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Zhang et al., 2019 - Google Patents

Phase unwrapping in optical metrology via denoised and convolutional segmentation networks

Zhang et al., 2019

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Document ID
348734364215745124
Author
Zhang J
Tian X
Shao J
Luo H
Liang R
Publication year
Publication venue
Optics express

External Links

Snippet

The interferometry technique is commonly used to obtain the phase information of an object in optical metrology. The obtained wrapped phase is subject to a 2π ambiguity. To remove the ambiguity and obtain the correct phase, phase unwrapping is essential. Conventional …
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