Temple, 1979 - Google Patents
Measurement of thin‐film optical absorption at the air‐film interface within the film and at the film‐substrate interfaceTemple, 1979
- Document ID
- 3201634633729134712
- Author
- Temple P
- Publication year
- Publication venue
- Applied Physics Letters
External Links
Snippet
A measurement technique is described where the absorption introduced by the addition of a single-layer thin film is separated into three parts: absorption (a) within the bulk of the film;(b) at the air-film interface;(c) at the film-substrate interface. The technique employs a scanning …
- 239000010408 film 0 title abstract description 84
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Temple | Measurement of thin‐film optical absorption at the air‐film interface within the film and at the film‐substrate interface | |
Moser et al. | Optical absorption of pure silver halides | |
Aspnes et al. | Optical properties of anodically grown native oxides on some Ga‐V compounds from 1.5 to 6.0 eV | |
Torres et al. | A simple method to determine the optical constants and thicknesses of ZnxCd1− xS thin films | |
Kolbe et al. | Optical properties and damage thresholds of dielectric UV/VUV coatings deposited by conventional evaporation, IAD, and IBS | |
Granata et al. | Optical and Mechanical Properties of Ion-Beam-Sputtered Mg F 2 Thin Films for Gravitational-Wave Interferometers | |
Zernike | Fabrication and measurement of passive components | |
Newnam et al. | Ultraviolet damage resistance of laser coatings | |
Roberts | A simple method of making vacuum-tight coolable window seals for low temperature optical transmission cells | |
Temple et al. | Measured Thin Film Absorption at the Air–Film Interface, the Film Bulk, and the Film–Substrate Interface | |
Willmott | The Infra-red Spectrum of Magnesium Oxide | |
Ashton et al. | Optical properties of lead in the vacuum ultraviolet | |
Ladelfe et al. | Optical constants of cupric oxide from 450 to 800 mμ | |
Hodgkinson | The change in thickness and other optical properties of ultraviolet irradiated silicon oxide films | |
Konan et al. | Optical reflectivity study of photodissolution kinetics in GeSe3 vitreous thin films | |
Welsch et al. | Measurement of the extinction of sputtered TiO2 films | |
US2587282A (en) | Step gauge for measuring thickness of thin films | |
McNally et al. | Properties of IAD single-and multi-layer oxide coatings | |
Wohlgemuth et al. | A method for calculating the index of refraction of thin films | |
Flory | Comparison of different technologies for high-quality optical coatings | |
Robertson Jr et al. | Specular reflectance and surface roughness of silicon on sapphire | |
Mbow et al. | Experimental measurements of optical constants of thin films | |
Beams | Some Interferometer Techniques for Observing Sedimentation | |
Browning | ELECTRON BOMBARDMENT OF CERTAIN THIN FILMS DURING DEPOSITION (ANTIMONY TRIOXIDE, SILICON MONOXIDE, ZINC SULFIDE, POTASSIUM HEXAFLUOROZIRCONATE) | |
Meneghini et al. | High-accuracy characterization of titanium films for LiNbO/sub 3/guided wave devices by optical densitometry |