[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Shalabi, 2011 - Google Patents

Design, assembly and validation of a system for measuring damping in microresonators

Shalabi, 2011

View PDF
Document ID
1920644373940707000
Author
Shalabi N
Publication year

External Links

Snippet

Miniaturized resonators are the critical components of microelectromechanical systems (MEMS) used for sensing, communications, imaging, and energy harvesting. For many of these applications, the important design parameters are the frequency of vibrations and the …
Continue reading at escholarship.mcgill.ca (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/036Analysing fluids by measuring frequency or resonance of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N11/00Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties
    • G01N11/10Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties by moving a body within the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N5/00Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/002Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity using variation of the resonant frequency of an element vibrating in contact with the material submitted to analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices

Similar Documents

Publication Publication Date Title
Davidovikj et al. Visualizing the motion of graphene nanodrums
Rabenimanana et al. Mass sensor using mode localization in two weakly coupled MEMS cantilevers with different lengths: Design and experimental model validation
Vančura et al. Analysis of resonating microcantilevers operating in a viscous liquid environment
US8434370B2 (en) Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer
Cerimovic et al. Sensing viscosity and density of glycerol–water mixtures utilizing a suspended plate MEMS resonator
St-Gelais et al. Swept-frequency drumhead optomechanical resonators
Ilic et al. Theoretical and experimental investigation of optically driven nanoelectromechanical oscillators
Kamppinen et al. Nanomechanical resonators for cryogenic research
Lepadatu et al. Quantification of electromechanical coupling measured with piezoresponse force microscopy
Possas et al. Fabrication and micromechanical characterization of polycrystalline diamond microcantilevers
WO2012064193A1 (en) Method for determining a spring constant for a deformable scanning probe microscope element, and scanning probe microscope and calibration device arranged for determining a spring constant for a probe element
Kwoka et al. Soft piezoresistive cantilevers for adhesion force measurements
Sohgawa et al. Detection of amyloid beta fibril growth by liposome-immobilized micro-cantilever with NiCr thin-film strain gauge
WO2007014044A9 (en) Biological detection based on differentially coupled nanomechanical systems using self-sensing cantilevers with attonewton force resolution
Shalabi Design, assembly and validation of a system for measuring damping in microresonators
De Man et al. Contact potentials in Casimir force setups: An experimental analysis
Yenuganti et al. Piezoelectric microresonant pressure sensor using aluminum nitride
JP2008241619A (en) Cantilevers, biosensors, and probe microscopes
Gotszalk et al. Shear force microscopy using piezoresistive cantilevers in surface metrology
Gotszalk et al. Parallel SPM cantilever arrays for large area surface metrology and lithography
Kwoka et al. Impedance spectroscopy of electrostatically driven MEMS resonators
Kazinczi et al. Environment-induced failure modes of thin film resonators
Ekwińska et al. Advantages of Using Piezoelectric Materials in the MEMS Construction on the Example of AlN and Sc Doped AlN Layers
Oh et al. Nanomechanical thermometry for probing sub-nW thermal transport
Prasad et al. Electrothermally tunable MEMS filters