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AU5929198A - Inspection equipment using small-angle topography in determining an object's internal structure and composition - Google Patents

Inspection equipment using small-angle topography in determining an object's internal structure and composition

Info

Publication number
AU5929198A
AU5929198A AU59291/98A AU5929198A AU5929198A AU 5929198 A AU5929198 A AU 5929198A AU 59291/98 A AU59291/98 A AU 59291/98A AU 5929198 A AU5929198 A AU 5929198A AU 5929198 A AU5929198 A AU 5929198A
Authority
AU
Australia
Prior art keywords
determining
composition
small
internal structure
inspection equipment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU59291/98A
Inventor
Oleg V. Komardin
Albert F. Lawrence
Pavel I Lazarev
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quanta Vision Inc
Original Assignee
Quanta Vision Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from RU97101221A external-priority patent/RU2119659C1/en
Priority claimed from RU97105594A external-priority patent/RU2119660C1/en
Application filed by Quanta Vision Inc filed Critical Quanta Vision Inc
Publication of AU5929198A publication Critical patent/AU5929198A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Geophysics (AREA)
  • Biochemistry (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU59291/98A 1997-01-24 1998-01-23 Inspection equipment using small-angle topography in determining an object's internal structure and composition Abandoned AU5929198A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
RO97101221 1997-01-24
RU97101221A RU2119659C1 (en) 1997-01-24 1997-01-24 Small-angle topography aid
RU97105594A RU2119660C1 (en) 1997-04-08 1997-04-08 Gear determining composition and structure of inhomogeneous object ( versions )
RO97105594 1997-04-08
PCT/US1998/001299 WO1998033062A1 (en) 1997-01-24 1998-01-23 Inspection equipment using small-angle topography in determining an object's internal structure and composition

Publications (1)

Publication Number Publication Date
AU5929198A true AU5929198A (en) 1998-08-18

Family

ID=26653910

Family Applications (2)

Application Number Title Priority Date Filing Date
AU59291/98A Abandoned AU5929198A (en) 1997-01-24 1998-01-23 Inspection equipment using small-angle topography in determining an object's internal structure and composition
AU60397/98A Abandoned AU6039798A (en) 1997-01-24 1998-01-23 Device for determining composition and structure of objects

Family Applications After (1)

Application Number Title Priority Date Filing Date
AU60397/98A Abandoned AU6039798A (en) 1997-01-24 1998-01-23 Device for determining composition and structure of objects

Country Status (5)

Country Link
EP (1) EP0898704A1 (en)
JP (1) JP2000512764A (en)
CN (1) CN1216109A (en)
AU (2) AU5929198A (en)
WO (2) WO1998033063A1 (en)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6483891B1 (en) * 1998-09-17 2002-11-19 Quanta Vision, Inc. Reduced-angle mammography device and variants
IT1320201B1 (en) 2000-06-09 2003-11-26 Dylog Italia Spa X-RAY INSPECTION DEVICE FOR FOOD PRODUCTS.
JP4149230B2 (en) * 2002-10-16 2008-09-10 富士フイルム株式会社 Radiographic imaging system and radiographic image detector
US7065175B2 (en) * 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
EP1633251A1 (en) * 2003-05-28 2006-03-15 Philips Intellectual Property & Standards GmbH Fan-beam coherent-scatter computer tomography
US7406192B2 (en) 2003-10-06 2008-07-29 Ge Homeland Protection, Inc. Method for determining the change in position of an item of luggage in order to examine a suspect region in this item of luggage
GB0420222D0 (en) * 2004-09-11 2004-10-13 Koninkl Philips Electronics Nv Coherent scatter imaging
DE102004050543A1 (en) * 2004-10-16 2006-04-20 Bruker Axs Gmbh Analyzer with variably illuminated strip detector
DE102004060609A1 (en) * 2004-12-16 2006-06-29 Yxlon International Security Gmbh Method for measuring the momentum transfer spectrum of elastically scattered x-ray quanta
DE102004060612B4 (en) * 2004-12-16 2007-10-31 GE Homeland Protection, Inc., , Newark Arrangement for measuring the pulse transmission spectrum of elastically scattered X-ray quanta
JP2006177760A (en) * 2004-12-22 2006-07-06 Nagoya Electric Works Co Ltd X-ray inspection device, x-ray inspection method, and x-ray inspection program
US7738631B2 (en) * 2005-06-16 2010-06-15 Endicott Interconnect Technologies, Inc. Energy discriminating scatter imaging system
DE102005039642B3 (en) * 2005-08-22 2007-02-22 Yxlon International Security Gmbh Collimator system for x-ray diffractometery, e.g. for luggage inspection, has primary collimator with ring-shaped opening, and secondary collimator with cylindrical- and conical-surface apertures
DE102006012946A1 (en) * 2006-03-21 2007-09-27 Siemens Ag Radiation detection unit for computer tomography used during through-radiation of e.g. patient, has scattered radiation sensors arranged to measure scattered radiation, where sensors are arranged outside primary fan optical path
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
GB0706089D0 (en) 2007-03-29 2007-10-31 Durham Scient Crystals Ltd X-ray imaging of materials
GB0706088D0 (en) * 2007-03-29 2007-05-09 Durham Scient Crystals Ltd X-ray imaging of materials
CN102565097B (en) * 2008-03-18 2014-07-09 同方威视技术股份有限公司 Integration system for radioactive substance detection and X-ray radiation imaging
GB0823093D0 (en) 2008-12-19 2009-01-28 Durham Scient Crystals Ltd Apparatus and method for characterisation of materials
US7756249B1 (en) * 2009-02-19 2010-07-13 Morpho Detection, Inc. Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
JP2012170645A (en) * 2011-02-22 2012-09-10 Canon Inc X-ray imaging apparatus, and x-ray imaging method
DE102011006421A1 (en) * 2011-03-30 2012-10-04 Siemens Aktiengesellschaft Digital X-ray detector has anti-scatter grid that is arranged between active matrix and back plate so as to filter scattered radiation
CN102411157B (en) * 2011-08-05 2014-10-29 北京睿思厚德辐射信息科技开发有限公司 Method and device for unilaterally scanning object and bilaterally and stereoscopically imaging
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
TWI538565B (en) * 2013-10-15 2016-06-11 財團法人工業技術研究院 Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements
CN104754848B (en) 2013-12-30 2017-12-08 同方威视技术股份有限公司 X-ray generator and the radioscopy imaging system with the device
CN107407622A (en) * 2015-01-16 2017-11-28 拉皮斯坎系统股份有限公司 For detecting the non-intruding inspection system and method for material of interest
CN104873214B (en) * 2015-05-22 2018-04-13 北京师范大学 The detection device of early-stage breast cancer
CN108445023B (en) * 2016-11-09 2020-08-14 上海伊斯曼电气股份有限公司 Detection box for X-ray foreign matter detector
US10281414B2 (en) * 2016-12-01 2019-05-07 Malvern Panalytical B.V. Conical collimator for X-ray measurements
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
BR102018008275B1 (en) * 2018-04-24 2023-12-12 Marcio Issamu Haraguchi INDUSTRIAL EQUIPMENT IMAGING SYSTEM AND PROCESS
CN108956657A (en) * 2018-08-23 2018-12-07 深圳码隆科技有限公司 Liquid identification method and device thereof during a kind of safety check
CN109374660B (en) * 2018-11-22 2024-09-06 北京科技大学 High flux powder diffraction device for pencil beam

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60181638A (en) * 1984-02-29 1985-09-17 Toshiba Corp Photography method of radiation image
DE3526015A1 (en) * 1985-07-20 1987-01-22 Philips Patentverwaltung METHOD FOR DETERMINING THE SPATIAL DISTRIBUTION OF THE SPREAD CROSS SECTIONS FOR ELASTICALLY SCREENED X-RAY RADIATION AND ARRANGEMENT FOR IMPLEMENTING THE METHOD
US5007072A (en) * 1988-08-03 1991-04-09 Ion Track Instruments X-ray diffraction inspection system
DE4101544A1 (en) * 1991-01-19 1992-07-23 Philips Patentverwaltung ROENTGENGERAET
DE59308726D1 (en) * 1992-02-06 1998-08-13 Philips Patentverwaltung Arrangement for measuring the pulse transmission spectrum of elastically scattered X-ray quanta
US5802137A (en) * 1993-08-16 1998-09-01 Commonwealth Scientific And Industrial Research X-ray optics, especially for phase contrast imaging
RU2098797C1 (en) * 1994-11-30 1997-12-10 Алексей Владиславович Курбатов Method for obtaining object projection by means of penetrating radiation and device for its realization

Also Published As

Publication number Publication date
WO1998033062A1 (en) 1998-07-30
AU6039798A (en) 1998-08-18
CN1216109A (en) 1999-05-05
JP2000512764A (en) 2000-09-26
EP0898704A1 (en) 1999-03-03
WO1998033063A1 (en) 1998-07-30

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