AU2003301935A1 - System and method for manufacturing wireless devices - Google Patents
System and method for manufacturing wireless devicesInfo
- Publication number
- AU2003301935A1 AU2003301935A1 AU2003301935A AU2003301935A AU2003301935A1 AU 2003301935 A1 AU2003301935 A1 AU 2003301935A1 AU 2003301935 A AU2003301935 A AU 2003301935A AU 2003301935 A AU2003301935 A AU 2003301935A AU 2003301935 A1 AU2003301935 A1 AU 2003301935A1
- Authority
- AU
- Australia
- Prior art keywords
- wireless devices
- manufacturing wireless
- manufacturing
- devices
- wireless
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
- G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Radar Systems Or Details Thereof (AREA)
- Emergency Alarm Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40115402P | 2002-08-05 | 2002-08-05 | |
US60/401,154 | 2002-08-05 | ||
PCT/US2003/024503 WO2004044672A2 (en) | 2002-08-05 | 2003-08-05 | System and method for manufacturing wireless devices |
Publications (2)
Publication Number | Publication Date |
---|---|
AU2003301935A1 true AU2003301935A1 (en) | 2004-06-03 |
AU2003301935A8 AU2003301935A8 (en) | 2004-06-03 |
Family
ID=32312443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003301935A Abandoned AU2003301935A1 (en) | 2002-08-05 | 2003-08-05 | System and method for manufacturing wireless devices |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1573484A4 (en) |
AU (1) | AU2003301935A1 (en) |
WO (1) | WO2004044672A2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006179856A (en) | 2004-11-25 | 2006-07-06 | Fuji Electric Holdings Co Ltd | Insulating substrate and semiconductor device |
DE102004059716B3 (en) | 2004-12-08 | 2006-04-06 | Siemens Ag | Cold gas spraying method uses particles which are chemical components of high temperature superconductors and are sprayed on to substrate with crystal structure corresponding to that of superconductors |
NL1033148C2 (en) * | 2006-12-29 | 2008-07-01 | Univ Delft Tech | Electric measuring device, method and computer program product. |
DE102008024504A1 (en) | 2008-05-21 | 2009-11-26 | Linde Ag | Method and apparatus for cold gas spraying |
US8444377B2 (en) | 2009-10-07 | 2013-05-21 | General Electric Company | Method for attaching a connector to deposited material |
DE102009053987A1 (en) | 2009-11-23 | 2011-06-01 | Linde Aktiengesellschaft | Method and device for producing a multilayer coil |
EP2333133B1 (en) | 2009-11-23 | 2013-03-06 | Linde Aktiengesellschaft | Method for manufacturing a multilayer coil |
FR2986320B1 (en) * | 2012-01-27 | 2014-12-26 | Commissariat Energie Atomique | MEASURING DEVICE WITH RESONANT SENSORS |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3689907A (en) * | 1970-08-03 | 1972-09-05 | Robbins Aviat Inc | Dewpoint monitor |
US4327416A (en) * | 1980-04-16 | 1982-04-27 | Sangamo Weston, Inc. | Temperature compensation system for Hall effect element |
DE4033053C1 (en) * | 1990-10-18 | 1992-03-05 | Hottinger Baldwin Messtechnik Gmbh, 6100 Darmstadt, De | |
US5227798A (en) * | 1992-06-24 | 1993-07-13 | The United States Of America As Represented By The Secretary Of The Air Force | Passive transmitting sensor |
US5406829A (en) * | 1994-04-19 | 1995-04-18 | Tektronix, Inc. | Temperature control for chemical sensors |
US5705399A (en) * | 1994-05-20 | 1998-01-06 | The Cooper Union For Advancement Of Science And Art | Sensor and method for detecting predetermined chemical species in solution |
US6026725A (en) * | 1995-04-10 | 2000-02-22 | Best Cutting Die Company | Panel cutting apparatus with waste repellant die structure |
US6331680B1 (en) * | 1996-08-07 | 2001-12-18 | Visteon Global Technologies, Inc. | Multilayer electrical interconnection device and method of making same |
US6111520A (en) * | 1997-04-18 | 2000-08-29 | Georgia Tech Research Corp. | System and method for the wireless sensing of physical properties |
EP1012609B1 (en) * | 1997-04-21 | 2001-10-24 | Arbeitsgemeinschaft Prof. Dr. J. Hugel | Device with wide pass band for measuring electric current intensity in a conductor |
US5894647A (en) * | 1997-06-30 | 1999-04-20 | Tfr Technologies, Inc. | Method for fabricating piezoelectric resonators and product |
US6278379B1 (en) * | 1998-04-02 | 2001-08-21 | Georgia Tech Research Corporation | System, method, and sensors for sensing physical properties |
GB2356050B (en) * | 1999-11-05 | 2001-10-24 | Elcometer Instr Ltd | Apparatus and method for measuring thickness |
-
2003
- 2003-08-05 EP EP03811202A patent/EP1573484A4/en not_active Withdrawn
- 2003-08-05 AU AU2003301935A patent/AU2003301935A1/en not_active Abandoned
- 2003-08-05 WO PCT/US2003/024503 patent/WO2004044672A2/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP1573484A4 (en) | 2010-11-03 |
WO2004044672A3 (en) | 2009-07-16 |
WO2004044672A2 (en) | 2004-05-27 |
WO2004044672A9 (en) | 2004-07-08 |
EP1573484A2 (en) | 2005-09-14 |
AU2003301935A8 (en) | 2004-06-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |