AU2002245700A1 - Screening of combinatorial library using x-ray analysis - Google Patents
Screening of combinatorial library using x-ray analysisInfo
- Publication number
- AU2002245700A1 AU2002245700A1 AU2002245700A AU2002245700A AU2002245700A1 AU 2002245700 A1 AU2002245700 A1 AU 2002245700A1 AU 2002245700 A AU2002245700 A AU 2002245700A AU 2002245700 A AU2002245700 A AU 2002245700A AU 2002245700 A1 AU2002245700 A1 AU 2002245700A1
- Authority
- AU
- Australia
- Prior art keywords
- screening
- ray analysis
- combinatorial library
- combinatorial
- library
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2002/008434 WO2003081222A1 (en) | 2002-03-19 | 2002-03-19 | Screening of combinatorial library using x-ray analysis |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2002245700A1 true AU2002245700A1 (en) | 2003-10-08 |
Family
ID=28452135
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2002245700A Abandoned AU2002245700A1 (en) | 2002-03-19 | 2002-03-19 | Screening of combinatorial library using x-ray analysis |
Country Status (2)
| Country | Link |
|---|---|
| AU (1) | AU2002245700A1 (en) |
| WO (1) | WO2003081222A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1953537A1 (en) * | 2007-01-30 | 2008-08-06 | KEMMER, Josef, Dr. | Device for detecting or guiding x-radiation using x-ray optics |
| EP2162732A1 (en) | 2007-03-15 | 2010-03-17 | X-ray Optical Systems, INC. | Small spot and high energy resolution xrf system for valence state determination |
| CN106288796A (en) * | 2016-07-26 | 2017-01-04 | 中国科学院上海应用物理研究所 | A kind of glancing incidence XAFS high-temp in-situ stove |
| CN109324072B (en) * | 2017-07-28 | 2021-05-14 | 中国科学院苏州纳米技术与纳米仿生研究所 | Detection system and detection method for high-flux combined material chip |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL8801019A (en) * | 1988-04-20 | 1989-11-16 | Philips Nv | ROENTGEN SPECTROMETER WITH DOUBLE-CURVED CRYSTAL. |
| DE69427152T2 (en) * | 1994-07-08 | 2001-11-22 | Muradin Abubekirovic Kumachov | METHOD FOR GUIDING NEUTRAL AND CARGO BEAMS AND A DEVICE FOR IMPLEMENTING THE METHOD |
| AU4812097A (en) * | 1996-10-09 | 1998-05-05 | Symyx Technologies, Inc. | Infrared spectroscopy and imaging of libraries |
| GB9815968D0 (en) * | 1998-07-23 | 1998-09-23 | Bede Scient Instr Ltd | X-ray focusing apparatus |
| AU2368900A (en) * | 1998-12-18 | 2000-07-03 | Symyx Technologies, Inc. | Apparatus and method for characterizing libraries of different materials using x-ray scattering |
| US6389101B1 (en) * | 1999-05-24 | 2002-05-14 | Jmar Research, Inc. | Parallel x-ray nanotomography |
| JP3373803B2 (en) * | 1999-05-28 | 2003-02-04 | 科学技術振興事業団 | Combinatorial X-ray diffractometer |
| US6624431B1 (en) * | 1999-07-21 | 2003-09-23 | Jmar Research, Inc. | High collection angle short wavelength radiation collimator and focusing optic |
-
2002
- 2002-03-19 AU AU2002245700A patent/AU2002245700A1/en not_active Abandoned
- 2002-03-19 WO PCT/US2002/008434 patent/WO2003081222A1/en not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003081222A1 (en) | 2003-10-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |