in use, at a pressure selected from the group consisting of: (i) between 0.0001 and 10 mbar; (ii) between 0.0001 and 1 mbar; (iii) between 0.0001 and 0.1 mbar; (iv) between 0.0001 and 0.01 mbar;
(v) between 0.0001 and 0.001 mbar; (vi) between 0.001 and 10 mbar; (vii) between 0.001 and 1 mbar; (viii) between 0.001 and 0.1 mbar; (ix) between 0.001 and 0.01 mbar; (x) between 0.01 and 10 mbar; (xi) between 0.01 and 1 mbar; (xii) between 0.01 and 0.1 mbar; (xiii) between 0.1 and 10 mbar; (xiv) between 0.1 and 1 mbar;
and (xv) between 1 and 10 mbar.
33. A mass spectrometer as claimed in any preceding claim, further comprising a third ion trap arranged to have, in use, a third low mass cut-off, said third low mass cut-off being lower than said second low mass cut-off so that at least some ions having mass to charge ratios lower than said first and second mass cut-offs which are not trapped in said first and second ion traps are trapped in said third ion trap.
34. A mass spectrometer as claimed in claim 33, wherein a third AC or RF voltage having a third amplitude is applied to said third ion trap.
35. A mass spectrometer as claimed in claim 34, wherein said third amplitude is selected from the group consisting of: (i) 0-250 V pp; (ii) 250-500 V pp; (iii) 500-750 V pp; (iv) 750-1000 V pp; (v) 1000-1250 V pp; (vi) 1250-1500 V pp; (vii) 1500-1750 V pp; (viii) 1750-2000 V pp;
(ix) 2000-2250 V pp; (x) 2250-2500 V pp; (xi) 2500-2750 V pp;
(xii) 2750-3000 V pp; (xiii) 3000-3250 V pp; (xiv) 3250-3500 V pp; (xv) 3500-3750 V pp; (xvi) 3750-4000 V pp; (xvii) 4000-4250 V pp; (xviii) 4250-4500 V pp; (xix) 4500-4750 V pp;
(xx) 4750-5000 V pp; (xxi) 5000-5250 V pp; (xxii) 5250-5500 V pp; (xxiii) 5500-5750 V pp; (xxiv) 5750-6000 V pp; (xxv) 6000-6250 V pp; (xxvi) 6250-6500 V pp; (xxvii) 6500-6750 V pp; (xxviii) 6750-7000 V pp; (xxix) 7000-7250 V pp; (xxx) 7250-7500 V pp; (xxxi) 7500-7750 V pp; (xxxii) 7750-8000 V pp; (xxxiii) 8000-8250 V pp; (xxxiv) 8250-8500 V pp; (xxxv) 8500-8750 V pp; (xxxvi) 8750-9000 V pp; (xxxvii) 9250-9500 V pp; (xxxviii) 9500-9750 V pp; (xxxix) 9750-10000 V pp; and (x1) >10000 V pp.
36. A mass spectrometer as claimed in claim 34 or 35, wherein said third AC or RF voltage has a frequency within a range selected from the group consisting of:
(i) < 100 kHz; (ii) 100-200 kHz; (iii) 200-400 kHz; (iv) 400-600 kHz; (v) 600-800 kHz; (vi) 800-1000 kHz; (vii) 1.0-1.2 MHz; (viii) 1.2-1.4 MHz; (ix) 1.4-1.6 MHz; (x) 1.6-1.8 MHz; (xi) 1.8-2.0 MHz; and (xii) > 2.0 MHz.
37. A mass spectrometer as claimed in any of claims 34, 35 or 36, wherein said third amplitude is lesser than the amplitude of an AC or RF voltage applied to said first and/or second ion trap.
38. A mass spectrometer as claimed in any of claims 33-37, further comprising a fourth ion trap arranged to have, in use, a fourth low mass cut-off, said fourth low mass cut-off being lower than said third low mass cut-off so that at least some ions having mass to charge ratios lower than said first, second and third mass cut-offs which are not trapped in said first, second and third ion traps are trapped in said fourth ion trap.
39. A mass spectrometer as claimed in claim 38, wherein a fourth AC or RF voltage having a fourth amplitude is applied to said fourth ion trap.
40. A mass spectrometer as claimed in claim 39, wherein said fourth amplitude is selected from the group consisting of: (i) 0-250 V pp; (ii) 250-500 V pp; (iii) 500-750 V pp; (iv) 750-1000 V pp; (v) 1000-1250 V pp; (vi) 1250-1500 V pp; (vii) 1500-1750 V pp; (viii) 1750-2000 V pp;
(ix) 2000-2250 V pp; (x) 2250-2500 V pp; (xi) 2500-2750 V pp;
(xii) 2750-3000 V pp; (xiii) 3000-3250 V pp; (xiv) 3250-3500 V pp; (xv) 3500-3750 V pp; (xvi) 3750-4000 V pp; (xvii) 4000-4250 V pp; (xviii) 4250-4500 V pp; (xix) 4500-4750 V pp;
(xx) 4750-5000 V pp; (xxi) 5000-5250 V pp; (xxii) 5250-5500 V pp; (xxiii) 5500-5750 V pp; (xxiv) 5750-6000 V pp; (xxv) 6000-6250 V pp; (xxvi) 6250-6500 V pp; (xxvii) 6500-6750 V pp; (xxviii) 6750-7000 V pp; (xxix) 7000-7250 V pp; (xxx) 7250-7500 V pp; (xxxi) 7500-7750 V pp; (xxxii) 7750-8000 V pp; (xxxiii) 8000-8250 V pp; (xxxiv) 8250-8500 V pp; (xxxv) 8500-8750 V pp; (xxxvi) 8750-9000 V pp; (xxxvii) 9250-9500 V pp; (xxxviii) 9500-9750 V pp; (xxxix) 9750-10000 V pp; and (x1) >10000 V pp.
41. A mass spectrometer as claimed in claim 39 or 40, wherein said fourth AC or RF voltage has a frequency within a range selected from the group consisting of:
(i) < 100 kHz; (ii) 100-200 kHz; (iii) 200-400 kHz; (iv) 400-600 kHz; (v) 600-800 kHz; (vi) 800-1000 kHz; (vii) 1.0-1.2 MHz; (viii) 1.2-1.4 MHz; (ix) 1.4-1.6 MHz; (x) 1.6-1.8 MHz; (xi) 1.8-2.0 MHz; and (xii) > 2.0 MHz.
42. A mass spectrometer as claimed in claim 39, 40 or 41, wherein said fourth amplitude is lesser than the amplitude of an AC or RF voltage applied to said first and/or second and/or third ion trap.
43. A mass spectrometer as claimed in any preceding claim, further comprising a continuous or pulsed ion source.
44. A mass spectrometer as claimed in claim 43, wherein said ion source is selected from the group consisting of: (i) an Electrospray ion source; (ii) an Atmospheric Pressure Chemical Ionisation ("APCI") ion source; (iii) an Atmospheric Pressure MALDI ion source; (iv) an Electron Ionisation ("EI") ion source; (v) a Chemical Ionisation ("CI") ion source; and (vi) a Field Desorption Ionisation ("FI") ion source.
45. A mass spectrometer as claimed in claim 43, wherein said ion source is selected from the group consisting of: (i) a Matrix Assisted Laser Desorption Ionisation ("MALDI") ion source; (ii) a Laser Desorption Ionisation ("LDI") ion source; (iii) a Laser Desorption/Ionisation on Silicon ("DIOS") ion source; (iv) a Surface Enhanced Laser Desorption Ionisation ("SELDI") ion source; and (v) a Fast Atom Bombardment ("FAB") ion source.
46. A mass spectrometer as claimed in any preceding claim, further comprising an ion detector arranged downstream of said second ion trap.
47. A mass spectrometer as claimed in claim 46, wherein said ion detector comprises an electron multiplier, a photo-multiplier, or a channeltron.
48. A mass spectrometer as claimed in any preceding claim, further comprising a Time of Flight mass analyser.
49. A mass spectrometer as claimed in claim 48, wherein said Time of Flight mass analyser comprises an axial or an orthogonal acceleration Time of Flight mass analyser.
50. A mass spectrometer as claimed in any preceding claim, further comprising a further ion trap.
51. A mass spectrometer as claimed in claim 50, wherein said further ion trap comprises a quadrupole ion trap.
52. A mass spectrometer as claimed in claim 51, wherein said further ion trap comprises a 3D (Paul) quadrupole ion trap comprising a ring electrode and two end-cap electrodes, said ring electrode and said end-cap electrodes having a hyperbolic surface.
53. A mass spectrometer as claimed in claim 51, wherein said further ion trap comprises one or more cylindrical ring electrodes and two substantially planar end-cap electrodes.
54. A mass spectrometer as claimed in claim 51, wherein said further ion trap comprises one, two, three or more than three ring electrodes and two substantially planar end-cap electrodes.
55. A mass spectrometer as claimed in claim 53 or 54, wherein one or more end-cap electrodes of said further ion trap comprise a mesh or grid.
56. A mass spectrometer as claimed in claim 51, wherein said further ion trap comprises a 2D (linear) quadrupole ion trap comprising a plurality of rod electrodes and two end electrodes.
57. A mass spectrometer as claimed in claim 50, wherein said further ion trap is selected from the group consisting of: (i) a segmented ring set comprising a plurality of electrodes having apertures through which ions are transmitted; and (ii) a Penning ion trap.
58. A mass spectrometer as claimed in any of claims 50-57, wherein ions are pulsed out of or ejected from said further ion trap in a non mass-selective or a non scanning mode.
59. A mass spectrometer as claimed in claim 58, wherein ions are pulsed out of or ejected from said further ion trap by applying a DC voltage extraction pulse to said further ion trap.
60. A mass spectrometer as claimed in any preceding claim, further comprising a first additional ion trap.
61. A mass spectrometer as claimed in claim 60, wherein said first additional ion trap comprises a quadrupole ion trap.
62. A mass spectrometer as claimed in claim 61, wherein said first additional ion trap comprises a 3D (Paul) quadrupole ion trap comprising a ring electrode and two end-cap electrodes, said ring electrode and said end-cap electrodes having a hyperbolic surface.
63. A mass spectrometer as claimed in claim 61, wherein said first additional ion trap comprises one or more cylindrical ring electrodes and two substantially planar end-cap electrodes.
64. A mass spectrometer as claimed in claim 61, wherein said first additional ion trap comprises one, two, three or more than three ring electrodes and two substantially planar end-cap electrodes.
65. A mass spectrometer as claimed in claim 63 or 64, wherein one or more end-cap electrodes of said first additional ion trap comprise a mesh or grid.
66. A mass spectrometer as claimed in claim 61, wherein said first additional ion trap comprises a 2D (linear) quadrupole ion trap comprising a plurality of rod electrodes and two end electrodes.
67. A mass spectrometer as claimed in claim 60, wherein said first additional ion trap is selected from the group consisting of: (i) a segmented ring set comprising a plurality of electrodes having apertures through which ions are transmitted; and (ii) a Penning ion trap.
68. A mass spectrometer as claimed in any of claims 60-67, further comprising a second additional ion trap.
69. A mass spectrometer as claimed in claim 68, wherein said second additional ion trap comprises a quadrupole ion trap.
70. A mass spectrometer as claimed in claim 69, wherein said second additional ion trap comprises a 3D (Paul) quadrupole ion trap comprising a ring electrode and two end-cap electrodes, said ring electrode and said end-cap electrodes having a hyperbolic surface.
71. A mass spectrometer as claimed in claim 69, wherein said second additional ion trap comprises one or more cylindrical ring electrodes and two substantially planar end-cap electrodes.
72. A mass spectrometer as claimed in claim 69, wherein said second additional ion trap comprises one, two, three or more than three ring electrodes and two substantially planar end-cap electrodes.
73. A mass spectrometer as claimed in claim 71 or 72, wherein one or more end-cap electrodes of said second additional ion trap comprises a mesh or grid.
74. A mass spectrometer as claimed in claim 69, wherein said second additional ion trap comprises a 2D (linear) quadrupole ion trap comprising a plurality of rod electrodes and two end electrodes.
75. A mass spectrometer as claimed in claim 68, wherein said second additional ion trap is selected from the group consisting of: (i) a segmented ring set comprising a plurality of electrodes having apertures through which ions are transmitted; and (ii) a Penning ion trap.
76. A method of mass spectrometry, comprising:
providing a first ion trap having a first low mass cut-off;
providing a second ion trap having a second low mass cut-off, said second low mass cut-off being lower than said first low mass cut-off;
trapping some ions in said first ion trap; and trapping in said second ion trap at least some ions having mass to charge ratios lower than said first low mass cut-off which are not trapped in said first ion trap.
CA 2436880 2002-08-08 2003-08-08 Mass spectrometer Expired - Fee Related CA2436880C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0218454.7 2002-08-08
GB0218454A GB0218454D0 (en) 2002-08-08 2002-08-08 Mass spectrometer

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CA2436880C CA2436880C (en) 2012-04-17

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GB0404106D0 (en) * 2004-02-24 2004-03-31 Shimadzu Res Lab Europe Ltd An ion trap and a method for dissociating ions in an ion trap
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DE20312271U1 (en) 2004-01-15

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