Qin et al., 2022 - Google Patents
A novel factor analysis-based metric learning method for kinship verificationQin et al., 2022
- Document ID
- 17874828348321529828
- Author
- Qin X
- Liu D
- Wang D
- Publication year
- Publication venue
- Multimedia Tools and Applications
External Links
Snippet
This paper presents a novel factor analysis-based metric learning (FAML) method for kinship verification. While metric learning has achieved reasonably good performance in kinship verification, most existing metric learning methods ignore to discover semantically …
- 238000000556 factor analysis 0 title abstract description 27
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