Zambaldi et al., 2009 - Google Patents
Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffractionZambaldi et al., 2009
View PDF- Document ID
- 2296331693431526022
- Author
- Zambaldi C
- Zaefferer S
- Wright S
- Publication year
- Publication venue
- Journal of Applied Crystallography
External Links
Snippet
A new approach to resolve the slight tetragonality of L10-ordered γ-TiAl by electron backscatter diffraction (EBSD) is presented. The phase has ac/a ratio of only about 2% larger than unity. The corresponding EBSD patterns therefore exhibit cubic …
- 238000001887 electron backscatter diffraction 0 title abstract description 33
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30004—Biomedical image processing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0012—Biomedical image inspection
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