Bernal et al., 2014 - Google Patents
In situ electron microscopy four‐point electromechanical characterization of freestanding metallic and semiconducting nanowiresBernal et al., 2014
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- 17460040193278378019
- Author
- Bernal R
- Filleter T
- Connell J
- Sohn K
- Huang J
- Lauhon L
- Espinosa H
- Publication year
- Publication venue
- small
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Electromechanical coupling is a topic of current interest in nanostructures, such as metallic and semiconducting nanowires, for a variety of electronic and energy applications. As a result, the determination of structure‐property relations that dictate the electromechanical …
- 239000002070 nanowire 0 title abstract description 113
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