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Roman et al., 2023 - Google Patents

Predictive Power of Two Data Flow Metrics in Software Defect Prediction.

Roman et al., 2023

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Document ID
17640570530931494744
Author
Roman A
Brozek R
Hryszko J
Publication year
Publication venue
ENASE

External Links

Snippet

Data flow coverage criteria are widely used in software testing, but there is almost no research on low-level data flow metrics as software defect predictors. Aims: We examine two such metrics in this context: depdegree (DD) proposed by Beyer and Fararooy and a new …
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