Smith et al., 2022 - Google Patents
Proton Beam Enhancement from Ultrafast Laser Interactions with Compound Parabolic ConcentratorsSmith et al., 2022
View PDF- Document ID
- 2956636213427058995
- Author
- Smith H
- Rusby D
- Zeraouli G
- Campbell P
- Ha T
- Mariscal D
- Ma T
- Wilks S
- Mackinnon A
- Quevedo H
- Medina E
- Spinks M
- Bruce S
- Donovan M
- Ditmire T
- Publication year
- Publication venue
- CLEO: QELS_Fundamental Science
External Links
Snippet
Proton Beam Enhancement from Ultrafast Laser Interactions with Compound Parabolic
Concentrators Page 1 Proton Beam Enhancement from Ultrafast Laser Interactions with
Compound Parabolic Concentrators H. Smith1, D. Rusby2, G. Zeraouli2, P. Campbell2, T. Ha1, D …
- 150000001875 compounds 0 title abstract description 5
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anti-cathode is movable relative to the surface thereof
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
- G21K5/04—Irradiation devices with beam-forming means
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