Alexeev et al., 2019 - Google Patents
Triple GEM performance in magnetic fieldAlexeev et al., 2019
View PDF- Document ID
- 3144973724426862445
- Author
- Alexeev M
- Amoroso A
- Bagnasco S
- Ferroli R
- Balossino I
- Bencivenni G
- Bertani M
- Bettoni D
- Bianchi F
- Bortone A
- Calcaterra A
- Capodiferro M
- Carassiti V
- Cerioni S
- Chai J
- Cheng W
- Chiozzi S
- Cibinetto G
- Ramusino A
- Cotto G
- Cossio F
- Rolo M
- De Mori F
- Destefanis M
- Domenici D
- Dong J
- Evangelisti F
- Farinelli R
- Fava L
- Felici G
- Fioravanti E
- Gaido L
- Garzia I
- Gatta M
- Giraudo G
- Gramigna S
- Greco M
- Lavezzi L
- Leng C
- Li H
- Li P
- Lusso S
- Maggiora M
- Malaguti R
- Mangoni A
- Marcello S
- Melchiorri M
- Mezzadri G
- Morello G
- Mignone M
- Pace E
- Pacetti S
- Papalino G
- Passalacqua B
- Patteri P
- Pelosi A
- Lener M
- Rivetti A
- Savrié M
- Scodeggio M
- Sosio S
- Spataro S
- Tskhadadze E
- Verma S
- Yang L
- Wang B
- Weadon R
- Zhang J
- Publication year
- Publication venue
- Journal of Instrumentation
External Links
Snippet
Performance of triple GEM prototypes in strong magnetic field has been evaluated by means of a muon beam at the H4 line of the SPS test area at CERN. Data have been reconstructed and analyzed offline with two reconstruction methods: the charge centroid and the micro …
- 230000005291 magnetic 0 title abstract description 42
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Alexeev et al. | Triple GEM performance in magnetic field | |
Sauli | The gas electron multiplier (GEM): Operating principles and applications | |
Anderson et al. | The STAR time projection chamber: a unique tool for studying high multiplicity events at RHIC | |
Ball et al. | Ion backflow studies for the ALICE TPC upgrade with GEMs | |
Charpak et al. | First beam test results with Micromegas, a high-rate, high-resolution detector | |
Sharma | Muon tracking and triggering with gaseous detectors and some applications | |
Alexopoulos et al. | Performance studies of resistive-strip bulk micromegas detectors in view of the ATLAS New Small Wheel upgrade | |
Barouch et al. | Development of a fast gaseous detector:‘Micromegas’ | |
Banerjee et al. | Performance of Multiplexed XY Resistive Micromegas detectors in a high intensity beam | |
Iodice | Performance studies of MicroMegas for the ATLAS experiment | |
Manjarrés et al. | Performances of anode-resistive Micromegas for HL-LHC | |
Farinelli | Research and development in cylindrical triple-GEM detector with $\mu $ TPC readout for the BESIII experiment | |
Cattani | The Resistive Plate Chambers of the ATLAS experiment: performance studies | |
García et al. | A GEM-TPC in twin configuration for the Super-FRS tracking of heavy ions at FAIR | |
Assamagan et al. | Time-zero fission-fragment detector based on low-pressure multiwire proportional chambers | |
Lavezzi et al. | The Cylindrical GEM Inner Tracker of the BESIII experiment: prototype test beam results | |
Eldridge et al. | Directional dark matter readout with a novel multi-mesh ThGEM for SF6 negative ion operation | |
Felici et al. | Triple GEM performance in magnetic field | |
Bencivenni et al. | The μ-RWELL for high rate application | |
Shekhtman et al. | High resolution tracking detectors with cascaded Gaseous Electron Multipliers | |
Bashkirov et al. | A novel detector for 2D ion detection in low-pressure gas and its applications | |
Zhou et al. | Design and simulation of a cylindrical μRWELL inner tracker for the experiment at the Super Tau-Charm Facility | |
Zhao et al. | Measurements of classical transport of fast ions | |
Pancin et al. | Secondary electrons detectors for beam tracking: micromegas and wire chamber | |
Boldyrev et al. | Tracking performance of GasPixel detectors in test beam studies |