AU2003292115A1 - Adapter for testing conductor arrangements - Google Patents

Adapter for testing conductor arrangements

Info

Publication number: AU2003292115A1
Authority: AU; Australia
Prior art keywords: adapter; conductor arrangements; testing conductor; testing; arrangements
Prior art date: 2002-12-20
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Abandoned

Application number

AU2003292115A

Inventor

Manfred Prokopp

Victor Romanov

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

ATG Test Systems GmbH and Co KG

Original Assignee

ATG Test Systems GmbH and Co KG

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2002-12-20

Filing date

2003-11-25

Publication date

2004-07-22

2003-11-25 Application filed by ATG Test Systems GmbH and Co KG filed Critical ATG Test Systems GmbH and Co KG

2004-07-22 Publication of AU2003292115A1 publication Critical patent/AU2003292115A1/en

Status Abandoned legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
Testing Of Individual Semiconductor Devices (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Measuring Leads Or Probes (AREA)
Tests Of Electronic Circuits (AREA)

AU2003292115A 2002-12-20 2003-11-25 Adapter for testing conductor arrangements Abandoned AU2003292115A1 (en)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
DE10260238A DE10260238B4 (en)	2002-12-20	2002-12-20	Adapter for testing one or more ladder arrangements and methods
DE10260238.7		2002-12-20
PCT/EP2003/013253 WO2004059329A1 (en)	2002-12-20	2003-11-25	Adapter for testing conductor arrangements

Publications (1)

Publication Number	Publication Date
AU2003292115A1 true AU2003292115A1 (en)	2004-07-22

Family

ID=32519240

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AU2003292115A Abandoned AU2003292115A1 (en)	2002-12-20	2003-11-25	Adapter for testing conductor arrangements

Country Status (7)

Country	Link
JP (1)	JP2006510026A (en)
KR (1)	KR100638330B1 (en)
CN (1)	CN1714294A (en)
AU (1)	AU2003292115A1 (en)
DE (1)	DE10260238B4 (en)
TW (1)	TWI234002B (en)
WO (1)	WO2004059329A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP4845031B2 (en)	2006-11-10	2011-12-28	株式会社ヨコオ	Relay connector
KR101396604B1 (en) *	2006-11-27	2014-05-16	엘지디스플레이 주식회사	Apparatus for Testing Liquid Crystal Display Device
TWI413777B (en) *	2010-09-01	2013-11-01		Multi - power circuit board and its application probe card
CN102721835B (en) *	2012-07-03	2014-06-04	航天科工防御技术研究试验中心	Test adapter
CN104073427B (en) *	2014-06-27	2016-03-30	江苏卓微生物科技有限公司	Cell detection adaptor chip
CN104073426B (en) *	2014-06-27	2016-03-30	江苏卓微生物科技有限公司	Cell detection adaptor chip mount pad
CN104031823B (en) *	2014-06-27	2016-08-24	江苏卓微生物科技有限公司	cell detection chip and adapter thereof
DE102015113046A1 (en) *	2015-08-07	2017-02-09	Xcerra Corp.	Positioning device for a parallel tester for testing printed circuit boards and parallel testers for PCB testing
CN105044402A (en) *	2015-08-25	2015-11-11	贵州航天计量测试技术研究所	Encapsulated micro-wave voltage-controlled oscillator test device
DE102018120337B3 (en) *	2018-08-21	2020-02-27	Preh Gmbh	TOUCH-SENSITIVE CONTROL FOR A MOTOR VEHICLE

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3838413A1 (en) *	1988-11-12	1990-05-17	Mania Gmbh	ADAPTER FOR ELECTRONIC TEST DEVICES FOR PCBS AND THE LIKE
US5469064A (en) *	1992-01-14	1995-11-21	Hewlett-Packard Company	Electrical assembly testing using robotic positioning of probes
DE19541307C2 (en) *	1995-11-06	2001-09-27	Atg Test Systems Gmbh	Method for testing electrical conductor arrangements and device for carrying out the method
DE19718637A1 (en)	1997-05-02	1998-11-05	Atg Test Systems Gmbh	Device and method for testing printed circuit boards
TW360790B (en) *	1996-10-28	1999-06-11	Atg Test Systems Gmbh	Printed circuit board test apparatus and method
DE19644725C1 (en) *	1996-10-28	1998-04-02	Atg Test Systems Gmbh	System for testing electric printed circuit board
JP3214415B2 (en) *	1997-10-30	2001-10-02	日本電産リード株式会社	Substrate inspection device and substrate inspection method
JP2000009755A (en) *	1998-06-23	2000-01-14	Jsr Corp	Printed wiring board testing jig substrate and printed wiring board testing method
DE10024875B4 (en) *	2000-05-16	2004-07-01	Infineon Technologies Ag	Component holder system for use with test devices for testing electronic components

2002
- 2002-12-20 DE DE10260238A patent/DE10260238B4/en not_active Expired - Fee Related
2003
- 2003-11-17 TW TW092132186A patent/TWI234002B/en not_active IP Right Cessation
- 2003-11-25 AU AU2003292115A patent/AU2003292115A1/en not_active Abandoned
- 2003-11-25 JP JP2004562651A patent/JP2006510026A/en not_active Withdrawn
- 2003-11-25 KR KR1020057011514A patent/KR100638330B1/en not_active IP Right Cessation
- 2003-11-25 CN CNA200380103923XA patent/CN1714294A/en active Pending
- 2003-11-25 WO PCT/EP2003/013253 patent/WO2004059329A1/en active Application Filing

Also Published As

Publication number	Publication date
DE10260238A1 (en)	2004-07-22
KR100638330B1 (en)	2006-10-25
TWI234002B (en)	2005-06-11
KR20050091013A (en)	2005-09-14
DE10260238B4 (en)	2007-04-05
JP2006510026A (en)	2006-03-23
WO2004059329A1 (en)	2004-07-15
TW200413740A (en)	2004-08-01
CN1714294A (en)	2005-12-28

Publication	Publication Date	Title
AU2003218348A1 (en)	2003-10-13	Test probe alignment apparatus
TW551706U (en)	2003-09-01	Electrical adapter
AU2002349755A1 (en)	2003-09-16	Electronic part test apparatus
AU2003252010A1 (en)	2004-02-02	Electrical connector apparatus
AU2003214863A1 (en)	2003-10-08	Test and burn-in connector
AU2002368120A1 (en)	2004-02-16	Electronic device test system
AU2003211373A1 (en)	2003-09-16	Current measuring device
AU2003237344A1 (en)	2003-12-19	Testing device
AU2002347370A1 (en)	2003-06-17	Test apparatus
AU2003291821A1 (en)	2004-06-15	Corrosion testing apparatus
AU2003221928A1 (en)	2003-11-03	Semiconductor test system with easily changed interface unit
AU2003243367A1 (en)	2003-12-19	Electric arc testing systems
AU2002253956A1 (en)	2003-09-04	Smart adapter for wiring analyzer
AU2002357580A1 (en)	2004-07-22	Device for gioniometric measurements
AU2003292115A1 (en)	2004-07-22	Adapter for testing conductor arrangements
AU2003227908A1 (en)	2003-11-11	Test apparatus
AU2003253721A1 (en)	2004-01-19	Multiple conductor indicator
EP1420263A3 (en)	2004-12-29	Voltage standard apparatus
AU2003288981A1 (en)	2004-05-25	Electrical adapter for protecting electrical interfaces
AU2002238144A1 (en)	2002-09-24	Device for testing coaxial connectors
GB2388969B (en)	2005-04-13	Electrical testing
AU2003245306A1 (en)	2003-12-12	Compliant component for supporting electrical interface component
AU2003258310A1 (en)	2004-03-11	Latch for an electrical device
TW572391U (en)	2004-01-11	Electrical adapter
AU2003284411A1 (en)	2004-06-15	Electric probe system

Legal Events

Date	Code	Title	Description
2005-09-08	MK6	Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase