[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Meiguni et al., 2019 - Google Patents

System level EMC for multiple EMI sources

Meiguni et al., 2019

Document ID
3898560060569539305
Author
Meiguni J
Soerensen M
Zhang W
Hosseinbeig A
Pommerenke D
Ghosh K
Sochoux P
Rollin J
Li A
Publication year
Publication venue
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+ SIPI)

External Links

Snippet

A system level EMC method is proposed in this paper to predict the electromagnetic interference (EMI) from multiple radiators. The problem under test consists of a large network router with 480 optical modules radiating at 10.3 GHz. The proposed method handles the …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Similar Documents

Publication Publication Date Title
Primiani et al. Numerical simulation of reverberation chamber parameters affecting the received power statistics
Andrieu et al. Fast and accurate assessment of the “well stirred condition” of a reverberation chamber from $ s_ {11} $ measurements
Gifuni et al. Base-case model for measurement uncertainty in a reverberation chamber including frequency stirring
Meiguni et al. EMI prediction of multiple radiators
Arnaut Measurement uncertainty for reverberation chambers-I. Sample statistics.
Meiguni et al. System level EMC for multiple EMI sources
Vogt-Ardatjew Electromagnetic fields in reverberant environments
Fedeli et al. Accurate analysis of reverberation field penetration into an equipment-level enclosure
Pan et al. Measurement validation of the dipole-moment model for IC radiated emissions
Hoijer Including directivity in reverberation chamber radiated susceptibility testing
Gkatsi et al. Risk-based EMC system analysis platform of automotive environments
Andrieu et al. On the risk to declare EMC compliant a faulty EUT during radiated susceptibility tests in reverberation chambers
De Leo et al. A general method for radiated emission prediction in a multiple monopole source stirred reverberation chamber
Olivieri et al. Efficient estimation of EMI from stacked radiation sources by combining their spherical wave expansion coefficients
Zhang et al. System-Level EMI of an artificial router system with multiple radiators: prediction and validation
Gradoni et al. Determination of the reverberation chamber stirrer uncorrelated positions by means of the spatial and frequency correlation matrix
Zhang et al. Radiated Emission Tests for High-frequency Router Systems in Class A: Discussion and Improvement
Dirix et al. Calculating arbitrarily located sampling data from quiet zone spherical near-field scanning measurements
Bonnet et al. From Electromagnetic Time‐Reversal Theoretical Accuracy to Practical Robustness for EMC Applications
Sun et al. Estimating electromagnetic emissions from a site installation with multiple racks of server equipment
Primiani et al. Modeling of the reverberation chamber method for determining the shielding properties of a coaxial cable
Marvin et al. Shielding measurements of equipment enclosures in the radiating near field
Johnson et al. Comparison of in situ aircraft electromagnetic environment measurements with time domain simulations
Hoijer Maximum radiated power density from electrically large sources—comparing probability theory and measurements
Antonini et al. Equivalent circuit extraction for an SMA connector