[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Lee et al., 2023 - Google Patents

Electrochemical migration in electronic materials: factors affecting the mechanism and recent strategies for inhibition

Lee et al., 2023

Document ID
16868429908653419495
Author
Lee E
Goh Y
Haseeb A
Wong Y
Sabri M
Low B
Publication year
Publication venue
Journal of The Electrochemical Society

External Links

Snippet

Electrochemical migration (ECM) is one of the serious failure modes encountered in electronic devices due to the electrochemical reactions triggered by the presence of moisture and bias voltage, leading to the growth of dendrites and short circuits. The classical …
Continue reading at iopscience.iop.org (other versions)

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/17Post-manufacturing processes
    • H05K2203/176Removing, replacing or disconnecting component; Easily removable component
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/66Electroplating: Baths therefor from melts
    • C25D3/665Electroplating: Baths therefor from melts from ionic liquids

Similar Documents

Publication Publication Date Title
Zhong et al. Electrochemical migration of Sn and Sn solder alloys: a review
Lee et al. Electrochemical migration in electronic materials: factors affecting the mechanism and recent strategies for inhibition
Minzari et al. On the electrochemical migration mechanism of tin in electronics
US8986434B2 (en) Silver plating in electronics manufacture
Liao et al. Recent advances in method of suppressing dendrite formation of tin-based solder alloys
ES2574561T3 (en) Solution and process to increase the weldability and corrosion resistance of the surface of a metal or metal alloy
Wang et al. An Assessment of Immersion Silver Surface Finish for Lead-Free Electronics.
Jaiswal et al. Electrochemical behavior of Sn-9Zn-xCu solder alloy in 3.5 wt% NaCl solution at room temperature
Illés et al. Corrosion-induced tin whisker growth in electronic devices: A review
Wafula et al. Impact of key deposition parameters on the voiding sporadically occurring in solder joints with electroplated copper
Vimala et al. Corrosion and protection of electronic components in different environmental conditions-an overview
Guerrero et al. Corrosion and Leaching Behaviours of Sn‐0.7 Cu‐0.05 Ni Lead‐Free Solder in 3.5 wt.% NaCl Solution
Salahinejad et al. Synergistic galvanic-pitting corrosion of copper electrical pads treated with electroless nickel-phosphorus/immersion gold surface finish
EP2411559B1 (en) Organic polymer coatings for protection against creep corrosion
EP2180081A1 (en) Post-treatment composition for increasing corrosion resistance of metal or metal alloy surfaces
Lao et al. Corrosion and leaching behaviors of Sn-based alloy in simulated soil solutions
WO2005121405A1 (en) Corrosion resistance enhancement of tin surfaces
Oh et al. Galvanic corrosion of Cu coupled to Au on a print circuit board; effects of pretreatment solution and etchant concentration in organic solderability preservatives soft etching solution
CN1297490A (en) Method for coating surfaces of copper or of copper alloy with tin or tin alloy layer
Tanaka Factors leading to ionic migration in lead-free solder
Yoo et al. Influence of corrosion properties on electrochemical migration susceptibility of SnPb solders for PCBs
Tsai et al. Pulse Electroplating of Sn-Bi Alloys on Micropatterned Electrodes for Lead-Free Solder Bumping
KR20130069591A (en) Sealing agent and sealing method
Vianco Corrosion issues in solder joint design and service
EP0750549A1 (en) Bismuth coating protection for copper