Malik et al., 2008 - Google Patents
Comparison of polymers: a new application of shape from focusMalik et al., 2008
- Document ID
- 17650380537896132571
- Author
- Malik A
- Choi T
- Publication year
- Publication venue
- IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and Reviews)
External Links
Snippet
New polymers are frequently appearing in the literature with a wide range of applications, eg, they are being used in applications like fuel cell membrane, fertilizers, coating elements, etc. One of the requirements of the researchers involved in polymer science is to quickly …
- 229920000642 polymer 0 title abstract description 37
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30004—Biomedical image processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20112—Image segmentation details
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
- G06K9/46—Extraction of features or characteristics of the image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/00127—Acquiring and recognising microscopic objects, e.g. biological cells and cellular parts
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/62—Methods or arrangements for recognition using electronic means
- G06K9/6217—Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/62—Methods or arrangements for recognition using electronic means
- G06K9/6267—Classification techniques
- G06K9/6268—Classification techniques relating to the classification paradigm, e.g. parametric or non-parametric approaches
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Mahmood et al. | Optimal depth estimation by combining focus measures using genetic programming | |
Malik et al. | Comparison of polymers: a new application of shape from focus | |
Wang et al. | 3-D particle surface reconstruction from multiview 2-D images with structure from motion and shape from shading (January 2020) | |
US20210358160A1 (en) | Method and system for determining plant leaf surface roughness | |
Li et al. | Adaptive spatial filtering based on region growing for automatic analysis in digital holographic microscopy | |
Jähnisch et al. | 3-D vision feedback for nanohandling monitoring in a scanning electron microscope | |
Bergström et al. | Virtual projective shape matching in targetless CAD-based close-range photogrammetry for efficient estimation of specific deviations | |
Leach et al. | Fusion of photogrammetry and coherence scanning interferometry data for all-optical coordinate measurement | |
CN107590787B (en) | Image distortion correction method of scanning electron microscope | |
Lee et al. | Robust focus measure operator using adaptive log-polar mapping for three-dimensional shape recovery | |
CN113048912B (en) | Calibration system and method of projector | |
Kudryavtsev | 3D Reconstruction in Scanning Electron Microscope: from image acquisition to dense point cloud | |
Lee et al. | Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm | |
WO2006026214A1 (en) | Measuring sub-wavelength displacements | |
Li et al. | Deep learning-based interference fringes detection using convolutional neural network | |
Farnes et al. | Autofocus measurement for electronic components using deep regression | |
Bessmel'tsev et al. | Fast image registration algorithm for automated inspection of laser micromachining | |
Kim et al. | Optical distance control for a multi focus image in camera phone module assembly | |
Burla et al. | Fourier descriptors for defect indication in a multiscale and multisensor measurement system | |
Karthik et al. | Underwater microscopic shape from focus | |
Li et al. | Research on three-dimensional reconstruction technology of line laser scanning scene based on Otsu method | |
Li et al. | Microscopic photometric stereo: A dense microstructure 3d measurement method | |
Yang et al. | Automatic optical inspection system for 3D surface profile measurement of multi-microlenses using the optimal inspection path | |
Jahnisch et al. | Stereoscopic depth-detection for handling and manipulation tasks in a scanning electron microscope | |
Yin et al. | A new Surface roughness measurement method based on image mosaic of template matching algorithm |