[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Coudert, 1997 - Google Patents

Gate sizing for constrained delay/power/area optimization

Coudert, 1997

View PDF
Document ID
18363180716954765779
Author
Coudert O
Publication year
Publication venue
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

External Links

Snippet

Gate sizing has a significant impact on the delay, power dissipation, and area of the final circuit. It consists of choosing for each node of a mapped circuit a gate implementation in the library so that a cost function is optimized under some constraints. For instance, one wants to …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5022Logic simulation, e.g. for logic circuit operation
    • G06F17/5031Timing analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5036Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5045Circuit design
    • G06F17/505Logic synthesis, e.g. technology mapping, optimisation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/504Formal methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5077Routing
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5072Floorplanning, e.g. partitioning, placement
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10Complex mathematical operations
    • G06F17/11Complex mathematical operations for solving equations, e.g. nonlinear equations, general mathematical optimization problems
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70Fault tolerant, i.e. transient fault suppression
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/78Power analysis and optimization
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/30Information retrieval; Database structures therefor; File system structures therefor
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/02Computer systems based on biological models using neural network models
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/34Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3457Performance evaluation by simulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequence

Similar Documents

Publication Publication Date Title
Coudert Gate sizing for constrained delay/power/area optimization
US6212665B1 (en) Efficient power analysis method for logic cells with many output switchings
Monteiro et al. Estimation of average switching activity in combinational logic circuits using symbolic simulation
Liou et al. Fast statistical timing analysis by probabilistic event propagation
Bogliolo et al. Regression-based RTL power modeling
US8719742B2 (en) Conversion of circuit description to an abstract model of the circuit
US6687883B2 (en) System and method for inserting leakage reduction control in logic circuits
Riesgo et al. Design methodologies based on hardware description languages
US5680332A (en) Measurement of digital circuit simulation test coverage utilizing BDDs and state bins
US5544071A (en) Critical path prediction for design of circuits
US5946475A (en) Method for performing transistor-level static timing analysis of a logic circuit
US20050091025A1 (en) Methods and systems for improved integrated circuit functional simulation
JP2004501438A (en) High precision timing model for integrated circuit verification
US7142991B2 (en) Voltage dependent parameter analysis
US7188327B2 (en) Method and system for logic-level circuit modeling
Rohfleisch et al. Reducing power dissipation after technology mapping by structural transformations
Roy et al. Transistor-level optimization of digital designs with flex cells
US5883818A (en) Method for generating an improved model for evaluating the operation of an integrated circuit design
US7325210B2 (en) Hybrid linear wire model approach to tuning transistor widths of circuits with RC interconnect
US6640330B1 (en) System and method for setup and hold characterization in integrated circuit cells
US5903468A (en) Determining maximum load index for tabular timing models
Gupta et al. Energy and peak-current per-cycle estimation at RTL
US8452581B2 (en) Technique using power macromodeling for register transfer level power estimation
Beerel et al. Estimation of energy consumption in speed-independent control circuits
Gunes et al. A survey and comparison of digital logic simulators