[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

MX2018015199A - Metodo de inspeccion, metodo de inspeccion y notificacion, metodo de fabricacion que incluye el metodo de inspeccion, aparato de inspeccion y aparato de fabricacion. - Google Patents

Metodo de inspeccion, metodo de inspeccion y notificacion, metodo de fabricacion que incluye el metodo de inspeccion, aparato de inspeccion y aparato de fabricacion.

Info

Publication number
MX2018015199A
MX2018015199A MX2018015199A MX2018015199A MX2018015199A MX 2018015199 A MX2018015199 A MX 2018015199A MX 2018015199 A MX2018015199 A MX 2018015199A MX 2018015199 A MX2018015199 A MX 2018015199A MX 2018015199 A MX2018015199 A MX 2018015199A
Authority
MX
Mexico
Prior art keywords
inspection
manufacturing
image
notification
inspection object
Prior art date
Application number
MX2018015199A
Other languages
English (en)
Inventor
Yasue Kenzo
Original Assignee
Yoshino Gypsum Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yoshino Gypsum Co filed Critical Yoshino Gypsum Co
Publication of MX2018015199A publication Critical patent/MX2018015199A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Wood Science & Technology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Analysis (AREA)

Abstract

Un método de inspección para inspeccionar un objeto de inspección en forma de tablero con un patrón, incluye un paso de formación de imagen para capturar una imagen original de una superficie de inspección del objeto de inspección, un paso de digitalización para generar una imagen con dos o tres niveles de graduación por la digitalización de la imagen original capturada por el paso de formación de imagen usando un umbral, y un paso de determinación para inspeccionar el objeto de inspección usando la imagen generada por el paso de digitalización.
MX2018015199A 2016-07-12 2017-06-16 Metodo de inspeccion, metodo de inspeccion y notificacion, metodo de fabricacion que incluye el metodo de inspeccion, aparato de inspeccion y aparato de fabricacion. MX2018015199A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016137994 2016-07-12
PCT/JP2017/022279 WO2018012192A1 (ja) 2016-07-12 2017-06-16 検査方法、検査・通知方法、該検査方法を含む製造方法、検査装置及び製造装置

Publications (1)

Publication Number Publication Date
MX2018015199A true MX2018015199A (es) 2019-04-22

Family

ID=60952555

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018015199A MX2018015199A (es) 2016-07-12 2017-06-16 Metodo de inspeccion, metodo de inspeccion y notificacion, metodo de fabricacion que incluye el metodo de inspeccion, aparato de inspeccion y aparato de fabricacion.

Country Status (13)

Country Link
US (1) US10830707B2 (es)
EP (1) EP3486638B1 (es)
JP (1) JP6997457B2 (es)
KR (1) KR102270741B1 (es)
CN (1) CN109477803B (es)
AU (1) AU2017296488B2 (es)
CA (1) CA3029218C (es)
ES (1) ES2965966T3 (es)
MX (1) MX2018015199A (es)
MY (1) MY193069A (es)
PL (1) PL3486638T3 (es)
RU (1) RU2727913C1 (es)
WO (1) WO2018012192A1 (es)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107067421B (zh) * 2017-05-12 2020-02-28 京东方科技集团股份有限公司 一种基板残材检测方法、装置及系统
JP2020092855A (ja) * 2018-12-13 2020-06-18 三菱電機株式会社 縫製制御装置、縫製制御システム、縫製制御方法およびプログラム
MX2021007957A (es) * 2019-02-28 2021-08-11 Yoshino Gypsum Co Aparato para inspeccionar cuerpos semejantes a una placa.
CN113947560A (zh) * 2020-07-17 2022-01-18 京东方科技集团股份有限公司 产品检测方法、装置、系统和计算机存储介质
CN117769648A (zh) * 2021-01-19 2024-03-26 西姆伯蒂克加拿大有限公司 装箱货物检验系统及其方法
US11878873B2 (en) 2021-01-19 2024-01-23 Symbotic Canada, Ulc Cased goods inspection and method therefor
CN117412821A (zh) * 2021-01-25 2024-01-16 检测技术有限公司 自动化颗粒检查
RU2768691C1 (ru) * 2021-08-16 2022-03-24 федеральное государственное бюджетное образовательное учреждение высшего образования "Марийский государственный университет" Способ получения профиля вдоль линии сканирования и профиля поверхности по изображению, полученному с цифрового устройства
JP7274026B1 (ja) 2022-07-05 2023-05-15 株式会社ジーテクト プレス機
WO2024084305A1 (en) * 2022-10-17 2024-04-25 Georgia-Pacific Gypsum Llc Tear inspection system, apparatus, and methods
CN116213271B (zh) * 2023-04-28 2023-08-11 山东瑞邦智能装备股份有限公司 装饰石膏板自动缺陷检测与智能剔除装置及其工作方法

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5870150A (ja) * 1981-10-22 1983-04-26 Fuji Electric Co Ltd 光学検査装置用照明器
JPS60227107A (ja) * 1984-04-25 1985-11-12 Matsushita Electric Works Ltd 欠点検出装置
JPS6375507A (ja) * 1986-09-19 1988-04-05 Toshiba Corp くぼみ穴測定方法及び装置
JPH01297542A (ja) * 1988-05-25 1989-11-30 Csk Corp 欠陥検査装置
JPH06147855A (ja) * 1992-11-10 1994-05-27 Hiyuu Burein:Kk 画像検査方法
WO1998059213A1 (fr) * 1997-06-25 1998-12-30 Matsushita Electric Works, Ltd. Procede et dispositif de controle de motifs
JP4293653B2 (ja) 1998-10-23 2009-07-08 パナソニック電工株式会社 外観検査方法
JP4548912B2 (ja) * 2000-08-11 2010-09-22 パナソニック株式会社 透明液体検査装置、および透明液体塗布装置、および透明液体検査方法、および透明液体塗布方法
JP2002181718A (ja) * 2000-12-14 2002-06-26 Dainippon Printing Co Ltd ホログラムシートの検査方法及び検査装置
JP4038356B2 (ja) * 2001-04-10 2008-01-23 株式会社日立製作所 欠陥データ解析方法及びその装置並びにレビューシステム
JP3698075B2 (ja) * 2001-06-20 2005-09-21 株式会社日立製作所 半導体基板の検査方法およびその装置
JP2004334491A (ja) * 2003-05-07 2004-11-25 Seiko Epson Corp 貼付位置画像検査装置、貼付位置画像検査方法、電気光学装置モジュールの製造装置、電気光学装置モジュールの製造方法、電子部品付き回路基板の製造装置及び電子部品付き回路基板の製造方法
JP3914530B2 (ja) * 2003-10-16 2007-05-16 株式会社日立製作所 欠陥検査装置
JP4347028B2 (ja) * 2003-12-01 2009-10-21 株式会社日立国際電気 目視検査装置
JP4776197B2 (ja) * 2004-09-21 2011-09-21 日本特殊陶業株式会社 配線基板の検査装置
JP2007240432A (ja) * 2006-03-10 2007-09-20 Omron Corp 欠陥検査装置および欠陥検査方法
JP2007248376A (ja) * 2006-03-17 2007-09-27 National Printing Bureau Ｏｖｄ箔上の印刷模様の検査方法及び検査装置
DE102006036723B4 (de) * 2006-08-05 2008-08-21 Uhlmann Pac-Systeme Gmbh & Co. Kg Verfahren zur Prüfung des Siegelergebnisses bei der Siegelung von Folien in einer Siegelstation einer Thermoformmaschine
JP4855920B2 (ja) * 2006-12-26 2012-01-18 日立Ｇｅニュークリア・エナジー株式会社 ウォータージェットピーニング施工面の残留応力評価方法
KR20090024943A (ko) * 2007-09-05 2009-03-10 아주하이텍(주) 자동 광학 검사 장치 및 방법
JP2010139461A (ja) * 2008-12-15 2010-06-24 Toppan Printing Co Ltd 目視検査システム
JPWO2011004534A1 (ja) * 2009-07-09 2012-12-13 株式会社日立ハイテクノロジーズ 半導体欠陥分類方法，半導体欠陥分類装置，半導体欠陥分類プログラム
KR101214806B1 (ko) * 2010-05-11 2012-12-24 가부시키가이샤 사무코 웨이퍼 결함 검사 장치 및 웨이퍼 결함 검사 방법
KR101400220B1 (ko) * 2010-09-17 2014-05-27 도요세이칸 그룹 홀딩스 가부시키가이샤 유리 제품의 곱 검사 장치
JP2012088199A (ja) * 2010-10-20 2012-05-10 Yamaha Motor Co Ltd 異物検査装置および異物検査方法
JP2012242268A (ja) * 2011-05-20 2012-12-10 Toppan Printing Co Ltd 検査装置及び検査方法
CN102507597B (zh) * 2011-10-08 2014-04-23 苏州赛琅泰克高技术陶瓷有限公司 陶瓷基板镭射孔洞检测系统及其检测方法
JP2013157369A (ja) * 2012-01-27 2013-08-15 Dainippon Screen Mfg Co Ltd ステージ移動装置
CN102879402B (zh) * 2012-10-10 2015-01-14 北新集团建材股份有限公司 板材缺陷的影像检测控制方法
RU2611089C2 (ru) * 2012-10-18 2017-02-21 Йосино Джипсум Ко., Лтд. Способ изготовления строительной плиты на основе гипса
JP6483942B2 (ja) * 2013-05-08 2019-03-13 ケイミュー株式会社 建材の柄計測方法及び建材の製造方法
JP2015197396A (ja) * 2014-04-02 2015-11-09 三菱電機株式会社 画像検査方法および画像検査装置
JP6499898B2 (ja) * 2014-05-14 2019-04-10 株式会社ニューフレアテクノロジー 検査方法、テンプレート基板およびフォーカスオフセット方法
KR101730787B1 (ko) * 2014-07-08 2017-04-27 닛산 지도우샤 가부시키가이샤 결함 검사 장치 및 생산 시스템

Also Published As

Publication number Publication date
EP3486638A1 (en) 2019-05-22
CA3029218C (en) 2024-02-20
CN109477803B (zh) 2022-04-26
EP3486638B1 (en) 2023-09-20
CN109477803A (zh) 2019-03-15
AU2017296488B2 (en) 2021-10-28
WO2018012192A1 (ja) 2018-01-18
JP6997457B2 (ja) 2022-01-20
KR102270741B1 (ko) 2021-06-28
KR20190028391A (ko) 2019-03-18
ES2965966T3 (es) 2024-04-17
US10830707B2 (en) 2020-11-10
RU2727913C1 (ru) 2020-07-24
US20200124541A1 (en) 2020-04-23
AU2017296488A1 (en) 2019-01-24
JPWO2018012192A1 (ja) 2019-04-25
MY193069A (en) 2022-09-26
CA3029218A1 (en) 2018-01-18
EP3486638A4 (en) 2019-09-11
PL3486638T3 (pl) 2024-03-04

Similar Documents

Publication Publication Date Title
MX2018015199A (es) Metodo de inspeccion, metodo de inspeccion y notificacion, metodo de fabricacion que incluye el metodo de inspeccion, aparato de inspeccion y aparato de fabricacion.
EP3664705A4 (en) IMAGE PROCESSING SYSTEMS, DEVICES AND METHODS FOR GENERATING AN IMAGE WITH PREDICTIVE MARKING
MX2016000590A (es) Aparato y metodo para marcar un objeto comestible.
IL278300B (en) Adaptive local thresholding and color filtering
SG10201913148YA (en) System and method for imaging a surface defect on an object
MX2017012962A (es) Metodo de inspeccion de superficie de cuerpo ceramico.
GB2532642A (en) A laser line probe having improved high dynamic range
WO2016083897A3 (en) Automated inspection
EP3674967A4 (en) IMAGE SIGNAL PROCESSING METHOD, APPARATUS AND DEVICE
EP3026627A3 (en) Image processing method and apparatus
MY190242A (en) Vehicle inspection methods and systems
IL247421B (en) An image sensor, an inspection system and a method of inspecting an article
AR101248A1 (es) Detección y medición de grietas en vasos metalúrgicos
EP3043329A3 (en) Image processing apparatus, image processing method, and program
EP3002712A3 (en) Horizontal and vertical line detection and removal for document images
EP2942736A3 (en) Liveness testing methods and apparatuses and image processing methods and apparatuses
TW201614586A (en) Repeater detection
TW201614383A (en) Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
EP3214603A3 (en) Image processing
EP3270144A4 (en) DEVICE FOR RECORDING AN IMAGE OF AN OBJECT TO BE TESTED, METHOD FOR RECORDING AN IMAGE OF AN OBJECT TO BE TESTED, SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD
MX2019000775A (es) Linea de montaje con inspeccion visual elctronica integrada.
MX354715B (es) Dispositivo de deteccion de defectos y sistema de produccion.
WO2012161874A3 (en) Contour-based defect detection using an inspection apparatus
EP4254330A3 (en) Flaw detection device and flaw detection method
MY192764A (en) Laser processing method, apparatus for sapphire and storage medium