AU5929198A - Inspection equipment using small-angle topography in determining an object's internal structure and composition - Google Patents
Inspection equipment using small-angle topography in determining an object's internal structure and compositionInfo
- Publication number
- AU5929198A AU5929198A AU59291/98A AU5929198A AU5929198A AU 5929198 A AU5929198 A AU 5929198A AU 59291/98 A AU59291/98 A AU 59291/98A AU 5929198 A AU5929198 A AU 5929198A AU 5929198 A AU5929198 A AU 5929198A
- Authority
- AU
- Australia
- Prior art keywords
- determining
- composition
- small
- internal structure
- inspection equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000007689 inspection Methods 0.000 title 1
- 238000012876 topography Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Geophysics (AREA)
- Biochemistry (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Theoretical Computer Science (AREA)
- Radiology & Medical Imaging (AREA)
- Pulmonology (AREA)
- Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RO97101221 | 1997-01-24 | ||
RU97101221A RU2119659C1 (en) | 1997-01-24 | 1997-01-24 | Small-angle topography aid |
RU97105594A RU2119660C1 (en) | 1997-04-08 | 1997-04-08 | Gear determining composition and structure of inhomogeneous object ( versions ) |
RO97105594 | 1997-04-08 | ||
PCT/US1998/001299 WO1998033062A1 (en) | 1997-01-24 | 1998-01-23 | Inspection equipment using small-angle topography in determining an object's internal structure and composition |
Publications (1)
Publication Number | Publication Date |
---|---|
AU5929198A true AU5929198A (en) | 1998-08-18 |
Family
ID=26653910
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU59291/98A Abandoned AU5929198A (en) | 1997-01-24 | 1998-01-23 | Inspection equipment using small-angle topography in determining an object's internal structure and composition |
AU60397/98A Abandoned AU6039798A (en) | 1997-01-24 | 1998-01-23 | Device for determining composition and structure of objects |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU60397/98A Abandoned AU6039798A (en) | 1997-01-24 | 1998-01-23 | Device for determining composition and structure of objects |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0898704A1 (en) |
JP (1) | JP2000512764A (en) |
CN (1) | CN1216109A (en) |
AU (2) | AU5929198A (en) |
WO (2) | WO1998033063A1 (en) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6483891B1 (en) * | 1998-09-17 | 2002-11-19 | Quanta Vision, Inc. | Reduced-angle mammography device and variants |
IT1320201B1 (en) | 2000-06-09 | 2003-11-26 | Dylog Italia Spa | X-RAY INSPECTION DEVICE FOR FOOD PRODUCTS. |
JP4149230B2 (en) * | 2002-10-16 | 2008-09-10 | 富士フイルム株式会社 | Radiographic imaging system and radiographic image detector |
US7065175B2 (en) * | 2003-03-03 | 2006-06-20 | Varian Medical Systems Technologies, Inc. | X-ray diffraction-based scanning system |
EP1633251A1 (en) * | 2003-05-28 | 2006-03-15 | Philips Intellectual Property & Standards GmbH | Fan-beam coherent-scatter computer tomography |
US7406192B2 (en) | 2003-10-06 | 2008-07-29 | Ge Homeland Protection, Inc. | Method for determining the change in position of an item of luggage in order to examine a suspect region in this item of luggage |
GB0420222D0 (en) * | 2004-09-11 | 2004-10-13 | Koninkl Philips Electronics Nv | Coherent scatter imaging |
DE102004050543A1 (en) * | 2004-10-16 | 2006-04-20 | Bruker Axs Gmbh | Analyzer with variably illuminated strip detector |
DE102004060609A1 (en) * | 2004-12-16 | 2006-06-29 | Yxlon International Security Gmbh | Method for measuring the momentum transfer spectrum of elastically scattered x-ray quanta |
DE102004060612B4 (en) * | 2004-12-16 | 2007-10-31 | GE Homeland Protection, Inc., , Newark | Arrangement for measuring the pulse transmission spectrum of elastically scattered X-ray quanta |
JP2006177760A (en) * | 2004-12-22 | 2006-07-06 | Nagoya Electric Works Co Ltd | X-ray inspection device, x-ray inspection method, and x-ray inspection program |
US7738631B2 (en) * | 2005-06-16 | 2010-06-15 | Endicott Interconnect Technologies, Inc. | Energy discriminating scatter imaging system |
DE102005039642B3 (en) * | 2005-08-22 | 2007-02-22 | Yxlon International Security Gmbh | Collimator system for x-ray diffractometery, e.g. for luggage inspection, has primary collimator with ring-shaped opening, and secondary collimator with cylindrical- and conical-surface apertures |
DE102006012946A1 (en) * | 2006-03-21 | 2007-09-27 | Siemens Ag | Radiation detection unit for computer tomography used during through-radiation of e.g. patient, has scattered radiation sensors arranged to measure scattered radiation, where sensors are arranged outside primary fan optical path |
GB2441578A (en) * | 2006-09-08 | 2008-03-12 | Ucl Business Plc | Phase Contrast X-Ray Imaging |
GB0706089D0 (en) | 2007-03-29 | 2007-10-31 | Durham Scient Crystals Ltd | X-ray imaging of materials |
GB0706088D0 (en) * | 2007-03-29 | 2007-05-09 | Durham Scient Crystals Ltd | X-ray imaging of materials |
CN102565097B (en) * | 2008-03-18 | 2014-07-09 | 同方威视技术股份有限公司 | Integration system for radioactive substance detection and X-ray radiation imaging |
GB0823093D0 (en) | 2008-12-19 | 2009-01-28 | Durham Scient Crystals Ltd | Apparatus and method for characterisation of materials |
US7756249B1 (en) * | 2009-02-19 | 2010-07-13 | Morpho Detection, Inc. | Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source |
JP2012170645A (en) * | 2011-02-22 | 2012-09-10 | Canon Inc | X-ray imaging apparatus, and x-ray imaging method |
DE102011006421A1 (en) * | 2011-03-30 | 2012-10-04 | Siemens Aktiengesellschaft | Digital X-ray detector has anti-scatter grid that is arranged between active matrix and back plate so as to filter scattered radiation |
CN102411157B (en) * | 2011-08-05 | 2014-10-29 | 北京睿思厚德辐射信息科技开发有限公司 | Method and device for unilaterally scanning object and bilaterally and stereoscopically imaging |
US9297772B2 (en) | 2013-07-30 | 2016-03-29 | Industrial Technology Research Institute | Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements |
TWI538565B (en) * | 2013-10-15 | 2016-06-11 | 財團法人工業技術研究院 | Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements |
CN104754848B (en) | 2013-12-30 | 2017-12-08 | 同方威视技术股份有限公司 | X-ray generator and the radioscopy imaging system with the device |
CN107407622A (en) * | 2015-01-16 | 2017-11-28 | 拉皮斯坎系统股份有限公司 | For detecting the non-intruding inspection system and method for material of interest |
CN104873214B (en) * | 2015-05-22 | 2018-04-13 | 北京师范大学 | The detection device of early-stage breast cancer |
CN108445023B (en) * | 2016-11-09 | 2020-08-14 | 上海伊斯曼电气股份有限公司 | Detection box for X-ray foreign matter detector |
US10281414B2 (en) * | 2016-12-01 | 2019-05-07 | Malvern Panalytical B.V. | Conical collimator for X-ray measurements |
EP3553507A1 (en) * | 2018-04-13 | 2019-10-16 | Malvern Panalytical B.V. | X-ray analysis apparatus |
BR102018008275B1 (en) * | 2018-04-24 | 2023-12-12 | Marcio Issamu Haraguchi | INDUSTRIAL EQUIPMENT IMAGING SYSTEM AND PROCESS |
CN108956657A (en) * | 2018-08-23 | 2018-12-07 | 深圳码隆科技有限公司 | Liquid identification method and device thereof during a kind of safety check |
CN109374660B (en) * | 2018-11-22 | 2024-09-06 | 北京科技大学 | High flux powder diffraction device for pencil beam |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60181638A (en) * | 1984-02-29 | 1985-09-17 | Toshiba Corp | Photography method of radiation image |
DE3526015A1 (en) * | 1985-07-20 | 1987-01-22 | Philips Patentverwaltung | METHOD FOR DETERMINING THE SPATIAL DISTRIBUTION OF THE SPREAD CROSS SECTIONS FOR ELASTICALLY SCREENED X-RAY RADIATION AND ARRANGEMENT FOR IMPLEMENTING THE METHOD |
US5007072A (en) * | 1988-08-03 | 1991-04-09 | Ion Track Instruments | X-ray diffraction inspection system |
DE4101544A1 (en) * | 1991-01-19 | 1992-07-23 | Philips Patentverwaltung | ROENTGENGERAET |
DE59308726D1 (en) * | 1992-02-06 | 1998-08-13 | Philips Patentverwaltung | Arrangement for measuring the pulse transmission spectrum of elastically scattered X-ray quanta |
US5802137A (en) * | 1993-08-16 | 1998-09-01 | Commonwealth Scientific And Industrial Research | X-ray optics, especially for phase contrast imaging |
RU2098797C1 (en) * | 1994-11-30 | 1997-12-10 | Алексей Владиславович Курбатов | Method for obtaining object projection by means of penetrating radiation and device for its realization |
-
1998
- 1998-01-23 AU AU59291/98A patent/AU5929198A/en not_active Abandoned
- 1998-01-23 JP JP10532140A patent/JP2000512764A/en active Pending
- 1998-01-23 CN CN199898800059A patent/CN1216109A/en active Pending
- 1998-01-23 EP EP98902696A patent/EP0898704A1/en not_active Withdrawn
- 1998-01-23 AU AU60397/98A patent/AU6039798A/en not_active Abandoned
- 1998-01-23 WO PCT/US1998/001365 patent/WO1998033063A1/en active Application Filing
- 1998-01-23 WO PCT/US1998/001299 patent/WO1998033062A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
WO1998033062A1 (en) | 1998-07-30 |
AU6039798A (en) | 1998-08-18 |
CN1216109A (en) | 1999-05-05 |
JP2000512764A (en) | 2000-09-26 |
EP0898704A1 (en) | 1999-03-03 |
WO1998033063A1 (en) | 1998-07-30 |
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