[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Chen et al., 2011 - Google Patents

A practical method to Extending Dynamic Range of CCD Camera

Chen et al., 2011

Document ID
2565558084351201450
Author
Chen Z
Jiang B
Gao B
Publication year
Publication venue
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications

External Links

Snippet

CCD (Charge Coupled Device) is the most popular detector for camera to detect low levels of light for wavelengths from 300nm to 1100nm. Contemporary CCD has read noise level equivalent to a few electrons, and Well capacity over 100,000 electrons. In order to take full …
Continue reading at www.spiedigitallibrary.org (other versions)

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/335Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/378Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/335Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/374Addressed sensors, e.g. MOS or CMOS sensors
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry
    • G01J5/10Radiation pyrometry using electric radiation detectors
    • G01J5/20Radiation pyrometry using electric radiation detectors using resistors, thermistors, or semi-conductors sensitive to radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/33Transforming infra-red radiation
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/14Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit

Similar Documents

Publication Publication Date Title
CN106664379B (en) High dynamic range pixel and method for operating a high dynamic range pixel
Antolovic et al. Nonuniformity analysis of a 65-kpixel CMOS SPAD imager
US9967499B2 (en) Readout circuit for image sensors
Fossum Photon counting error rates in single-bit and multi-bit quanta image sensors
Qiu et al. Evaluation of a scientific CMOS camera for astronomical observations
Chierchie et al. Smart readout of nondestructive image sensors with single photon-electron sensitivity
Tyrrell et al. Design approaches for digitally dominated active pixel sensors: leveraging Moore's Law scaling in focal plane readout design
Chen et al. A practical method to Extending Dynamic Range of CCD Camera
Meuris et al. Development and Characterization of New 256$\,\times\, $256 Pixel DEPFET Detectors for X-Ray Astronomy
Haro et al. A low noise digital readout system for scientific charge coupled devices
JPWO2018221074A1 (en) Light receiving device and signal reading method of light receiving device
WO2016080016A1 (en) Optical detector
Greffe et al. Characterization of low light performance of a CMOS Sensor for ultraviolet astronomical applications
Li et al. CMOS sensors for the vertex detector of the future international linear collider
US7045760B2 (en) Intensity detector circuitry
魏杨 et al. Digital output for short-wave infrared InGaAs linear FPA
Kenter et al. Development of monolithic CMOS detectors as x-ray imaging spectrometers
Guerrini et al. Design and characterisation of a highly miniaturised radiation monitor HMRM
US20210025994A1 (en) Signal peak detection apparatus and method of signal peak detection
Glicenstein et al. The NectarCAM camera project
US7714267B2 (en) Intensity detector circuitry using a cascade of gain elements
Guilloux et al. CMOS APS with in-pixel discrimination and improved rolling shutter architecture for charged particle tracking
Katayose et al. Development of wide range charge integration application specified integrated circuit for photo-sensor
Li et al. Study on detection sensitivity of EMCCD star tracker
Nan et al. Research on the test methods of charge accumulating TDICMOS sensor