BE743180A - - Google Patents

Info

Publication number: BE743180A
Authority: BE; Belgium

Application number

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1968-10-01

Filing date

1969-12-16

Publication date

1970-06-16

1969-12-16 Application filed filed Critical

1970-06-16 Publication of BE743180A publication Critical patent/BE743180A/xx

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D61/00—Tools for sawing machines or sawing devices; Clamping devices for these tools
- B23D61/18—Sawing tools of special type, e.g. wire saw strands, saw blades or saw wire equipped with diamonds or other abrasive particles in selected individual positions
- B23D61/185—Saw wires; Saw cables; Twisted saw strips
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
- H01C17/245—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material by mechanical means, e.g. sand blasting, cutting, ultrasonic treatment
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe

Landscapes

Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Manufacturing & Machinery (AREA)
Microelectronics & Electronic Packaging (AREA)
Mechanical Engineering (AREA)
Measuring Leads Or Probes (AREA)

BE743180D 1968-10-01 1969-12-16 BE743180A (fr)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US78411668A	1968-10-01	1968-10-01

Publications (1)

Publication Number	Publication Date
BE743180A true BE743180A (fr)	1970-06-16

Family

ID=25131395

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
BE743180D BE743180A (fr)	1968-10-01	1969-12-16

Country Status (8)

Country	Link
US (1)	US3551807A (fr)
BE (1)	BE743180A (fr)
CH (2)	CH502172A (fr)
DE (1)	DE1962446A1 (fr)
FR (1)	FR2026236A1 (fr)
GB (1)	GB1232175A (fr)
NL (1)	NL6917977A (fr)
SE (1)	SE358242B (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3810017A (en) *	1972-05-15	1974-05-07	Teledyne Inc	Precision probe for testing micro-electronic units
US4034293A (en) *	1974-03-04	1977-07-05	Electroglas, Inc.	Micro-circuit test probe
US4056777A (en) *	1974-08-14	1977-11-01	Electroglas, Inc.	Microcircuit test device with multi-axes probe control
US4123706A (en) *	1975-03-03	1978-10-31	Electroglas, Inc.	Probe construction
DE3628104A1 (de) *	1986-08-19	1988-02-25	Feinmetall Gmbh	Kontaktelement fuer pruefkarten
US4956923A (en) *	1989-11-06	1990-09-18	The Micromanipulator Co., Inc.	Probe assembly including touchdown sensor
DE4101920A1 (de) *	1991-01-23	1992-07-30	Ehlermann Eckhard	Pruefvorrichtung fuer integrierte schaltkreise
US5446393A (en) *	1993-05-21	1995-08-29	Schaefer; Richard K.	Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin
JP2003084009A (ja) *	2001-09-11	2003-03-19	Umc Japan	テスト用ピンユニット
US6897668B1 (en) *	2003-11-28	2005-05-24	Premtek International Inc.	Double-faced detecting devices for an electronic substrate
US20050200369A1 (en) *	2004-03-12	2005-09-15	Andre Langevin	Resistance metering device having probes on bar clamps
US11047066B2 (en) *	2018-06-27	2021-06-29	Globalwafers Co., Ltd.	Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots
US10954606B2 (en)	2018-06-27	2021-03-23	Globalwafers Co., Ltd.	Methods for modeling the impurity concentration of a single crystal silicon ingot
US10830793B2 (en) *	2019-01-29	2020-11-10	Kuan-Hung Chen	Deflecting device for a probe
WO2024081107A1 (fr) *	2022-10-12	2024-04-18	Macom Technology Solutions Holdings, Inc.	Sonde à ressort à lames à bobine acoustique

1968
- 1968-12-16 US US784116A patent/US3551807A/en not_active Expired - Lifetime
1969
- 1969-10-01 CH CH1475869A patent/CH502172A/fr not_active IP Right Cessation
- 1969-11-24 GB GB1232175D patent/GB1232175A/en not_active Expired
- 1969-11-28 NL NL6917977A patent/NL6917977A/xx unknown
- 1969-12-12 DE DE19691962446 patent/DE1962446A1/de active Pending
- 1969-12-15 FR FR6943306A patent/FR2026236A1/fr not_active Withdrawn
- 1969-12-15 SE SE17283/69A patent/SE358242B/xx unknown
- 1969-12-15 CH CH1865769A patent/CH506070A/fr not_active IP Right Cessation
- 1969-12-16 BE BE743180D patent/BE743180A/xx unknown

Also Published As

Publication number	Publication date
CH506070A (fr)	1971-04-15
NL6917977A (fr)	1970-06-18
SE358242B (fr)	1973-07-23
GB1232175A (fr)	1971-05-19
DE1962446A1 (de)	1970-07-02
CH502172A (fr)	1971-01-31
FR2026236A1 (fr)	1970-09-18
US3551807A (en)	1970-12-29

Publication	Publication Date	Title
AU5506869A (fr)	1970-11-26
AU5184069A (fr)	1970-07-17
FR2026236A1 (fr)	1970-09-18
AU6168869A (fr)	1971-04-08
AU6171569A (fr)	1971-04-08
AU4811568A (fr)	1974-08-01
AU4744468A (fr)	1970-06-18
BE725968A (fr)	1969-06-23
BE723009A (fr)	1969-04-01
AU463027A (fr)	1971-03-04
BE727882A (fr)	1969-08-04
AU479894A (fr)	1973-08-30
BE727529A (fr)	1969-07-01
BE727038A (fr)	1969-07-17
AU4558658A (fr)	1970-05-07
BE726782A (fr)	1969-06-16
BE726666A (fr)	1969-06-16
BE726630A (fr)	1969-07-08
BE726603A (fr)	1969-06-16
BE726387A (fr)	1969-06-16
BE726246A (fr)	1969-06-30
BE725094A (fr)	1969-05-16
BE725919A (fr)	1969-05-29
AU5758767A (fr)	1970-03-26
BE724795A (fr)	1969-05-16