[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Sun et al., 1999 - Google Patents

Lifetime resistance model of bare metal electrical contacts

Sun et al., 1999

Document ID
1864986275544157017
Author
Sun M
Pecht M
Natishan M
Martens R
Publication year
Publication venue
IEEE transactions on advanced packaging

External Links

Snippet

The performance of a bare metal electrical contact may be seriously impaired by the formation of surface films in the contact area. The growth of surface films is influenced by the anion diffusion process in the contacts. The present paper examines the effects of …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L35/00Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L35/02Details

Similar Documents

Publication Publication Date Title
Jiao et al. Interaction of thermal cycling and electric current on reliability of solder joints in different solder balls
Bryant Resistance buildup in electrical connectors due to fretting corrosion of rough surfaces
Sun et al. Lifetime resistance model of bare metal electrical contacts
Ziolkowski et al. Estimation of thermoelectric generator performance by finite element modeling
Oguibe et al. Conduction mechanisms in anisotropic conducting adhesive assembly
Camut et al. Efficiency Measurement and Modeling of a High‐Performance Mg2 (Si, Sn)‐Based Thermoelectric Generator
He et al. Effects of oxidation layer and roughness on the fretting wear behavior of copper under electrical contact
Sun Conductivity of conductive polymer for flip chip bonding and BGA socket
Tripp et al. The gas-tightness of separable base metal electric contacts
Malucci Stability and contact resistance failure criteria
Ming et al. A comparative assessment of gold plating thickness required for stationary electrical contacts
Braunovic et al. A model for life time evaluation of closed electrical contacts
Wang et al. A systematic approach for the reliability evaluation of electric connector
Myers Overview of the use of silver in connector applications
Dreier The impact of films on the long-term behavior of stationary electrical connections and contacts in electric power systems
CA1331325C (en) Electric power connectors
Trinh et al. The role of microstructure and surface topography in the electrical behavior of Sn-coated Cu contacts
Ahmad et al. Au/al wire bond interface resistance degradation rate simulations
Zhang et al. Interfacial Crack Growth-Based Fatigue Lifetime Prediction of Thermoelectric Modules under Thermal Cycling
Sun et al. A kinetic model for noble plated electrical contact behavior
Fang et al. Assessment of risk resulting from unattached tin whisker bridging
Loscar et al. Fluctuations of jamming coverage upon random sequential adsorption on homogeneous and heterogeneous media
Jun et al. Study of contact resistance in the design of a pyro-breaker applied in superconducting fusion facility
Lang et al. Reliability of spring pressure contacts under environmental stress
Shibutani et al. Key reliability concerns with lead-free connectors