Pourkazemi et al., 2015 - Google Patents
Novel illumination and parameter extraction technique for the characterization of multilayer structures in the GHz range with deep sub-wavelength resolutionPourkazemi et al., 2015
- Document ID
- 1672609137344336751
- Author
- Pourkazemi A
- Ranson W
- Stiens J
- Becquaert M
- Vandewal M
- Publication year
- Publication venue
- 2015 IEEE 15th Mediterranean Microwave Symposium (MMS)
External Links
Snippet
a new fast contact-free nondestructive technique (NDT) for the characterization of multilayer dielectric structures, potentially backed by a metal or water layer is proposed. By means of a novel blind analysis method of the time dependent reflected electromagnetic signal, detailed …
- 238000000034 method 0 title abstract description 15
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/043—Analysing solids in the interior, e.g. by shear waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/10—Number of transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F23/00—Indicating or measuring liquid level, or level of fluent solid material, e.g. indicating in terms of volume, indicating by means of an alarm
- G01F23/22—Indicating or measuring liquid level, or level of fluent solid material, e.g. indicating in terms of volume, indicating by means of an alarm by measurement of physical variables, other than linear dimensions, pressure or weight, dependent on the level to be measured, e.g. by difference of heat transfer of steam or water
- G01F23/28—Indicating or measuring liquid level, or level of fluent solid material, e.g. indicating in terms of volume, indicating by means of an alarm by measurement of physical variables, other than linear dimensions, pressure or weight, dependent on the level to be measured, e.g. by difference of heat transfer of steam or water by measuring the variations of parameters of electric or acoustic waves applied directly to the liquid or fluent solid material
- G01F23/284—Electromagnetic waves
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109669075B (en) | Dielectric complex dielectric constant nondestructive reflection measurement method based on open rectangular waveguide | |
Wu et al. | Application of terahertz time domain spectroscopy for NDT of oxide-oxide ceramic matrix composites | |
CN109883337A (en) | Thermal Barrier Coating Thickness Measurement System and Measurement Method Based on Terahertz Spectroscopy | |
JP6620098B2 (en) | Nondestructive material characterization waveguide probe | |
CN103335951B (en) | The measuring system of stealth material Terahertz reflectivity | |
CN104856678B (en) | The microwave detection system of the internal portion's foreign matter of complexity based on template signal similarity | |
JP2013507640A (en) | System and method for detecting and measuring interface properties of single-layer and multi-layer objects | |
US11085874B2 (en) | Characterization of multilayer structures | |
CN104914115B (en) | Soil moisture content analyzer and assay method thereof | |
Nezadal et al. | Non-destructive testing of glass fibre reinforced plastics with a synthetic aperture radar in the lower THz region | |
JP2019095438A (en) | Ultrasonic inspection of structure with ramp | |
Barowski et al. | Millimeter wave material characterization using FMCW-transceivers | |
Pourkazemi et al. | Novel illumination and parameter extraction technique for the characterization of multilayer structures in the GHz range with deep sub-wavelength resolution | |
US20180156728A1 (en) | Characterization of multilayer structures | |
Vogt et al. | An 80 GHz radar level measurement system with dielectric lens antenna | |
KR101795992B1 (en) | Device for analyzing tubular specimen using terahertz wave and method for analyzing tubular specimen using the device | |
Pourkazemi et al. | Transient radar method: Novel illumination and blind electromagnetic/geometrical parameter extraction technique for multilayer structures | |
Barowski et al. | Monostatic and thickness-independent material characterisation based on microwave ellipsometry | |
Becquaert et al. | Novel illumination and parameter extraction technique for the characterization of multilayer structures in the GHz range with deep sub-wavelength resolution | |
EP3311147A1 (en) | Characterization of multilayer structures | |
RU2528130C1 (en) | Device for measurement of property of dielectric material | |
EP3156784A1 (en) | Enhanced characterization of dielectric properties | |
Sklarczyk | Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization | |
Moll et al. | Millimeter-wave non-destructive testing of a cured in place pipe sample | |
Barowski et al. | Ellipsometry based on millimeter wave radar measurements |