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Wang et al., 2009 - Google Patents

A novel architecture for on-chip path delay measurement

Wang et al., 2009

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Document ID
1693826628019918177
Author
Wang X
Tehranipoor M
Datta R
Publication year
Publication venue
2009 International Test Conference

External Links

Snippet

As technology scales to 45nm and below, the deviation between predicted path delay using simulation and actual path delay on a manufactured chip increases. Hence, on-chip measurement architectures are now widely used due to their higher accuracy and lower cost …
Continue reading at scholar.archive.org (PDF) (other versions)

Classifications

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    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318594—Timing aspects
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    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
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    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • G01R31/3181—Functional testing
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    • G01R31/318572—Input/Output interfaces
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    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318385—Random or pseudo-random test pattern
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    • G—PHYSICS
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    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
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    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation

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