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Xie et al., 2005 - Google Patents

Scalable error detection using boolean satisfiability

Xie et al., 2005

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Document ID
3669922566477457583
Author
Xie Y
Aiken A
Publication year
Publication venue
Proceedings of the 32nd ACM SIGPLAN-SIGACT symposium on Principles of programming languages

External Links

Snippet

We describe a software error-detection tool that exploits recent advances in boolean satisfiability (SAT) solvers. Our analysis is path sensitive, precise down to the bit level, and models pointers and heap data. Our approach is also highly scalable, which we achieve …
Continue reading at theory.stanford.edu (PDF) (other versions)

Classifications

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    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3676—Test management for coverage analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3604—Software analysis for verifying properties of programs
    • G06F11/3608—Software analysis for verifying properties of programs using formal methods, e.g. model checking, abstract interpretation
    • G—PHYSICS
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    • G06F11/3636—Software debugging by tracing the execution of the program
    • G—PHYSICS
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    • G06F11/3612—Software analysis for verifying properties of programs by runtime analysis
    • G—PHYSICS
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    • G06F8/436—Semantic checking
    • G06F8/437—Type checking
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    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/504—Formal methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
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    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
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    • G—PHYSICS
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    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring

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