[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

ATE64230T1 - Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie. - Google Patents

Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie.

Info

Publication number
ATE64230T1
ATE64230T1 AT85303443T AT85303443T ATE64230T1 AT E64230 T1 ATE64230 T1 AT E64230T1 AT 85303443 T AT85303443 T AT 85303443T AT 85303443 T AT85303443 T AT 85303443T AT E64230 T1 ATE64230 T1 AT E64230T1
Authority
AT
Austria
Prior art keywords
feedback shift
shift register
linear feedback
validation
device technology
Prior art date
Application number
AT85303443T
Other languages
English (en)
Inventor
Venkatraman Iyer
Gil Lee
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Application granted granted Critical
Publication of ATE64230T1 publication Critical patent/ATE64230T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/31853—Test of registers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Dc Digital Transmission (AREA)
  • Pulse Circuits (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Electronic Switches (AREA)
AT85303443T 1984-05-17 1985-05-16 Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie. ATE64230T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/611,450 US4713605A (en) 1984-05-17 1984-05-17 Linear feedback shift register for circuit design technology validation
EP85303443A EP0171874B1 (de) 1984-05-17 1985-05-16 Lineares rückgekoppeltes Schieberegister zur Gültigkeitsbestätigung bei der Schaltungsentwurftechnologie

Publications (1)

Publication Number Publication Date
ATE64230T1 true ATE64230T1 (de) 1991-06-15

Family

ID=24449069

Family Applications (1)

Application Number Title Priority Date Filing Date
AT85303443T ATE64230T1 (de) 1984-05-17 1985-05-16 Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie.

Country Status (5)

Country Link
US (1) US4713605A (de)
EP (1) EP0171874B1 (de)
JP (1) JPH077041B2 (de)
AT (1) ATE64230T1 (de)
DE (1) DE3583085D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8626517D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
GB8626516D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
JPS63182585A (ja) * 1987-01-26 1988-07-27 Toshiba Corp テスト容易化機能を備えた論理回路
US5033048A (en) * 1988-04-01 1991-07-16 Digital Equipment Corporation Memory selftest method and apparatus same
US5228045A (en) * 1990-08-06 1993-07-13 Ncr Corporation Test driver for connecting a standard test port integrated circuit chip to a controlling computer
US5991909A (en) * 1996-10-15 1999-11-23 Mentor Graphics Corporation Parallel decompressor and related methods and apparatuses
US6675338B1 (en) * 2000-08-09 2004-01-06 Sun Microsystems, Inc. Internally generated vectors for burnin system
US6665760B1 (en) 2000-09-29 2003-12-16 Rockwell Automation Technologies, Inc. Group shifting and level shifting rotational arbiter system
US6883132B1 (en) 2000-09-29 2005-04-19 Rockwell Automation Technologies, Inc. Programmable error checking value circuit and method
US6556021B1 (en) * 2000-11-29 2003-04-29 Lsi Logic Corporation Device frequency measurement system
GB2375463A (en) * 2001-05-08 2002-11-13 Ubinetics Ltd Configurable encoder
JP4254201B2 (ja) * 2002-10-31 2009-04-15 ソニー株式会社 スクランブラ、送信装置および受信装置
DE102005024917A1 (de) * 2005-05-31 2006-12-07 Advanced Micro Devices, Inc., Sunnyvale Dynamische Synchronisierersimulation
US7668893B2 (en) * 2005-08-30 2010-02-23 Micron Technology, Inc. Data generator having linear feedback shift registers for generating data pattern in forward and reverse orders
WO2007034935A1 (en) 2005-09-21 2007-03-29 Semiconductor Energy Laboratory Co., Ltd. Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
CA2664620A1 (en) 2009-05-07 2009-07-20 Avalon Microelectronics, Inc. Pseudo-random bit sequence generator
US8949493B1 (en) * 2010-07-30 2015-02-03 Altera Corporation Configurable multi-lane scrambler for flexible protocol support
CN111105825B (zh) * 2018-10-26 2024-08-23 长鑫存储技术有限公司 移位寄存器电路、动态随机存储器和电路控制方法
CN113030709B (zh) * 2021-04-06 2022-06-24 中国科学院上海微系统与信息技术研究所 超导高频测试系统和方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3976864A (en) * 1974-09-03 1976-08-24 Hewlett-Packard Company Apparatus and method for testing digital circuits
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)

Also Published As

Publication number Publication date
EP0171874A2 (de) 1986-02-19
US4713605A (en) 1987-12-15
DE3583085D1 (de) 1991-07-11
JPH077041B2 (ja) 1995-01-30
EP0171874A3 (en) 1988-08-10
EP0171874B1 (de) 1991-06-05
JPS60259973A (ja) 1985-12-23

Similar Documents

Publication Publication Date Title
ATE64230T1 (de) Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie.
JPS6470999A (en) Method and apparatus for memory test
DK25186A (da) Kredsloebsarrangement til anvendelse i et integreret kredsloeb
DE3484134D1 (de) Lineares rueckfuehrungsschieberegister.
NL192801B (nl) Werkwijze voor het testen van een drager met meerdere digitaal-werkende geïntegreerde schakelingen, geïntegreerde schakeling geschikt voor het aanbrengen op een aldus te testen drager, en drager voorzien van meerdere van zulke geïntegreerde schakelingen.
DE3787900D1 (de) Verfahren und Gerät zur Erzeugung von Prüfungs-Byten zur Fehlerdetektion für einen Datenblock.
ATE10878T1 (de) Pruefeinrichtung fuer ein digitales elektrisches laengen- oder winkelmessystem.
TW352466B (en) Apparatus and method for testing integrated circuit
JPS6484342A (en) Test circuit for integrated circuit
DE68909811D1 (de) IC-Testsonde auf Membranbasis mit präzise positionierten Kontakten.
LV10532A (lv) Ierice dazada veida merijumiem un panemiens datu ievadisanai sis ierices atmina
DE69430304D1 (de) Anordnung zum testen von verbindungen mit pulling-widerständen
JPS5797466A (en) Testing method for analogically printed board
DK404089D0 (da) Kredsloeb til kontrol og overvaagning af en elektronisk elektricitetstaellers funktion
NO900503D0 (no) Fremgangsmaate og krets for kobling av et elektronisk telleverk til et lese-/skriveapparat.
DE59102919D1 (de) Schaltungsanordnung zum Überwachen einer Matrix aus bistabilen Matrixpunkten.
ES441228A1 (es) Un circuito de exploracion para sistemas de conmutacion.
JPS545416A (en) Data check system by crc
SU1196911A1 (ru) Устройство дл моделировани радиоэлектронных схем
JPS5731057A (en) Information processing equipment
JPS6421643A (en) Pseudo fault circuit
DE68927556D1 (de) Verfahren und Anordnung zum Codieren eines Sprachparameters, wie z.B. der Tonhöhe in Abhängigkeit von der Zeit
JPS6413263A (en) Sector mark detecting device for optical disk
JPS54109333A (en) Main memory unit
JPS57206961A (en) Logical integrated circuit

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee