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AU2001242390A1 - Method of analysis using x-ray fluorescence - Google Patents

Method of analysis using x-ray fluorescence

Info

Publication number
AU2001242390A1
AU2001242390A1 AU2001242390A AU4239001A AU2001242390A1 AU 2001242390 A1 AU2001242390 A1 AU 2001242390A1 AU 2001242390 A AU2001242390 A AU 2001242390A AU 4239001 A AU4239001 A AU 4239001A AU 2001242390 A1 AU2001242390 A1 AU 2001242390A1
Authority
AU
Australia
Prior art keywords
analysis
ray fluorescence
fluorescence
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001242390A
Inventor
Konrad Beckenkamp
Alexander Henrich
Oliver Mandal
Matthias Ohm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Merck Patent GmbH
Original Assignee
Merck Patent GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merck Patent GmbH filed Critical Merck Patent GmbH
Publication of AU2001242390A1 publication Critical patent/AU2001242390A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2001242390A 2000-03-09 2001-02-13 Method of analysis using x-ray fluorescence Abandoned AU2001242390A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10011115 2000-03-09
DE10011115A DE10011115A1 (en) 2000-03-09 2000-03-09 Analysis method using X-ray fluorescence uses unfiltered X-ray radiation generated using acceleration voltage of between 5 and 60 kV
PCT/EP2001/001580 WO2001067076A2 (en) 2000-03-09 2001-02-13 Method of analysis using x-ray fluorescence

Publications (1)

Publication Number Publication Date
AU2001242390A1 true AU2001242390A1 (en) 2001-09-17

Family

ID=7633855

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001242390A Abandoned AU2001242390A1 (en) 2000-03-09 2001-02-13 Method of analysis using x-ray fluorescence

Country Status (6)

Country Link
US (1) US20030049859A1 (en)
EP (1) EP1261859A2 (en)
JP (1) JP2003527585A (en)
AU (1) AU2001242390A1 (en)
DE (1) DE10011115A1 (en)
WO (1) WO2001067076A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7978820B2 (en) 2009-10-22 2011-07-12 Panalytical B.V. X-ray diffraction and fluorescence
CN103868941A (en) * 2012-12-18 2014-06-18 南京第四分析仪器有限公司 Energy dispersive X-ray fluorescence analysis rapidly judging method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
US2897367A (en) * 1956-04-25 1959-07-28 Applied Res Lab Inc Spectroscopy
US3562525A (en) * 1967-06-29 1971-02-09 Minnesota Mining & Mfg X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
JPS5139188A (en) * 1974-09-30 1976-04-01 Horiba Ltd Hibunsangatakeikoxsenbunsekisochi
EP0108447A3 (en) * 1982-11-04 1985-07-17 North American Philips Corporation Simultaneous collection of diffraction and spectrographic data
JP2853261B2 (en) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 Metal analysis method and analyzer
JP2821656B2 (en) * 1992-10-11 1998-11-05 株式会社堀場製作所 Multiple conditions X-ray fluorescence qualitative analysis method
GB9317371D0 (en) * 1993-08-20 1993-10-06 Oxford Analytical Instr Ltd X-ray fluorescence inspection apparatus

Also Published As

Publication number Publication date
WO2001067076A3 (en) 2002-06-20
DE10011115A1 (en) 2001-09-27
JP2003527585A (en) 2003-09-16
US20030049859A1 (en) 2003-03-13
WO2001067076A2 (en) 2001-09-13
EP1261859A2 (en) 2002-12-04

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