Thomas et al., 2013 - Google Patents
Solution-processable metal oxide semiconductors for thin-film transistor applicationsThomas et al., 2013
- Document ID
- 16873626893278173980
- Author
- Thomas S
- Pattanasattayavong P
- Anthopoulos T
- Publication year
- Publication venue
- Chemical Society Reviews
External Links
Snippet
Solution-processable metal oxide semiconductors for thin-film transistor applications -
Chemical Society Reviews (RSC Publishing) DOI:10.1039/C3CS35402D Royal Society of
Chemistry View PDF VersionPrevious ArticleNext Article DOI: 10.1039/C3CS35402D (Review …
- 229910044991 metal oxide 0 title abstract description 55
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- H01L29/66—Types of semiconductor device; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
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- H01L29/66—Types of semiconductor device; Multistep manufacturing processes therefor
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- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L29/66—Types of semiconductor device; Multistep manufacturing processes therefor
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