Murata et al., 2013 - Google Patents
Noise analysis using on-chip waveform monitor in bandgap voltage referencesMurata et al., 2013
- Document ID
- 17115739804061949418
- Author
- Murata A
- Agatsuma S
- Ikoma D
- Ichikawa K
- Tsuda T
- Nagata M
- Yoshikawa K
- Araga Y
- Harada Y
- Publication year
- Publication venue
- 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
External Links
Snippet
In this paper, the susceptibility of a CMOS bandgap voltage reference (BGR) to external noise was investigated using an on-chip waveform monitor circuit in conjunction with circuit simulations. A Direct RF Power Injection method was employed for the immunity test of the …
- 238000004458 analytical method 0 title description 3
Classifications
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
- G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
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- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
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- G01R31/02—Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current, or incorrect line connection
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- G01R31/1227—Testing dielectric strength or breakdown voltage; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- G06F17/5009—Computer-aided design using simulation
- G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
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