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Ishida et al., 2016 - Google Patents

An ATE system for testing RF digital communication devices with QAM signal interfaces

Ishida et al., 2016

Document ID
18345600962305788877
Author
Ishida M
Ichiyama K
Publication year
Publication venue
IEEE Design & Test

External Links

Snippet

An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces Page 1 An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces Masahiro Ishida and Kiyotaka Ichiyama ADVANTEST Corporation h DUE TO ADVANCING …
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
    • H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
    • H04L27/38—Demodulator circuits; Receiver circuits
    • H04L27/3845—Demodulator circuits; Receiver circuits using non - coherent demodulation, i.e. not using a phase synchronous carrier
    • H04L27/3854—Demodulator circuits; Receiver circuits using non - coherent demodulation, i.e. not using a phase synchronous carrier using a non - coherent carrier, including systems with baseband correction for phase or frequency offset
    • H04L27/3863—Compensation for quadrature error in the received signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
    • H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
    • H04L27/38—Demodulator circuits; Receiver circuits
    • H04L27/3818—Demodulator circuits; Receiver circuits using coherent demodulation, i.e. using one or more nominally phase synchronous carriers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/18—Phase-modulated carrier systems, i.e. using phase-shift keying includes continuous phase systems
    • H04L27/20—Modulator circuits; Transmitter circuits
    • H04L27/2032—Modulator circuits; Transmitter circuits for discrete phase modulation, e.g. in which the phase of the carrier is modulated in a nominally instantaneous manner
    • H04L27/2053—Modulator circuits; Transmitter circuits for discrete phase modulation, e.g. in which the phase of the carrier is modulated in a nominally instantaneous manner using more than one carrier, e.g. carriers with different phases
    • H04L27/206—Modulator circuits; Transmitter circuits for discrete phase modulation, e.g. in which the phase of the carrier is modulated in a nominally instantaneous manner using more than one carrier, e.g. carriers with different phases using a pair of orthogonal carriers, e.g. quadrature carriers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; Arrangements for supplying electrical power along data transmission lines
    • H04L25/06—Dc level restoring means; Bias distortion correction decision circuits providing symbol by symbol detection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/0014—Carrier regulation

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