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MX2017012404A - Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha. - Google Patents

Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha.

Info

Publication number
MX2017012404A
MX2017012404A MX2017012404A MX2017012404A MX2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A
Authority
MX
Mexico
Prior art keywords
optical element
selective filter
systems employing
testing methods
element testing
Prior art date
Application number
MX2017012404A
Other languages
English (en)
Inventor
l perkins David
M Price James
Original Assignee
Halliburton Energy Services Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/US2015/025869 external-priority patent/WO2016167758A1/en
Priority claimed from PCT/US2015/025866 external-priority patent/WO2016167757A1/en
Priority claimed from PCT/US2015/025922 external-priority patent/WO2016167761A1/en
Application filed by Halliburton Energy Services Inc filed Critical Halliburton Energy Services Inc
Publication of MX2017012404A publication Critical patent/MX2017012404A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • E—FIXED CONSTRUCTIONS
    • E21—EARTH OR ROCK DRILLING; MINING
    • E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
    • E21B47/00—Survey of boreholes or wells
    • E—FIXED CONSTRUCTIONS
    • E21—EARTH OR ROCK DRILLING; MINING
    • E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
    • E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
    • E21B49/08—Obtaining fluid samples or testing fluids, in boreholes or wells
    • E21B49/087—Well testing, e.g. testing for reservoir productivity or formation parameters
    • E21B49/088—Well testing, e.g. testing for reservoir productivity or formation parameters combined with sampling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • G01N2021/215—Brewster incidence arrangement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Geology (AREA)
  • Mining & Mineral Resources (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Fluid Mechanics (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Geophysics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Optical Transform (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

Un sistema de análisis de elementos ópticos incluye un filtro selectivo de ángulo de banda ancha colocado en un circuito óptico con un elemento óptico que se debe analizar. El sistema también incluye un transductor de radiación electromagnética que produce una señal en respuesta a radiación electromagnética que pasa a través del filtro selectivo de ángulo de banda ancha. El sistema también incluye un dispositivo de almacenamiento que almacena datos correspondientes a la señal producida desde el transductor de radiación electromagnética, en el que los datos indican una propiedad del elemento óptico en respuesta a un análisis.
MX2017012404A 2015-04-15 2015-08-12 Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha. MX2017012404A (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
PCT/US2015/025869 WO2016167758A1 (en) 2015-04-15 2015-04-15 Optical computing devices comprising rotatable broadband angle-selective filters
PCT/US2015/025866 WO2016167757A1 (en) 2015-04-15 2015-04-15 Optical computing devices comprising broadband angle-selective filters
PCT/US2015/025922 WO2016167761A1 (en) 2015-04-15 2015-04-15 Parallel optical measurement system with broadband angle selective filters
PCT/US2015/044908 WO2016167825A1 (en) 2015-04-15 2015-08-12 Optical element testing methods and systems employing a broadband angle-selective filter

Publications (1)

Publication Number Publication Date
MX2017012404A true MX2017012404A (es) 2018-01-26

Family

ID=57125994

Family Applications (2)

Application Number Title Priority Date Filing Date
MX2017012404A MX2017012404A (es) 2015-04-15 2015-08-12 Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha.
MX2017011984A MX2017011984A (es) 2015-04-15 2015-08-12 Herramienta de analisis de muestras que emplea un filtro selectivo de angulo de banda ancha.

Family Applications After (1)

Application Number Title Priority Date Filing Date
MX2017011984A MX2017011984A (es) 2015-04-15 2015-08-12 Herramienta de analisis de muestras que emplea un filtro selectivo de angulo de banda ancha.

Country Status (6)

Country Link
US (2) US20180100799A1 (es)
BR (2) BR112017019476A2 (es)
DE (2) DE112015006132T5 (es)
GB (2) GB2552276A (es)
MX (2) MX2017012404A (es)
WO (2) WO2016167826A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016167761A1 (en) * 2015-04-15 2016-10-20 Halliburton Energy Services, Inc. Parallel optical measurement system with broadband angle selective filters
US11204508B2 (en) 2017-01-19 2021-12-21 Lockheed Martin Corporation Multiple band multiple polarizer optical device
US10789467B1 (en) * 2018-05-30 2020-09-29 Lockheed Martin Corporation Polarization-based disturbed earth identification

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692621A (en) * 1985-10-11 1987-09-08 Andros Anlayzers Incorporated Digital anesthetic agent analyzer
SE9700384D0 (sv) * 1997-02-04 1997-02-04 Biacore Ab Analytical method and apparatus
US5940183A (en) * 1997-06-11 1999-08-17 Johnson & Johnson Clinical Diagnostics, Inc. Filter wheel and method using filters of varying thicknesses
US7280214B2 (en) * 2002-06-04 2007-10-09 Baker Hughes Incorporated Method and apparatus for a high resolution downhole spectrometer
US7369233B2 (en) * 2002-11-26 2008-05-06 Kla-Tencor Technologies Corporation Optical system for measuring samples using short wavelength radiation
US7830512B2 (en) * 2008-03-14 2010-11-09 J.A. Woollam Co., Inc. System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters
US7271912B2 (en) * 2003-04-15 2007-09-18 Optiscan Biomedical Corporation Method of determining analyte concentration in a sample using infrared transmission data
US7408645B2 (en) * 2003-11-10 2008-08-05 Baker Hughes Incorporated Method and apparatus for a downhole spectrometer based on tunable optical filters
JP2007514950A (ja) * 2003-12-19 2007-06-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 多変量光学素子を使用する光学分析系
US7564552B2 (en) * 2004-05-14 2009-07-21 Kla-Tencor Technologies Corp. Systems and methods for measurement of a specimen with vacuum ultraviolet light
NO322775B1 (no) * 2004-09-24 2006-12-11 Tomra Systems Asa Anordning og fremgangsmate for detektering av et medium
US7206070B2 (en) * 2004-11-15 2007-04-17 Therma-Wave, Inc. Beam profile ellipsometer with rotating compensator
JP2006176831A (ja) * 2004-12-22 2006-07-06 Tokyo Electron Ltd 蒸着装置
TWI416096B (zh) * 2007-07-11 2013-11-21 Nova Measuring Instr Ltd 用於監控圖案化結構的性質之方法及系統
WO2010073249A1 (en) * 2008-12-24 2010-07-01 Glusense, Ltd. Implantable optical glucose sensing
US20100160749A1 (en) * 2008-12-24 2010-06-24 Glusense Ltd. Implantable optical glucose sensing
US8164050B2 (en) * 2009-11-06 2012-04-24 Precision Energy Services, Inc. Multi-channel source assembly for downhole spectroscopy
WO2011100506A1 (en) * 2010-02-12 2011-08-18 First Solar, Inc. Deposition rate control
GB2501641B (en) * 2011-02-11 2018-02-21 Halliburton Energy Services Inc Method for fabrication of a multivariate optical element
US20130273237A1 (en) * 2012-04-12 2013-10-17 David Johnson Method to Determine the Thickness of a Thin Film During Plasma Deposition
US8879053B2 (en) * 2012-04-26 2014-11-04 Halliburton Energy Services, Inc. Devices having an integrated computational element and a proximal interferent monitor and methods for determining a characteristic of a sample therewith
BR112015005511A2 (pt) * 2012-09-13 2017-07-04 Halliburton Energy Services Inc ferramenta e método de análise espectral
MX350574B (es) * 2013-02-20 2017-09-11 Halliburton Energy Services Inc Técnicas de diseño óptico para proporcionar características de fabricacion favorables.
US20150090909A1 (en) * 2013-09-30 2015-04-02 Capella Microsystems (Taiwan), Inc. Selectable view angle optical sensor
US9518916B1 (en) * 2013-10-18 2016-12-13 Kla-Tencor Corporation Compressive sensing for metrology
WO2015178982A2 (en) * 2014-02-25 2015-11-26 Massachusetts Institute Of Technology Methods and apparatus for broadband angular selectivity of electromagnetic waves

Also Published As

Publication number Publication date
WO2016167826A1 (en) 2016-10-20
WO2016167825A1 (en) 2016-10-20
GB2551929A (en) 2018-01-03
GB2552276A (en) 2018-01-17
DE112015006132T5 (de) 2017-11-02
US20180045602A1 (en) 2018-02-15
DE112015006163T5 (de) 2017-10-26
GB201714207D0 (en) 2017-10-18
MX2017011984A (es) 2018-01-30
US20180100799A1 (en) 2018-04-12
GB201714213D0 (en) 2017-10-18
BR112017019560A2 (pt) 2018-05-02
BR112017019476A2 (pt) 2018-05-15

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