[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Weisfield et al., 1998 - Google Patents

New amorphous-silicon image sensor for x-ray diagnostic medical imaging applications

Weisfield et al., 1998

View PDF
Document ID
17966681867899947131
Author
Weisfield R
Hartney M
Street R
Apte R
Publication year
Publication venue
Medical Imaging 1998: Physics of Medical Imaging

External Links

Snippet

This paper introduces new high-resolution amorphous Silicon (a-Si) image sensors specifically configured for demonstrating film-quality medical x-ray imaging capabilities. The devices utilizes an x-ray phosphor screen coupled to an array of a-Si photodiodes for …
Continue reading at citeseerx.ist.psu.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/026—Semiconductor dose-rate meters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/357—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N5/361—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/369—SSIS architecture; Circuitry associated therewith

Similar Documents

Publication Publication Date Title
Weisfield et al. New amorphous-silicon image sensor for x-ray diagnostic medical imaging applications
US7573038B2 (en) Radiation image pickup apparatus, radiation image pickup system, their control method and their control program
Antonuk et al. Empirical investigation of the signal performance of a high‐resolution, indirect detection, active matrix flat‐panel imager (AMFPI) for fluoroscopic and radiographic operation
Zhao et al. Digital radiology using active matrix readout of amorphous selenium: Construction and evaluation of a prototype real‐time detector
JP4307230B2 (en) Radiation imaging apparatus and radiation imaging method
Antonuk et al. Strategies to improve the signal and noise performance of active matrix, flat‐panel imagers for diagnostic x‐ray applications
JP3839941B2 (en) Radiation detection apparatus and radiation detection method
CN101584203B (en) Imaging array for multiple frame capture
CN101518056B (en) Compensation of leakage current and residual signals for integrating detector based on direct x-ray conversion
JP5625833B2 (en) Radiation detector and radiography apparatus
US7791032B2 (en) Multi-mode digital imaging apparatus and system
US8199236B2 (en) Device and pixel architecture for high resolution digital
US8792618B2 (en) Radiographic detector including block address pixel architecture, imaging apparatus and methods using the same
Weisfield Amorphous silicon TFT X-ray image sensors
US20040135911A1 (en) Active pixel sensor for digital imaging
US20150256765A1 (en) Charge injection compensation for digital radiographic detectors
CA2494602A1 (en) Digital imaging apparatus and system
KR20080114590A (en) Image detection device and method of driving image detector
Hoheisel et al. Amorphous silicon X-ray detectors
WO2018135293A1 (en) Radiation imaging device and radiation imaging system
US20110284749A1 (en) Radiation detector
JP5020840B2 (en) Image detection apparatus and image detector driving method
WO2014050531A1 (en) Radiographic imaging device, radiographic imaging system, method for controlling radiographic imaging device, and radiographic imaging program
Street et al. High performance amorphous silicon image sensor arrays
Antonuk et al. Investigation of strategies to achieve optimal DQE performance from indirect-detection active-matrix flat-panel imagers (AMFPIs) through novel pixel amplification architectures