[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Ottonelli et al., 2009 - Google Patents

Laser-self-mixing interferometry for mechatronics applications

Ottonelli et al., 2009

View HTML
Document ID
17727119878673850040
Author
Ottonelli S
Dabbicco M
De Lucia F
Di Vietro M
Scamarcio G
Publication year
Publication venue
Sensors

External Links

Snippet

We report on the development of an all-interferometric optomechatronic sensor for the detection of multi-degrees-of-freedom displacements of a remote target. The prototype system exploits the self-mixing technique and consists only of a laser head, equipped with …
Continue reading at www.mdpi.com (HTML) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infra-red, visible, or ultra-violet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infra-red, visible, or ultra-violet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infra-red, visible, or ultra-violet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means

Similar Documents

Publication Publication Date Title
Zheng et al. A method for simultaneously measuring 6DOF geometric motion errors of linear and rotary axes using lasers
Wang et al. An ultra-precision absolute-type multi-degree-of-freedom grating encoder
Yang et al. Reduction of the influence of laser beam directional dithering in a laser triangulation displacement probe
Shimizu et al. Optical angle sensor technology based on the optical frequency comb laser
Li et al. Design and Testing of a Compact Optical Prism Module for Multi-Degree-of-Freedom Grating Interferometry Application
Cai et al. Error analysis and compensation of a laser measurement system for simultaneously measuring five-degree-of-freedom error motions of linear stages
Ottonelli et al. Laser-self-mixing interferometry for mechatronics applications
Cai et al. Development of a compact three-degree-of-freedom laser measurement system with self-wavelength correction for displacement feedback of a nanopositioning stage
Liu et al. Design of a measurement system for six-degree-of-freedom geometric errors of a linear guide of a machine tool
Jia et al. Simultaneous measurement of 6DOF motion errors of linear guides of CNC machine tools using different modes
Chang et al. Double-diffracted spatially separated heterodyne grating interferometer and analysis on its alignment tolerance
Hsieh et al. A geometric error measurement system for linear guideway assembly and calibration
Chang et al. Design and characterisation of a fast steering mirror compensation system based on double porro prisms by a screw-ray tracing method
Yang et al. Two degree-of-freedom fiber-coupled heterodyne grating interferometer with milli-radian operating range of rotation
Hong et al. A new optical configuration for the surface encoder with an expanded Z-directional measuring range
Sun et al. Compact laser collimation system for simultaneous measurement of five-degree-of-freedom motion errors
Yang et al. An Ultracompact Angular Displacement Sensor Based on the Talbot Effect of Optical Microgratings
Zhou et al. Grating-corner-cube-based roll angle sensor
Küng et al. Low-cost 2D index and straightness measurement system based on a CMOS image sensor
Su et al. A straightness error compensation system for topography measurement based on thin film interferometry
Chen et al. An optical sensor for measuring the position and slanting direction of flat surfaces
Yu et al. Development of a 3-DOF Angle Sensor Based on a Single Laser Interference Probe
Cheng et al. Modeling and optimal design for a high stability 2D optoelectronic angle sensor
Yang et al. Research on focal length measurement scheme of self-collimating optical instrument based on double grating
Lazar et al. Short-range six-axis interferometer controlled positioning for scanning probe microscopy