[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Pannala et al., 1999 - Google Patents

Extraction of S-parameters from TDR/TDT measurements using rational functions

Pannala et al., 1999

Document ID
18136111990829797887
Author
Pannala S
Swaminathan M
Publication year
Publication venue
54th ARFTG Conference Digest

External Links

Snippet

This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08Locating faults in cables, transmission lines, or networks
    • G01R31/11Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • G01R31/2839Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5036Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage
    • G01R23/14Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison
    • G01R23/145Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison by heterodyning or by beat-frequency comparison with the harmonic of an oscillator

Similar Documents

Publication Publication Date Title
Hsue et al. Reconstruction of nonuniform transmission lines from time-domain reflectometry
Deutsch et al. Extraction of/spl epsiv//sub r/(f) and tan/spl delta/(f) for printed circuit board insulators up to 30 GHz using the short-pulse propagation technique
US8659315B2 (en) Method for printed circuit board trace characterization
Liu et al. A hybrid de-embedding method for low loss and reciprocal PCB fixtures
US20030088394A1 (en) Efficient construction of passive macromodels for resonant networks
Pannala et al. Extraction of S-parameters from TDR/TDT measurements using rational functions
Su et al. Calibration of time domain network analyzers
Kim et al. Determination of propagation constants of transmission lines using 1-port TDR measurements
Beyene et al. An accurate transient analysis of high-speed package interconnects using convolution technique
Pannala et al. Contribution of resonance to ground bounce in lossy thin film planes
Ferrari et al. Calibration of a time-domain network analyzer: A new approach
Mandrekar et al. Causality enforcement in transient co-simulation of signal and power delivery networks
Cronson et al. Current status of time-domain metrology in material and distributed network research
Fidanboylu et al. A new time-domain approach for determining the complex permittivity using stripline geometry
Kim et al. Simulation of lossy package transmission lines using extracted data from one-port TDR measurements and nonphysical RLGC models
Pannala et al. Extraction of S‐parameters from time domain reflectometry and transmission measurements using rational functions
Zyari et al. Identifying multiple reflections in distributed-lumped high-frequency structures
Ferrari et al. A simulation technique for the evaluation of random error effects in time-domain measurement systems
Kim et al. Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements
Sercu et al. A new algorithm for experimental circuit modeling of interconnection structures based on causality
Paulter et al. Low-impedance time-domain reflectometry for measuring the impedance characteristics of low-impedance transmission lines
Bogatin et al. Practical characterization and analysis of lossy transmission lines
Diepenbrock Characterization and modeling of cables for high-speed data communications applications
Rajagopal et al. Material parameter extraction using time-domain TRL (t-TRL) measurements
Kim et al. Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements