AU1129500A - Environmentally controllable sample holder for x-ray diffractometer (xrd) - Google Patents
Environmentally controllable sample holder for x-ray diffractometer (xrd)Info
- Publication number
- AU1129500A AU1129500A AU11295/00A AU1129500A AU1129500A AU 1129500 A AU1129500 A AU 1129500A AU 11295/00 A AU11295/00 A AU 11295/00A AU 1129500 A AU1129500 A AU 1129500A AU 1129500 A AU1129500 A AU 1129500A
- Authority
- AU
- Australia
- Prior art keywords
- xrd
- sample holder
- ray diffractometer
- controllable sample
- environmentally controllable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10510398P | 1998-10-21 | 1998-10-21 | |
| US60105103 | 1998-10-21 | ||
| PCT/US1999/024678 WO2000023795A1 (en) | 1998-10-21 | 1999-10-21 | Environmentally controllable sample holder for x-ray diffractometer (xrd) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU1129500A true AU1129500A (en) | 2000-05-08 |
Family
ID=22304039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU11295/00A Abandoned AU1129500A (en) | 1998-10-21 | 1999-10-21 | Environmentally controllable sample holder for x-ray diffractometer (xrd) |
Country Status (2)
| Country | Link |
|---|---|
| AU (1) | AU1129500A (en) |
| WO (1) | WO2000023795A1 (en) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10232172B4 (en) * | 2002-07-16 | 2005-03-10 | Proteros Biostructures Gmbh | Apparatus and method for creating a defined environment for particulate samples |
| DE10322040A1 (en) * | 2003-05-16 | 2004-12-09 | Forschungszentrum Karlsruhe Gmbh | Coupling and adjustment device for an X-ray diffractometer |
| FR2856793B1 (en) * | 2003-06-24 | 2006-04-14 | Inst Francais Du Petrole | POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION |
| EP1947448B1 (en) | 2007-01-19 | 2013-07-03 | Panalytical B.V. | X-ray diffraction equipment for X-ray scattering |
| ES2378045B1 (en) * | 2009-04-13 | 2013-02-15 | Consejo Superior De Investigaciones Científicas (Csic) | DEVICE FOR HOUSING A SAMPLE INSIDE A DISPERSION CHAMBER OR X-RAY DIFFACTION. |
| FR2978246B1 (en) * | 2011-07-21 | 2014-06-06 | Commissariat Energie Atomique | INTEGRATED THERMOCOUPLE SAMPLE HOLDER |
| GB2514125B (en) | 2013-05-13 | 2016-10-05 | Nikon Metrology Nv | X-ray imaging system with climate control |
| EP2848924B1 (en) | 2013-09-11 | 2016-08-24 | Anton Paar GmbH | Tempering chamber for compact x-ray apparatus |
| EP2927942A1 (en) * | 2014-04-04 | 2015-10-07 | Nordson Corporation | X-ray inspection apparatus for inspecting semiconductor wafers |
| RU2650836C1 (en) * | 2016-12-14 | 2018-04-17 | федеральное государственное автономное образовательное учреждение высшего образования "Московский физико-технический институт (государственный университет)" | Sample assembly block, intended for conducting combined measurements by x-ray structural analysis in a sliding bundle and additional physico-chemical methods of the study |
| WO2019215326A1 (en) * | 2018-05-11 | 2019-11-14 | Universite De Rouen-Normandie | Anti-frosting and anti-dew device for spectroscopic measurements |
| EP3885756B1 (en) * | 2018-11-23 | 2025-02-19 | Rigaku Corporation | Soaking machine and soaking method of sample for single-crystal x-ray structure analysis |
| CN110031362B (en) * | 2019-02-26 | 2024-10-22 | 中国科学技术大学 | A steam extensional rheometer |
| CN111933832B (en) * | 2020-09-03 | 2023-10-20 | 广州阳瑞仪器科技有限公司 | In-situ battery accessory of X-ray diffractometer and assembling method |
| CN113049618B (en) * | 2021-03-10 | 2022-12-09 | 华研环科(北京)科技有限公司 | High-temperature high-pressure in-situ XRD testing device |
| CN113406128B (en) * | 2021-07-23 | 2022-11-11 | 重庆大学 | A temperature control accessory for X-ray diffractometer |
| CN113945594B (en) * | 2021-10-11 | 2023-03-24 | 安徽科技学院 | Rotating Sample Stage for X-ray Diffraction Analysis for Mounting Vertical Goniometers |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2683933B2 (en) * | 1989-01-20 | 1997-12-03 | 信越半導体株式会社 | Inspection device for front and back and orientation of semiconductor wafer |
| US5084910A (en) * | 1990-12-17 | 1992-01-28 | Dow Corning Corporation | X-ray diffractometer sample holder |
| US5390230A (en) * | 1993-03-30 | 1995-02-14 | Valence Technology, Inc. | Controlled atmosphere, variable volume sample holder for x-ray diffractomer |
| JP3166638B2 (en) * | 1996-11-29 | 2001-05-14 | 株式会社島津製作所 | X-ray fluorescence analyzer |
| US5848122A (en) * | 1997-03-25 | 1998-12-08 | Advanced Technology Materials, Inc. | Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers |
-
1999
- 1999-10-21 WO PCT/US1999/024678 patent/WO2000023795A1/en active Application Filing
- 1999-10-21 AU AU11295/00A patent/AU1129500A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| WO2000023795A9 (en) | 2000-08-24 |
| WO2000023795A1 (en) | 2000-04-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |