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Qin et al., 2022 - Google Patents

A novel factor analysis-based metric learning method for kinship verification

Qin et al., 2022

Document ID
17874828348321529828
Author
Qin X
Liu D
Wang D
Publication year
Publication venue
Multimedia Tools and Applications

External Links

Snippet

This paper presents a novel factor analysis-based metric learning (FAML) method for kinship verification. While metric learning has achieved reasonably good performance in kinship verification, most existing metric learning methods ignore to discover semantically …
Continue reading at link.springer.com (other versions)

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