[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Legkodymov et al., 2019 - Google Patents

The SRXFA station on the VEPP-4M storage ring

Legkodymov et al., 2019

View PDF
Document ID
18349943931389765067
Author
Legkodymov A
Kuper K
Kolmogorov Y
Baranov G
Publication year
Publication venue
Bulletin of the Russian Academy of Sciences: Physics

External Links

Snippet

A description is given of the SRXFA synchrotron radiation station on the VEPP-4M storage ring at the Siberian Synchrotron and Terahertz Radiation Center. The station is intended to develop and implement SRXFA technology in the hard X-ray photon (40–120 keV) range …
Continue reading at www.ipgg.sbras.ru (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS
    • G01V5/00—Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • G01V5/0008—Detecting hidden objects, e.g. weapons, explosives
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes

Similar Documents

Publication Publication Date Title
Kavčič et al. Design and performance of a versatile curved-crystal spectrometer for high-resolution spectroscopy in the tender x-ray range
Fuchs et al. Anomalous nonlinear X-ray Compton scattering
Kuvvetli et al. A 3D CZT high resolution detector for x-and gamma-ray astronomy
Legkodymov et al. The SRXFA station on the VEPP-4M storage ring
Jones et al. Application of synchrotron radiation to elemental analysis
Zhalsaraev X‐ray scattering and polarization in wavelength‐dispersive spectrometers
Stoupin et al. The multi-optics high-resolution absorption x-ray spectrometer (HiRAXS) for studies of materials under extreme conditions
Journel et al. Performances of a bent-crystal spectrometer adapted to resonant x-ray emission measurements on gas-phase samples
Martin et al. Quantitative high-pressure pair distribution function analysis of nanocrystalline gold
Jentschel et al. Isotope-selective radiography and material assay using high-brilliance, quasi-monochromatic, high-energy photons
Bjeoumikhov et al. Polycapillary optics for energy dispersive micro x-ray diffractometry
Kashimoto et al. High-energy-resolution angle-resolved inverse-photoelectron spectroscopy apparatus for damage-free measurements of conduction band structures of functional materials
Wobrauschek Total reflection X-ray fluorescencespectrometric determination of trace elementsin the femtogram region: a survey
Creagh Synchrotron radiation and its use in art, archaeometry, and cultural heritage studies
Suchkov et al. Calibrating the Prototype Calorimeter for the GAMMA-400 γ-Ray Telescope on the Positron Beam at the Pakhra Accelerator
Kaginelli et al. Mass attenuation coefficient of chromium and manganese compounds around absorption edge
Alekseev et al. Effect of the grain size of powder targets on the spectra of parametric X-ray radiation of relativistic electrons
Aksenov et al. Powder diffractometer for microsamples at the Kurchatov Synchrotron Radiation Source
Zhou et al. Establishment and study of a polarized X-ray radiation facility
Suortti et al. Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements
Tamura et al. Measurement of mass attenuation coefficients around the K absorption edge by parametric X-rays
Rose et al. Cherenkov detectors for spatial imaging applications using discrete-energy photons
Brown et al. Rapid, absolute calibration of x-ray filters employed by laser-produced plasma diagnostics
Qi et al. A simulation tool for the in-flight calibration sources in polarimetry focusing telescope array
Seely Hard x-ray spectrometer calibrations using a portable 120 kV x-ray source